Cypress Semiconductor Corp S26KL256SDABHN030
- Part No.:
- S26KL256SDABHN030
- Manufacturer:
- Cypress Semiconductor Corp
- Category:
- Memory
- Package:
- 24-VBGA
- Datasheet:
-
S26KL256SDABHN030.pdf
- Description:
- IC FLASH 256MBIT PAR 24FBGA
- Quantity:
- Payment:

- Shipping:

Inventory:936
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Product details
Overview
S26KL256SDABHN030 from Infineon Technologies is a 256 Mb (32 MB) HYPERFLASH™ NOR flash memory with HYPERBUS™ DDR interface, operating at 1.8 V I/O and supporting differential clock (CK/CK#), 8-bit DQ bus, and RWDS read strobe. It delivers 333 MBps sustained read throughput at 166 MHz, features 256-KB uniform sectors with optional 4-KB parameter sectors, ECC 1-bit correction/2-bit detection, and supports industrial temperature range (–40°C to +85°C) in 24-ball FBGA package.
For engineers reviewing the S26KL256SDABHN030 datasheet, S26KL256SDABHN030 pinout, S26KL256SDABHN030 application, or S26KL256SDABHN030 equivalent, key selection criteria include HYPERBUS™ DDR timing compliance, RWDS-synchronized read latency (96 ns initial access), sector protection configurability, deep power-down current (4 µA), and AEC-Q100 grade 3 qualification for automotive infotainment boot storage.
Technical Context
The device implements a dual-controller architecture: Host Interface Controller (HIC) manages real-time DDR signal capture and RWDS-aligned data transfer, while Embedded Algorithm Controller (EAC) executes autonomous program/erase sequences without host intervention. It uses MIRRORBIT™ technology for high-density NOR storage and supports both wrapped (16/32/64-byte) and linear burst modes.
HYPERBUS™ protocol enables command/address/data multiplexing over the same 8-bit DQ bus using DDR edge-aligned transfers; RWDS output is edge-aligned to CK/CK# transitions during reads, and initial random access requires 5–16 clock cycles of latency before first data word appears on DQ[7:0].
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Density | 256 Mb (32 MB) - supports full firmware image storage for mid-tier microcontrollers and SoCs. |
| Interface Standard | HYPERTBUS™ DDR - 8-bit bidirectional DQ bus with differential CK/CK#, eliminating parallel address bus and reducing pin count vs. legacy parallel NOR. |
| Max Read Throughput | 333 MBps - achieved via 166 MHz clock × 2 transfers/cycle × 1 byte, enabling fast boot and XIP execution. |
| Initial Access Time | 96 ns - defines minimum latency from CS# assertion to first valid data word under worst-case conditions. |
| ECC Capability | 1-bit correction / 2-bit detection - hardware-implemented on-die, requiring no host-side ECC logic. |
| Power Modes | Deep Power-Down: 4 µA (typical); Standby: 25 µA; Active Clock Stop Read: 12 mA - enables ultra-low-power retention in always-on systems. |
| Endurance & Retention | 100,000 program/erase cycles; 20-year data retention - validated per JEDEC JESD22-A117 and ISO/TS16949. |
Pinout & Package
Package: 24-ball FBGA (VAA024), 5 mm × 5 mm × 1.0 mm, 0.8 mm ball pitch, RoHS-compliant.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| CK / CK# | Differential clock input | Defines sampling edges for all DDR transfers; CK# must be inverted and phase-matched to CK per HYPERBUS™ spec. |
| CS# | Chip select (active low) | Enables device operation; HIGH places device in standby or deep power-down depending on mode configuration. |
| RWDS | Read data strobe output | Edge-aligned to data transitions during reads only; used by host to latch DQ[7:0] values synchronously. |
| DQ[7:0] | Bi-directional data bus | Carries commands, addresses, and data in DDR fashion; 8-bit width reduces PCB routing complexity vs. 16/32-bit parallel NOR. |
| RSTO# | Reset output (open-drain) | Asserts system-level power-on reset pulse; LOW period configurable via internal register (1–16 ms). |
