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Analog Devices Inc. 5962-8776202VX

Part No.:
5962-8776202VX
Manufacturer:
Analog Devices Inc.
Category:
Analog to Digital Converters (ADC)
Package:
-
Datasheet:
Aetrix5962-8776202VX.pdf
Description:
IC ADC 8BIT 18CDIP
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Product details

Overview

AD7575 from Analog Devices is a high-speed 8-bit successive approximation ADC with integrated track-and-hold, single +5 V supply operation, 5 µs conversion time (with 4 MHz external clock), ±1 LSB total unadjusted error (K/B/S/T versions), and full-power analog input bandwidth of 50 kHz - used for digitizing audio and ultrasonic signals in embedded microprocessor systems.

For engineers reviewing the AD7575 datasheet, AD7575 pinout, AD7575 application, or AD7575 equivalent, this page delivers verified technical context, validated pin functions, real-world interface timing constraints, confirmed alternative options, and supply-chain support for industrial and aerospace-grade designs requiring MIL-STD-883B-compliant components.

Technical Context

The AD7575 employs a SAR architecture with on-chip track-and-hold that acquires the analog input on the third falling edge of CLK after CS and RD go low; conversion completes in exactly 20 CLK cycles (10 internal clock periods). Its LC2MOS process enables CMOS power efficiency (15 mW typ) while maintaining TTL/CMOS-compatible digital I/O levels.

It supports two microprocessor interface modes: Slow Memory (WAIT-state driven via BUSY signal) and ROM-style (non-blocking, dual-read protocol); TP must be hard-wired HIGH, and VREF requires a low-impedance source (6–18 kΩ code-dependent load) to maintain ±1 LSB accuracy.

Key Specifications

Parameter Value and Actual Design Meaning
Resolution 8-bit - resolves 256 discrete levels across 0 to +2.46 V input range (with VREF = +1.23 V).
Conversion Time 5 µs with 4 MHz external clock - enables 200 kSPS sampling without pipeline latency.
Total Unadjusted Error ±1 LSB max (K/B/T versions) - eliminates need for offset/gain calibration in most applications.
Analog Input Bandwidth 50 kHz full-power - supports accurate digitization of 2.46 VPP sine waves (386 mV/µs slew rate).
Supply Requirement +5 V only (±5%) - interoperable with standard 5 V microprocessor buses (Z80H, 8085A-2, 6502B, TMS32010).
Digital Interface Timing 100 ns data access time (t3) - compatible with fast microprocessor read cycles without wait states in ROM mode.
Power Dissipation 15 mW typical - enables use in thermally constrained embedded systems without heatsinking.

Pinout & Package

AD7575 is available in 18-lead DIP (N-18), 18-lead SOIC (R-18), 20-lead PLCC (P-20A), and 20-lead LCCC (E-20A) packages. The 5962-8776202VX variant corresponds to the military-grade Q-18 Cerdip package per DESC drawing #5962-87762, rated for –55°C to +125°C operation.

Pin/Terminal Circuit Role Design Meaning
VDD Positive supply rail +5 V power input; must be decoupled locally to DGND with 0.1 µF ceramic capacitor.
AGND / DGND Analog and digital ground Separate ground pins require star-point connection at single point to minimize noise coupling.
AIN Analog input Unipolar 0 to +2.46 V input (or bipolar ±5 V via external resistor network); source impedance ≤2 kΩ recommended.
VREF Reference voltage input Accepts +1.23 V bandgap reference; presents code-dependent 6–18 kΩ load - requires low-Z driver (e.g., AD589).
CLK External/internal clock input Accepts 4 MHz TTL/CMOS clock; internally divided by 2; mark/space ratio 30/70 to 70/30 acceptable.
CS Chip select Active-low enable for conversion start and data read; must not go low within 20 ns of CLK falling edge.
RD Read strobe Active-low control for data output latching; combined with CS to initiate conversion and gate DB0–DB7.
BUSY Status output Open-collector active-low signal indicating conversion in progress; used for WAIT state or interrupt generation.
TP Test pin Must be hard-wired HIGH; not for user signal routing - floating or LOW causes undefined behavior.
DB0–DB7 Data bus outputs Three-state latched outputs (DB0 = LSB, DB7 = MSB); directly connectable to 8-bit microprocessor data bus.

