Cypress Semiconductor Corp CY7C1570XV18-600BZXC
- Part No.:
- CY7C1570XV18-600BZXC
- Manufacturer:
- Cypress Semiconductor Corp
- Category:
- Memory
- Package:
- 165-LBGA
- Datasheet:
-
CY7C1570XV18-600BZXC.pdf
- Description:
- IC SRAM 72MBIT PAR 165FBGA
- Quantity:
- Payment:

- Shipping:

Inventory:133
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Product details
Overview
CY7C1570XV18-600BZXC from Cypress Semiconductor is a 72-Mbit (2M × 36) synchronous DDR II+ Xtreme SRAM with two-word burst architecture, 2.5-cycle read latency at 600 MHz, HSTL I/O interface, and integrated PLL for precise DDR timing. It operates with core VDD = 1.8 V ± 0.1 V and I/O VDDQ = 1.4–1.6 V, delivering 1266 MT/s data throughput in high-bandwidth networking and test equipment memory buffers.
For engineers reviewing the CY7C1570XV18-600BZXC datasheet, CY7C1570XV18-600BZXC pinout, CY7C1570XV18-600BZXC application, or CY7C1570XV18-600BZXC equivalent, this page provides verified package mapping (165-ball FBGA), confirmed 36-bit bidirectional DQ[35:0] interface, echo clock synchronization (CQ/CQ), QVLD timing alignment, and DOFF-controlled latency mode selection between DDR I (1-cycle) and DDR II+ (2.5-cycle) operation.
Technical Context
This SRAM implements a synchronous pipelined architecture with dual input clocks (K/K) - all address, control, and write data sampled on K rising edges, while read data is driven on both K and K rising edges. The device uses echo clocks CQ/CQ aligned to output data, eliminating system-level skew compensation.
Internally organized as two 1M × 36 arrays, it supports byte-write via four synchronous BWS[3:0] inputs and features programmable output impedance tuning via ZQ pin. The PLL enables accurate data placement at 600 MHz; when disabled (DOFF = LOW), it reverts to DDR I timing with ≤167 MHz operation.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Density & Organization | 72 Mbit (2M × 36); supports 36-bit bidirectional data path with two-word burst per access |
| Max Clock Frequency | 600 MHz (K/K); enables 1200 MT/s effective bandwidth with DDR interface |
| Read Latency | 2.5 cycles (DOFF = HIGH); ensures deterministic timing for high-speed memory controllers |
| VDD / VDDQ | Core VDD = 1.8 V ± 0.1 V; I/O VDDQ = 1.4–1.6 V; supports 1.5 V system I/O compatibility |
| Interface Standard | HSTL Class I inputs and variable-drive HSTL outputs; matches JEDEC-compliant memory bus loading |
| Package | 165-ball fine-pitch BGA (13 × 15 × 1.4 mm); RoHS-compliant, Pb-free, thermal pad enabled |
| JTAG Support | IEEE 1149.1 compliant TAP (TCK/TMS/TDI/TDO); enables boundary-scan testing in production |
Pinout & Package
Package: 165-ball FBGA (13 mm × 15 mm × 1.4 mm), ball pitch 0.8 mm, thermal pad exposed on underside.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| DQ[35:0] | Synchronous bidirectional data I/O | 36-bit data bus; sampled on K/K rising edges during writes, driven on K/K rising edges during reads; tristated automatically on deselect |
| K / K | Differential clock inputs | Rising edges of both clocks control all synchronous operations; K used for address/control latching, both used for data transfer |
| CQ / CQ | Output echo clocks | Free-running, edge-aligned with K/K; simplifies high-speed data capture without external strobes |
| QVLD | Valid data indicator | Asserted synchronously with CQ/CQ rising edges; signals valid data on DQ[35:0] for receiver sampling |
| DOFF | PLL disable control | Active LOW; disables internal PLL to switch from DDR II+ (2.5-cycle) to DDR I (1-cycle) timing mode |
| ZQ | Output impedance calibration input | Connects to external resistor to ground; tunes CQ/CQ/DQ output drive strength to match 50 Ω system trace impedance |
| BWS[3:0] | Byte write select inputs | Four active-LOW signals controlling 9-bit byte lanes (D[8:0], D[17:9], D[26:18], D[35:27]); enables partial-word writes without read-modify-write |
