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Texas Instruments 5962-9458601QXA
- Part No.:
- 5962-9458601QXA
- Manufacturer:
- Texas Instruments
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- Datasheet:
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5962-9458601QXA.pdf
- Description:
- SN54ABT8646 SCAN TEST DEVICES WI
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Product details
Overview
5962-9458601QXA from Texas Instruments is a military-grade octal bus transceiver with integrated IEEE 1149.1 boundary-scan testability, supporting A↔B bidirectional data flow under DIR/OE control, real-time/registered transfer modes via CLKAB/SAB and CLKBA/SBA, and operating across −55°C to 125°C. It implements dual boundary-scan cells per I/O, 40-bit boundary-scan register, and EPIC-II B BiCMOS process for low power.
For engineers reviewing the 5962-9458601QXA datasheet, 5962-9458601QXA pinout, 5962-9458601QXA application, or 5962-9458601QXA equivalent, key selection criteria include JTAG-compliant test architecture, dual-clock/register-controlled bus management, military temperature qualification, TAP-controlled PSA/PRPG test functions, and functional equivalence to 'F646/'ABT646 in normal mode.
Technical Context
The device integrates IEEE Std 1149.1-1990 TAP controller with 16-state synchronous finite-state machine, supporting mandatory instructions (EXTEST, INTEST, BYPASS) and optional CLAMP/HIGHZ. Its boundary-scan architecture includes three dedicated registers: 40-bit BSR (two cells per I/O), 11-bit BCR for RUNT-mode test operations, and 1-bit bypass register.
Normal-mode operation uses CLKAB/SAB for A→B path and CLKBA/SBA for B→A path, with DIR selecting direction and OE enabling/disabling transceiver output drivers. Test-mode isolation ensures functional logic remains unaffected during scan access via TDI/TDO/TCK/TMS interface.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Temperature Range | −55°C to +125°C - Qualified for full military environmental operation without derating. |
| Boundary-Scan Register | 40-bit - Supports two scan cells per I/O (input + output), enabling precise pin-level observability and controllability. |
| TAP Interface | IEEE 1149.1-1990 compliant - Enables standardized board-level test access using TDI/TDO/TCK/TMS signals. |
| Functional Equivalence | Matches 'F646 and 'ABT646 - Direct drop-in replacement in non-test applications with identical timing and logic behavior. |
| Process Technology | EPIC-II B BiCMOS - Reduces dynamic power vs. pure CMOS while maintaining TTL-compatible drive strength. |
| Test Operations | PSA, PRPG, TOPSIP, COUNT - Executed via BCR under RUNT instruction for on-chip self-test and signature analysis. |
Pinout & Package
Ceramic Flatpack (FK) package - 28-pin, hermetically sealed, MIL-PRF-38535 qualified, suitable for high-reliability aerospace and defense systems.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A1–A8 | Normal-function A-bus I/O | Octal bidirectional data ports for A-side bus interface; driven or sensed depending on DIR/OE state. |
| B1–B8 | Normal-function B-bus I/O | Octal bidirectional data ports for B-side bus interface; functionally mirrored to A-side with independent clock/select control. |
| CLKAB / CLKBA | Normal-function clocks | Low-to-high edge-triggered clocks controlling register capture from A→B (CLKAB) or B→A (CLKBA). |
| SAB / SBA | Normal-function select | Selects transparent (SAB = L) or registered (SAB = H) A→B data path; SBA mirrors for B→A path. |
| DIR | Direction control | High = A→B active; Low = B→A active - determines primary data flow direction when OE is low. |
| OE | Output enable | Low = transceiver enabled; High = both A and B ports placed in high-impedance state for bus isolation. |
| TDI / TDO / TCK / TMS | JTAG test interface | Standard 4-wire boundary-scan port - TDI inputs serial test data; TDO outputs it; TCK clocks all operations; TMS controls TAP state transitions. |
| VCC / GND | Power supply | 5 V ±5% supply with decoupling required; GND reference plane essential for noise immunity in mixed-signal test environments. |
