Cypress Semiconductor Corp CY7C1312KV18-300BZC

Overview

CY7C1312KV18 from Cypress Semiconductor is a 1M × 18, 18-Mbit QDR® II SRAM with separate read/write ports, 333 MHz clock operation (666 MT/s DDR), 1.5-cycle read latency (DOFF = HIGH), and 1.8 V core / 1.4–1.8 V I/O supply. It delivers concurrent burst transfers in networking packet buffers, high-speed test equipment memory subsystems, and FPGA co-processor caches.

For engineers reviewing the CY7C1312KV18 datasheet, CY7C1312KV18 pinout, CY7C1312KV18 application, or CY7C1312KV18 equivalent, key selection criteria include dual-port concurrency, echo-clock–assisted data capture, HSTL-compatible 165-ball FBGA packaging, and JTAG 1149.1 testability for high-reliability embedded memory systems.

Technical Context

The CY7C1312KV18 implements a true dual-port synchronous architecture with independent K/K clocks for write address/data capture and C/C clocks for read data output timing-enabling precise DDR alignment without bus turnaround. Its internal pipelined control logic supports simultaneous read and write operations on the same clock cycle.

It uses echo clocks CQ/CQ referenced to C/C to simplify high-speed data capture at 666 MT/s, and integrates a PLL for accurate data placement. The DOFF pin selects between 1.5-cycle (QDR II) and 1-cycle (QDR I) read latency modes, preserving backward compatibility while enabling bandwidth scaling.

Key Specifications

Pinout & Package

Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm body, RoHS-compliant, 0.8 mm ball pitch.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-bandwidth dual-port SRAM applications.

Compared with IDT72T36120L10BG and IS61WV102418B, the CY7C1312KV18 uniquely delivers concurrent DDR read/write at 666 MT/s with echo-clock–assisted timing closure - essential for next-generation packet processing and FPGA acceleration where deterministic latency and full-duplex bandwidth are non-negotiable.

Availability

CY7C1312KV18 is available at Aetrix Electronics and suitable for networking packet buffers, FPGA co-processor caches, and high-speed test equipment requiring stable component supply across long-life industrial and telecom programs.

Supply support for CY7C1312KV18 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and programmable solutions for automotive, industrial, and communications markets.

The QDR® II SRAM product line targets high-bandwidth, low-latency memory subsystems in networking, test & measurement, and FPGA-based computing - emphasizing deterministic timing, concurrent access, and system-level signal integrity.

FAQ

What is the function of the DOFF pin on CY7C1312KV18?

The DOFF (Double-Data-Rate OFF) pin configures read latency mode: when asserted HIGH, it enables QDR II operation with 1.5-cycle latency; when LOW or tied to VSS, it reverts to QDR I mode with 1-cycle latency. This pin directly controls internal pipeline staging and must be set at power-up before initialization.

Can CY7C1312KV18 operate with only a single clock domain?

Yes - the device supports single-clock mode where K/K and C/C are driven by the same differential clock pair. In this configuration, Q[17:0] and CQ/CQ are timed to K/K edges, simplifying clock tree design at the cost of reduced skew margin versus dual-clock operation.

How does ZQ pin calibration affect signal integrity?

ZQ connects to an external resistor (typically 100 Ω to ground) to calibrate output driver impedance for Q[17:0] and CQ/CQ pins. This ensures consistent 50 Ω (or system-matched) termination, minimizing reflections and jitter - critical for maintaining eye opening at 666 MT/s DDR rates.

Is JTAG boundary scan supported during normal operation?

Yes - IEEE 1149.1 TAP remains fully functional during active memory operation. Test instructions (SAMPLE/PRELOAD, EXTEST, INTEST) can be executed without halting read/write transactions, enabling in-system diagnostics and production test without interrupting real-time data flow.