Cypress Semiconductor Corp CY7C1513V18-200BZC

Overview

CY7C1513V18 from Cypress Semiconductor is a 4M × 18-bit (72-Mbit), 1.8V QDR-II SRAM with separate read/write ports, 200 MHz maximum operating frequency, DDR interfaces on both ports (400 Mbps per data pin), and 165-ball FBGA (15 × 17 × 1.4 mm) packaging. It delivers concurrent high-bandwidth memory access for network packet buffering in telecom line cards.

For engineers reviewing the CY7C1513V18 datasheet, CY7C1513V18 pinout, CY7C1513V18 application, or CY7C1513V18 equivalent, key selection criteria include burst depth (4-word), dual-clock timing (K/K and C/C), echo clocks (CQ/CQ), HSTL I/O compatibility, and synchronous self-timed write control.

Technical Context

The CY7C1513V18 implements QDR-II architecture with fully independent read and write pipelines, each synchronized to dedicated input clocks (K/K for address/control, C/C for output timing). Address latching occurs on alternating rising edges of K/K, enabling 4-word burst transfers per access without bus turnaround.

It uses a 1M × 18 internal array organization with four parallel sub-arrays, supports byte write selects (BWS[1:0]), includes a DLL for precise data-eye alignment, and features echo clocks (CQ/CQ) referenced to C/C to compensate for PCB flight-time skew in high-speed systems.

Key Specifications

Pinout & Package

165-ball Fine-Pitch Ball Grid Array (FBGA), 15 mm × 17 mm × 1.4 mm body, 0.8 mm ball pitch, RoHS-compliant (Pb-free option available).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-bandwidth dual-port SRAM applications.

Compared with IDT72T3615L10BG and IS61WV102418B, CY7C1513V18 uniquely delivers true concurrent DDR read/write at 200 MHz with echo-clock–assisted timing closure-enabling deterministic 1.44 GB/s throughput without external FIFOs or arbitration logic.

Availability

CY7C1513V18 is available at Aetrix Electronics and suitable for network packet buffering, telecom line card memory, baseband processing buffers, and high-speed test equipment requiring stable component supply and long-term obsolescence management.

Supply support for CY7C1513V18 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and programmable solutions for networking, automotive, and industrial applications.

The QDR-II SRAM product line targets high-speed communications infrastructure requiring deterministic latency, concurrent access, and DDR bandwidth-optimized for packet switching, TDM, and real-time signal processing.

FAQ

What is the minimum supported clock frequency for CY7C1513V18?

The device operates down to DC - no minimum clock frequency is specified. All timing parameters are guaranteed over the full 0–200 MHz range, and the DLL remains functional at any enabled frequency. System-level timing margins must still be verified at low frequencies due to hold-time dependencies on clock duty cycle and skew.

Can CY7C1513V18 operate in single-clock mode?

Yes - it supports single-clock mode where K/K serve as both input and output clocks (C/C internally derived from K/K). In this mode, echo clocks CQ/CQ are referenced to K/K instead of C/C, and output timing aligns to K/K edges. This simplifies clock routing but reduces maximum achievable bandwidth compared to dual-clock operation.

How does ZQ pin calibration affect signal integrity?

ZQ connects to an external resistor (typically 100 Ω) to ground, tuning output driver impedance to 20 Ω (0.2 × RQ). This matches typical 100 Ω differential or 50 Ω single-ended PCB traces, reducing reflections and improving eye height at 400 Mbps DDR rates. Leaving ZQ unconnected or tied to GND violates specification and causes excessive overshoot/undershoot.

Is JTAG accessible during normal operation?

Yes - the IEEE 1149.1 TAP controller operates independently of memory function. TDI, TDO, TCK, and TMS remain active and controllable at any time, including during active read/write cycles. Boundary-scan testing can be performed without halting memory operations or resetting the device.