Infineon Technologies S6E1B84FHAGV20000

Overview

S6E1B84FHAGV20000 from Infineon is a 32-bit TRAVEO™ T2G Arm® Cortex®-M4 microcontroller for automotive body electronics, featuring 2 MB embedded flash, 512 KB SRAM, CAN FD, LIN, and up to 144 GPIOs in a 176-pin LQFP package. It supports ASIL-B functional safety per ISO 26262 and operates across -40°C to 125°C ambient.

For engineers reviewing the S6E1B84FHAGV20000 datasheet, S6E1B84FHAGV20000 pinout, S6E1B84FHAGV20000 application, or S6E1B84FHAGV20000 equivalent, key selection criteria include CAN FD interface count, flash ECC configuration, SRAM retention mode support, and qualification for automotive AEC-Q100 Grade 2.

Technical Context

This MCU integrates dual-core lockstep capability for safety-critical body control modules, with dedicated hardware accelerators for CRC, encryption (AES-128/256), and secure boot. Its memory subsystem includes error correction code (ECC) on both flash and SRAM, plus parity protection on peripheral registers.

The device implements a multi-layer AHB/APB bus matrix with configurable access rights, supports up to 16 priority levels per interrupt, and includes a programmable watchdog timer with windowed mode and independent clock source.

Key Specifications

Pinout & Package

Package: 176-pin LQFP (24 × 24 mm, 0.5 mm pitch), thermally enhanced with exposed pad for improved heat dissipation in automotive environments.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar automotive body control applications.

Compared with S6E1B84FHAGV10000, this part provides double flash/SRAM capacity for future-proofing and feature-rich software stacks; versus TC377TP, it offers lower power consumption and optimized peripheral mix for non-safety-critical body functions without ASIL-D overhead.

Availability

S6E1B84FHAGV20000 is available at Aetrix Electronics and suitable for automotive door modules, seat control units, rearview mirror systems, and centralized body control modules requiring stable component supply across extended production lifecycles.

Supply support for S6E1B84FHAGV20000 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Infineon Technologies AG is a German semiconductor manufacturer specializing in power electronics, automotive ICs, and security solutions, with global R&D and manufacturing infrastructure.

S6E1B84FHAGV20000 belongs to the TRAVEO™ T2G family-designed specifically for automotive body electronics with integrated safety, security, and mixed-signal capabilities for centralized and distributed control units.

FAQ

What is the maximum operating frequency of the S6E1B84FHAGV20000?

The S6E1B84FHAGV20000 runs its Arm® Cortex®-M4F core at up to 160 MHz, sustained across the full -40°C to +125°C temperature range with appropriate voltage scaling. This frequency is achieved using the internal PLL driven by an external 20 MHz crystal, and all peripherals remain fully functional at this speed without timing violations.

Does the S6E1B84FHAGV20000 support CAN FD with flexible data rate?

Yes, the device integrates four independent CAN FD controllers compliant with ISO 11898-1:2015, supporting arbitration bit rates up to 1 Mbps and data bit rates up to 5 Mbps. Each controller includes dedicated message RAM with hardware acceptance filtering and transmit/receive FIFOs for deterministic real-time messaging.

How is functional safety implemented in this MCU?

Functional safety is implemented via hardware-enforced mechanisms including dual-core lockstep execution, ECC on flash and SRAM, memory BIST, peripheral protection unit (PPU), and a dedicated safety monitor unit that independently verifies clock, reset, and voltage domains. These features collectively enable ASIL-B compliance per ISO 26262 without requiring external safety components.

What debug interfaces are supported for development and production testing?

The MCU supports JTAG and SWD debug interfaces via dedicated pins, with full support for real-time trace using the Embedded Trace Macrocell (ETM). Production testing leverages boundary scan (IEEE 1149.1) and on-chip self-test routines accessible through the debug port, enabling automated test coverage for solder joint integrity and logic functionality.