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Renesas 71T75602S166PFG8

Part No.:
71T75602S166PFG8
Manufacturer:
Renesas
Category:
Memory
Package:
100-LQFP
Datasheet:
Aetrix71T75602S166PFG8.pdf
Description:
IC SRAM 18MBIT PARALLEL 100TQFP
Quantity:
Payment:
Payment
Shipping:
Shipping

Inventory:2,132

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Product details

Overview

71T75602S166PFG8 from IDT (now Renesas) is a 2.5V synchronous ZBT™ SRAM with 512K × 36-bit organization (18 Mbit), 200 MHz operation, 3.2 ns clock-to-data access, zero bus turnaround architecture, and JEDEC-standard 100-pin TQFP package. It serves as high-speed buffer/cache in network packet processors and telecom line cards requiring deterministic burst read/write without dead cycles.

For engineers reviewing the 71T75602S166PFG8 datasheet, 71T75602S166PFG8 pinout, 71T75602S166PFG8 application, or 71T75602S166PFG8 equivalent, key selection criteria include ZBT™ burst timing compliance, 4-word interleaved/linear burst capability, 2.5V I/O supply (VDDQ), individual byte write control (BW1–BW4), and IEEE 1149.1 JTAG boundary scan support for system-level testability.

Technical Context

The 71T75602S166PFG8 implements a fully pipelined synchronous interface with positive-edge-triggered registers for address, data, and control signals. Its on-chip burst counter enables 4-word burst sequences-configurable via LBO pin for linear or interleaved order-and eliminates bus turnaround latency between consecutive reads and writes.

It features three chip enables (CE1, CE2 active-low; CE2 active-high) for depth expansion, internal output buffer synchronization (removing OE timing constraints), and a dedicated ZZ input for synchronous sleep mode with guaranteed data retention. All synchronous operations are referenced to CLK rising edge; OE remains the sole asynchronous signal.

Key Specifications

ParameterValue and Actual Design Meaning
Memory Organization512K × 36-bit (18,874,368-bit capacity); supports full-word or byte-selectable writes
Clock Frequency200 MHz maximum; enables 5 ns cycle time for high-throughput memory access
Access Time3.2 ns clock-to-data (tCD); ensures deterministic output valid timing for pipelined systems
Supply VoltagesVDD = 2.5 V ±5% (core); VDDQ = 2.5 V ±5% (I/O); enables low-power, noise-immune signaling
Burst Capability4-word burst (interleaved or linear); reduces address bus traffic and improves bandwidth efficiency
Temperature RangeIndustrial grade: –40°C to +85°C; qualified for embedded telecom and industrial control environments
JTAG SupportIEEE 1149.1-compliant boundary scan; enables board-level test and debug without external probes

Pinout & Package

Packaged in JEDEC-standard 100-pin plastic thin quad flatpack (TQFP), 14 mm × 20 mm body, 0.5 mm pitch. Pinout validated per IDT document 5313 drw 02r for 512K × 36 configuration.

Pin/TerminalCircuit RoleDesign Meaning
CLKClock InputSynchronous timing reference; all register updates occur on rising edge
A0–A18Address Inputs19-bit address bus for 512K-depth addressing; registered on rising CLK with ADV/LD low
R/WRead/Write ControlSynchronous command; determines load-cycle direction (read or write) at burst initiation
ADV/LDBurst Counter ControlLow = load external address; High = increment internal burst counter; defines burst sequence trigger
LBOBurst Order SelectStatic input; Low = linear burst (A0, A1, A2, A3); High = interleaved burst (A0, A1, A2, A3 per IEEE Std)
BW1–BW4Byte Write EnablesActive-low per-byte controls for 9-bit segments (I/O[0:7]+I/OP1 through I/O[24:31]+I/OP4)
CE1, CE2, CE2Chip EnablesThree independent enables (CE1/CE2 low, CE2 high) for multi-SRAM depth expansion
I/O0–I/O31, I/OP1–I/OP4Data I/O Bus36-bit bidirectional synchronous data path; registered inputs/outputs aligned to CLK edge
ZZSleep Mode InputActive-high synchronous entry into low-power state; clocks gated internally; data retained
TMS, TDI, TCK, TDOJTAG Test InterfaceBoundary scan controller pins; enable IEEE 1149.1 test access without functional interference

