Renesas 71T75602S166PFG8
- Part No.:
- 71T75602S166PFG8
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- 100-LQFP
- Datasheet:
-
71T75602S166PFG8.pdf
- Description:
- IC SRAM 18MBIT PARALLEL 100TQFP
- Quantity:
- Payment:

- Shipping:

Inventory:2,132
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
71T75602S166PFG8 from IDT (now Renesas) is a 2.5V synchronous ZBT™ SRAM with 512K × 36-bit organization (18 Mbit), 200 MHz operation, 3.2 ns clock-to-data access, zero bus turnaround architecture, and JEDEC-standard 100-pin TQFP package. It serves as high-speed buffer/cache in network packet processors and telecom line cards requiring deterministic burst read/write without dead cycles.
For engineers reviewing the 71T75602S166PFG8 datasheet, 71T75602S166PFG8 pinout, 71T75602S166PFG8 application, or 71T75602S166PFG8 equivalent, key selection criteria include ZBT™ burst timing compliance, 4-word interleaved/linear burst capability, 2.5V I/O supply (VDDQ), individual byte write control (BW1–BW4), and IEEE 1149.1 JTAG boundary scan support for system-level testability.
Technical Context
The 71T75602S166PFG8 implements a fully pipelined synchronous interface with positive-edge-triggered registers for address, data, and control signals. Its on-chip burst counter enables 4-word burst sequences-configurable via LBO pin for linear or interleaved order-and eliminates bus turnaround latency between consecutive reads and writes.
It features three chip enables (CE1, CE2 active-low; CE2 active-high) for depth expansion, internal output buffer synchronization (removing OE timing constraints), and a dedicated ZZ input for synchronous sleep mode with guaranteed data retention. All synchronous operations are referenced to CLK rising edge; OE remains the sole asynchronous signal.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 512K × 36-bit (18,874,368-bit capacity); supports full-word or byte-selectable writes |
| Clock Frequency | 200 MHz maximum; enables 5 ns cycle time for high-throughput memory access |
| Access Time | 3.2 ns clock-to-data (tCD); ensures deterministic output valid timing for pipelined systems |
| Supply Voltages | VDD = 2.5 V ±5% (core); VDDQ = 2.5 V ±5% (I/O); enables low-power, noise-immune signaling |
| Burst Capability | 4-word burst (interleaved or linear); reduces address bus traffic and improves bandwidth efficiency |
| Temperature Range | Industrial grade: –40°C to +85°C; qualified for embedded telecom and industrial control environments |
| JTAG Support | IEEE 1149.1-compliant boundary scan; enables board-level test and debug without external probes |
Pinout & Package
Packaged in JEDEC-standard 100-pin plastic thin quad flatpack (TQFP), 14 mm × 20 mm body, 0.5 mm pitch. Pinout validated per IDT document 5313 drw 02r for 512K × 36 configuration.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| CLK | Clock Input | Synchronous timing reference; all register updates occur on rising edge |
| A0–A18 | Address Inputs | 19-bit address bus for 512K-depth addressing; registered on rising CLK with ADV/LD low |
| R/W | Read/Write Control | Synchronous command; determines load-cycle direction (read or write) at burst initiation |
| ADV/LD | Burst Counter Control | Low = load external address; High = increment internal burst counter; defines burst sequence trigger |
| LBO | Burst Order Select | Static input; Low = linear burst (A0, A1, A2, A3); High = interleaved burst (A0, A1, A2, A3 per IEEE Std) |
| BW1–BW4 | Byte Write Enables | Active-low per-byte controls for 9-bit segments (I/O[0:7]+I/OP1 through I/O[24:31]+I/OP4) |
| CE1, CE2, CE2 | Chip Enables | Three independent enables (CE1/CE2 low, CE2 high) for multi-SRAM depth expansion |
| I/O0–I/O31, I/OP1–I/OP4 | Data I/O Bus | 36-bit bidirectional synchronous data path; registered inputs/outputs aligned to CLK edge |
| ZZ | Sleep Mode Input | Active-high synchronous entry into low-power state; clocks gated internally; data retained |
| TMS, TDI, TCK, TDO | JTAG Test Interface | Boundary scan controller pins; enable IEEE 1149.1 test access without functional interference |
Key Features
| Feature | Design Value |
|---|---|
| ZBTTM Zero Bus Turnaround | Eliminates dead cycles between read/write transitions-enables back-to-back burst transfers at full clock rate |