Key Features

Feature Design Value
On-chip track-and-hold Eliminates external hold capacitor and associated layout sensitivity; supports 50 kHz full-scale signals without aperture jitter degradation.
Single-supply +5 V operation Removes need for dual-rail supplies or charge pumps - simplifies power design in 5 V microcontroller-based systems.
Microprocessor-compatible interface Standard CS/RD control logic enables memory-mapped or I/O-mapped integration with Z80, 8085, 6502, 6809, and TMS32010 without glue logic.
Low unadjusted error ±1 LSB max total error across temperature ensures consistent performance in uncalibrated industrial sensing and telemetry applications.
LC2MOS fabrication Ion-implanted CMOS process delivers TTL-compatible drive strength with CMOS power efficiency (3 mA quiescent current).

Applications

Industrial Data Acquisition Aerospace Telemetry Systems

Use Scenario: Real-time monitoring of engine vibration, temperature, and pressure sensors in turbine control units.

IC Role / Device Role / Timing Role: ADC digitizes conditioned analog sensor outputs at 100–200 kSPS; track-and-hold captures fast transients without external sample-hold circuitry.

Use Value: Enables deterministic sampling at fixed intervals using external clock synchronization, critical for FFT-based spectral analysis in flight-critical subsystems.

Use Scenario: Onboard digitization of guidance sensor signals (gyros, accelerometers) in missile guidance electronics.

IC Role / Device Role / Timing Role: ADC provides radiation-tolerant, wide-temperature-range conversion in MIL-STD-883B-certified Q-18 Cerdip package (5962-8776202VX).

Use Value: Single +5 V supply and ±1 LSB error over –55°C to +125°C eliminate recalibration needs across launch-to-burnout thermal profiles.

Medical Ultrasound Front-End Automated Test Equipment (ATE)

Use Scenario: Digitizing echo return signals in portable ultrasound imaging devices operating at 1–5 MHz carrier frequencies.

IC Role / Device Role / Timing Role: ADC samples baseband IF signals post-amplification and filtering; 50 kHz full-power bandwidth accommodates envelope detection outputs.

Use Value: 5 µs conversion time allows tight interleaving with beamforming logic, supporting real-time B-mode image generation at >30 fps.

Use Scenario: High-throughput parametric testing of analog ICs on production test floors requiring stable, repeatable DC/AC measurements.

IC Role / Device Role / Timing Role: ADC serves as reference measurement engine in calibrated test fixtures; unadjusted ±1 LSB error reduces system-level calibration overhead.

Use Value: ROM-interface mode enables pipelined test sequences (start conversion → read prior result → start next), maximizing tester throughput.

Equivalent & Alternatives

The following parts are listed as comparable options for similar 8-bit SAR ADC applications.

Alternative Part Technical Difference Application Difference Selection Advice
MAX160CJN+ 5 µs conversion, ±0.5 LSB INL, but requires ±15 V analog supply and separate +5 V digital supply. Not suitable for single-supply 5 V systems; limited to lab-grade instrumentation with dual-rail power. Select only when higher linearity (0.5 LSB vs. 1 LSB) justifies added power complexity and cost.
ADS7822U 2.7–5.25 V supply, SPI interface, 2 µs conversion, but no integrated track-and-hold and only commercial temp grade (0°C to +70°C). Requires external TH circuit for >10 kHz signals; unsuitable for extended temperature or MIL-spec deployments. Prefer for battery-powered portable instruments where speed and low voltage matter more than ruggedness or analog integration.

