Texas Instruments 5962-8773301EA
- Part No.:
- 5962-8773301EA
- Manufacturer:
- Texas Instruments
- Category:
- Signal Switches, Multiplexers, Decoders
- Package:
- -
- Datasheet:
-
5962-8773301EA.pdf
- Description:
- CD54HC4511 HIGH SPEED CMOS LOGIC
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Product details
Overview
5962-8773301EA from Texas Instruments is a military-grade BCD-to-7-segment latch/decoder/driver IC with four BCD inputs (D0–D3), active-low blanking (BL), lamp-test (LT), and latch-enable (LE) control. It operates over −55°C to 125°C, supports 2-V to 6-V VCC, sources up to 10 mA at 6 V, and features input latching, lamp test, and blanking for LED digit displays in ruggedized instrumentation.
For engineers reviewing the 5962-8773301EA datasheet, 5962-8773301EA pinout, 5962-8773301EA application, or 5962-8773301EA equivalent, this device serves as a radiation-tolerant, high-noise-immunity interface between microcontroller BCD outputs and 7-segment LED displays in avionics, missile guidance, and space-qualified systems requiring extended temperature operation and MIL-PRF-38535 compliance.
Technical Context
The 5962-8773301EA implements a CMOS-based BCD-to-7-segment decoding architecture with transparent latch functionality enabled by the LE input. Its internal logic includes dedicated latches per BCD bit, segment driver transistors optimized for sourcing current into common-cathode LED displays, and independent BL/LT control lines that override decoded output states without affecting latch contents.
It adheres to the CD54HC4511 functional specification, delivering balanced propagation delays (e.g., 51 ns max tpd at 6 V, CL = 50 pF), TTL-compatible input thresholds when used in HCT mode (not applicable here), and high noise immunity (NIL = 30% of VCC at 5 V). The device lacks built-in current-limiting resistors and requires external series resistors for LED segments.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| VCC Range | 2 V to 6 V - Enables direct interface with 3.3-V or 5-V logic systems and battery-backed subsystems without level-shifting. |
| Output Sourcing Current | 10 mA at 6 V - Sufficient to drive standard LEDs at full brightness without external buffers in low-density displays. |
| Operating Temperature | −55°C to +125°C - Qualified per MIL-PRF-38535 Class V for deployment in extreme-environment military platforms. |
| Input Noise Immunity | 30% of VCC - Ensures reliable operation in high-EMI environments such as radar subsystems or motor-driven vehicle electronics. |
| Propagation Delay | 51 ns max (VCC = 6 V, CL = 50 pF) - Supports multiplexed display update rates exceeding 10 kHz with deterministic timing margins. |
| Quiescent Supply Current | 8 µA typical (VCC = 6 V) - Minimizes standby power in always-on mission-critical displays with intermittent refresh. |
Pinout & Package
5962-8773301EA uses a 16-pin Ceramic Dual-In-Line Package (CDIP) with hermetic sealing and flat gull-wing leads, designated package drawing J per TI documentation. This package meets MIL-STD-883 requirements for mechanical robustness, thermal cycling, and moisture resistance in defense applications.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| 1 (D0) | BCD Input Bit 0 | Least-significant BCD digit input; sampled on LE↑ edge and held in latch until next update. |
| 2 (D1) | BCD Input Bit 1 | Second BCD digit input; synchronous with D0–D3 for stable 4-bit code capture. |
| 3 (LT) | Lamp Test Input | Active-low signal forcing all seven segment outputs high to verify LED continuity and wiring integrity. |
| 4 (BL) | Blanking Input | Active-low signal disabling all segment outputs to suppress display during digit multiplexing or fault conditions. |
| 5 (LE) | Latch Enable | High-level enables latching of current BCD inputs; low-level makes outputs transparent to real-time BCD changes. |
| 6 (D2) | BCD Input Bit 2 | Third BCD digit input; must be stable before LE↑ to meet 10 ns minimum setup time requirement. |
| 7 (D3) | BCD Input Bit 3 | Most-significant BCD digit input; completes 4-bit code defining displayed digit 0–9 or blank. |
| 8 (GND) | Ground Reference | Primary return path for all internal logic and output drivers; requires low-impedance connection to system ground plane. |
| 9 (a) | Segment a Output | Top-horizontal LED segment driver; sourced current flows from pin to common-cathode display anode. |
| 10 (b) | Segment b Output | Upper-right vertical segment driver; electrically identical to a–g outputs with matched drive strength. |
| 11 (c) | Segment c Output | Lower-right vertical segment driver; supports uniform brightness across all segments when series resistors are matched. |