| Internally Synchronized OE | Removes OE timing constraints; outputs enabled/disabled synchronously with CLK-no external OE strobing required |
| 4-Word Burst Counter | Reduces address bus activity by 75% per burst; supports both linear and interleaved sequences via LBO pin |
| Individual Byte Write Control | Enables selective 9-bit writes without masking logic; BW1–BW4 allow partial-word updates in cache or FIFO applications |
| Three Chip Enables | Supports seamless depth expansion across multiple 71T75602 devices without external decode logic |
| IEEE 1149.1 JTAG Boundary Scan | Provides structural test coverage for PCB interconnects and SRAM I/O pins-critical for high-reliability telecom systems |
Applications
| Packet Buffer in Network Switch ASIC | Line Card Data Cache in Telecom Equipment |
|---|---|
Use Scenario: Storing ingress/egress packet headers and metadata in multi-gigabit Ethernet switch fabric. IC Role / Device Role / Timing Role: High-speed dual-port buffer with zero-turnaround burst reads/writes synchronized to switch fabric clock. Use Value: 200 MHz operation and 3.2 ns tCD ensure sub-10 ns latency for header lookup and rewrite-meeting strict switch fabric timing budgets. | Use Scenario: Caching real-time voice/video frame buffers in carrier-grade SDH/SONET line cards. IC Role / Device Role / Timing Role: Deterministic latency SRAM supporting 4-word interleaved bursts for frame assembly/disassembly engines. Use Value: Linear/interleaved burst modes align with ATM or GFP framing structures-reducing CPU overhead and improving throughput by 4× vs. single-word access. |
| Control Plane Memory in Base Station Controllers | Real-Time Data Logger in Industrial PLCs |
Use Scenario: Storing protocol stack state tables and routing tables in LTE/5G baseband control units. IC Role / Device Role / Timing Role: Synchronous SRAM interfaced to ARM Cortex-A processor via AMBA AXI with burst coherency. Use Value: Individual byte write (BW1–BW4) enables atomic updates of TCP/IP state fields without full-word overwrite-preserving cache line integrity. | Use Scenario: Capturing sensor timestamped samples at 100 kSPS in ruggedized programmable logic controllers. IC Role / Device Role / Timing Role: Buffered acquisition memory with sleep mode (ZZ) for power-gated logging intervals. Use Value: Industrial temperature range (–40°C to +85°C) and 2.5V supplies ensure reliable operation in uncooled enclosures; ZZ pin reduces idle power by >60%. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C1362KV18 | 1M × 18 organization (same density), 166 MHz max, 3.5 ns tCD, 3.3V core/I/O | Requires level-shifting for 2.5V systems; lacks ZBT™ zero-turnaround-introduces 1-cycle gap between R/W | Select only if legacy 3.3V infrastructure exists and burst turnaround latency is acceptable |
| AS7C331024B | 1M × 36 organization, 166 MHz, 4.5 ns tCD, 3.3V-only, no JTAG or burst counter | No burst capability or ZBT™; requires external burst logic; no IEEE 1149.1 test support | Use only in cost-sensitive, non-burst, non-test-critical applications where 3.3V compatibility is mandatory |
Compared with CY7C1362KV18 and AS7C331024B, the 71T75602S166PFG8 delivers superior timing determinism (3.2 ns tCD, zero-turnaround), native 2.5V operation, and integrated JTAG-making it the only choice for new designs requiring high-speed burst coherence and production testability.
Availability
71T75602S166PFG8 is available at Aetrix Electronics and suitable for network packet processing, telecom line card buffering, and industrial real-time data logging requiring stable component supply, long-term lifecycle support, and traceable sourcing.
Supply support for 71T75602S166PFG8 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
IDT (Integrated Device Technology), now part of Renesas Electronics, is a fabless semiconductor company specializing in high-performance timing, memory interface, and RF solutions for communications and computing markets.
The 71T75602S166PFG8 belongs to IDT's ZBT™ SRAM product line-designed specifically for zero-latency, burst-oriented applications in networking, telecom infrastructure, and high-end embedded systems demanding deterministic memory access.
FAQ
What memory organization does the 71T75602S166PFG8 support?
