Renesas 71V2556SA133BGG8
- Part No.:
- 71V2556SA133BGG8
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- 119-BGA
- Datasheet:
-
71V2556SA133BGG8.pdf
- Description:
- IC SRAM 4.5MBIT PAR 119PBGA
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
71V2556SA133BGG8 from IDT (now Renesas) is a 3.3V synchronous ZBT™ SRAM with 128K × 36-bit organization (4.5 Mbit), 166 MHz operation (3.5 ns clock-to-data access), pipelined outputs, and zero-bus-turnaround architecture for high-throughput memory subsystems in network packet buffers and telecom switching fabrics.
For engineers reviewing the 71V2556SA133BGG8 datasheet, 71V2556SA133BGG8 pinout, 71V2556SA133BGG8 application, or 71V2556SA133BGG8 equivalent, key selection criteria include burst-mode timing compliance, 2.5V I/O voltage tolerance, JTAG testability support, and BGA-119 package thermal/mechanical suitability for high-density PCB layouts.
Technical Context
This device implements a fully synchronous, clock-edge-triggered interface with address/data/control registers, an on-chip 4-word burst counter (linear or interleaved via LBO), and internally synchronized OE to eliminate external output-enable timing constraints. It supports depth expansion using three independent chip enables (CE1/CE2/CE2).
The architecture features individual byte-write control (BW1–BW4), clock enable (CEN) for cycle suspension, and optional IEEE 1149.1 JTAG boundary scan. All inputs are registered on the positive clock edge; data output is pipelined with deterministic 2-cycle latency from address load.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 128K × 36-bit (4.5 Mbit); supports 36-bit wide data path without external multiplexing |
| Max Clock Frequency | 166 MHz; enables 166 MT/s sustained throughput in pipelined read/write sequences |
| Clock-to-Data Access | 3.5 ns; defines minimum latency from CLK rise to valid Q output in read cycles |
| I/O Voltage | 2.5 V (VDDQ); decouples I/O signaling from core 3.3 V supply for noise isolation and compatibility with 2.5 V logic families |
| Supply Voltage | 3.3 V ±5% (VDD); standard core rail compatible with common system power domains |
| Operating Temperature | –40°C to +85°C; qualified for industrial-grade deployment in base station and infrastructure equipment |
| Package | 119-ball BGA (BGG), 14 mm × 20 mm footprint; optimized for thermal dissipation and high-pin-count routing in dense designs |
Pinout & Package
71V2556SA133BGG8 is packaged in a JEDEC-standard 119-ball grid array (BGA), designated BGG119, with 1.27 mm ball pitch and Pb-free finish. The package supports automated optical inspection and reflow-compatible assembly.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A16 | Address Inputs | 17-bit address bus; selects one of 128K locations; sampled on rising CLK edge |
| CLK | System Clock Input | Positive-edge-triggered master timing reference for all synchronous operations |
| R/W | Read/Write Control | Single pin determines cycle direction; latched at CLK edge to define burst sequence type |
| ADV/LD | Address Load/Burst Counter Advance | Low = load external address; High = increment internal burst counter |
| LBO | Burst Order Select | Drives linear (LBO = VSS) or interleaved (LBO = VDD) 4-word burst addressing |
| BW1–BW4 | Byte Write Enables | Independent 8-bit write masking; each active low enables corresponding I/O[7:0]–I/O[31:24] |
| CE1, CE2, CE2 | Chip Enable Inputs | Three enables allow hierarchical depth expansion; any false disables new operations but completes pending transfers |
| I/O[0:31], I/OP[1:4] | Data I/O Bus | 36-bit bidirectional data path (32 data + 4 parity); operates at 2.5 V I/O level |
| VDD, VDDQ, VSS | Power Supplies | VDD = 3.3 V core; VDDQ = 2.5 V I/O; VSS = common ground; dedicated balls per supply domain |
| TMS, TDI, TCK, TDO, TRST | JTAG Boundary Scan | IEEE 1149.1-compliant test interface; optional on SA version; supports production test and debug |
Key Features
| Feature | Design Value |
|---|---|
| ZBT™ Architecture | Eliminates dead cycles between read/write transitions - enables back-to-back burst transfers without bus turnaround penalty |
| Pipelined Output Buffer | Internally synchronized OE removes need for external timing control; outputs align deterministically to CLK edge |
| 4-Word Burst Capability | Single address initiates four consecutive data transfers; reduces address bus traffic and improves bandwidth efficiency |
| Individual Byte Write Control | BW1–BW4 allow granular 8-bit writes without read-modify-write overhead - critical for packet header updates |
| JTAG Test Support | Optional IEEE 1149.1 boundary scan (SA version) enables structural testing and interconnect verification in assembled systems |
Applications
| Network Packet Buffer | Telecom Switch Fabric |
|---|---|
Use Scenario: Storing and forwarding variable-length Ethernet/IP packets in line cards with strict latency budgets. IC Role / Device Role / Timing Role: High-speed dual-port buffer providing zero-turnaround read-after-write for header modification and payload reassembly. Use Value: 3.5 ns clock-to-data and 166 MHz burst throughput meet sub-100 ns round-trip latency requirements for 10G+ switch ASIC interfaces. |
Use Scenario: Interfacing with multi-gigabit switch fabric controllers requiring burst-aligned data staging. IC Role / Device Role / Timing Role: Synchronous pipeline stage for cell/packet buffering between ingress and egress scheduler logic. Use Value: 4-word linear/interleaved burst mode matches fabric controller burst widths, eliminating address setup overhead per transfer. |
| Base Station Baseband Processing | Industrial Real-Time Controller |
Use Scenario: Temporary storage of OFDM symbol data during channel estimation and precoding in LTE/5G radio units. IC Role / Device Role / Timing Role: Low-latency, deterministic-access memory for time-critical DSP data exchange between FPGA and ASIC blocks. Use Value: Industrial temperature rating (–40°C to +85°C) and 2.5 V I/O ensure reliable operation in uncontrolled outdoor cabinet environments. |
Use Scenario: High-reliability data logging and motion control loop buffering in CNC and PLC systems. IC Role / Device Role / Timing Role: Deterministic-access scratchpad memory for real-time task context switching and sensor fusion preprocessing. Use Value: CEN pin allows precise clock gating during idle periods; JTAG support enables field-upgradeable firmware validation. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C1355BV33-133BZI | 128K × 36, 133 MHz max, 3.3 V core/2.5 V I/O, no JTAG, TQFP-100 only | Lacks burst counter and ZBT optimization; limited to lower-frequency control-plane buffering | Select when JTAG testability and 166 MHz throughput are not required; lower cost for non-critical paths |
| AS7C3256B-133BIN | 128K × 32, 133 MHz, 3.3 V only (no VDDQ separation), no burst counter, no JTAG, TSOP-II-100 | 32-bit width requires external parity handling; lacks ZBT and pipelined OE; higher I/O noise coupling | Use where board space permits TSOP packaging and system-level parity generation is acceptable |
Compared with CY7C1355BV33-133BZI and AS7C3256B-133BIN, the 71V2556SA133BGG8 delivers higher bandwidth (166 vs. 133 MHz), true zero-bus-turnaround operation, integrated burst counter, and JTAG testability - making it uniquely suited for latency-sensitive, high-reliability telecom and infrastructure memory subsystems.
