Cypress Semiconductor Corp CY7C2163KV18-550BZXI
- Part No.:
- CY7C2163KV18-550BZXI
- Manufacturer:
- Cypress Semiconductor Corp
- Category:
- Memory
- Package:
- 165-LBGA
- Datasheet:
-
CY7C2163KV18-550BZXI.pdf
- Description:
- IC SRAM 18MBIT PAR 165FBGA
- Quantity:
- Payment:

- Shipping:

Inventory:3,195
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
CY7C2163KV18-550BZXI from Infineon Technologies (formerly Cypress) is a 18-Mbit QDR® II+ SRAM with four-word burst architecture, 2.5-cycle read latency, and on-die termination (ODT). It delivers 1100 MT/s data rate via DDR interfaces on independent read/write ports, operates at 550 MHz clock frequency with 1.8 V core supply and 1.4–1.8 V I/O supply, and is packaged in a 165-ball FBGA (13 × 15 × 1.4 mm) for high-speed networking and packet buffering applications.
For engineers reviewing the CY7C2163KV18-550BZXI datasheet, CY7C2163KV18-550BZXI pinout, CY7C2163KV18-550BZXI application, or CY7C2163KV18-550BZXI equivalent, this page provides verified technical context, pin-level circuit roles, real-world use scenarios in telecom infrastructure, and validated alternative parts with documented functional trade-offs.
Technical Context
The device implements a synchronous pipelined architecture with fully independent read and write ports sharing a multiplexed address bus. Each port uses DDR signaling synchronized to separate K and K clocks-both rising edges drive data transfers, enabling concurrent read/write operations without bus turnaround.
It integrates a phase-locked loop (PLL) for precise data placement, echo clocks (CQ/CQ) for simplified high-speed capture, and programmable ODT on D[17:0], BWS[1:0], and K/K inputs. The DOFF pin selects between 2.5-cycle (HIGH) and 1-cycle (LOW) read latency modes, preserving backward compatibility with QDR I systems.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Density | 18 Mbit (1M × 18 organization) |
| Max Clock Frequency | 550 MHz - enables 1100 MT/s effective bandwidth on both read and write ports |
| Read Latency | 2.5 cycles (DOFF = HIGH) - optimized for high-throughput packet buffering with deterministic timing |
| VDD / VDDQ | Core: 1.8 V ± 0.1 V; I/O: 1.4–1.8 V - supports dual-voltage system integration and HSTL-compatible signaling |
| Burst Length | Four-word burst - reduces address bus toggling frequency by 4× versus single-word access |
| On-Die Termination | Configurable ODT on D[17:0], BWS[1:0], K/K - eliminates external 50 Ω resistors and simplifies PCB routing |
| Package | 165-ball FBGA (13 × 15 × 1.4 mm) - standard footprint for high-density memory subsystems in telecom line cards |
Pinout & Package
Package: 165-ball Fine-Pitch Ball Grid Array (FBGA), 13 mm × 15 mm × 1.4 mm body height, RoHS-compliant Pb-free construction.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| D[17:0] | Synchronous data input | 18-bit write data bus sampled on rising edges of K/K; supports byte-selectable writes via BWS0/BWS1 |
| Q[17:0] | Synchronous data output | 18-bit read data bus driven on rising edges of K/K; tristated when RPS is deasserted |
| RPS / WPS | Port select control | Active-low synchronous enables for independent read/write port activation; enables depth expansion |
| BWS[1:0] | Byte write select | Two active-low signals controlling D[8:0] (BWS0) and D[17:9] (BWS1); preserves unselected bytes during partial writes |
| K / K | Differential clock inputs | Positive/negative input clocks driving all synchronous registers; only rising edges used for sampling and output timing |
| CQ / CQ | Echo clock outputs | Free-running, edge-aligned copies of K/K for source-synchronous data capture in FPGA/ASIC receivers |
| QVLD | Valid data indicator | Output pulse aligned with CQ/CQ edges indicating presence of valid Q[17:0] data; eliminates setup/hold uncertainty |
| ODT | On-die termination control | Static input selecting ODT resistance range (RQ/3.33 or RQ/1.66) during power-up; default HIGH for high-range mode |
| ZQ | Impedance calibration reference | External precision resistor (175–350 Ω) setting output driver impedance to 0.2 × RQ for CQ/CQ/Q[17:0] |
Key Features
| Feature | Design Value |
|---|---|
| Independent read/write ports | Eliminates bus turnaround overhead - enables true concurrent access for full-duplex packet processing |
| Four-word burst architecture | Reduces address bus frequency by 75% versus single-word mode - lowers routing complexity and EMI in backplane designs |
| Programmable 2.5/1-cycle read latency | DOFF pin allows runtime selection between QDR II+ performance and QDR I compatibility - no hardware change required |
| HSTL-compatible I/O with variable drive | Meets JEDEC HSTL Class I specifications with adjustable output strength - ensures signal integrity across varied trace lengths |
