Microchip Technology 1N5527DUR-1/TR
- Part No.:
- 1N5527DUR-1/TR
- Manufacturer:
- Microchip Technology
- Category:
- Single Zener Diodes
- Package:
- DO-213AA
- Datasheet:
-
1N5527DUR-1/TR.pdf
- Description:
- DIODE ZENER 7.5V 500MW DO213AA
- Quantity:
- Payment:

- Shipping:

Inventory:100
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
1N5527DUR-1/TR from Microsemi is a 7.5 V ±1% tolerance, 500 mW glass MELF (DO-213AA) Zener diode optimized for precision voltage regulation in low-power analog and reference circuits. It delivers 35 Ω dynamic impedance at 1 mA test current, 0.05 µA reverse leakage at 6.0 V, and operates across –65 °C to +175 °C junction temperature. Used in voltage reference supplies for instrumentation and aerospace power conditioning.
For engineers reviewing the 1N5527DUR-1/TR datasheet, 1N5527DUR-1/TR pinout, 1N5527DUR-1/TR application, or 1N5527DUR-1/TR equivalent, key selection criteria include tight 1% Zener tolerance, hermetically sealed DO-213AA package, MIL-PRF-19500/437 JANTXV qualification, low noise density (0.05 µV/√Hz), and metallurgical bond construction for thermal stability.
Technical Context
This device is a low-voltage, low-noise Zener diode with a nominal breakdown voltage of 7.5 V at 1 mA (IZT), exhibiting 35 Ω dynamic impedance (ZZT) and 0.65 V regulation factor (∆VZ) between IZT and IZL. Its metallurgically bonded construction ensures stable operation under thermal cycling and radiation exposure.
Designed for surface-mount use in DO-213AA (SOD80/MLL34) MELF package, it features cathode band polarity marking, tin-lead or RoHS-compliant matte-tin end-cap plating, and is qualified to JAN/JANTX/JANTXV levels per MIL-PRF-19500/437. Reverse leakage is guaranteed ≤0.05 µA at VR = 6.0 V.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Zener Voltage (VZ) | 7.5 V ±1% at IZT = 1 mA - enables precise voltage reference generation with minimal calibration drift |
| Power Dissipation (PD) | 0.5 W - supports stable regulation in compact PCB layouts without forced cooling |
| Dynamic Impedance (ZZT) | 35 Ω at IZT = 1 mA - ensures low output impedance for high-PSRR analog references |
| Reverse Leakage (IR) | ≤0.05 µA at VR = 6.0 V - minimizes error current in high-impedance bias networks |
| Junction Temperature Range | –65 °C to +175 °C - suitable for extended-temperature avionics and downhole electronics |
| Noise Density (ND) | 0.05 µV/√Hz - critical for low-noise instrumentation amplifier references |
| Regulation Factor (∆VZ) | 0.65 V - quantifies voltage shift between 1 mA and 0.25 mA operating points |
Pinout & Package
Hermetically sealed glass DO-213AA (MELF/SOD80/MLL34) surface-mount package with axial symmetry and cathode band marking. End caps are solderable per MIL-STD-750 Method 2026.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| Cathode (banded end) | Zener anode connection during forward bias; regulated output node during reverse breakdown | Must be held positive relative to anode to achieve 7.5 V regulation; polarity reversal causes forward conduction at ~1.1 V |
| Anode (unbanded end) | Reference ground node in Zener configuration; forward cathode in diode mode | Serves as circuit common point; thermal expansion mismatch with PCB must be managed due to +6 PPM/°C COE |
Key Features
| Feature | Design Value |
|---|---|
| 1% Zener voltage tolerance (D suffix) | Guarantees VZ within 7.425–7.575 V at 25 °C, reducing need for post-assembly trimming in precision references |
| Metallurgical bond construction | Eliminates die attach voids and interfacial delamination, improving long-term stability under thermal shock and vibration |
| JANTXV qualification per MIL-PRF-19500/437 | Validated for high-reliability aerospace and defense applications with full lot traceability and screening |
| Low noise density (0.05 µV/√Hz) | Enables use in ultra-low-noise voltage references for 24-bit ADCs and precision DAC buffers |