The 71T75602S166PFG8 is configured as 512K × 36-bit (18 Mbit total), providing 36-bit wide data I/O with individual byte write enables (BW1–BW4). It does not support 1M × 18 mode-this is implemented in the pin-compatible 71T75802 variant. The 71T75602S166PFG8 uses address pins A0–A18 exclusively.
Does the 71T75602S166PFG8 require external OE control?
No-the 71T75602S166PFG8 features internally synchronized output enable logic. OE is asynchronous but can be tied low permanently in most designs; the device automatically tri-states outputs during deselect or write cycles without external timing management. This simplifies PCB layout and eliminates OE skew concerns.
How is burst order selected on the 71T75602S166PFG8?
Burst order is controlled by the LBO (Linear Burst Order) pin: LBO = LOW selects linear burst (A0, A1, A2, A3); LBO = HIGH selects interleaved burst (A0, A1, A2, A3 per IEEE standard). LBO is a static input and must remain stable during burst operation-changing it mid-burst causes undefined behavior.
What is the function of the ZZ pin on the 71T75602S166PFG8?
The ZZ pin enables synchronous sleep mode: when driven HIGH, it gates the internal clock and reduces power consumption to minimum while guaranteeing data retention. ZZ is sampled synchronously on CLK rising edge; it has an internal pulldown resistor, so floating = inactive. This feature is essential for power-constrained telecom and industrial applications.
Is JTAG boundary scan supported on the 71T75602S166PFG8 in TQFP package?
Yes-the 71T75602S166PFG8 includes full IEEE 1149.1 JTAG boundary scan support in its 100-pin TQFP package. Pins TMS, TDI, TCK, and TDO are assigned to pins 38, 39, 43, and 42 respectively (per 5313 drw 02r), enabling structural test and debug without functional interference.
71T75602S166PFG8 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- -
- Package/Case:
- 100-LQFP
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, SDR (ZBT)
- Memory Size:
- 18Mbit
- Memory Organization:
- 512K x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 166 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 3.5 ns
- Voltage - Supply:
- 2.375V ~ 2.625V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 100-TQFP (14x20)
71T75602S166PFG8 FAQ
1.How can I place an order for 71T75602S166PFG8 through Aetrix?
Please submit a Request for Quotation (RFQ) for 71T75602S166PFG8 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for 71T75602S166PFG8 reliable?
The price and inventory of 71T75602S166PFG8 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for 71T75602S166PFG8 is usually 5 days.
3.What payment methods are accepted for 71T75602S166PFG8?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for 71T75602S166PFG8 transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for 71T75602S166PFG8?
71T75602S166PFG8 orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your 71T75602S166PFG8 order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for 71T75602S166PFG8?
For technical support, including 71T75602S166PFG8 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your 71T75602S166PFG8 requirements.
6.How does Aetrix verify that 71T75602S166PFG8 is sourced from the original manufacturer or authorized distributors?
All 71T75602S166PFG8 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 71T75602S166PFG8 meets industry standards.
7.What is the process for return or replacement of 71T75602S166PFG8?
All 71T75602S166PFG8 units undergo pre-shipment inspection (PSI). If there is an issue with 71T75602S166PFG8, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 71T75602S166PFG8 part is unused and in its original packaging.
Return procedure for 71T75602S166PFG8:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
71T75602S166PFG8 Tags

-
M24C02-WMN6TP
STMicroelectronics
-
AT24C02C-XHM-T
Microchip Technology

-
AT21CS01-STUM10-T
Microchip Technology

-
AT24C02C-SSHM-T
Microchip Technology

-
24LC01BT-I/OT
Microchip Technology
-
M24C02-FMC6TG
STMicroelectronics

-
AT24CS02-SSHM-T
Microchip Technology

-
93LC46BT-I/OT
Microchip Technology

-
AT24C04C-SSHM-T
Microchip Technology

-
24LC01BT-I/SN
Microchip Technology

-
24AA02UIDT-I/OT
Microchip Technology

-
AT24C08C-STUM-T
Microchip Technology
Tech Hub
TTL and CMOS logic families differ in thresholds, loading, output drive, power and timing. This engineering guide compares 74HC and 74HCT, calculates noise margins and checks 3.3 V/5 V compatibility.
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…

