Cypress Semiconductor Corp CY7C1319KV18-250BZXC
- Part No.:
- CY7C1319KV18-250BZXC
- Manufacturer:
- Cypress Semiconductor Corp
- Category:
- Memory
- Package:
- 165-LBGA
- Datasheet:
-
CY7C1319KV18-250BZXC.pdf
- Description:
- IC SRAM 18MBIT PAR 165FBGA
- Quantity:
- Payment:

- Shipping:

Inventory:1,953
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
CY7C1319KV18-250BZXC from Cypress Semiconductor is a 18-Mbit (1M × 18) DDR II synchronous pipelined SRAM with four-word burst architecture, 250 MHz maximum clock frequency, 1.8 V core supply, and HSTL I/O compatible with 1.5 V/1.8 V VDDQ. It delivers 666 MT/s data rate via double-data-rate interface and supports configurable read latency (1-cycle or 1.5-cycle) via DOFF pin. Used in high-bandwidth networking packet buffers and telecom line card memory subsystems.
For engineers reviewing the CY7C1319KV18-250BZXC datasheet, CY7C1319KV18-250BZXC pinout, CY7C1319KV18-250BZXC application, or CY7C1319KV18-250BZXC equivalent, key selection criteria include DDR II timing compliance, echo clock (CQ/CQ) synchronization capability, burst-addressed 18-bit data path, and 165-ball FBGA package compatibility with high-density PCB layouts.
Technical Context
This SRAM implements a synchronous pipelined architecture with internal two-bit burst counter driven by A[1:0], enabling sequential four-word reads/writes per address load. All synchronous inputs (R/W, LD, BWS, A) are registered on rising edges of K/K clocks, while outputs (DQ, CQ, CQ) are edge-aligned to C/C or K/K in single-clock mode.
The device integrates a PLL for precise data placement, JTAG 1149.1 test access port, and programmable output impedance via ZQ pin (0.2 × RQ calibration). Read latency is selectable: 1 cycle when DOFF = LOW (DDR I mode), 1.5 cycles when DOFF = HIGH (DDR II mode), with all writes self-timed internally.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Density & Organization | 18 Mbit (1,048,576 × 18 bits); four 256K × 18 arrays enable interleaved burst access |
| Max Clock Frequency | 250 MHz K/K input clock; supports 500 MT/s effective bus bandwidth with DDR |
| Data Rate | 666 MT/s (double-data-rate at 333 MHz clock); actual sustained throughput depends on burst efficiency |
| Read Latency | Selectable: 1 cycle (DOFF = LOW) or 1.5 cycles (DOFF = HIGH); determines minimum read turnaround time |
| Supply Voltages | 1.8 V ±0.1 V core (VDD); 1.4–1.8 V I/O (VDDQ) with HSTL-compliant drive strength |
| Package | 165-ball FBGA (13 mm × 15 mm × 1.4 mm); 0.8 mm ball pitch; RoHS-compliant Pb-free option |
| Output Timing Reference | Echo clocks CQ/CQ aligned to C/C; eliminates board-level skew compensation in multi-SRAM systems |
Pinout & Package
Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm footprint, 1.4 mm height, 0.8 mm ball pitch. Thermal pad exposed on underside for enhanced heat dissipation in high-throughput operation.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| DQ[17:0] | Synchronous bidirectional data bus | 18-bit DDR data path; inputs sampled on K/K rising edges, outputs driven on C/C rising edges; tristated automatically when deselected |
| K / K | Positive/negative input clocks | Rising edges latch all synchronous inputs (address, R/W, LD, BWS); define burst initiation and write sampling points |
| C / C | Positive/negative output data clocks | Control timing of DQ and CQ/CQ outputs; used with echo clocks to deskew flight time across multiple devices |
| CQ / CQ | Echo clocks referenced to C/C | Free-running, phase-matched copies of C/C; simplify system-level data capture without per-device delay tuning |
| DOFF | Read latency configuration input | LOW → 1-cycle DDR I latency; HIGH → 1.5-cycle DDR II latency; sets internal pipeline depth |
| ZQ | Output impedance calibration input | Connects to external resistor to ground (RQ); calibrates DQ/CQ/CQ drive strength to 0.2 × RQ for signal integrity |
Key Features
| Feature | Design Value |
|---|---|
| Four-word burst architecture | Reduces address bus toggling by 75% vs. single-word access; lowers system-level EMI and routing complexity |
| Configurable DDR latency (DOFF) | Enables migration between DDR I and DDR II timing models without hardware change; supports legacy and next-gen controller designs |
| Integrated echo clocks (CQ/CQ) | Eliminates need for per-SRAM trace-length matching; enables deterministic data capture in multi-chip memory modules |
| Programmable output drive (ZQ) | Calibrates DQ/CQ/CQ impedance to match PCB trace impedance (typically 50 Ω), reducing reflections and improving eye margin |