| JTAG 1149.1 test access port | Enables boundary scan testing and in-system programming without additional test fixtures - supports production test automation |
Applications
| Telecom Packet Buffering | Network Processor Interface |
|---|---|
|
Use Scenario: Line card memory for 10G/40G Ethernet switch fabric, storing ingress/egress packet headers and metadata. IC Role / Device Role / Timing Role: High-bandwidth, low-latency shared buffer between MAC and traffic manager ASICs using separate read/write ports. Use Value: 1100 MT/s DDR throughput and 2.5-cycle latency enable real-time packet classification and scheduling without pipeline stalls. |
Use Scenario: External cache for multi-core network processors performing deep packet inspection and flow table lookups. IC Role / Device Role / Timing Role: Synchronous SRAM acting as deterministic latency memory for instruction/data fetch in parallel processing pipelines. Use Value: Four-word burst and echo clocks (CQ/CQ) simplify timing closure in 550 MHz interface design, reducing FPGA logic overhead. |
| Baseband Processing Memory | High-Speed Test Equipment Buffer |
|
Use Scenario: Real-time data buffering in LTE/5G baseband units handling uplink/downlink channel estimation and precoding. IC Role / Device Role / Timing Role: Dual-port SRAM interfacing between DSP cores and RF front-end controllers with strict jitter tolerance. Use Value: On-die termination (ODT) on D[17:0] and K/K eliminates external termination networks - improves signal fidelity at 1.1 GHz data rates. |
Use Scenario: Acquisition memory in automated test equipment capturing high-speed serial waveforms for protocol conformance validation. IC Role / Device Role / Timing Role: Burst-mode memory staging raw ADC samples before post-processing in FPGA-based analysis engines. Use Value: QVLD pin provides cycle-accurate validity indication - removes need for complex strobe recovery logic in sampling clock domain. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar QDR II+ SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C2163KV18-450BZXI | Lower max clock: 450 MHz → 900 MT/s bandwidth; identical pinout, latency, and ODT support | Reduced power consumption (670 mA vs. 780 mA) but lower throughput - suitable for cost-sensitive or thermally constrained designs | Select when system clock budget permits relaxed timing margin and thermal envelope is restrictive |
| AS7C3256B-15JCIN | Asynchronous 256K × 16 SRAM; no DDR, no ODT, no echo clocks; 15 ns access time; SOJ-44 package | Lacks concurrent read/write, burst, or high-speed interface features - only viable for legacy non-pipelined control plane buffers | Use only for drop-in replacement in pre-QDR designs where bandwidth < 200 MB/s suffices and board layout cannot accommodate FBGA |
Compared with CY7C2163KV18-550BZXI, the -450 variant trades 22% bandwidth for lower power and cost, while AS7C3256B-15JCIN lacks QDR architecture entirely-requiring redesign of timing control, bus arbitration, and PCB layout to accommodate asynchronous operation and SOJ packaging.
Availability
CY7C2163KV18-550BZXI is available at Aetrix Electronics and suitable for telecom infrastructure, network processor subsystems, and high-speed test equipment requiring stable component supply, long-lifecycle support, and guaranteed Pb-free compliance.
Supply support for CY7C2163KV18-550BZXI includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Infineon Technologies acquired Cypress Semiconductor in 2020 and maintains full product continuity, documentation, and support for the QDR® II+ SRAM portfolio originally developed by Cypress.
This device belongs to Infineon's high-performance memory product line targeting deterministic-latency, high-bandwidth applications in networking, wireless infrastructure, and test instrumentation-designed specifically for systems demanding concurrent access and sub-3-cycle read response.
FAQ
What is the function of the DOFF pin on CY7C2163KV18-550BZXI?
The DOFF (Double-Off) pin configures read latency mode: when asserted HIGH, it enables 2.5-cycle read latency per QDR II+ specification; when LOW, it reverts to 1-cycle latency compatible with QDR I devices. This is a static configuration set at power-up and affects internal pipeline staging but does not alter pin timing or voltage requirements.
Can CY7C2163KV18-550BZXI operate with VDDQ = 1.5 V?
Yes. The device supports VDDQ from 1.4 V to VDD (1.8 V), explicitly including 1.5 V operation. HSTL Class I output drivers are characterized across this range, and DC/AC electrical parameters-including setup/hold times and ODT resistance-are guaranteed at 1.5 V per datasheet Rev. *K Section "Electrical Characteristics".
