Renesas 71V3556SA133BQGI
- Part No.:
- 71V3556SA133BQGI
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- 165-TBGA
- Datasheet:
-
71V3556SA133BQGI.pdf
- Description:
- IC SRAM 4.5MBIT PAR 165CABGA
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
71V3556SA133BQGI from IDT (now Renesas) is a 3.3V synchronous ZBT™ SRAM with 128K × 36-bit organization (4.5 Mbit), 133 MHz maximum clock frequency, 3.5 ns clock-to-data access time, zero bus turnaround architecture, and pipelined outputs. It serves as high-speed buffer/cache memory in network packet processors and telecom line cards requiring deterministic burst read/write with no dead cycles.
For engineers reviewing the 71V3556SA133BQGI datasheet, 71V3556SA133BQGI pinout, 71V3556SA133BQGI application, or 71V3556SA133BQGI equivalent, key selection criteria include ZBT™ timing compliance, 100-pin TQFP package compatibility, industrial temperature support (–40°C to +85°C), JTAG boundary scan capability, and 4-word interleaved/linear burst mode operation.
Technical Context
The 71V3556SA133BQGI implements a fully synchronous, positive-edge-triggered architecture with registered address, control, and data paths. Its ZBT™ feature eliminates bus turnaround latency by enabling immediate read-after-write or write-after-read transitions without idle cycles.
It integrates an on-chip 4-word burst counter controlled by ADV/LD and LBO pins, supports individual byte write via BW1–BW4, and includes optional IEEE 1149.1 JTAG boundary scan (TMS/TDI/TCK/TDO/TRST) for testability - all operating at 3.3V core and I/O supply with ±5% tolerance.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 128K × 36-bit (4.5 Mbit); supports high-bandwidth data path in 32-bit+ systems with parity or ECC extension |
| Max Clock Frequency | 133 MHz; enables 133 MT/s sustained throughput with pipelined access |
| Clock-to-Data Access | 3.5 ns; guarantees deterministic output valid timing for synchronous system timing closure |
| ZBT™ Architecture | Zero dead cycles between read/write transitions; eliminates bus arbitration overhead in burst-intensive applications |
| Burst Mode | 4-word linear or interleaved burst; reduces address setup overhead and improves effective bandwidth |
| Supply Voltage | 3.3 V ±5% (VDD/VDDQ); compatible with standard 3.3V logic families and mixed-voltage board designs |
| Operating Temperature | –40°C to +85°C; qualified for industrial-grade embedded and telecom infrastructure deployment |
| JTAG Support | IEEE 1149.1 compliant (TMS/TDI/TCK/TDO/TRST); enables in-system test and debug without external probes |
Pinout & Package
Packaged in a JEDEC-standard 100-pin plastic thin quad flatpack (TQFP), 14 mm × 20 mm body, 0.5 mm pitch, lead-free and RoHS-compliant.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A16 | Address Inputs | 17-bit synchronous address bus; latched on rising CLK edge when ADV/LD = LOW and chip enabled |
| CLK | System Clock Input | Primary timing reference; all synchronous registers triggered on rising edge; defines tCYC = 7.5 ns (133 MHz) |
| R/W | Read/Write Control | Synchronous signal determining cycle type; sampled with ADV/LD to initiate load read/write or burst advance |
| ADV/LD | Burst Counter Control | Loads new external address (LOW) or increments internal burst counter (HIGH); governs burst sequence flow |
| LBO | Burst Order Select | Static input selecting linear (LOW) or interleaved (HIGH) 4-word burst addressing pattern |
| BW1–BW4 | Byte Write Enables | Four independent active-low enables for 9-bit bytes (I/O[0:7]+I/OP1 through I/O[24:31]+I/OP4) |
| CE1, CE2, CE2 | Chip Enable Inputs | Three-signal enable scheme: CE1=LOW, CE2=LOW, CE2=HIGH required for selection; enables depth expansion |
| I/O0–I/O31, I/OP1–I/OP4 | Data I/O Bus | 36-bit bidirectional synchronous data path; registered input/output with 2-cycle pipeline delay |
| OE | Output Enable | Asynchronous control; tri-states outputs immediately when HIGH; may be tied LOW for simplified interface |
| CEN | Clock Enable | Suspends all synchronous operation when HIGH; preserves register state without clock gating side effects |
| TMS, TDI, TCK, TDO, TRST | JTAG Test Interface | Boundary scan support per IEEE 1149.1; TRST is optional asynchronous reset (available in BGA only; not on TQFP) |
| VDD, VDDQ, VSS | Power/Ground | VDD = 3.3V core supply; VDDQ = 3.3V I/O supply; separate rails allow noise isolation between logic and I/O domains |
Key Features
| Feature | Design Value |
|---|---|
| ZBTTM Zero Bus Turnaround | Eliminates dead cycles between consecutive reads/writes - enables continuous 133 MT/s burst streaming without inter-cycle gaps |