Availability
71V2556SA133BGG8 is available at Aetrix Electronics and suitable for network packet buffers, telecom switch fabrics, base station baseband processing, and industrial real-time controllers requiring stable component supply across extended product lifecycles.
Supply support for 71V2556SA133BGG8 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
IDT (Integrated Device Technology), now part of Renesas Electronics, is a semiconductor company specializing in high-performance timing, memory, and interface solutions for communications, computing, and industrial markets.
The 71V2556SA133BGG8 belongs to IDT's ZBT™ SRAM product line, engineered specifically for zero-latency memory subsystems in high-speed networking and telecom infrastructure where deterministic burst access and bus turnaround elimination are critical.
FAQ
What is the maximum operating frequency of the 71V2556SA133BGG8?
The 71V2556SA133BGG8 is rated for 166 MHz operation, corresponding to a 6.0 ns clock period and 3.5 ns clock-to-data access time. This frequency is guaranteed across the full industrial temperature range (–40°C to +85°C) and 3.3 V ±5% supply, enabling sustained 166 MT/s throughput in burst-mode applications.
Does the 71V2556SA133BGG8 support JTAG boundary scan?
Yes, the 71V2556SA133BGG8 (SA suffix) includes optional IEEE 1149.1-compliant JTAG boundary scan functionality. Pins TMS, TDI, TCK, TDO, and TRST are assigned on the BGA package and support structural testing, interconnect verification, and in-system programming diagnostics when enabled.
How does the ZBT™ architecture improve performance in the 71V2556SA133BGG8?
The ZBT™ (Zero Bus Turnaround) architecture in the 71V2556SA133BGG8 eliminates dead cycles between alternating read and write operations. By overlapping bus direction control with data transfer, it enables immediate back-to-back burst reads and writes - increasing effective bandwidth by up to 30% compared to conventional synchronous SRAMs in mixed-access workloads.
What is the function of the ADV/LD and LBO pins on the 71V2556SA133BGG8?
On the 71V2556SA133BGG8, ADV/LD controls the burst counter: LOW loads a new external address; HIGH increments the internal counter. LBO selects burst order - tied to VSS for linear sequence (0,1,2,3), or VDD for interleaved (0,2,1,3). Together they enable flexible, efficient 4-word burst addressing without external logic.
Can the 71V2556SA133BGG8 operate with different supply voltages for core and I/O?
Yes, the 71V2556SA133BGG8 uses separate supplies: VDD = 3.3 V ±5% for core logic and VDDQ = 2.5 V for I/O drivers. This dual-rail design isolates noise-sensitive I/O signaling from core switching activity and ensures compatibility with 2.5 V FPGA/ASIC interfaces while maintaining 3.3 V logic robustness.
71V2556SA133BGG8 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- -
- Package/Case:
- 119-BGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, SDR (ZBT)
- Memory Size:
- 4.5Mbit
- Memory Organization:
- 128K x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 133 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 4.2 ns
- Voltage - Supply:
- 3.135V ~ 3.465V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 119-PBGA (14x22)
71V2556SA133BGG8 FAQ
1.How can I place an order for 71V2556SA133BGG8 through Aetrix?
Please submit a Request for Quotation (RFQ) for 71V2556SA133BGG8 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for 71V2556SA133BGG8 reliable?
The price and inventory of 71V2556SA133BGG8 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for 71V2556SA133BGG8 is usually 5 days.
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Once your 71V2556SA133BGG8 order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for 71V2556SA133BGG8?
For technical support, including 71V2556SA133BGG8 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your 71V2556SA133BGG8 requirements.
6.How does Aetrix verify that 71V2556SA133BGG8 is sourced from the original manufacturer or authorized distributors?
All 71V2556SA133BGG8 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 71V2556SA133BGG8 meets industry standards.
7.What is the process for return or replacement of 71V2556SA133BGG8?
All 71V2556SA133BGG8 units undergo pre-shipment inspection (PSI). If there is an issue with 71V2556SA133BGG8, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 71V2556SA133BGG8 part is unused and in its original packaging.
Return procedure for 71V2556SA133BGG8:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
71V2556SA133BGG8 Tags

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