Analog Devices Inc. 5962-9474301MXA
- Part No.:
- 5962-9474301MXA
- Manufacturer:
- Analog Devices Inc.
- Category:
- Analog to Digital Converters (ADC)
- Package:
- -
- Datasheet:
-
5962-9474301MXA.pdf
- Description:
- IC ADC 16BIT 100KSPS 28CDIP
- Quantity:
- Payment:

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Product details
Overview
5962-9474301MXA from Analog Devices is a 16-bit, 100 kSPS successive-approximation analog-to-digital converter (ADC) with on-chip sample-hold, autocalibration, and parallel output. It delivers ±1 LSB INL (J/A grade), –97 dB THD, 90 dB S/(N+D), 1 MHz full-power bandwidth, and operates from +5 V, ±12 V supplies. It is used in precision instrumentation, automated test equipment, and high-fidelity data acquisition systems requiring stable dc accuracy and dynamic performance.
For engineers reviewing the 5962-9474301MXA datasheet, 5962-9474301MXA pinout, 5962-9474301MXA application, or 5962-9474301MXA equivalent, key selection considerations include its MIL-STD-883–screened ceramic DIP package, dual-chip BiMOS II/DSP CMOS architecture, 10 µs conversion time, twos-complement output coding, and requirement for external 5–10 V reference voltage.
Technical Context
The 5962-9474301MXA implements a switched-capacitor charge-redistribution SAR architecture-eliminating laser-trimmed resistor ladders-and integrates two monolithic dies: an analog ADC chip (BiMOS II) and a digital controller chip (DSP CMOS). Its autocalibration uses an on-chip microcontroller and calibration DAC to measure and store capacitor mismatch corrections in RAM for real-time error compensation.
Conversion is initiated by the falling edge of SAMPLE, followed by 17 CLK cycles; BUSY asserts high during conversion and calibration. The device supports continuous conversion mode, requires separate AGND/DGND planes with single-point interconnection, and mandates strict decoupling: 0.1 µF capacitors placed adjacent to each supply pin (VCC, VEE, VDD) and VREF.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Resolution | 16-bit - guarantees no missing codes across full operating temperature range |
| Sampling Rate | 100 kSPS - enables 10 µs total conversion time with 17-clock-cycle execution |
| INL (Max) | ±1.5 LSB (B grade) - defines worst-case deviation from ideal transfer curve, critical for measurement linearity |
| THD | –97 dB at 100 kSPS, +25°C - limits harmonic distortion in signal processing applications |
| S/(N+D) | 90 dB at 100 kSPS, +25°C - determines usable dynamic range for low-noise ac signal capture |
| Full-Power Bandwidth | 1 MHz - supports accurate digitization of fast-rising bipolar signals up to 1 MHz |
| Supply Voltages | +5 V (VDD), +12 V (VCC), –12 V (VEE) - isolated digital/analog rails minimize crosstalk and enable clean analog front-end operation |
| Reference Input Range | 5 V to 10 V - sets full-scale input span; 10 V reference yields ±10 V analog input range |
Pinout & Package
5962-9474301MXA is housed in a 28-pin side-brazed ceramic DIP (package option D-28), compliant with MIL-STD-883 screening requirements for military and aerospace applications.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| 1–6 | BIT 11–BIT 16 (DO) | LSB data outputs (parallel, twos-complement format); require termination and controlled impedance routing |
| 7 | BUSY (DO) | Active-high status flag indicating conversion or calibration in progress; must be buffered if loaded >1 TTL input |
| 8 | CAL (DI) | Asynchronous hardware reset and calibration trigger; initiates 85,530-clock autocalibration sequence |
| 9 | SAMPLE (DI) | Acquisition control; HIGH enables track mode, falling edge initiates conversion or holds LOW during calibration |
| 10 | CLK (DI) | Master clock input; rising edge drives SAR logic; minimum 480 ns period required for valid timing |
| 11 | DGND (P) | Digital ground reference; must be isolated from AGND except at single-point connection near AD676 |
| 12 | VCC (P) | +12 V analog supply for SHA and ADC core; requires dedicated 0.1 µF bypass to AGND |
| 13 | AGND (P/AI) | Analog ground return; primary reference for VIN, VREF, and internal analog circuitry |
| 14 | AGND SENSE (AI) | High-impedance analog ground sense node; connects to system AGND to compensate for trace IR drop |
| 15 | VIN (AI) | Differential analog input (±VREF range); requires low-noise buffer and matched layout to AGND SENSE |
| 16 | VREF (AI) | External reference voltage input (5–10 V); dictates full-scale range and directly impacts gain error and noise floor |