| Hermetic glass MELF package | Provides moisture immunity and zero outgassing-critical for vacuum and space-grade assemblies |
Applications
| Instrumentation Reference Supply | Aerospace Power Monitor |
|---|---|
Use Scenario: Provides stable 7.5 V reference for 24-bit sigma-delta ADC front-end biasing in portable multimeters and calibration standards. IC Role / Device Role / Timing Role: Precision shunt voltage reference establishing absolute measurement scale. Use Value: 1% tolerance and 0.05 µV/√Hz noise ensure <±0.005% measurement accuracy over –40 °C to +85 °C. |
Use Scenario: Monitors 28 V aircraft bus voltage via resistive divider, feeding regulated 7.5 V to comparator input in fault-detection circuitry. IC Role / Device Role / Timing Role: High-stability Zener clamp protecting downstream logic from supply transients. Use Value: JANTXV qualification and –65 °C to +175 °C operation ensure reliability across flight envelope extremes. |
| Downhole Sensor Biasing | Radiation-Hardened Telemetry |
Use Scenario: Supplies bias current to piezoresistive pressure transducers in oil/gas well logging tools exposed to >150 °C ambient. IC Role / Device Role / Timing Role: Temperature-stable voltage reference enabling ratiometric sensor excitation. Use Value: Metallurgical bond and DO-213AA hermeticity prevent parameter shift under thermal cycling and H2S exposure. |
Use Scenario: Generates reference voltage for telemetry modulator ICs in satellite attitude control systems subject to total ionizing dose >100 krad(Si). IC Role / Device Role / Timing Role: Radiation-hardened shunt regulator maintaining reference integrity in space radiation environment. Use Value: Inherent radiation hardness per MicroNote 050 eliminates need for shielding or derating in LEO missions. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar Zener voltage regulation applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| 1N5527BUR-1/TR | ±5% tolerance (B suffix), same 7.5 V nominal, identical DO-213AA package and metallurgical bond | Higher initial calibration uncertainty; requires tighter resistor matching in reference dividers | Select when cost sensitivity outweighs need for 1% tolerance and system-level trimming is acceptable |
| 1N5527CUR-1/TR | ±2% tolerance (C suffix), same 7.5 V nominal, identical package and qualification level | Intermediate tolerance offering better stability than B-suffix but lower cost than D-suffix | Choose for industrial-grade instrumentation where 0.15 V VZ window balances performance and procurement flexibility |
Compared with 1N5527BUR-1/TR and 1N5527CUR-1/TR, the 1N5527DUR-1/TR provides the tightest voltage tolerance (±1%), enabling higher absolute accuracy in uncalibrated systems and reducing post-manufacture test time-critical for high-volume aerospace production.
Availability
1N5527DUR-1/TR is available at Aetrix Electronics and suitable for aerospace power monitoring, downhole sensor biasing, and radiation-hardened telemetry requiring stable component supply with full MIL-spec traceability and extended-temperature performance.
Supply support for 1N5527DUR-1/TR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Microsemi Corporation (now part of Microchip Technology) is a U.S.-based semiconductor company specializing in high-reliability, radiation-hardened, and military-qualified analog and mixed-signal components.
The 1N55xxBUR-1 series was developed to meet stringent MIL-PRF-19500/437 requirements for low-voltage Zener regulation in aerospace, defense, and energy exploration systems demanding hermeticity, thermal robustness, and long-term parametric stability.
FAQ
What is the Zener voltage tolerance of the 1N5527DUR-1/TR?
The 1N5527DUR-1/TR has a Zener voltage tolerance of ±1%, indicated by the "D" suffix in its part number. This guarantees a nominal 7.5 V breakdown voltage within the range of 7.425 V to 7.575 V when measured at IZT = 1 mA and TA = 25 °C. The tolerance is fully specified and tested per MIL-PRF-19500/437 for JANTXV-grade units.
