Cypress Semiconductor Corp CY7C2570XV18-600BZXC
- Part No.:
- CY7C2570XV18-600BZXC
- Manufacturer:
- Cypress Semiconductor Corp
- Category:
- Memory
- Package:
- 165-LBGA
- Datasheet:
-
CY7C2570XV18-600BZXC.pdf
- Description:
- IC SRAM 72MBIT PAR 165FBGA
- Quantity:
- Payment:

- Shipping:

Inventory:105
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Product details
Overview
CY7C2570XV18 from Cypress Semiconductor is a 72-Mbit synchronous pipelined DDR II+ Xtreme SRAM with 2 M × 36 organization, 2.5-cycle read latency (DOFF = HIGH), 600 MHz clock operation, and on-die termination (ODT) for DQ/BWS/K/K inputs-designed for high-bandwidth buffering in network packet processors and telecom line cards.
For engineers reviewing the CY7C2570XV18 datasheet, CY7C2570XV18 pinout, CY7C2570XV18 application, or CY7C2570XV18 equivalent, key selection criteria include DDR II+ burst timing, echo-clock–synchronized data capture, HSTL I/O compatibility, and ODT configuration via ZQ/ODT pins under 1.8 V core / 1.5 V I/O supply conditions.
Technical Context
The device implements a two-word burst architecture with address latching on alternate rising edges of complementary K/K clocks, enabling 1266 MT/s effective data rate at 600 MHz input clock. Read data is driven synchronously on both K and K rising edges, with QVLD edge-aligned to CQ/CQ for precise strobing.
It integrates a PLL for accurate data placement, supports programmable ODT ranges (RQ/3.33 or RQ/1.66) via ODT pin state, and uses synchronous self-timed write circuitry with byte-write select (BWS[3:0]) for granular 9-bit writes-operating in either DDR I mode (1-cycle latency, DOFF = LOW) or DDR II+ mode (2.5-cycle latency, DOFF = HIGH).
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Density & Organization | 72 Mbit, 2 M × 36 - enables single-chip 36-bit wide memory interface without depth expansion |
| Max Clock Frequency | 600 MHz - defines maximum sustained burst throughput of 1.2 Gbps per data pin |
| Read Latency | 2.5 cycles (DOFF = HIGH) - determines minimum read-to-read turnaround time in DDR II+ mode |
| I/O Voltage | VDDQ = 1.4 V to 1.6 V - supports 1.5 V HSTL-compatible signaling with variable drive strength |
| Core Voltage | VDD = 1.8 V ± 0.1 V - sets power delivery requirements and thermal budget for high-speed SRAM core |
| On-Die Termination | Supported on DQ[35:0], BWS[3:0], K/K - eliminates external 50 Ω resistors, reducing PCB routing complexity |
| Echo Clocks | CQ/CQ outputs synchronized to K - provide system-level timing reference for reliable DDR data capture |
Pinout & Package
Package: 165-ball FBGA (13 mm × 15 mm × 1.4 mm), RoHS-compliant, Pb-free.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| DQ[35:0] | Synchronous bidirectional data bus | 36-bit DDR data path; sampled on K/K rising edges during writes, driven on K/K rising edges during reads |
| BWS[3:0] | Byte write select inputs | Active-low controls 9-bit byte segments (D[8:0] to D[35:27]); enables partial-word writes without read-modify-write |
| K / K | Complementary DDR clock inputs | Rising edges latch all synchronous inputs and drive output registers; K only used for address/control sampling |
| CQ / CQ | Free-running echo clock outputs | Phase-locked to K; provides deterministic timing reference for external data capture logic |
| QVLD | Valid data indicator output | Asserted edge-aligned to CQ/CQ; signals when DQ[35:0] contains stable, valid read data |
| ODT | On-die termination range select | LOW = low-range ODT (~175–350 Ω); HIGH/floating = high-range ODT (~175–250 Ω); configures termination impedance at power-up |
| ZQ | Output impedance calibration reference | Connected to external resistor to GND; sets output driver impedance to 0.2 × RQ for matched signal integrity |
| LD | Load control input | Latched on K rising edge; initiates burst address capture and defines start of bus cycle sequence |
Key Features
| Feature | Design Value |
|---|---|
| Two-word burst architecture | Reduces address bus toggling by 50% versus single-word access-lowers system EMI and simplifies controller address generation |
| Programmable read latency (1 or 2.5 cycles) | DOFF pin selects DDR I (1-cycle) or DDR II+ (2.5-cycle) timing mode-enables backward compatibility and performance tuning |
| HSTL I/O with variable drive | Meets JEDEC HSTL Class I specs; drive strength configurable via ZQ resistor-ensures signal integrity across varied trace lengths |
| JTAG 1149.1 test access port | Enables boundary scan testing and in-system diagnostics without additional test fixtures or probe points |
| Synchronous self-timed writes | Eliminates external write pulse timing constraints-controller only needs to meet K/K setup/hold, not write duration |
Applications
| Network Packet Buffering | Telecom Line Card Memory |
|---|---|
|
Use Scenario: Storing and forwarding variable-length Ethernet/IP packets in multi-gigabit switching ASICs. IC Role / Device Role / Timing Role: High-throughput, low-latency buffer SRAM interfacing directly to packet processor's DDR-capable memory controller. Use Value: 2.5-cycle latency and echo-clock–synchronized QVLD enable deterministic packet header/tail alignment with 1266 MT/s throughput. |
Use Scenario: Frame buffering in OC-192/STM-64 SONET/SDH line interface units. IC Role / Device Role / Timing Role: Synchronous burst SRAM providing jitter-tolerant, ODT-enabled data storage between framer and DSP subsystems. Use Value: On-die termination eliminates stub reflections on dense backplane traces; HSTL I/O ensures noise immunity in noisy telecom environments. |
| High-Speed Test Equipment Memory | Avionics Data Acquisition Buffer |
|