| 17 | VEE (P) | –12 V analog supply; ceramic package lid is internally tied to VEE - ensure mechanical grounding compliance |
| 18 | VDD (P) | +5 V digital supply for logic outputs and controller; bypassed separately to DGND with 0.1 µF |
| 19–28 | BIT 1–BIT 10 (DO) | MSB data outputs (parallel, twos-complement); BIT 1 = MSB, BIT 10 = MSB-9; routed away from clock/noise sources |
Key Features
| Feature | Design Value |
|---|---|
| On-chip autocalibration | Eliminates need for external trims; stores correction coefficients in on-chip RAM for real-time INL/DNL compensation |
| Integrated sample-hold amplifier | Removes requirement for external SHA; supports 2 µs input settling time and 100 ps aperture jitter |
| Separate analog/digital supplies and grounds | Reduces digital switching noise coupling into analog path; enables >90 dB S/(N+D) performance |
| Capacitor-array SAR architecture | Replaces resistor ladder with binary-weighted capacitors - inherently stable over temperature and process variation |
| MIL-STD-883–qualified ceramic DIP | Ensures reliability in extended temperature (–40°C to +85°C), shock, vibration, and hermeticity-critical environments |
| Twos-complement parallel output | Direct interface to 16-bit microprocessors/DSPs without level-shifting; midscale = 0x0000, full-scale positive = 0x7FFF |
Applications
| Automated Test Equipment (ATE) | Precision DC Measurement Systems |
|---|---|
Use Scenario: High-accuracy voltage/current sourcing and measurement in semiconductor parametric testers and board-level functional testers. IC Role / Device Role / Timing Role: Primary digitizer for feedback-controlled source-monitor loops; samples at 100 kSPS with <±1.5 LSB INL to validate DUT specifications. Use Value: Enables sub-0.01% gain error and <0.005% FSR zero drift over temperature - critical for pass/fail binning accuracy. |
Use Scenario: Digital multimeters and calibration standards requiring traceable dc accuracy and long-term stability. IC Role / Device Role / Timing Role: Core ADC in 6½-digit DMM architectures; leverages autocalibration to maintain ±1 LSB linearity without periodic user recalibration. Use Value: Delivers <0.003% FSR gain drift and <0.0015% FSR zero drift (J grade), meeting ANSI C12.20 Class 0.1 metering requirements. |
| Avionics Sensor Signal Conditioning | High-Fidelity Data Acquisition |
Use Scenario: Digitizing pressure, temperature, and inertial sensor outputs in flight control and health monitoring systems. IC Role / Device Role / Timing Role: Ruggedized ADC in DO-254–compliant modules; operates continuously across –40°C to +85°C with MIL-spec packaging. Use Value: Ceramic DIP package and MIL-STD-883 screening ensure survivability under EMI, thermal cycling, and mechanical stress per RTCA/DO-160. |
Use Scenario: Seismic monitoring, audio analysis, and spectral analysis systems requiring wide dynamic range and low distortion. IC Role / Device Role / Timing Role: Front-end ADC in 24-bit oversampling systems; provides 90 dB S/(N+D) and –97 dB THD at 100 kSPS for clean baseband capture. Use Value: Full-power bandwidth of 1 MHz supports anti-aliasing filter design with <0.1 dB passband ripple up to 400 kHz. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar high-precision SAR ADC applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| AD676BD | Same die, identical electrical specs, but screened to B-grade (–40°C to +85°C) and packaged in same ceramic DIP; not MIL-STD-883 qualified | Lacks military screening - suitable for industrial, not aerospace/defense platforms | Select when full MIL-STD-883 compliance is unnecessary and cost sensitivity outweighs environmental assurance needs |
| ADS8860IDRCT | 16-bit, 1 MSPS SAR ADC with integrated reference; single +3.3 V supply; no ±12 V analog rails or autocalibration | Targets low-power, space-constrained designs; lacks dc stability and noise immunity of dual-supply architecture | Choose for battery-powered or compact instrumentation where throughput >100 kSPS is required and MIL reliability is secondary |
Compared with AD676BD, 5962-9474301MXA adds MIL-STD-883 screening, enhanced burn-in, and lot traceability - essential for mission-critical avionics. Compared with ADS8860IDRCT, it trades higher power and complexity for superior dc accuracy, lower THD, and guaranteed operation across extreme temperatures without external calibration.
Availability
5962-9474301MXA is available at Aetrix Electronics and suitable for precision instrumentation, avionics subsystems, and automated test equipment requiring stable component supply, long-lifecycle support, and MIL-qualified consistency.