| JTAG 1149.1 boundary scan | Supports IEEE-compliant production testing and in-system diagnostics without additional test fixtures or probes |
Applications
| Telecom Line Card Buffer | Network Packet Processing |
|---|---|
|
Use Scenario: High-speed packet buffering in 10G/25G Ethernet line cards requiring low-latency, burst-oriented memory access. IC Role / Device Role / Timing Role: Primary burst-access SRAM for ingress/egress packet queues; synchronized to line-rate clock domain via K/K and C/C. Use Value: Four-word burst reduces controller address bus activity by 75%, lowering FPGA logic utilization and PCB routing congestion. |
Use Scenario: Deep packet inspection engines needing fast random-access storage for flow state tables and header caches. IC Role / Device Role / Timing Role: Low-latency DDR II SRAM interfaced to network processor's memory controller; DOFF = HIGH for 1.5-cycle latency optimization. Use Value: Echo clocks (CQ/CQ) align read data precisely with controller sampling windows, eliminating per-lane deskew circuitry. |
| Industrial Control Data Logging | Test Equipment Waveform Memory |
|
Use Scenario: Real-time data acquisition systems logging sensor streams at >100 MS/s into circular buffers. IC Role / Device Role / Timing Role: Burst-capable memory buffer accepting parallel samples from ADC interfaces; ZQ calibrated to 50 Ω traces. Use Value: Variable-drive HSTL outputs maintain signal integrity across long backplane traces, supporting >20 cm routing lengths. |
Use Scenario: Automated test equipment storing high-resolution analog waveforms for pattern generation and comparison. IC Role / Device Role / Timing Role: Synchronous pipelined SRAM providing deterministic 250 MHz read/write timing to arbitrary waveform generators. Use Value: PLL-based data placement ensures sub-nanosecond jitter on DQ outputs, critical for <100 ps timing resolution applications. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar DDR II SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| AS7C331024B-250BIN | 256-Mbit density (16M × 18), 250 MHz, but uses QDR-II interface (not DDR II); no echo clocks or DOFF latency control | Higher density but incompatible timing model; requires QDR-capable controller and separate clock tree design | Select only if system controller supports QDR-II and higher capacity outweighs DDR II feature loss |
| IS45S16160J-25BLI | SDRAM (not SRAM); 256-Mbit, 250 MHz, but asynchronous command interface, no burst counter, no echo clocks | Lower cost but introduces refresh overhead, variable latency, and no deterministic DDR II timing guarantees | Acceptable only in non-real-time applications where latency predictability is not required |
Compared with AS7C331024B-250BIN and IS45S16160J-25BLI, CY7C1319KV18-250BZXC uniquely provides DDR II–specific features-configurable latency, echo clocks, and synchronous burst addressing-enabling deterministic, low-jitter memory access essential for telecom and test equipment.
Availability
CY7C1319KV18-250BZXC is available at Aetrix Electronics and suitable for telecom line card design, network packet processing, industrial data logging, and automated test equipment requiring stable component supply and long-term lifecycle support.
Supply support for CY7C1319KV18-250BZXC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Cypress Semiconductor (now part of Infineon Technologies) is a fabless semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.
CY7C1319KV18 belongs to Cypress's DDR II SRAM product line, engineered specifically for high-bandwidth, low-latency buffering in telecom infrastructure and test instrumentation where deterministic timing and signal integrity are critical.
FAQ
What is the function of the DOFF pin on CY7C1319KV18-250BZXC?
The DOFF (Data Output OFFset) pin configures read latency: when asserted LOW, the device operates in DDR I mode with 1-cycle read latency; when HIGH, it enters DDR II mode with 1.5-cycle latency. This setting directly controls internal pipeline staging and must be held stable during operation - it is not dynamically switchable mid-burst.
Can CY7C1319KV18-250BZXC operate without external C and C clocks?
Yes - in single-clock mode, the device uses K and K as both input and output clocks. In this configuration, CQ and CQ are generated relative to K/K instead of C/C, and data is driven on K/K rising edges. However, echo clock benefits (flight-time deskew) are lost, and system timing margin decreases accordingly.
