Cypress Semiconductor Corp CY7C1613KV18-300BZI

Overview

CY7C1613KV18 from Cypress Semiconductor is a 144-Mbit QDR® II SRAM with 8 M × 18 organization, 333 MHz clock support, 1.8 V core supply (±0.1 V), and 1.4–1.8 V I/O supply. It features separate read/write ports, four-word burst architecture, and DDR interfaces on both ports for 666 MHz effective data rate. Used in high-bandwidth networking buffers and packet forwarding engines.

For engineers reviewing the CY7C1613KV18 datasheet, CY7C1613KV18 pinout, CY7C1613KV18 application, or CY7C1613KV18 equivalent, key selection criteria include read latency (1.5-cycle with DOFF high), echo clock support (CQ/CQ), JTAG 1149.1 compliance, HSTL output drive, and FBGA-165 package compatibility with depth expansion via RPS/WPS.

Technical Context

The CY7C1613KV18 implements true quad data rate operation using independent K/K clocks for address/data capture and C/C clocks for output timing, enabling concurrent read and write transactions without bus turnaround. Its internal pipelined architecture latches addresses on alternating rising edges of K and supports synchronous self-timed writes.

It delivers full data coherency with 1.5-cycle read latency when DOFF = high, or 1-cycle latency when DOFF = low (QDR I mode). Echo clocks CQ and CQ are phase-aligned to C and C respectively, simplifying high-speed data capture in systems with flight-time skew.

Key Specifications

Pinout & Package

Package: 165-ball fine-pitch ball grid array (FBGA), 15 mm × 17 mm × 1.4 mm body, 0.8 mm ball pitch, Pb-free option available.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar QDR II SRAM applications.

Compared with IDT72T3615L5 and IS61WV102418B, CY7C1613KV18 uniquely supports 333 MHz operation with echo clocks and HSTL-18 I/O, making it the only viable choice for new 10 GbE switch fabric designs requiring guaranteed 1.5-cycle latency and source-synchronous capture.

Availability

CY7C1613KV18 is available at Aetrix Electronics and suitable for network packet buffering, telecom line card memory, and switch fabric lookup tables requiring stable component supply across extended product lifecycles.

Supply support for CY7C1613KV18 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) is a fabless semiconductor company specializing in high-performance memory, microcontrollers, and connectivity solutions for industrial, automotive, and communications markets.

CY7C1613KV18 belongs to Cypress's QDR® II SRAM product line, designed specifically for ultra-low-latency, high-bandwidth data buffering in packet-switched networking infrastructure and high-speed digital signal processing systems.

FAQ

What is the function of the DOFF pin on CY7C1613KV18?

The DOFF (Data Output OFFset) pin configures read latency mode: when asserted high, it enables QDR II operation with 1.5-cycle read latency; when low, it reverts to QDR I mode with 1-cycle latency. This pin is sampled synchronously on the rising edge of K and must be held stable during initialization. It does not affect write timing or burst length.

Can CY7C1613KV18 operate with only a single clock (K only)?

Yes - CY7C1613KV18 supports single-clock mode where K serves as both input and output clock. In this mode, C and C are unused, and CQ/CQ are generated relative to K. However, deskew capability is lost, and maximum frequency drops to 250 MHz due to timing margin constraints on shared clock paths.

How is output impedance calibrated using the ZQ pin?

ZQ connects to an external precision resistor (RQ) tied to ground; the device measures RQ and sets output driver impedance to 0.2 × RQ for Q[17:0], CQ, and CQ pins. If RQ = 240 Ω, outputs are calibrated to 48 Ω. Direct connection to VDDQ enables minimum impedance (~30 Ω); floating or grounding ZQ is prohibited and may damage the device.

Is JTAG boundary scan supported during normal operation?

Yes - the IEEE 1149.1 TAP remains fully functional during active memory operation. Test instructions (SAMPLE/PRELOAD, EXTEST, INTEST) can be executed without halting read/write transactions, provided TMS/TCK/TDI/TDO are isolated from functional logic during scan mode. The TAP controller operates independently of the memory core clock domain.