| LD | Load enable | Sampled on K rising edge; initiates address capture and defines start of burst transaction cycle |
| R/W | Read/write direction | Sampled with LD on K rising edge; HIGH = read, LOW = write; determines data flow direction for current burst |
Key Features
| Feature | Design Value |
|---|---|
| Two-word burst architecture | Reduces address bus toggling by 50% versus single-word SRAMs; cuts address decode logic and routing congestion in high-speed designs |
| Integrated PLL with DOFF control | Enables dynamic switching between 2.5-cycle DDR II+ latency (600 MHz) and 1-cycle DDR I mode (≤167 MHz) via single pin |
| Echo clock outputs (CQ/CQ) | Eliminates need for board-level strobe routing; allows source-synchronous capture of DQ[35:0] using same clock domain as memory controller |
| Programmable output impedance (ZQ) | Calibrates DQ/CQ drive strength to match PCB trace impedance without external termination resistors; improves signal integrity at 1266 MT/s |
| HSTL Class I I/O | Ensures compatibility with FPGA and ASIC memory controllers requiring low-voltage, high-speed differential signaling standards |
Applications
| High-Speed Test Equipment | Network Packet Buffers |
|---|---|
|
Use Scenario: Real-time acquisition and buffering of multi-gigabit serial data streams in automated test systems. IC Role / Device Role / Timing Role: High-bandwidth, low-latency memory buffer interfacing directly with FPGA-based pattern generators and analyzers. Use Value: 2.5-cycle latency and 1266 MT/s throughput enable full-rate capture of 10G/25G Ethernet and PCIe Gen3 traffic without pipeline stalls. |
Use Scenario: Temporary storage of variable-length packets in Layer 2/3 switches and routers before forwarding decisions. IC Role / Device Role / Timing Role: Burst-access SRAM providing deterministic read/write response for packet header inspection and queue management. Use Value: Two-word burst reduces memory controller overhead; QVLD and echo clocks simplify timing closure in multi-device depth-expanded configurations. |
| Medical Imaging Data Acquisition | Avionics Data Recorders |
|
Use Scenario: Buffering raw sensor data from high-resolution ultrasound or CT detectors prior to compression and transfer. IC Role / Device Role / Timing Role: Synchronous pipelined memory acting as first-stage frame buffer between ADC array and DSP subsystem. Use Value: 1.8 V core + 1.5 V I/O operation minimizes power density; HSTL interface ensures noise immunity in mixed-signal medical chassis. |
Use Scenario: Secure, high-reliability storage of flight telemetry and sensor logs in certified airborne computing modules. IC Role / Device Role / Timing Role: Radiation-tolerant SRAM serving as nonvolatile-configurable scratchpad memory for real-time fault logging. Use Value: JTAG 1149.1 support enables in-system boundary scan verification; Pb-free FBGA meets aerospace RoHS and outgassing requirements. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar high-speed synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| AS7C362000B-15JIN | 2M × 36, 15 ns async access; no DDR, no PLL, no echo clocks; CMOS I/O, 3.3 V only | Limited to ≤66 MHz systems; requires external timing control; unsuitable for 600 MHz burst interfaces | Select only for cost-sensitive, low-frequency legacy upgrades where DDR timing and echo clocking are unnecessary |
| IS61WV204832BLL-10BLI | 2M × 32, 10 ns sync SRAM; single-clock interface; no burst mode; LVCMOS I/O; 2.5 V/3.3 V | Lower bandwidth (≤100 MHz), no DDR capability; lacks QVLD, CQ/CQ, ZQ; incompatible pinout and timing model | Use only if system design cannot accommodate DDR II+ timing constraints and requires simpler synchronous control |
Compared with AS7C362000B-15JIN and IS61WV204832BLL-10BLI, CY7C1570XV18-600BZXC delivers 12× higher effective bandwidth, eliminates external strobe routing via echo clocks, and enables latency-mode flexibility through DOFF-critical for scalable, future-proof memory subsystems.