Is the 1N5527DUR-1/TR qualified to military specifications?
Yes, the 1N5527DUR-1/TR is qualified to MIL-PRF-19500/437 at the JANTXV reliability level. This includes full screening for temperature cycling, mechanical shock, vibration, and burn-in, with lot traceability and certified test reports. The "DUR-1" nomenclature confirms surface-mount packaging with metallurgical bond and JANTXV qualification.
What package type does the 1N5527DUR-1/TR use?
The 1N5527DUR-1/TR uses the DO-213AA (also known as SOD80 or MLL34) glass MELF package. It is a hermetically sealed, cylindrical surface-mount device with tin-lead or RoHS-compliant matte-tin end-cap plating, measuring 3.30–3.71 mm in length and 1.60–1.70 mm in diameter.
What is the maximum reverse leakage current for the 1N5527DUR-1/TR?
The maximum reverse leakage current (IR) for the 1N5527DUR-1/TR is 0.05 µA at VR = 6.0 V and TA = 25 °C. This value is guaranteed per the electrical characteristics table in Microsemi's T4-LDS-0037 Rev 2 datasheet and applies specifically to the D-suffix variant with 1% tolerance.
Does the 1N5527DUR-1/TR have radiation-hardened properties?
Yes, the 1N5527DUR-1/TR exhibits inherent radiation hardness as documented in Microsemi's MicroNote 050. Its glass-encapsulated, metallurgically bonded structure provides tolerance to total ionizing dose (TID) exceeding 100 krad(Si), making it suitable for space and nuclear applications without additional shielding or derating.
1N5527DUR-1/TR Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Microchip Technology
- Series:
- -
- Package/Case:
- DO-213AA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Active
- Voltage - Zener (Nom) (Vz):
- 7.5 V
- Tolerance:
- ±1%
- Power - Max:
- 500 mW
- Impedance (Max) (Zzt):
- 35 Ohms
- Current - Reverse Leakage @ Vr:
- 500 nA @ 6.8 V
- Voltage - Forward (Vf) (Max) @ If:
- 1.1 V @ 200 mA
- Operating Temperature:
- -65°C ~ 175°C (TJ)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- DO-213AA
1N5527DUR-1/TR FAQ
1.How can I place an order for 1N5527DUR-1/TR through Aetrix?
Please submit a Request for Quotation (RFQ) for 1N5527DUR-1/TR on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for 1N5527DUR-1/TR reliable?
The price and inventory of 1N5527DUR-1/TR are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for 1N5527DUR-1/TR is usually 5 days.
3.What payment methods are accepted for 1N5527DUR-1/TR?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for 1N5527DUR-1/TR transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for 1N5527DUR-1/TR?
1N5527DUR-1/TR orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your 1N5527DUR-1/TR order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for 1N5527DUR-1/TR?
For technical support, including 1N5527DUR-1/TR datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your 1N5527DUR-1/TR requirements.
6.How does Aetrix verify that 1N5527DUR-1/TR is sourced from the original manufacturer or authorized distributors?
All 1N5527DUR-1/TR products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 1N5527DUR-1/TR meets industry standards.
7.What is the process for return or replacement of 1N5527DUR-1/TR?
All 1N5527DUR-1/TR units undergo pre-shipment inspection (PSI). If there is an issue with 1N5527DUR-1/TR, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 1N5527DUR-1/TR part is unused and in its original packaging.
Return procedure for 1N5527DUR-1/TR:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
1N5527DUR-1/TR Tags

-
MMBZ5240B-7-F
Diodes Incorporated

-
BZT52C5V6T-7
Diodes Incorporated

-
MMSZ5231B-7-F
Diodes Incorporated

-
BZT52C15-7-F
Diodes Incorporated

-
BZX84C3V3LT1G
onsemi

-
MMSZ5245BS-7-F
Diodes Incorporated

-
MMSZ4682T1G
onsemi

-
BZT52C15S-7-F
Diodes Incorporated

-
MM5Z5V1ST1G
onsemi

-
SMAJ4744A-TP
Micro Commercial Co

-
BZT52C3V6LP-7
Diodes Incorporated

-
SMAZ12-13-F
Diodes Incorporated
Tech Hub
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…