| INT# | Interrupt output (open-drain) | Signals Busy→Ready transition or ECC error detection; enables asynchronous host notification without polling. |
Key Features
| Feature | Design Value |
|---|---|
| HYPERBUS™ DDR interface | Reduces signal count to 12 pins (vs. ≥40 for parallel NOR), enabling compact PCB layout and lower EMI in space-constrained embedded designs. |
| Configurable burst mode | Supports wrapped (16/32/64-byte) or linear bursts per transaction - allows optimization for cache line alignment or sequential streaming. |
| 512-byte program buffer | Enables 1 MBps effective write speed (vs. 4 KBps for single-word programming), accelerating firmware updates and field reprogramming. |
| Volatile/non-volatile sector protection | Per-sector lock bits can be set via command or retained across power cycles - prevents accidental overwrite of bootloader or calibration data. |
| AEC-Q100 Grade 3 | Qualified for automotive infotainment and ADAS control modules operating from –40°C to +85°C with full traceability and PPAP support. |
Applications
| Automotive Infotainment Boot Storage | Industrial PLC Firmware Storage |
|---|---|
|
Use Scenario: Storing boot code and OS kernel for head unit SoC with strict <200 ms cold-boot requirement. IC Role / Device Role / Timing Role: Primary non-volatile boot memory accessed via HYPERBUS™ master controller; RWDS-synchronized reads ensure deterministic timing for XIP execution. Use Value: 333 MBps read throughput and 96 ns tACC enable sub-100 ms firmware load, meeting ASAM MCD-2 MC timing constraints. |
Use Scenario: Holding firmware and configuration data for modular I/O controllers deployed in factory automation cabinets. IC Role / Device Role / Timing Role: Field-upgradable flash memory interfaced to ARM Cortex-M7 MCU via dedicated HYPERBUS™ PHY; supports remote OTA updates. Use Value: 512-byte write buffer and 100K-cycle endurance allow >500 firmware revisions over 10-year product lifecycle without wear leveling. |
| Medical Imaging System Configuration | Avionics Display Module Memory |
|
Use Scenario: Storing calibrated sensor profiles and UI assets for portable ultrasound devices requiring radiation-tolerant, long-retention storage. IC Role / Device Role / Timing Role: Non-volatile configuration store with ECC-enabled reads; operates in deep power-down between imaging sessions to conserve battery. |
Use Scenario: Providing certified boot image storage for DO-254-compliant cockpit display processors where data integrity is safety-critical. IC Role / Device Role / Timing Role: AEC-Q100 Grade 3 qualified flash with 20-year retention and CRC/ECC validation for Level A software loading. Use Value: Hardware ECC and CRC reduce need for redundant external checksum logic, simplifying certification evidence for DAL A requirements. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar high-speed serial NOR flash applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| Cypress S26KS256SDABHN020 | Same die, identical electrical specs, but rated for Industrial Plus (–40°C to +105°C) and lacks AEC-Q100 certification. | Preferred for extended-temperature industrial gateways where automotive qualification is unnecessary. | Select when higher ambient operating temperature is required without automotive compliance overhead. |
| Winbond W25Q256JWSIQ | Quad SPI interface (not HYPERBUS™), 133 MHz max clock, no RWDS or differential clock; 256 Mb density, 3.3 V only. | Suitable for cost-sensitive consumer electronics where board space permits additional IO lines and lower bandwidth suffices. | Choose only if existing design uses QSPI infrastructure and 333 MBps throughput is not required. |
Compared with S26KL256SDABHN030, the Cypress alternative offers identical performance at higher temperature but no automotive qualification, while the Winbond part trades HYPERBUS™ efficiency for broader ecosystem compatibility at significantly lower bandwidth and voltage flexibility.
