Cypress Semiconductor Corp CY7C1470BV25-200BZXC

Overview

CY7C1470BV25-200BZXC from Cypress Semiconductor is a 72-Mbit (2M × 36) synchronous pipelined SRAM with NoBL™ architecture, designed for high-throughput memory subsystems in networking and telecom line cards. It operates at 200 MHz with zero wait states, supports 2.5 V core and I/O supply, features fully registered inputs/outputs, and delivers 3.0 ns clock-to-output delay. Used in packet buffering and cache coherency circuits where back-to-back read/write transitions are critical.

For engineers reviewing the CY7C1470BV25-200BZXC datasheet, CY7C1470BV25-200BZXC pinout, CY7C1470BV25-200BZXC application, or CY7C1470BV25-200BZXC equivalent, this page provides verified package mapping (100-pin TQFP), byte-write control logic, burst order selection via MODE pin, JTAG boundary-scan support, and validated alternatives for ZBT-compatible designs.

Technical Context

The device implements a synchronous, fully registered pipeline with rising-edge-triggered input and output registers. All address, control, and data signals-including BWa–BWd, CE1/CE2/CE3, ADV/LD, and WE-are sampled on the rising edge of CLK, which is gated by CEN.

NoBL™ logic enables true back-to-back read/write operations without bus latency; internal self-timed write circuitry eliminates external OE timing constraints, and burst addressing supports both linear and interleaved orders selected by the MODE strap pin.

Key Specifications

Pinout & Package

Package: 100-pin TQFP (14 × 20 × 1.4 mm), RoHS-compliant, JEDEC-standard Pb-free.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar synchronous pipelined SRAM applications.

Compared with IDT72V2125L15PF and IS61WV102436B, CY7C1470BV25-200BZXC uniquely combines 72-Mbit density, 200 MHz zero-wait-state operation, MODE-configurable burst order, and IEEE 1149.1 testability-making it optimal for next-generation telecom and defense signal processing where timing determinism and test coverage are non-negotiable.

Availability

CY7C1470BV25-200BZXC is available at Aetrix Electronics and suitable for telecom line card buffering, network processor cache extension, and radar signal processing applications requiring stable component supply across extended production lifecycles.

Supply support for CY7C1470BV25-200BZXC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) is a fabless semiconductor company specializing in high-performance memory, microcontrollers, and programmable systems-on-chip for industrial, automotive, and communications markets.

CY7C1470BV25 belongs to Cypress's NoBL™ SRAM product line, engineered specifically for eliminating bus latency in high-speed packet-forwarding and real-time signal-processing systems where deterministic timing and burst efficiency are essential.

FAQ

What is the function of the MODE pin on CY7C1470BV25-200BZXC?

The MODE pin is a static strap input that selects burst addressing order: pulled HIGH (or left floating) enables interleaved burst mode; pulled LOW enables linear burst mode. It must remain stable during device operation and is sampled only at power-up or reset. This allows hardware-level configuration to match the burst expectations of the host ASIC or FPGA without firmware intervention.

Does CY7C1470BV25-200BZXC support partial writes without read-modify-write cycles?

Yes. The device supports true byte-write operations via four independent active-low Byte Write Select signals (BWa–BWd), each controlling a 9-bit segment (DQa/DQPa through DQd/DQPd). When a specific BWx is asserted LOW while WE is active, only the corresponding 9-bit data group is written-no internal read-modify-write is performed, preserving timing determinism and reducing power.

How does the CEN pin affect timing behavior compared to deasserting CE1/CE2/CE3?

CEN gates the CLK signal without deselecting the device: when CEN is HIGH, the internal state holds and the previous clock cycle extends, preserving address and data validity. In contrast, deasserting CE1/CE2/CE3 places the device in a deselected state, requiring ADV/LD to be driven LOW before loading a new address. CEN is used for precise cycle stretching; CE signals manage bank activation.

Is JTAG boundary scan functional on CY7C1470BV25-200BZXC, and what pins are required?

Yes, the device implements full IEEE 1149.1 JTAG boundary scan. Required pins are TCK (Test Clock), TMS (Test Mode Select), TDI (Test Data In), and TDO (Test Data Out)-all located on dedicated balls/pins per the 100-pin TQFP and 165-ball FBGA packages. JTAG remains active regardless of CEN or chip-enable state, enabling in-system test even during standby.