Key Features
| Feature | Design Value |
|---|---|
| Dual boundary-scan cell per I/O | Enables independent capture of input signal and control of output driver at each pin - critical for fault isolation in dense PCB assemblies. |
| Parallel-signature analysis (PSA) | Performs real-time CRC-like compression of up to 16 input bits per TCK cycle - reduces test time versus full vector capture. |
| Pseudorandom pattern generation (PRPG) | Generates 16-bit maximal-length test sequences from internal LFSR - enables structural testing without external stimulus vectors. |
| Sample/PRELOAD instruction | Captures live pin states during normal operation - allows visibility into system behavior without halting functional logic. |
| State-of-the-art EPIC-II B BiCMOS | Combines bipolar speed and CMOS density - achieves 5 V TTL-compatible drive with sub-10 mW/MHz dynamic power. |
Applications
| Aerospace Avionics Backplane | Military Radar Signal Processing |
|---|---|
Use Scenario: High-speed data routing between ADC/DAC modules and FPGA-based processing units in airborne radar front-ends. IC Role / Device Role / Timing Role: Octal bidirectional bus transceiver with registered A→B/B→A paths, synchronized to system clock domains via CLKAB/CLKBA edges. Use Value: Enables deterministic timing alignment across multiple voltage domains while providing IEEE 1149.1 test access for field-deployable diagnostics. | Use Scenario: Interfacing legacy 5 V TTL buses to modern radiation-hardened microcontrollers in missile guidance subsystems. IC Role / Device Role / Timing Role: Level-shifting, direction-controlled bus buffer with military temperature range and hermetic FK packaging. Use Value: Maintains signal integrity and timing margins over −55°C to +125°C while supporting post-deployment boundary-scan validation. |
| Secure Communications Crypto Module | Spacecraft Onboard Data Handling |
Use Scenario: Isolating cryptographic co-processor I/O from host processor bus during secure boot and key loading sequences. IC Role / Device Role / Timing Role: High-impedance bus isolator activated by OE, with DIR-controlled data path and TAP-controlled PSA for tamper-evidence verification. Use Value: Provides hardware-enforced bus separation plus cryptographically verifiable test signatures via masked PSA on critical I/O lines. | Use Scenario: Managing telemetry data flow between radiation-tolerant memory and command & data handling (C&DH) unit in LEO satellites. IC Role / Device Role / Timing Role: Registered bus transceiver with dual-clock domain synchronization and built-in boundary-scan for in-orbit fault diagnosis. Use Value: Eliminates need for external test fixtures; enables remote JTAG-based health monitoring and reconfiguration without ground intervention. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar octal bus transceiver with boundary-scan applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SNJ54ABT8646FK | Same die, identical pinout and functionality; differs only in screening level (QML-V vs QML-Q). | Qualified to MIL-PRF-38535 Class V (space) instead of Class Q (military); higher reliability screening and lot traceability. | Select SNJ54ABT8646FK for spaceflight-critical subsystems requiring QML-V certification and extended radiation tolerance documentation. |
| 5962-9458602QXA | Complementary part number - same device, different revision level (SCBS123D vs SCBS123F); no functional or parametric differences. | No application impact - identical temperature range, package, and boundary-scan capability; used interchangeably in DoD logistics systems. | Choose 5962-9458602QXA when sourcing from legacy inventory or when matching specific contract revision requirements. |
Compared with SNJ54ABT8646FK and 5962-9458602QXA, the 5962-9458601QXA offers QML-Q qualification optimized for tactical military platforms, whereas SNJ54ABT8646FK targets space missions and 5962-9458602QXA serves as a direct revision-equivalent logistics alternative - all share identical electrical behavior and JTAG architecture.
