Renesas 71V3556SA133BGGI
- Part No.:
- 71V3556SA133BGGI
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- 119-BGA
- Datasheet:
-
71V3556SA133BGGI.pdf
- Description:
- IC SRAM 4.5MBIT PAR 119PBGA
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
71V3556SA133BGGI from Renesas is a 3.3V 128K × 36-bit synchronous ZBT SRAM with Zero Bus Turnaround, 133 MHz operation (7.5 ns clock-to-data), pipelined outputs, and JTAG boundary scan support. It eliminates dead cycles between read/write transitions and supports 4-word linear or interleaved burst modes in high-speed networking and packet buffering applications.
For engineers reviewing the 71V3556SA133BGGI datasheet, 71V3556SA133BGGI pinout, 71V3556SA133BGGI application, or 71V3556SA133BGGI equivalent, key selection criteria include ZBT timing compliance, TQFP/BGA package compatibility, industrial temperature range (–40°C to +85°C), 3.3V I/O supply tolerance, and JTAG IEEE 1149.1 support for system-level testability.
Technical Context
The 71V3556SA133BGGI implements a fully synchronous, positive-edge-triggered architecture with address/control/data registers clocked on CLK rising edge. Its ZBT feature enables immediate bus turnaround-no idle cycles between consecutive reads and writes-by decoupling address load and data transfer via two-cycle latency (address loaded at cycle n, data accessed at n+2).
It integrates an on-chip 4-word burst counter controlled by ADV/LD and LBO pins, supports individual byte write (BW1–BW4) for partial-word updates, and includes optional IEEE 1149.1 JTAG boundary scan (TMS/TDI/TCK/TDO/TRST) for production test and debug in BGA packages.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 128K × 36-bit (4.5 Mbit); supports 256K × 18-bit via pin-compatible variant |
| Max Clock Frequency | 133 MHz; enables 7.5 ns clock-to-data access time for real-time packet buffering |
| Supply Voltage | VDD = 3.3 V ±5% (core), VDDQ = 3.3 V ±5% (I/O); separate power domains reduce noise coupling |
| Burst Capability | 4-word burst (linear or interleaved); reduces address bus traffic by 75% per memory transaction |
| Operating Temperature | –40°C to +85°C industrial grade; qualified for base station and industrial control environments |
| JTAG Support | IEEE 1149.1 compliant boundary scan; TRST optional; enables board-level structural test without external probes |
| Package | 119-ball BGA (BGGI); 14 mm × 20 mm footprint; compatible with standard SMT reflow profiles |
Pinout & Package
71V3556SA133BGGI is packaged in a 119-ball fine-pitch ball grid array (BGGI) per JEDEC MO-207AD, with 1.0 mm ball pitch and Pb-free (RoHS-compliant) finish. Pin functions are validated per Renesas datasheet 5281, revision Aug.06.21.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A16 | Address Inputs | 17-bit synchronous address bus; latched on rising CLK edge with ADV/LD low |
| CLK | System Clock Input | Primary timing reference; all synchronous inputs sampled on rising edge |
| R/W | Read/Write Control | Synchronous signal defining cycle type; determines data direction two cycles later |
| ADV/LD | Burst Counter Control | Loads new address when low; advances internal counter when high |
| LBO | Burst Order Select | Static input selecting linear (LBO = low) or interleaved (LBO = high) burst sequence |
| TMS/TDI/TCK/TDO/TRST | JTAG Test Interface | IEEE 1149.1 boundary scan signals; TRST optional asynchronous reset |
| I/O0–I/O31, I/OP1–I/OP4 | Data I/O Bus | 36-bit bidirectional synchronous data path; registered inputs/outputs for timing predictability |
| VDD / VDDQ / VSS | Power & Ground | Dual-supply design: VDD (core), VDDQ (I/O), VSS (common ground) |
Key Features
| Feature | Design Value |
|---|---|
| ZBT™ Architecture | Zero Bus Turnaround eliminates dead cycles between read/write operations, enabling continuous high-throughput data streaming |
| Pipelined Outputs | Internally synchronized output buffer enable removes need for external OE timing control, simplifying system timing closure |