Availability
CY7C1570XV18-600BZXC is available at Aetrix Electronics and suitable for high-speed test equipment, network packet buffers, and medical imaging data acquisition requiring stable component supply across extended product lifecycles.
Supply support for CY7C1570XV18-600BZXC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Cypress Semiconductor (now part of Infineon Technologies) is a fabless semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.
CY7C1570XV18 belongs to the DDR II+ Xtreme SRAM product line, engineered specifically for deterministic, low-latency, high-throughput memory buffering in FPGA- and ASIC-based systems operating above 500 MHz.
FAQ
What is the function of the DOFF pin on CY7C1570XV18-600BZXC?
The DOFF (PLL Turn Off) pin is an active-LOW control that disables the internal phase-locked loop. When asserted LOW, the device operates in DDR I mode with 1-cycle read latency and maximum frequency limited to 167 MHz. When HIGH (typically pulled up via ≤10 kΩ resistor), the PLL is enabled, supporting 2.5-cycle latency at 600 MHz. This pin directly controls the fundamental timing architecture and must be configured at power-up.
How does the ZQ pin calibrate output drive strength?
The ZQ pin connects to an external precision resistor (RQ) tied to ground; the device measures RQ and sets its DQ, CQ, and CQ output driver impedance to 0.2 × RQ. For standard 50 Ω trace matching, a 250 Ω resistor is used. Alternatively, tying ZQ to VDDQ enables minimum-impedance mode. ZQ must never be left floating or connected to GND, as this disables calibration and risks signal integrity failure.
Can CY7C1570XV18-600BZXC operate with only the K clock?
No. The device requires both K and K differential clock inputs for correct operation. All synchronous inputs (address, R/W, LD, BWS) are sampled on the rising edge of K, while write data is registered on both K and K rising edges, and read data is driven on both. Omitting K violates timing specifications and prevents functional operation - the K/K pair is mandatory per the DDR II+ architecture.
What is the role of QVLD in system timing design?
QVLD is a synchronous output that pulses HIGH on the same rising edge of CQ/CQ when valid data appears on DQ[35:0]. It replaces the need for fixed setup/hold margin calculations by providing a deterministic, clock-aligned validity signal - enabling receivers to sample DQ only when QVLD is asserted, thereby simplifying timing closure in multi-SRAM depth-expanded systems and eliminating inter-device skew concerns.
CY7C1570XV18-600BZXC Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Cypress Semiconductor Corp
- Series:
- -
- Package/Case:
- 165-LBGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, DDR II+
- Memory Size:
- 72Mbit
- Memory Organization:
- 2M x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 600 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-FBGA (13x15)
CY7C1570XV18-600BZXC FAQ
1.How can I place an order for CY7C1570XV18-600BZXC through Aetrix?
Please submit a Request for Quotation (RFQ) for CY7C1570XV18-600BZXC on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY7C1570XV18-600BZXC reliable?
The price and inventory of CY7C1570XV18-600BZXC are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C1570XV18-600BZXC is usually 5 days.
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Once your CY7C1570XV18-600BZXC order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY7C1570XV18-600BZXC?
For technical support, including CY7C1570XV18-600BZXC datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C1570XV18-600BZXC requirements.
6.How does Aetrix verify that CY7C1570XV18-600BZXC is sourced from the original manufacturer or authorized distributors?
All CY7C1570XV18-600BZXC products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C1570XV18-600BZXC meets industry standards.
7.What is the process for return or replacement of CY7C1570XV18-600BZXC?
All CY7C1570XV18-600BZXC units undergo pre-shipment inspection (PSI). If there is an issue with CY7C1570XV18-600BZXC, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY7C1570XV18-600BZXC part is unused and in its original packaging.
Return procedure for CY7C1570XV18-600BZXC:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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