Availability
5962-9458601QXA is available at Aetrix Electronics and suitable for aerospace avionics backplanes, military radar signal processing, secure communications crypto modules, and spacecraft onboard data handling requiring stable component supply across extended temperature ranges and long production lifecycles.
Supply support for 5962-9458601QXA includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a U.S.-based semiconductor company specializing in analog, embedded processing, and high-reliability military/aerospace components with over 50 years of defense electronics heritage.
The SCOPE™ family - including 5962-9458601QXA - was designed specifically to meet stringent DoD testability requirements for complex circuit-board assemblies, embedding IEEE 1149.1 compliance directly into high-speed bus interface ICs.
FAQ
What is the full military temperature range supported by the 5962-9458601QXA?
The 5962-9458601QXA is characterized for continuous operation from −55°C to +125°C, meeting MIL-PRF-38535 Class Q requirements. This range is validated across all electrical parameters including propagation delay, setup/hold times, and boundary-scan register functionality - ensuring reliable performance in jet engine bays, missile seekers, and ground vehicle electronics without thermal derating.
Does the 5962-9458601QXA support IEEE 1149.1 mandatory instructions?
Yes, the 5962-9458601QXA fully supports all IEEE 1149.1-1990 mandatory instructions: EXTEST, INTEST, SAMPLE/PRELOAD, and BYPASS. It also implements optional HIGHZ and CLAMP instructions per IEEE 1149.1a-1993. All instructions execute via the standard TAP controller with verified state transitions and timing compliance per the SCBS123F datasheet.
How does the 5962-9458601QXA differ from commercial-grade SN74ABT8646 devices?
The 5962-9458601QXA differs from SN74ABT8646 in three key ways: (1) military temperature range (−55°C to +125°C vs −40°C to +85°C), (2) ceramic flatpack (FK) package with hermetic seal vs plastic SOIC/DL packages, and (3) QML-Q qualification per MIL-PRF-38535 with full lot traceability and screening. Functionally and electrically, they are identical in normal mode.
Can the 5962-9458601QXA perform parallel-signature analysis (PSA) on all 16 I/O pins simultaneously?
Yes - the 5962-9458601QXA's 40-bit boundary-scan register includes dedicated input cells for all A1–A8 and B1–B8 pins, enabling true 16-bit parallel-signature analysis. The BCR supports masking individual inputs (via bits 10–3), allowing selective PSA on subsets of pins during system-level diagnostics without modifying hardware.
What clocking scheme does the 5962-9458601QXA use for registered data transfer between A and B buses?
The 5962-9458601QXA uses separate low-to-high edge-triggered clocks: CLKAB controls A→B registered transfer, and CLKBA controls B→A registered transfer. Each clock operates independently, allowing asynchronous domain bridging. Registered mode is selected by asserting SAB = H (A→B) or SBA = H (B→A), while SAB = L/SBA = L enables transparent real-time transfer.
5962-9458601QXA Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- *
- Package/Case:
- -
- Packaging:
- Bulk
- Product Status:
- Active
- Logic Type:
- -
- Number of Elements:
- -
- Number of Bits per Element:
- -
- Input Type:
- -
- Output Type:
- -
- Current - Output High, Low:
- -
- Voltage - Supply:
- -
- Operating Temperature:
- -
- Grade:
- -
- Qualification:
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5962-9458601QXA FAQ
1.How can I place an order for 5962-9458601QXA through Aetrix?
Please submit a Request for Quotation (RFQ) for 5962-9458601QXA on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
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6.How does Aetrix verify that 5962-9458601QXA is sourced from the original manufacturer or authorized distributors?
All 5962-9458601QXA products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 5962-9458601QXA meets industry standards.
7.What is the process for return or replacement of 5962-9458601QXA?
All 5962-9458601QXA units undergo pre-shipment inspection (PSI). If there is an issue with 5962-9458601QXA, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 5962-9458601QXA part is unused and in its original packaging.
Return procedure for 5962-9458601QXA:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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