| Individual Byte Write | BW1–BW4 enable selective 9-bit byte updates without disturbing adjacent bytes-critical for protocol header manipulation |
| Three Chip Enables | CE1 (active-low), CE2 (active-low), CE2 (active-high) allow flexible depth expansion and hierarchical memory mapping |
| Optional JTAG Boundary Scan | Full IEEE 1149.1 support enables automated test pattern generation and fault isolation in dense PCB layouts |
Applications
| High-Speed Packet Buffering | Telecom Line Card Memory |
|---|---|
Use Scenario: Storing incoming/outgoing Ethernet or SONET frames in network switches and routers before forwarding decisions. IC Role / Device Role / Timing Role: Primary data buffer with zero-turnaround read/write capability to sustain line-rate throughput without pipeline stalls. Use Value: Eliminates bus idle cycles during burst-mode frame assembly/disassembly, increasing effective bandwidth by up to 25% vs. conventional SRAMs. | Use Scenario: Serving as shared memory for multiple DSPs or ASICs on telecom line cards handling TDM voice channels. IC Role / Device Role / Timing Role: Synchronous dual-port-like interface supporting concurrent access from multiple controllers via burst addressing. Use Value: 4-word burst mode reduces address bus overhead, allowing faster context switching between voice channel buffers. |
| Industrial PLC Data Logging | Test Equipment Pattern Memory |
Use Scenario: Capturing sensor data streams at high sample rates in programmable logic controllers with deterministic response requirements. IC Role / Device Role / Timing Role: High-reliability, industrial-temperature SRAM providing deterministic 133 MHz access for real-time logging buffers. Use Value: Sleep mode (ZZ pin) enables ultra-low-power retention during idle periods while preserving logged data integrity. | Use Scenario: Storing stimulus/response vectors in automated test equipment (ATE) for semiconductor device validation. IC Role / Device Role / Timing Role: JTAG-enabled memory allowing boundary-scan verification of interconnect integrity prior to vector loading. Use Value: Integrated IEEE 1149.1 test infrastructure reduces fixture complexity and improves first-pass yield in ATE manufacturing. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| 71V3556SA133PFGI | Same die, 100-pin TQFP package (14 mm × 20 mm); no JTAG pins; lacks TRST/TDO/TDI/TMS | Preferred for cost-sensitive, space-constrained designs where boundary scan is unnecessary and manual rework is feasible | Select when JTAG is not required and PCB layout favors leaded package for thermal management or inspection |
| AS7C3256A-133JCIN | 128K × 32-bit organization; no ZBT feature; 133 MHz max; no burst counter or JTAG; commercial temp only (0°C to +70°C) | Suitable for non-real-time embedded systems where bus turnaround latency is acceptable and test coverage is handled externally | Choose only if ZBT timing and industrial temperature are not required, and 4-bit width reduction is acceptable |
Compared with 71V3556SA133BGGI, the TQFP alternative sacrifices JTAG testability but eases soldering and thermal dissipation, while the AS7C3256A offers lower cost at the expense of ZBT performance, burst capability, and extended temperature support.
Availability
71V3556SA133BGGI is available at Aetrix Electronics and suitable for high-speed packet buffering, telecom line card memory, and industrial PLC data logging requiring stable component supply across extended temperature ranges and long production lifecycles.
Supply support for 71V3556SA133BGGI includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Renesas Electronics is a global semiconductor leader delivering microcontrollers, analog, power, and memory solutions for automotive, industrial, and infrastructure markets.
The 71V3556SA series belongs to Renesas' high-performance synchronous SRAM product line, engineered specifically for zero-latency bus turnaround in real-time communications and control systems.
