Renesas 70V658S10DRG

Overview

70V658S10DRG from IDT is a high-speed 64K × 36 asynchronous dual-port static RAM with true independent left/right ports, 10 ns max read/write cycle time (commercial grade), LVTTL-compatible 3.3 V core supply, and selectable 3.3 V/2.5 V I/O voltage per port via OPT pins. It enables simultaneous access to the same memory location in systems requiring real-time inter-processor communication, such as telecom line cards and industrial motion controllers.

For engineers reviewing the 70V658S10DRG datasheet, 70V658S10DRG pinout, 70V658S10DRG application, or 70V658S10DRG equivalent, key selection criteria include dual-port arbitration logic, on-chip semaphore signaling, byte-enable granularity for 9-bit data lanes, JTAG IEEE 1149.1 compliance, and support for MASTER/SLAVE cascading to expand bus width beyond 72 bits.

Technical Context

The 70V658S10DRG implements fully asynchronous operation-each port has independent address, control, and bidirectional I/O buses with no shared clocks. Its internal arbitration logic resolves contention using BUSY flag handshaking and M/S-selectable master/slave behavior, where BUSY is an output in MASTER mode (M/S = VIH) and input in SLAVE mode (M/S = VIL).

It integrates dedicated semaphore registers (8 flags addressed by A0–A2) accessible via either port, with separate SEM enable inputs and non-tri-state totem-pole BUSY/INT outputs. The device supports depth expansion via dual chip enables (CE0/CE1) and data-width expansion using IDT70V659/58/57 family compatibility, where A16 is NC and A15 is NC-confirming its 64K × 36 configuration (2^16 = 65,536 words × 36 bits).

Key Specifications

Pinout & Package

70V658S10DRG is packaged in a 208-pin Plastic Quad Flatpack (PQFP), body size ≈ 28 mm × 28 mm × 3.5 mm, with 0.5 mm lead pitch. All VDD pins require connection to 3.3 V; VDDQL/VDDQR must match OPTL/OPTR settings (3.3 V if OPT = VDD, 2.5 V if OPT = VSS); all VSS pins connect to ground.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar dual-port SRAM applications.

Compared with 70V659S10DRG, the 70V658S10DRG saves board space and simplifies address decoding by omitting A16; compared with CY7C1362BV33-10BGXI, it delivers integrated arbitration and voltage flexibility-reducing BOM count and validation effort in complex embedded systems.

Availability

70V658S10DRG is available at Aetrix Electronics and suitable for telecom infrastructure, industrial automation, and medical imaging systems requiring stable component supply, long-term lifecycle support, and traceable sourcing.

Supply support for 70V658S10DRG includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

IDT (Integrated Device Technology) is a fabless semiconductor company specializing in high-performance timing, memory interface, and RF solutions, now part of Renesas Electronics.

The IDT70V658 product line delivers high-speed asynchronous dual-port SRAMs optimized for real-time inter-processor communication in telecom, industrial, and aerospace systems-emphasizing deterministic latency, hardware arbitration, and mixed-voltage interoperability.

FAQ

What is the memory organization of the 70V658S10DRG?

The 70V658S10DRG is organized as 64K × 36 (65,536 words × 36 bits). This is confirmed by datasheet notes stating A16 is a no-connect (NC) for IDT70V658, limiting addressing to 16 bits. The device supports two independent 36-bit data ports, enabling simultaneous access to any memory location without contention delay when arbitration is properly managed via BUSY/SEM signals. Its 70V658S10DRG configuration targets mid-density dual-processor buffering applications.

Does the 70V658S10DRG support JTAG boundary-scan testing?

Yes, the 70V658S10DRG includes full IEEE 1149.1-compliant JTAG test access port with dedicated TCK, TMS, TDI, TDO, and TRST pins. This enables boundary-scan testing for interconnect verification, fault isolation, and in-system programming support. The JTAG functionality is documented in the functional block diagram and pin table, and operates independently of memory access modes - making 70V658S10DRG suitable for high-reliability production test environments.

How does the BUSY signal operate in MASTER vs. SLAVE mode on the 70V658S10DRG?

On the 70V658S10DRG, the BUSY signal behavior depends on the M/S pin state: when M/S = VIH, the device operates as MASTER and BUSYL/BUSYR are totem-pole outputs that assert during port contention; when M/S = VIL, it operates as SLAVE and BUSYL/BUSYR become inputs used to stall write operations until the MASTER releases the resource. This dual-role design eliminates external arbitration logic - a key differentiator of the 70V658S10DRG in tightly coupled multi-CPU architectures.

Can the left and right ports of the 70V658S10DRG operate at different I/O voltages?

Yes, the 70V658S10DRG supports independent I/O voltage selection per port: OPTL sets the left port's I/O voltage (3.3 V if tied to VDD, 2.5 V if tied to VSS), and OPTR does the same for the right port. Corresponding VDDQL and VDDQR supplies must match these selections. This capability allows the 70V658S10DRG to interface directly with heterogeneous logic families - for example, connecting a 3.3 V ARM processor to a 2.5 V FPGA - without level translators, reducing signal integrity risk and BOM cost.

What is the maximum operating temperature range for the 70V658S10DRG?

The 70V658S10DRG is rated for commercial temperature operation from 0°C to +70°C, as indicated by the "S10" speed grade suffix and confirmed in the "Maximum Operating Temperature and Supply Voltage" table. It is not qualified for industrial (–40°C to +85°C) operation - that grade is available in the 70V658S12 variant. Designers selecting 70V658S10DRG must ensure ambient thermal conditions remain within this commercial envelope to maintain 10 ns timing compliance and reliability.