How is output impedance calibrated using the ZQ pin?
ZQ connects to an external precision resistor (RQ) tied to ground; the device measures RQ and sets DQ, CQ, and CQ output drive strength to 0.2 × RQ. For standard 50 Ω PCB traces, RQ = 250 Ω. Connecting ZQ directly to VDDQ enables minimum impedance mode (≈20 Ω), but grounding or leaving ZQ floating is prohibited.
Does CY7C1319KV18-250BZXC support byte-write masking across all 18 bits?
No - byte-write is implemented via BWS0 and BWS1 pins, each controlling nine bits: BWS0 governs DQ[8:0], BWS1 governs DQ[17:9]. Both are active-low and sampled synchronously on K/K rising edges. Full 18-bit masking requires asserting both BWS0 and BWS1 HIGH; partial writes affect only the enabled 9-bit segments.
CY7C1319KV18-250BZXC Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Cypress Semiconductor Corp
- Series:
- -
- Package/Case:
- 165-LBGA
- Packaging:
- Bulk
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, DDR II
- Memory Size:
- 18Mbit
- Memory Organization:
- 1M x 18
- Memory Interface:
- Parallel
- Clock Frequency:
- 250 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-FBGA (13x15)
CY7C1319KV18-250BZXC FAQ
1.How can I place an order for CY7C1319KV18-250BZXC through Aetrix?
Please submit a Request for Quotation (RFQ) for CY7C1319KV18-250BZXC on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY7C1319KV18-250BZXC reliable?
The price and inventory of CY7C1319KV18-250BZXC are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1319KV18-250BZXC is usually 5 days.
3.What payment methods are accepted for CY7C1319KV18-250BZXC?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY7C1319KV18-250BZXC transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for CY7C1319KV18-250BZXC?
CY7C1319KV18-250BZXC orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your CY7C1319KV18-250BZXC order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY7C1319KV18-250BZXC?
For technical support, including CY7C1319KV18-250BZXC datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1319KV18-250BZXC requirements.
6.How does Aetrix verify that CY7C1319KV18-250BZXC is sourced from the original manufacturer or authorized distributors?
All CY7C1319KV18-250BZXC products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1319KV18-250BZXC meets industry standards.
7.What is the process for return or replacement of CY7C1319KV18-250BZXC?
All CY7C1319KV18-250BZXC units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1319KV18-250BZXC, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY7C1319KV18-250BZXC part is unused and in its original packaging.
Return procedure for CY7C1319KV18-250BZXC:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
CY7C1319KV18-250BZXC Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
18650 battery guide covering lithium-ion cell basics, 3.6V/3.7V voltage, 4.2V charging, mAh and Wh capacity, protected cells, chargers, BMS, series-parallel packs, holders, welding and sourcing checks.…
Hall effect sensor guide covering working principle, linear and digital sensors, Arduino circuits, current sensing, speed detection, automotive applications, A3144 examples, signal filtering and datash…
Product Change Notification guide for electronic components, covering PCN meaning, PCN vs PDN/EOL, common change types, risk levels, form-fit-function review, engineering validation, BOM control, LTB/L…
A practical guide to blend door actuators, covering HVAC function, symptoms, location, AC and heater issues, reset and calibration, replacement cost, electrical diagnosis, compatibility checks, and rep…
Engineering guide to Raspberry Pi alternatives, covering chip-level differences, Orange Pi, ROCK, Jetson, Banana Pi, NanoPi, Compute Module, Pico, GPIO, camera, HAT compatibility, and replacement risks…
Engineering guide to dynamic load response testing for high-current buck converters, covering load step setup, slew rate, Vcore undershoot, overshoot, recovery time, probe location, output capacitors a…
Engineering guide to output capacitor selection for ASIC Vcore rails, covering bulk capacitors, polymer capacitors, MLCC decoupling, DC bias, ESR, ESL, placement, transient response and substitution ri…
Engineering guide to high-current ASIC Vcore rails, covering 12-phase buck architecture, PMBus control, dynamic load testing, output capacitor networks, smart power stage selection, thermal design and …
Voltage regulator guide covering linear, LDO, 7805, Zener, adjustable, buck, VRM and alternator regulators, with design checks, testing methods, troubleshooting and datasheet-based selection.
Amplifier guide covering voltage, current and power amplification, gain, feedback, amplifier classes, audio and RF applications, op-amp circuits, transimpedance amplifiers, datasheet selection and trou…