Key Features

FeatureDesign Value
ZBTTM Zero Bus TurnaroundEliminates dead cycles between read/write transitions-enables back-to-back burst transfers at full clock rate
Internally Synchronized OERemoves OE timing constraints; outputs enabled/disabled synchronously with CLK-no external OE strobing required
4-Word Burst CounterReduces address bus activity by 75% per burst; supports both linear and interleaved sequences via LBO pin
Individual Byte Write ControlEnables selective 9-bit writes without masking logic; BW1–BW4 allow partial-word updates in cache or FIFO applications
Three Chip EnablesSupports seamless depth expansion across multiple 71T75602 devices without external decode logic
IEEE 1149.1 JTAG Boundary ScanProvides structural test coverage for PCB interconnects and SRAM I/O pins-critical for high-reliability telecom systems

Applications

Packet Buffer in Network Switch ASICLine Card Data Cache in Telecom Equipment

Use Scenario: Storing ingress/egress packet headers and metadata in multi-gigabit Ethernet switch fabric.

IC Role / Device Role / Timing Role: High-speed dual-port buffer with zero-turnaround burst reads/writes synchronized to switch fabric clock.

Use Value: 200 MHz operation and 3.2 ns tCD ensure sub-10 ns latency for header lookup and rewrite-meeting strict switch fabric timing budgets.

Use Scenario: Caching real-time voice/video frame buffers in carrier-grade SDH/SONET line cards.

IC Role / Device Role / Timing Role: Deterministic latency SRAM supporting 4-word interleaved bursts for frame assembly/disassembly engines.

Use Value: Linear/interleaved burst modes align with ATM or GFP framing structures-reducing CPU overhead and improving throughput by 4× vs. single-word access.

Control Plane Memory in Base Station ControllersReal-Time Data Logger in Industrial PLCs

Use Scenario: Storing protocol stack state tables and routing tables in LTE/5G baseband control units.

IC Role / Device Role / Timing Role: Synchronous SRAM interfaced to ARM Cortex-A processor via AMBA AXI with burst coherency.

Use Value: Individual byte write (BW1–BW4) enables atomic updates of TCP/IP state fields without full-word overwrite-preserving cache line integrity.

Use Scenario: Capturing sensor timestamped samples at 100 kSPS in ruggedized programmable logic controllers.

IC Role / Device Role / Timing Role: Buffered acquisition memory with sleep mode (ZZ) for power-gated logging intervals.

Use Value: Industrial temperature range (–40°C to +85°C) and 2.5V supplies ensure reliable operation in uncooled enclosures; ZZ pin reduces idle power by >60%.

Equivalent & Alternatives

The following parts are listed as comparable options for similar synchronous SRAM applications.

Alternative PartTechnical DifferenceApplication DifferenceSelection Advice
CY7C1362KV181M × 18 organization (same density), 166 MHz max, 3.5 ns tCD, 3.3V core/I/ORequires level-shifting for 2.5V systems; lacks ZBT™ zero-turnaround-introduces 1-cycle gap between R/WSelect only if legacy 3.3V infrastructure exists and burst turnaround latency is acceptable
AS7C331024B1M × 36 organization, 166 MHz, 4.5 ns tCD, 3.3V-only, no JTAG or burst counterNo burst capability or ZBT™; requires external burst logic; no IEEE 1149.1 test supportUse only in cost-sensitive, non-burst, non-test-critical applications where 3.3V compatibility is mandatory

Compared with CY7C1362KV18 and AS7C331024B, the 71T75602S166PFG8 delivers superior timing determinism (3.2 ns tCD, zero-turnaround), native 2.5V operation, and integrated JTAG-making it the only choice for new designs requiring high-speed burst coherence and production testability.

Availability

71T75602S166PFG8 is available at Aetrix Electronics and suitable for network packet processing, telecom line card buffering, and industrial real-time data logging requiring stable component supply, long-term lifecycle support, and traceable sourcing.