How is on-die termination (ODT) configured on this SRAM?
ODT is enabled by pulling the ODT pin HIGH or LOW during power-up initialization. A HIGH selects high-range termination (RQ/1.66) for ZQ resistor values 175–250 Ω; LOW selects low-range (RQ/3.33) for 175–350 Ω. The ZQ pin connects to an external precision resistor that calibrates output driver impedance to 0.2 × RQ for Q[17:0], CQ, and CQ.
Is CY7C2163KV18-550BZXI pin-compatible with CY7C2165KV18-550BZXI?
No. Although both are QDR II+ SRAMs with same clocking and control logic, CY7C2163KV18-550BZXI (1M × 18) and CY7C2165KV18-550BZXI (512K × 36) have different ball counts, pin assignments, and data bus widths. The 165-ball FBGA for CY7C2163KV18 does not map to the 165-ball FBGA for CY7C2165KV18-address, data, and byte-select pins occupy distinct locations per datasheet Figure 1.
CY7C2163KV18-550BZXI Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Cypress Semiconductor Corp
- Series:
- -
- Package/Case:
- 165-LBGA
- Packaging:
- Bulk
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, QDR II+
- Memory Size:
- 18Mbit
- Memory Organization:
- 1M x 18
- Memory Interface:
- Parallel
- Clock Frequency:
- 550 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- -40°C ~ 85°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-FBGA (13x15)
CY7C2163KV18-550BZXI FAQ
1.How can I place an order for CY7C2163KV18-550BZXI through Aetrix?
Please submit a Request for Quotation (RFQ) for CY7C2163KV18-550BZXI on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY7C2163KV18-550BZXI reliable?
The price and inventory of CY7C2163KV18-550BZXI are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C2163KV18-550BZXI is usually 5 days.
3.What payment methods are accepted for CY7C2163KV18-550BZXI?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for CY7C2163KV18-550BZXI transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for CY7C2163KV18-550BZXI?
CY7C2163KV18-550BZXI orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your CY7C2163KV18-550BZXI order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY7C2163KV18-550BZXI?
For technical support, including CY7C2163KV18-550BZXI datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C2163KV18-550BZXI requirements.
6.How does Aetrix verify that CY7C2163KV18-550BZXI is sourced from the original manufacturer or authorized distributors?
All CY7C2163KV18-550BZXI products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C2163KV18-550BZXI meets industry standards.
7.What is the process for return or replacement of CY7C2163KV18-550BZXI?
All CY7C2163KV18-550BZXI units undergo pre-shipment inspection (PSI). If there is an issue with CY7C2163KV18-550BZXI, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY7C2163KV18-550BZXI part is unused and in its original packaging.
Return procedure for CY7C2163KV18-550BZXI:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
CY7C2163KV18-550BZXI Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
18650 battery guide covering lithium-ion cell basics, 3.6V/3.7V voltage, 4.2V charging, mAh and Wh capacity, protected cells, chargers, BMS, series-parallel packs, holders, welding and sourcing checks.…
Hall effect sensor guide covering working principle, linear and digital sensors, Arduino circuits, current sensing, speed detection, automotive applications, A3144 examples, signal filtering and datash…
Product Change Notification guide for electronic components, covering PCN meaning, PCN vs PDN/EOL, common change types, risk levels, form-fit-function review, engineering validation, BOM control, LTB/L…
A practical guide to blend door actuators, covering HVAC function, symptoms, location, AC and heater issues, reset and calibration, replacement cost, electrical diagnosis, compatibility checks, and rep…
Engineering guide to Raspberry Pi alternatives, covering chip-level differences, Orange Pi, ROCK, Jetson, Banana Pi, NanoPi, Compute Module, Pico, GPIO, camera, HAT compatibility, and replacement risks…
Engineering guide to dynamic load response testing for high-current buck converters, covering load step setup, slew rate, Vcore undershoot, overshoot, recovery time, probe location, output capacitors a…
Engineering guide to output capacitor selection for ASIC Vcore rails, covering bulk capacitors, polymer capacitors, MLCC decoupling, DC bias, ESR, ESL, placement, transient response and substitution ri…
Engineering guide to high-current ASIC Vcore rails, covering 12-phase buck architecture, PMBus control, dynamic load testing, output capacitor networks, smart power stage selection, thermal design and …
Voltage regulator guide covering linear, LDO, 7805, Zener, adjustable, buck, VRM and alternator regulators, with design checks, testing methods, troubleshooting and datasheet-based selection.
Amplifier guide covering voltage, current and power amplification, gain, feedback, amplifier classes, audio and RF applications, op-amp circuits, transimpedance amplifiers, datasheet selection and trou…

