Cypress Semiconductor Corp CY7C1520AV18-250BZC

Overview

CY7C1520AV18-250BZC from Cypress Semiconductor is a 72-Mbit DDR-II synchronous SRAM configured as 2 M × 36, operating at 250 MHz with 1.8-V core supply and HSTL I/O. It implements two-word burst architecture with dual input clocks (K/K̄) and dual output clocks (C/C̄), supports echo clocks (CQ/CQ̄) for precise data capture, and features on-chip DLL for 1.5-cycle read latency in DDR-II mode.

For engineers reviewing the CY7C1520AV18-250BZC datasheet, CY7C1520AV18-250BZC pinout, CY7C1520AV18-250BZC application, or CY7C1520AV18-250BZC equivalent, key selection criteria include DDR-II timing compliance, 36-bit wide data interface, FBGA-165 package compatibility, DLL-enabled low-latency read operation, and JTAG 1149.1 test support for high-speed memory subsystem validation.

Technical Context

This SRAM uses synchronous pipelined architecture with internal burst counter driven by A0 to deliver two sequential 36-bit words per access. All address, control, and data signals are registered on rising edges of K/K̄, while read data is edge-aligned to C/C̄ (or K/K̄ in single-clock mode) and echoed via CQ/CQ̄ for deterministic capture.

The device supports both DDR-II (DLL enabled, 1.5-cycle read latency, up to 300 MHz) and DDR-I (DLL disabled, 1-cycle latency, up to 167 MHz) operation modes. Byte write select inputs BWS[3:0] enable independent 9-bit byte masking, and ZQ pin allows dynamic output impedance calibration to match system bus termination.

Key Specifications

Pinout & Package

Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 15 mm × 17 mm × 1.4 mm body, 0.8 mm ball pitch, RoHS-compliant.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-speed synchronous SRAM applications.

Compared with AS7C3256A-25JC and IS61WV204836BLL-25BLI, CY7C1520AV18-250BZC delivers 2× higher bandwidth via DDR-II and eliminates board-level timing skew through integrated echo clocks - critical for deterministic real-time imaging and telecom applications.

Availability

CY7C1520AV18-250BZC is available at Aetrix Electronics and suitable for telecom packet buffering, network switching fabric, medical imaging frame store, and industrial vision processing requiring stable component supply and long-term production continuity.

Supply support for CY7C1520AV18-250BZC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and programmable solutions for demanding embedded and communications systems.

CY7C1520AV18 belongs to Cypress's DDR-II SRAM product line, engineered specifically for high-throughput, low-latency memory subsystems in networking, medical imaging, and industrial automation equipment.

FAQ

What is the minimum supported clock frequency for CY7C1520AV18-250BZC?

The device has no specified minimum clock frequency; it operates down to DC in DLL-enabled mode. However, DLL lock requires ≥100 MHz for stable operation. Below that, DOFF must be asserted to use DDR-I timing, which supports frequencies down to 0 Hz with 1-cycle latency.

Can CY7C1520AV18-250BZC operate without connecting C and C̄ pins?

Yes - when C and C̄ are left unconnected, the device defaults to single-clock mode using K and K̄ for both input sampling and output data timing. In this mode, CQ and CQ̄ remain functional but track K/K̄ instead of C/C̄, preserving echo clock utility for data capture.

How does ZQ pin calibration affect signal integrity?

ZQ calibration adjusts output driver impedance to match the system's characteristic impedance (typically 50 Ω). With a 240 Ω resistor to ground, drivers are tuned to 48 Ω (0.2 × 240 Ω), minimizing reflections and improving eye diagram margins at 500 Mbps data rates.

Is JTAG boundary scan supported in all operating modes?

Yes - IEEE 1149.1 TAP controller remains fully functional regardless of DLL state (enabled/disabled) or clock frequency. Scan operations proceed independently of memory access timing, allowing debug and test access even during high-speed DDR-II operation.