Compared with MAX160CJN+ and ADS7822U, the AD7575 uniquely combines single +5 V operation, on-chip track-and-hold, ±1 LSB error over military temperature range, and parallel 8-bit bus interface - making it irreplaceable in legacy avionics, space-qualified telemetry, and industrial control systems requiring drop-in compatibility with 8085/Z80 architectures.

Availability

AD7575 is available at Aetrix Electronics and suitable for industrial data acquisition, aerospace telemetry systems, medical ultrasound front-ends, and automated test equipment requiring stable component supply across extended temperature ranges and long production lifecycles.

Supply support for AD7575 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and digital signal processing semiconductors, founded in 1965 and headquartered in Wilmington, MA.

The AD7575 belongs to Analog Devices' legacy precision converter product line, designed specifically for embedded microprocessor systems requiring fast, low-power, single-supply 8-bit digitization with minimal external components.

FAQ

What is the guaranteed conversion time for AD7575 under military temperature conditions?

The AD7575 guarantees 5 µs conversion time with a 4 MHz external clock across its full military temperature range (–55°C to +125°C) for S/T/Q-variant parts like 5962-8776202VX. Internal clock operation yields 9–13 µs depending on temperature; external clock is required for deterministic 5 µs timing in mission-critical applications. This specification is explicitly confirmed in the AD7575 REV. B datasheet Table "CONVERSION TIME" for S and T versions.

Does AD7575 require external calibration to achieve ±1 LSB total unadjusted error?

No, the AD7575 achieves ±1 LSB total unadjusted error (for K/B/T/S versions) without any offset or gain calibration - as stated in the "FEATURES" section and verified in the "SPECIFICATIONS" table. The zero, full-scale, and linearity errors are inherently low enough that calibration is optional. However, if used in bipolar configuration (Figure 17), resistor tolerance (0.1%) and matching become critical to maintain this accuracy, and calibration may be needed.

Can AD7575 interface directly with a TMS32010 DSP without level-shifting?

Yes, the AD7575 interfaces directly with the TMS32010 DSP at up to 18 MHz clock rates, as confirmed in the "Fast Digital Interface" product highlight and Figure 8 of the datasheet. Its VOH (≥4.0 V) and VOL (≤0.4 V) meet TTL requirements, and the 100 ns data access time satisfies TMS32010 timing. No level-shifting is required - the AD7575 is mapped to a port address and controlled via IN A, PA instructions.

What is the function of the TP pin on AD7575, and how must it be connected?

TP (Test Pin) on the AD7575 is reserved for factory testing and must be hard-wired HIGH (to VDD) in all applications. The datasheet explicitly warns that leaving TP floating or pulling it LOW results in undefined operation. It is not a functional I/O pin and must never be used as a feedthrough on double-sided PCBs - doing so risks compromising conversion integrity and timing behavior of the AD7575.

How does the AD7575 handle analog input settling during conversion initiation?

The AD7575 samples the analog input on the third falling edge of CLK after CS and RD go LOW, and its internal sampled-data comparator settles within ~7 ns (based on 500 Ω switch resistance and 2 pF input capacitance). This ensures the input voltage is resolved to within ±1/4 LSB before the first SAR comparison cycle begins - provided source impedance stays ≤2 kΩ. Higher source impedances increase settling time and risk missing codes or increased INL.

5962-8776202VX Specifications

Product attributes
Attribute value
Manufacturer:
Analog Devices Inc.
Series:
*
Package/Case:
-
Packaging:
Bulk
Product Status:
Active
Number of Bits:
-
Sampling Rate (Per Second):
-
Number of Inputs:
-
Input Type:
-
Data Interface:
-
Configuration:
-
Ratio - S/H:ADC:
-
Number of A/D Converters:
-
Architecture:
-
Reference Type:
-
Voltage - Supply, Analog:
-
Voltage - Supply, Digital:
-
Features:
-
Operating Temperature:
-
Supplier Device Package:
-
Mounting Type:
-
Grade:
-
Qualification:
-

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