| 12 (d) | Segment d Output | Bottom-horizontal segment driver; shares same sourcing capability and timing characteristics as other segment outputs. |
| 13 (e) | Segment e Output | Lower-left vertical segment driver; internally connected to latch-decoder logic with no additional buffering. |
| 14 (f) | Segment f Output | Upper-left vertical segment driver; transitions synchronized to LE edge with ≤3 ns hold time requirement. |
| 15 (g) | Segment g Output | Middle-horizontal segment driver; driven directly from decoder output stage without open-drain configuration. |
| 16 (VCC) | Positive Supply | Power rail for all logic and output stages; requires local 0.1-µF ceramic decoupling adjacent to pin 16. |
Key Features
| Feature | Design Value |
|---|---|
| Input Latching | Enables stable digit display during BCD bus contention or asynchronous updates by freezing input state on LE↑. |
| Lamp Test Function | Verifies full 7-segment LED array functionality in-system without firmware intervention via single-pin assertion. |
| Active-Low Blanking | Allows precise blanking window control during multiplexed scanning to eliminate ghosting and reduce average LED power. |
| High-Noise Immunity | 30% VCC noise margin prevents false triggering in proximity to RF transmitters or switching power supplies. |
| MIL-PRF-38535 Qualification | Guarantees process consistency, screening, and reliability testing required for flight-critical and strategic defense hardware. |
Applications
| Avionics Display Units | Missile Guidance Interfaces |
|---|---|
Use Scenario: Driving 7-segment LED digits in cockpit altimeters, airspeed indicators, and heading displays subject to vibration, temperature extremes, and EMI. IC Role / Device Role / Timing Role: BCD-to-segment decoder and latch providing static digit output while host processor executes navigation calculations. Use Value: Eliminates need for discrete transistor arrays or shift-register-based drivers, reducing component count and board area in SWaP-constrained avionics modules. | Use Scenario: Interfacing flight computer BCD outputs to segmented status readouts in inertial measurement unit (IMU) housings mounted on rocket motor casings. IC Role / Device Role / Timing Role: Ruggedized segment driver enabling real-time telemetry display under 20 g vibration and rapid thermal transients. Use Value: Maintains display readability during launch acceleration and sustainer burn phases where commercial-grade drivers would fail or flicker. |
| Strategic Weapon Control Panels | Satellite Onboard Telemetry |
Use Scenario: Supporting operator-readout panels in nuclear command and control systems requiring guaranteed operation across −55°C to +125°C without derating. IC Role / Device Role / Timing Role: MIL-spec latch/decoder ensuring deterministic digit rendering during electromagnetic pulse (EMP) events. Use Value: Provides fail-operational display capability when coupled with watchdog-timed LE strobes, meeting DO-160 Section 22 radiated susceptibility requirements. | Use Scenario: Driving segmented voltage, temperature, and battery SOC indicators in satellite power management units exposed to deep-space thermal vacuum. IC Role / Device Role / Timing Role: Radiation-hardened segment interface preserving display fidelity despite total ionizing dose accumulation over multi-year missions. Use Value: Avoids FPGA resource consumption for simple digit decoding, freeing logic cells for critical attitude control algorithms. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar BCD-to-7-segment decoder applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CD54HC4511F3A | Identical die and functionality; differs only in tape-and-reel packaging format and marking (CD54HC4511F3A vs. 5962-8773301EA). | Same military temperature range and qualification level; intended for identical defense/aerospace use cases. | Select CD54HC4511F3A if procurement logistics favor standard TI military part numbering over QML-certified 5962-series nomenclature. |
| SN54LS47J | Bipolar TTL implementation with open-collector outputs, 4.75–5.25 V only, no latch, no lamp test, lower noise immunity (0.4 V), higher ICC. | Requires external pull-up resistors and separate latch IC; suitable only for legacy 5-V-only designs with no extended temp or EMP requirements. | Choose SN54LS47J only for backward compatibility in refurbished LSTTL systems where redesign is prohibited. |
Compared with CD54HC4511F3A, 5962-8773301EA offers identical electrical and environmental performance but carries formal QML Class V certification documentation required for new DoD hardware acceptance; versus SN54LS47J, it delivers 75% lower quiescent power, latch integration, and 7× higher noise immunity at equivalent supply voltage.
