Microchip Technology 1N4692-1

Overview

1N4692-1 from Microsemi is a 0.5 W axial-leaded Zener diode in DO-35 (DO-204AH) glass package, rated for 6.8 V nominal Zener voltage at 50 µA test current, with ±5% tolerance, 0.90 V maximum voltage regulation (10–100 µA), and 10.0 µA maximum reverse leakage at 5.1 V. It serves as a precision low-current voltage reference in analog sensor signal conditioning circuits.

For engineers reviewing the 1N4692-1 datasheet, 1N4692-1 pinout, 1N4692-1 application, or 1N4692-1 equivalent, key selection criteria include its tight regulation delta (0.90 V over 10× current range), hermetic DO-35 construction, MIL-PRF-19500 up-screening capability, RoHS-compliant plating option, and radiation-hardened performance per MicroNote 050.

Technical Context

The 1N4692-1 operates in the sharp knee region of Zener breakdown, delivering stable regulation from 10 µA to 70 mA with guaranteed ∆V_Z ≤ 0.90 V. Its internal metallurgical bond ensures mechanical robustness and long-term parameter stability under thermal cycling.

Designed for low-power, high-reliability biasing and reference functions, it exhibits minimal capacitance (<1.5 pF at 0 V, <1.0 pF at –2 V), non-ESD-sensitive behavior per MIL-STD-750 Method 1020, and a junction temperature range of –65°C to +175°C.

Key Specifications

Pinout & Package

Hermetically sealed axial-leaded DO-35 (DO-204AH) glass package with tin-lead or RoHS-compliant matte-tin plated leads. Cathode identified by color band; device operated with banded end positive relative to unbanded end during Zener conduction.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar Zener voltage reference applications.

Compared with 1N4692-1, the 1N4734A offers higher current capability in a larger package but lacks radiation hardness and military qualification; the BZX55C6V8 matches voltage and package but trades off leakage performance and reliability screening for lower cost and broader commercial availability.

Availability

1N4692-1 is available at Aetrix Electronics and suitable for industrial sensor biasing, aerospace reference supplies, medical instrument calibration, and downhole oilfield electronics requiring stable component supply across extended temperature and radiation environments.

Supply support for 1N4692-1 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Microsemi Corporation (now part of Microchip Technology) is a U.S.-based semiconductor company specializing in high-reliability, radiation-hardened, and aerospace-grade analog and mixed-signal components.

The 1N4692-1 belongs to Microsemi's legacy MIL-PRF-19500-qualified Zener diode family, engineered for mission-critical voltage reference applications in defense, space, and harsh-environment industrial systems.

FAQ

What is the Zener test current for the 1N4692-1?

The 1N4692-1 is specified at a Zener test current (I_ZT) of 50 µA, which establishes its nominal 6.8 V regulation point. This low test current reflects its design for ultra-low-power reference applications, such as sensor excitation and battery-operated instrumentation where standby current must be minimized. The 1N4692-1 maintains regulation across 10–100 µA, making it suitable for circuits with variable load conditions.

Does the 1N4692-1 support RoHS compliance?

Yes, the 1N4692-1 is available in RoHS-compliant versions with matte-tin plating, designated by the "e3" suffix (e.g., 1N4692-1e3), but only for commercial-grade units. Military-grade variants (MQ, MX, MV, MSP) retain tin-lead plating to meet MIL-PRF-19500 solderability requirements. RoHS compliance applies strictly to the lead finish-not to packaging or internal construction-and does not affect electrical specifications.

Can the 1N4692-1 be used in high-temperature downhole applications?

Yes, the 1N4692-1 is rated for junction temperatures from –65°C to +175°C and has been validated for operation in downhole oilfield electronics. Its hermetic DO-35 glass package and internal metallurgical bond prevent moisture ingress and parameter drift under sustained thermal stress. When mounted with ≥10 mm lead length, it sustains 0.48 W derated power at +25°C ambient-sufficient for localized heating near transducers in wellhead monitoring systems.

How does the voltage regulation specification (∆V_Z) of the 1N4692-1 impact circuit accuracy?

The 1N4692-1 guarantees ∆V_Z ≤ 0.90 V between 10 µA and 100 µA, meaning its output varies by no more than 0.90 V across that 10× current range. This tight regulation directly limits reference error in precision analog circuits-for example, in a 12-bit ADC with 3.3 V full-scale range, this translates to <0.3 LSB error contribution from the 1N4692-1 alone, assuming proper thermal layout and stable biasing.

Is the 1N4692-1 radiation-hardened, and what documentation supports this claim?

Yes, the 1N4692-1 is inherently radiation-hardened as documented in Microsemi's MicroNote 050, which characterizes its total ionizing dose (TID) response. Devices exhibit no parametric degradation up to 100 krad(Si), making them suitable for low-earth orbit satellite subsystems. This radiation tolerance stems from the DO-35 glass package and silicon processing-not an add-on feature-so no special ordering code is required; all 1N4692-1 units inherit this property.