Supply support for 71T75602S166PFG8 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

IDT (Integrated Device Technology), now part of Renesas Electronics, is a fabless semiconductor company specializing in high-performance timing, memory interface, and RF solutions for communications and computing markets.

The 71T75602S166PFG8 belongs to IDT's ZBT™ SRAM product line-designed specifically for zero-latency, burst-oriented applications in networking, telecom infrastructure, and high-end embedded systems demanding deterministic memory access.

FAQ

What memory organization does the 71T75602S166PFG8 support?

The 71T75602S166PFG8 is configured as 512K × 36-bit (18 Mbit total), providing 36-bit wide data I/O with individual byte write enables (BW1–BW4). It does not support 1M × 18 mode-this is implemented in the pin-compatible 71T75802 variant. The 71T75602S166PFG8 uses address pins A0–A18 exclusively.

Does the 71T75602S166PFG8 require external OE control?

No-the 71T75602S166PFG8 features internally synchronized output enable logic. OE is asynchronous but can be tied low permanently in most designs; the device automatically tri-states outputs during deselect or write cycles without external timing management. This simplifies PCB layout and eliminates OE skew concerns.

How is burst order selected on the 71T75602S166PFG8?

Burst order is controlled by the LBO (Linear Burst Order) pin: LBO = LOW selects linear burst (A0, A1, A2, A3); LBO = HIGH selects interleaved burst (A0, A1, A2, A3 per IEEE standard). LBO is a static input and must remain stable during burst operation-changing it mid-burst causes undefined behavior.

What is the function of the ZZ pin on the 71T75602S166PFG8?

The ZZ pin enables synchronous sleep mode: when driven HIGH, it gates the internal clock and reduces power consumption to minimum while guaranteeing data retention. ZZ is sampled synchronously on CLK rising edge; it has an internal pulldown resistor, so floating = inactive. This feature is essential for power-constrained telecom and industrial applications.

Is JTAG boundary scan supported on the 71T75602S166PFG8 in TQFP package?

Yes-the 71T75602S166PFG8 includes full IEEE 1149.1 JTAG boundary scan support in its 100-pin TQFP package. Pins TMS, TDI, TCK, and TDO are assigned to pins 38, 39, 43, and 42 respectively (per 5313 drw 02r), enabling structural test and debug without functional interference.

71T75602S166PFG8 Specifications

Product attributes
Attribute value
Manufacturer:
Renesas
Series:
-
Package/Case:
100-LQFP
Packaging:
Tape & Reel (TR)
Product Status:
Obsolete
Programmable:
Not Verified
Memory Type:
Volatile
Memory Format:
SRAM
Technology:
SRAM - Synchronous, SDR (ZBT)
Memory Size:
18Mbit
Memory Organization:
512K x 36
Memory Interface:
Parallel
Clock Frequency:
166 MHz
Write Cycle Time - Word, Page:
-
Access Time:
3.5 ns
Voltage - Supply:
2.375V ~ 2.625V
Operating Temperature:
0°C ~ 70°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
100-TQFP (14x20)

71T75602S166PFG8 FAQ

1.How can I place an order for 71T75602S166PFG8 through Aetrix?

Please submit a Request for Quotation (RFQ) for 71T75602S166PFG8 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for 71T75602S166PFG8 reliable?

The price and inventory of 71T75602S166PFG8 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for 71T75602S166PFG8 is usually 5 days.

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71T75602S166PFG8 orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your 71T75602S166PFG8 order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for 71T75602S166PFG8?

For technical support, including 71T75602S166PFG8 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your 71T75602S166PFG8 requirements.

6.How does Aetrix verify that 71T75602S166PFG8 is sourced from the original manufacturer or authorized distributors?

All 71T75602S166PFG8 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 71T75602S166PFG8 meets industry standards.

7.What is the process for return or replacement of 71T75602S166PFG8?

All 71T75602S166PFG8 units undergo pre-shipment inspection (PSI). If there is an issue with 71T75602S166PFG8, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The 71T75602S166PFG8 part is unused and in its original packaging.

Return procedure for 71T75602S166PFG8:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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