Use Scenario: Capturing real-time analog-to-digital samples at >1 GSPS in automated test systems. IC Role / Device Role / Timing Role: Burst-access SRAM acting as first-stage acquisition buffer before FPGA-based decimation or analysis. Use Value: Two-word burst reduces controller address rate by half; CQ/CQ echo clocks simplify high-speed data capture synchronization. |
Use Scenario: Buffered sensor data logging in flight control computers requiring radiation-tolerant, deterministic timing. IC Role / Device Role / Timing Role: Radiation-hardened–qualified SRAM serving as fault-isolated, low-jitter intermediate storage for inertial measurement units. Use Value: 1.8 V core + 1.5 V I/O minimizes power-induced thermal drift; JTAG support enables in-field diagnostic verification. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar high-speed synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| AS7C3256A-15JCIN | Asynchronous 256K × 16 SRAM, 15 ns access, no DDR interface or ODT | Used in legacy control-plane buffers where timing determinism is less critical than cost | Select only if DDR timing, burst mode, or ODT are unnecessary and lower bandwidth suffices |
| IS61WV102418BLL-10BLI | Synchronous 1M × 18 SRAM, 10 ns cycle time, no echo clocks or programmable latency | Fits simpler burst controllers lacking DDR II+ timing management logic | Choose when system lacks PLL or echo-clock capture infrastructure but requires 18-bit width and 100 MHz max clock |
Compared with AS7C3256A-15JCIN and IS61WV102418BLL-10BLI, CY7C2570XV18 delivers 2× higher effective bandwidth via DDR, eliminates external termination, and provides deterministic latency control-making it essential for systems requiring sub-nanosecond timing alignment and >1 Gbps sustained throughput.
Availability
CY7C2570XV18 is available at Aetrix Electronics and suitable for network packet buffering, telecom line card memory, and high-speed test equipment requiring stable component supply, long-lifecycle support, and guaranteed Pb-free FBGA sourcing.
Supply support for CY7C2570XV18 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Cypress Semiconductor (now part of Infineon Technologies) designs high-performance memory and programmable solutions for demanding embedded and communications applications.
CY7C2570XV18 belongs to the DDR II+ Xtreme SRAM product line, engineered specifically for deterministic, high-bandwidth buffering in packet-switched infrastructure where echo-clock–synchronized data capture and on-die termination reduce system-level timing margin risk.
FAQ
What is the function of the DOFF pin on CY7C2570XV18?
The DOFF (DDR Off) pin selects the device's read latency mode: when asserted HIGH, it enables DDR II+ operation with 2.5-cycle read latency; when LOW or tied to VSS, it reverts to DDR I mode with 1-cycle latency. This pin is sampled at power-up and remains static during operation-no dynamic switching is supported.
How does on-die termination (ODT) work on CY7C2570XV18?
ODT is enabled only during write operations and applies to DQ[35:0], BWS[3:0], and K/K inputs. Its resistance value is selected at power-up using the ODT pin state (LOW = low range, HIGH/floating = high range) and calibrated against the ZQ pin's external resistor. ODT is automatically disabled during read cycles to avoid loading the data bus.
Can CY7C2570XV18 operate with a 1.5 V I/O supply?
Yes-CY7C2570XV18 supports VDDQ from 1.4 V to 1.6 V, fully covering 1.5 V nominal HSTL I/O operation. The device's variable-drive HSTL output buffers are calibrated via the ZQ pin to maintain impedance matching across this range, ensuring signal integrity without external termination.
What is the purpose of CQ and CQ echo clocks?
CQ and CQ are free-running, phase-locked outputs synchronized to the K clock. They provide a system-level timing reference aligned with data output edges, allowing external logic (e.g., FPGA capture registers) to sample DQ[35:0] with minimal skew-even across multiple SRAM devices-without needing individual board-trace-matched strobes.
CY7C2570XV18-600BZXC Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Cypress Semiconductor Corp
- Series:
- -
- Package/Case:
- 165-LBGA
- Packaging:
- Bulk
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, DDR II+
- Memory Size:
- 72Mbit
- Memory Organization:
- 2M x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 600 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- -
- Voltage - Supply:
- 1.7V ~ 1.9V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-FBGA (13x15)
CY7C2570XV18-600BZXC FAQ
1.How can I place an order for CY7C2570XV18-600BZXC through Aetrix?
Please submit a Request for Quotation (RFQ) for CY7C2570XV18-600BZXC on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for CY7C2570XV18-600BZXC reliable?
The price and inventory of CY7C2570XV18-600BZXC are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for CY7C2570XV18-600BZXC is usually 5 days.
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Once your CY7C2570XV18-600BZXC order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for CY7C2570XV18-600BZXC?
For technical support, including CY7C2570XV18-600BZXC datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your CY7C2570XV18-600BZXC requirements.
6.How does Aetrix verify that CY7C2570XV18-600BZXC is sourced from the original manufacturer or authorized distributors?
All CY7C2570XV18-600BZXC products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that CY7C2570XV18-600BZXC meets industry standards.
7.What is the process for return or replacement of CY7C2570XV18-600BZXC?
All CY7C2570XV18-600BZXC units undergo pre-shipment inspection (PSI). If there is an issue with CY7C2570XV18-600BZXC, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The CY7C2570XV18-600BZXC part is unused and in its original packaging.
Return procedure for CY7C2570XV18-600BZXC:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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