Cypress Semiconductor Corp CY7C1911KV18-250BZC

Overview

CY7C1911KV18-250BZC from Cypress Semiconductor is a 2-Mbit × 9 (18-Mbit total) QDR® II SRAM with separate read/write ports, 250 MHz operation (40 ns clock period), 1.8 V core supply, and 1.4–1.8 V I/O supply. It delivers concurrent high-bandwidth memory access for network packet buffering in telecom line cards.

For engineers reviewing the CY7C1911KV18-250BZC datasheet, CY7C1911KV18-250BZC pinout, CY7C1911KV18-250BZC application, or CY7C1911KV18-250BZC equivalent, key selection criteria include four-word burst timing, echo clock (CQ/CQ) support for DDR data capture, DOFF-configurable 1-cycle vs. 1.5-cycle read latency, and 165-ball FBGA package compatibility with high-speed PCB layout constraints.

Technical Context

This QDR II SRAM implements true dual-port synchronous pipelined architecture: independent K/K clocks drive write address/data latching, while C/C clocks control output register timing. Read and write operations are fully decoupled-no bus turnaround required-and each transaction bursts four 9-bit words per access.

The device uses on-chip PLL for precise data-eye placement and supports both single-clock (K = C) and dual-clock (K ≠ C) modes. DOFF pin selects between QDR I–compatible 1-cycle latency (DOFF = LOW) and optimized QDR II 1.5-cycle latency (DOFF = HIGH), directly affecting system timing margin in backplane interfaces.

Key Specifications

Pinout & Package

Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm footprint, 1.4 mm height, RoHS-compliant.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar QDR II SRAM applications.

Compared with IDT72T3615L10PF and IS61QW25618A-250BQI, CY7C1911KV18-250BZC uniquely offers 2M × 9 density with selectable read latency and echo clock support-making it optimal for 9-bit-aligned telecom control plane buffers requiring timing adaptability.

Availability

CY7C1911KV18-250BZC is available at Aetrix Electronics and suitable for network packet buffering, telecom line card memory, backplane interconnect cache, and high-speed test equipment requiring stable component supply across extended production lifecycles.

Supply support for CY7C1911KV18-250BZC includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and programmable solutions for networking, automotive, and industrial applications.

CY7C1911KV18 belongs to the QDR® II SRAM product line, engineered specifically for ultra-low-latency, concurrent-access memory subsystems in packet-switched infrastructure equipment.

FAQ

What is the function of the DOFF pin on CY7C1911KV18-250BZC?

The DOFF (Data Output Fall-off) pin configures read latency mode: when asserted HIGH, it enables QDR II's 1.5-cycle latency for improved timing margin in high-frequency designs; when LOW, it reverts to QDR I–compatible 1-cycle latency for backward compatibility. This setting directly affects the number of clock cycles between address assertion and valid Q[8:0] output.

How does the echo clock (CQ) improve system timing?

CQ and CQ are source-synchronous copies of C and C clocks, routed alongside Q[8:0] signals. They provide a local timing reference at the receiver, eliminating skew between clock and data paths. This allows FPGA or ASIC input registers to capture Q[8:0] reliably at 500 Mbps per pin without complex deskew circuitry or dynamic phase alignment.

Can CY7C1911KV18-250BZC operate with 1.5 V I/O supply?

Yes-VDDQ supports 1.4 V to 1.8 V, including 1.5 V nominal. The device's HSTL-compatible output drivers and input receivers are fully specified across this range. Using 1.5 V VDDQ reduces I/O power consumption by ~25% versus 1.8 V while maintaining signal integrity on properly terminated lines.

Is JTAG boundary scan supported on CY7C1911KV18-250BZC?

Yes-the device implements IEEE 1149.1 JTAG test access port with TDI, TDO, TCK, and TMS pins. It supports instruction register loading, boundary scan register access, and device identification. JTAG can be disabled via fuse or strap option if unused, reducing pin count and simplifying layout.