Availability
S26KL256SDABHN030 is available at Aetrix Electronics and suitable for automotive infotainment boot storage, industrial PLC firmware storage, and medical imaging system configuration requiring stable component supply, AEC-Q100 compliance, and guaranteed 20-year data retention.
Supply support for S26KL256SDABHN030 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Infineon Technologies is a German semiconductor manufacturer specializing in power management, automotive ICs, and memory solutions, with global manufacturing and quality certifications including ISO/TS16949.
This device belongs to the HYPERFLASH™ family, designed specifically for high-bandwidth, low-pin-count boot and firmware storage in automotive and industrial systems requiring deterministic DDR timing and robust data integrity.
FAQ
What is the purpose of the RWDS signal in S26KL256SDABHN030?
RWDS (Read Data Strobe) is an output-only signal that indicates valid data presence on DQ[7:0] during read operations. It is edge-aligned to CK/CK# transitions and used by the host to sample data synchronously. Unlike clock signals, RWDS is active only during reads and does not drive writes or commands - its timing directly determines data capture window accuracy in HYPERBUS™ DDR transfers.
Does S26KL256SDABHN030 support both 1.8 V and 3.0 V I/O operation?
No - S26KL256SDABHN030 is a 1.8 V I/O variant only, as indicated by the 'D' in the part number suffix and confirmed in Table 1 of the datasheet. It requires 1.8 V VCCQ and uses differential CK/CK# signaling. The 3.0 V variants (e.g., S26KL256SBxx) have different pinouts and timing parameters and are not interchangeable.
How is sector protection configured on this device?
Sector protection is implemented via volatile (lock bits cleared on power cycle) and non-volatile (lock bits retained across power cycles) methods. Protection is controlled per 256-KB sector using command sequences written to specific address ranges. Parameter sectors (eight 4-KB blocks) support independent locking, enabling secure storage of calibration data or cryptographic keys without affecting main array operations.
What wake-up time is required after Deep Power-Down mode?
The device requires 300 µs to exit Deep Power-Down mode and become ready for commands. During this period, CS# must remain HIGH and CK must be stable. After wake-up, the device responds to status register reads; no additional initialization sequence is needed. This delay is fixed and independent of temperature or voltage within specified operating ranges.
S26KL256SDABHN030 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Cypress Semiconductor Corp
- Series:
- HYPERFLASH™ KL
- Package/Case:
- 24-VBGA
- Packaging:
- Bulk
- Product Status:
- Active
- Programmable:
- Not Verified
- Memory Type:
- Non-Volatile
- Memory Format:
- FLASH
- Technology:
- FLASH - NOR
- Memory Size:
- 256Mbit
- Memory Organization:
- 32M x 8
- Memory Interface:
- Parallel
- Clock Frequency:
- 100 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 96 ns
- Voltage - Supply:
- 2.7V ~ 3.6V
- Operating Temperature:
- -40°C ~ 125°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 24-FBGA (6x8)
S26KL256SDABHN030 FAQ
1.How can I place an order for S26KL256SDABHN030 through Aetrix?
Please submit a Request for Quotation (RFQ) for S26KL256SDABHN030 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for S26KL256SDABHN030 reliable?
The price and inventory of S26KL256SDABHN030 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for S26KL256SDABHN030 is usually 5 days.
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Once your S26KL256SDABHN030 order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for S26KL256SDABHN030?
For technical support, including S26KL256SDABHN030 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your S26KL256SDABHN030 requirements.
6.How does Aetrix verify that S26KL256SDABHN030 is sourced from the original manufacturer or authorized distributors?
All S26KL256SDABHN030 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that S26KL256SDABHN030 meets industry standards.
7.What is the process for return or replacement of S26KL256SDABHN030?
All S26KL256SDABHN030 units undergo pre-shipment inspection (PSI). If there is an issue with S26KL256SDABHN030, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The S26KL256SDABHN030 part is unused and in its original packaging.
Return procedure for S26KL256SDABHN030:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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