Infineon Technologies 5962F1120102QXA

Overview

5962F1120102QXA from Cypress Semiconductor is a radiation-hardened 72-Mbit QDR® II+ SRAM with RadStop™ technology, configured as 4 M × 18, operating at 250 MHz with DDR interfaces on independent read/write ports, 1.8 V core supply, and 165-ball CCGA package - deployed in spaceborne command/data handling systems requiring latch-up immunity ≥120 MeV·cm²/mg and total ionizing dose tolerance of 300 krad(Si).

For engineers reviewing the 5962F1120102QXA datasheet, 5962F1120102QXA pinout, 5962F1120102QXA application, or 5962F1120102QXA equivalent, this device delivers deterministic four-word burst timing, echo-clock–synchronized data capture, JTAG 1149.1 test access, and DLL-enabled 2-cycle read latency - critical for high-reliability avionics memory subsystems.

Technical Context

The 5962F1120102QXA implements a synchronous pipelined QDR II+ architecture with physically separate read and write data paths, eliminating bus turnaround overhead. It uses dual input clocks (K/K̄) for precise DDR timing, with all inputs registered on K rising edges and outputs registered on K/K̄ rising edges.

Its RadStop™ hardening includes process-level neutron/SEL mitigation and screening per MIL-PRF-38535 Class V, enabling operation at 125 °C under 2.0 × 10⁹ rad(Si)/sec dose rate and survivability up to 1.5 × 10¹¹ rad(Si)/sec. The device supports byte-write select (BWS0/BWS1), QVLD-valid data indication, and DOFF output disable control.

Key Specifications

Pinout & Package

5962F1120102QXA is housed in a 165-ball CCGA package with 21 × 25 ball array and 1.27 mm pitch. Pin functions are defined per MIL-PRF-38535 screening and validated against Cypress Document 001-60007 Rev. *L.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar radiation-hardened QDR SRAM applications.

Compared with 5962F1120102QXA, the 5962R1120101VXA trades speed and timing precision for lower cost and simpler qualification, while the 5962F1220101QXA shifts data-width priority - making the 5962F1120102QXA optimal for 18-bit, 250 MHz, DLL-dependent avionics designs.

Availability

5962F1120102QXA is available at Aetrix Electronics and suitable for onboard command & data handling, satellite telemetry buffering, spacecraft attitude control memory, and radiation-hardened FPGA configuration cache applications requiring stable component supply across extended mission lifetimes.

Supply support for 5962F1120102QXA includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Cypress Semiconductor (now part of Infineon Technologies) is a U.S.-based semiconductor company specializing in high-reliability memory, microcontrollers, and programmable analog/digital ICs for aerospace, defense, and industrial markets.

This device belongs to Cypress's RadHard QDR SRAM product line, engineered specifically for space-qualified systems demanding guaranteed operation under extreme radiation, temperature, and vacuum conditions - with design focus on deterministic timing, latch-up immunity, and TID resilience.

FAQ

What is the maximum allowable dose rate for continuous operation of 5962F1120102QXA?

The device is qualified for continuous operation at dose rates up to 2.0 × 10⁹ rad(Si)/sec and demonstrates survivability at transient levels up to 1.5 × 10¹¹ rad(Si)/sec. These values are verified per MIL-STD-883 TM 1019.8 and documented in Cypress Application Note AN54908. Operation beyond 2.0 × 10⁹ rad(Si)/sec requires derating analysis and is not covered by standard qualification.

Does 5962F1120102QXA support asynchronous reset or power-on initialization sequences?

No - the device relies entirely on synchronous control signals (RPS/WPS, K/K̄) and has no dedicated asynchronous reset pin. Power-up sequencing must follow the strict order specified in Document 001-60007: VDD must stabilize before VDDQ, and clocks must be held inactive until both supplies settle within tolerance. DLL calibration occurs automatically after clock enable.

Can BWS0 and BWS1 be used simultaneously to perform a 16-bit partial write in CYRS1543AV18 configuration?

Yes - BWS0 controls D[8:0] (9 bits) and BWS1 controls D[17:9] (9 bits), allowing independent masking of either or both byte groups. Asserting both BWS0 and BWS1 enables full 18-bit writes; asserting only one performs a 9-bit write to its respective group, leaving the other 9 bits unchanged per the self-timed write architecture.

Is JTAG boundary scan supported during powered operation or only in test mode?

JTAG 1149.1 boundary scan is fully operational during normal powered operation - TCK, TMS, TDI, and TDO remain functional regardless of RPS/WPS state. Scan operations do not interfere with memory access, and the TAP controller runs independently of the memory core, enabling in-system diagnostics without halting mission-critical data flow.