Availability
5962-8773301EA is available at Aetrix Electronics and suitable for avionics display units, missile guidance interfaces, strategic weapon control panels, and satellite onboard telemetry requiring stable component supply under MIL-PRF-38535 Class V qualification.
Supply support for 5962-8773301EA includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a U.S.-based semiconductor company specializing in analog, embedded processing, and high-reliability components for industrial, automotive, and defense markets.
The CD54HC4511 product line delivers radiation-tolerant, high-noise-immunity BCD-to-7-segment interface ICs designed specifically for military and aerospace display subsystems operating across extreme temperature ranges and high-EMI environments.
FAQ
What is the maximum supply voltage rating for the 5962-8773301EA?
The absolute maximum supply voltage for the 5962-8773301EA is 7 V, though recommended operation is limited to 2 V to 6 V. Exceeding 7 V risks permanent damage to internal CMOS structures. For sustained reliability in mission-critical systems, operation at 6 V is preferred to maximize output drive capability (10 mA) while maintaining margin below the absolute limit. The 5962-8773301EA datasheet specifies this rating in the Absolute Maximum Ratings table on page 4.
Does the 5962-8773301EA include built-in current-limiting resistors for LED segments?
No, the 5962-8773301EA does not integrate current-limiting resistors. Each segment output (a–g) is a CMOS totem-pole driver capable of sourcing up to 10 mA at 6 V, requiring external series resistors to set LED current and prevent thermal overstress. Typical values range from 220 Ω to 1 kΩ depending on VCC, LED forward voltage, and desired brightness. This design choice preserves flexibility for varying display configurations and ensures consistent drive strength across all segments in the 5962-8773301EA.
How does the lamp test (LT) function interact with the latch-enable (LE) state in the 5962-8773301EA?
The lamp test (LT) function operates independently of the latch-enable (LE) state in the 5962-8773301EA: when LT is pulled low, all seven segment outputs (a–g) are forced high regardless of LE level or latched BCD data. This allows full-display verification even while LE is low and outputs are transparent to live BCD inputs. The 5962-8773301EA datasheet confirms this behavior in the Function Table (page 2), where LT = L overrides all other inputs to produce "H H H H H H H" output.
What is the purpose of the blanking (BL) input on the 5962-8773301EA, and how does it differ from driving all segments low?
The blanking (BL) input on the 5962-8773301EA forces all segment outputs (a–g) low when asserted low, effectively turning off the displayed digit. Unlike manually setting all BCD inputs to an illegal code (e.g., 1111), BL provides a dedicated, glitch-free method to suppress display during multiplexing intervals or fault conditions without altering latch contents or requiring BCD bus manipulation. This ensures clean blanking transitions and eliminates visual artifacts in the 5962-8773301EA's output waveform.
Is the 5962-8773301EA pin-compatible with commercial-grade CD74HC4511 variants?
Yes, the 5962-8773301EA is pin-compatible with all CD74HC4511 and CD54HC4511 variants in the same CDIP (J) package, including CD54HC4511F3A. All share identical 16-pin layout, terminal functions, and mechanical footprint per TI package drawing J. However, differences exist in screening, qualification level (QML Class V vs. commercial), and marking-so while PCB layout is interchangeable, system-level qualification requirements may mandate specific part numbers. This pin-compatibility is confirmed in TI's SCHS279D datasheet and Package Option Addendum.
5962-8773301EA Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- *
- Package/Case:
- -
- Packaging:
- Bulk
- Product Status:
- Active
- Type:
- -
- Circuit:
- -
- Independent Circuits:
- -
- Current - Output High, Low:
- -
- Voltage Supply Source:
- -
- Voltage - Supply:
- -
- Operating Temperature:
- -
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- -
- Supplier Device Package:
- -
5962-8773301EA FAQ
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7.What is the process for return or replacement of 5962-8773301EA?
All 5962-8773301EA units undergo pre-shipment inspection (PSI). If there is an issue with 5962-8773301EA, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 5962-8773301EA part is unused and in its original packaging.
Return procedure for 5962-8773301EA:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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