FAQ
What is the maximum operating frequency and corresponding access time for the 71V3556SA133BGGI?
The 71V3556SA133BGGI operates at up to 133 MHz with a guaranteed clock-to-data access time of 7.5 ns. This timing is specified under industrial conditions (–40°C to +85°C) with VDD and VDDQ at 3.3 V ±5%, and reflects the delay from CLK rising edge to valid data on I/O pins after address load. The 71V3556SA133BGGI achieves this performance using a fully pipelined register-to-register architecture.
Does the 71V3556SA133BGGI support burst mode, and how is burst order configured?
Yes, the 71V3556SA133BGGI supports 4-word burst mode via its integrated burst counter. Burst order is selected by the LBO (Linear/Interleaved Burst Order) pin: LBO = low enables linear addressing (A0, A1, A2, A3), while LBO = high selects interleaved order (A0, A2, A1, A3). The ADV/LD pin controls whether a new external address is loaded (ADV/LD low) or the internal counter is advanced (ADV/LD high).
How does the ZBT™ feature eliminate dead cycles in the 71V3556SA133BGGI?
The ZBT™ feature in the 71V3556SA133BGGI removes bus turnaround latency by allowing immediate transition between read and write operations without inserting idle cycles. This is achieved through separate address load and data transfer phases: address/control are registered on one CLK edge, and data appears two cycles later-enabling back-to-back transactions with no bus contention or wait states.
Is JTAG boundary scan supported on the 71V3556SA133BGGI, and which pins are used?
Yes, the 71V3556SA133BGGI includes optional IEEE 1149.1-compliant JTAG boundary scan. Pins TMS, TDI, TCK, TDO, and optional TRST are assigned to dedicated balls in the 119-ball BGA package (BGGI). TRST is asynchronous and may be left floating if unused; all JTAG pins have internal pull-ups per datasheet 5281.
What power supply requirements and sleep capability does the 71V3556SA133BGGI have?
The 71V3556SA133BGGI requires two 3.3 V supplies: VDD (core, 3.3 V ±5%) and VDDQ (I/O, 3.3 V ±5%). It supports low-power sleep mode via the ZZ pin: asserting ZZ high gates the internal clock and reduces power consumption to minimum while guaranteeing data retention. ZZ has an internal pulldown resistor, so it defaults to active-low operation.
71V3556SA133BGGI Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- -
- Package/Case:
- 119-BGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, SDR (ZBT)
- Memory Size:
- 4.5Mbit
- Memory Organization:
- 128K x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 133 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 4.2 ns
- Voltage - Supply:
- 3.135V ~ 3.465V
- Operating Temperature:
- -40°C ~ 85°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 119-PBGA (14x22)
71V3556SA133BGGI FAQ
1.How can I place an order for 71V3556SA133BGGI through Aetrix?
Please submit a Request for Quotation (RFQ) for 71V3556SA133BGGI on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for 71V3556SA133BGGI reliable?
The price and inventory of 71V3556SA133BGGI are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for 71V3556SA133BGGI is usually 5 days.
3.What payment methods are accepted for 71V3556SA133BGGI?
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71V3556SA133BGGI orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your 71V3556SA133BGGI order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for 71V3556SA133BGGI?
For technical support, including 71V3556SA133BGGI datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your 71V3556SA133BGGI requirements.
6.How does Aetrix verify that 71V3556SA133BGGI is sourced from the original manufacturer or authorized distributors?
All 71V3556SA133BGGI products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 71V3556SA133BGGI meets industry standards.
7.What is the process for return or replacement of 71V3556SA133BGGI?
All 71V3556SA133BGGI units undergo pre-shipment inspection (PSI). If there is an issue with 71V3556SA133BGGI, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 71V3556SA133BGGI part is unused and in its original packaging.
Return procedure for 71V3556SA133BGGI:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
71V3556SA133BGGI Tags

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M24C02-WMN6TP
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