Supply support for 5962-9474301MXA includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and digital signal processing semiconductors, headquartered in Wilmington, MA.
The AD676 product line was designed specifically for high-accuracy, wide-dynamic-range data acquisition in military, aerospace, and industrial test systems - emphasizing dc stability, autocalibration, and rugged packaging over raw speed or integration.
FAQ
What is the operating temperature range for the 5962-9474301MXA?
The 5962-9474301MXA is rated for –40°C to +85°C operation and is screened per MIL-STD-883 for extended environmental reliability. This range is validated across all dc and ac specifications including INL, THD, and S/(N+D), with temperature drift coefficients specified for zero and gain error. The 5962-9474301MXA maintains ±1.5 LSB INL and –92 dB THD across this full range, making it suitable for harsh deployment environments where commercial-grade ADCs would degrade.
Does the 5962-9474301MXA require an external voltage reference?
Yes, the 5962-9474301MXA requires an external precision voltage reference applied to the VREF pin, with a supported range of 5 V to 10 V. Reference choice directly determines full-scale input range (±VREF) and impacts gain error, noise floor, and S/(N+D) performance. The 5962-9474301MXA does not include an internal reference; using a low-drift, low-noise reference such as the REF102 or ADR44x series is recommended to achieve datasheet-specified accuracy.
How does autocalibration work in the 5962-9474301MXA?
The 5962-9474301MXA performs autocalibration by measuring capacitor mismatches in its internal charge-redistribution array using an on-chip microcontroller and calibration DAC. Offset and gain errors are captured, stored in on-chip RAM, and applied during subsequent conversions. Calibration is triggered asynchronously via the CAL pin and completes in 85,530 clock cycles. The 5962-9474301MXA achieves full 16-bit linearity only after calibration - uncalibrated operation may fall to ~10-bit effective resolution.
Can the 5962-9474301MXA operate in continuous conversion mode?
Yes, the 5962-9474301MXA supports continuous conversion mode by reasserting SAMPLE while BUSY is still HIGH, enabling overlapping acquisition and conversion. This maximizes throughput to 100 kSPS. Timing must strictly adhere to tSC (SAMPLE LOW to first CLK delay) and tSL (minimum SAMPLE LOW duration) to avoid corruption. The 5962-9474301MXA's BUSY signal remains valid for latching previous data even during the next acquisition phase.
What are the power supply requirements for the 5962-9474301MXA?
The 5962-9474301MXA requires three independent supplies: +5 V (VDD) for digital logic, +12 V (VCC) and –12 V (VEE) for analog circuitry. Supplies must be regulated to ±5% (VCC/VEE) and ±10% (VDD), with <1% ripple. Each supply pin demands local 0.1 µF ceramic bypassing to its respective ground plane (DGND for VDD, AGND for VCC/VEE/VREF). Failure to isolate analog and digital grounds or omit bypassing degrades THD and S/(N+D) by >10 dB.
5962-9474301MXA Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Analog Devices Inc.
- Series:
- -
- Package/Case:
- -
- Packaging:
- Tube
- Product Status:
- Active
- Number of Bits:
- -
- Sampling Rate (Per Second):
- -
- Number of Inputs:
- -
- Input Type:
- -
- Data Interface:
- -
- Configuration:
- -
- Ratio - S/H:ADC:
- -
- Number of A/D Converters:
- -
- Architecture:
- -
- Reference Type:
- -
- Voltage - Supply, Analog:
- -
- Voltage - Supply, Digital:
- -
- Features:
- -
- Operating Temperature:
- -
- Supplier Device Package:
- -
- Mounting Type:
- -
- Grade:
- -
- Qualification:
- -
5962-9474301MXA FAQ
1.How can I place an order for 5962-9474301MXA through Aetrix?
Please submit a Request for Quotation (RFQ) for 5962-9474301MXA on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
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5.How can I obtain technical support or documentation for 5962-9474301MXA?
For technical support, including 5962-9474301MXA datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your 5962-9474301MXA requirements.
6.How does Aetrix verify that 5962-9474301MXA is sourced from the original manufacturer or authorized distributors?
All 5962-9474301MXA products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 5962-9474301MXA meets industry standards.
7.What is the process for return or replacement of 5962-9474301MXA?
All 5962-9474301MXA units undergo pre-shipment inspection (PSI). If there is an issue with 5962-9474301MXA, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 5962-9474301MXA part is unused and in its original packaging.
Return procedure for 5962-9474301MXA:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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