| Internally Synchronized OE | Removes need for precise OE timing control; outputs remain valid across clock edges unless OE is actively asserted HIGH |
| 4-Word Burst Counter | Reduces address bus traffic by 75% during sequential accesses; supports both linear and interleaved patterns via LBO pin |
| Individual Byte Write (BW1–BW4) | Enables partial-word updates without read-modify-write; critical for protocol header manipulation in packet processing |
| Three Chip Enables (CE1/CE2/CE2) | Supports seamless depth expansion across multiple devices with independent select control and two-cycle deselect latency |
| Optional JTAG Boundary Scan | Provides IEEE 1149.1 test access for interconnect verification and fault diagnosis in high-density PCB layouts |
Applications
| Packet Buffering in Switch ASICs | Line Card Memory in Telecom Routers |
|---|---|
Use Scenario: Storing ingress/egress packet headers and payload fragments in multi-gigabit Ethernet switches. IC Role / Device Role / Timing Role: High-speed dual-port buffer with zero-turnaround burst reads/writes to sustain 10 Gbps+ line rates. Use Value: 3.5 ns clock-to-data and 133 MHz operation ensure sub-10 ns memory latency, meeting tight switch fabric timing budgets. | Use Scenario: Serving as frame buffer and lookup table memory in OC-192/STM-64 line interface cards. IC Role / Device Role / Timing Role: Synchronous SRAM providing deterministic access for SONET/SDH framer and mapper logic. Use Value: Industrial temperature rating (–40°C to +85°C) and 100-pin TQFP package ensure reliability in carrier-grade chassis environments. |
| Baseband Processing in Wireless BTS | Real-Time Video Frame Buffering |
Use Scenario: Holding channel estimation coefficients and FFT intermediate results in 4G/LTE baseband units. IC Role / Device Role / Timing Role: Low-latency scratchpad memory interfaced directly to DSP cores via synchronous burst protocol. Use Value: Pipelined outputs and ZBT™ architecture eliminate pipeline stalls during rapid coefficient updates and symbol processing. | Use Scenario: Acting as line/frame buffer for HD video encoders/decoders in broadcast equipment. IC Role / Device Role / Timing Role: Dual-clocked buffer supporting simultaneous read (display engine) and write (encoder) with no bus contention. Use Value: 4-word burst mode and individual byte writes enable efficient YUV component handling and chroma subsampling alignment. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C1356BV33-133AXC | 128K × 32-bit (4 Mbit); no ZBT™; uses conventional pipeline with 1-cycle turnaround gap | Lacks zero-turnaround; requires external bus arbitration logic for back-to-back R/W sequences | Select when ZBT™ is unnecessary and 32-bit data width suffices; lower cost but higher system-level latency |
| AS7C33128PFSIG-133 | 128K × 32-bit (4 Mbit); no burst counter or JTAG; commercial temp only (0°C to +70°C) | No burst mode or boundary scan; unsuitable for industrial telecom or test-critical deployments | Choose for cost-sensitive, non-burst, non-JTAG consumer applications where industrial temp is not required |
Compared with CY7C1356BV33-133AXC and AS7C33128PFSIG-133, the 71V3556SA133BQGI delivers true zero-turnaround operation, integrated 4-word burst logic, and IEEE 1149.1 testability - making it uniquely suited for deterministic, high-throughput, testable embedded memory subsystems.
Availability
71V3556SA133BQGI is available at Aetrix Electronics and suitable for telecom infrastructure, network packet processing, and industrial embedded systems requiring stable component supply, long-term lifecycle support, and guaranteed industrial temperature performance.
Supply support for 71V3556SA133BQGI includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
IDT (Integrated Device Technology), now part of Renesas Electronics, is a fabless semiconductor company specializing in high-performance timing, memory interface, and RF solutions for communications and computing markets.
The 71V3556SA133BQGI belongs to IDT's ZBT™ SRAM product line, engineered specifically for zero-latency, burst-oriented memory subsystems in networking ASICs, telecom line cards, and real-time signal processing platforms.
FAQ
What is the memory organization and total capacity of the 71V3556SA133BQGI?
The 71V3556SA133BQGI is organized as 128K × 36 bits, delivering a total capacity of 4,718,592 bits (4.5 Mbit). This configuration supports 32-bit data paths plus 4-bit parity or ECC, making it ideal for high-integrity applications such as telecom control plane memory and packet buffering where data integrity and bandwidth are critical. The device operates exclusively in this 128K × 36 mode - no 256K × 18 reconfiguration is supported in the SA variant.
Does the 71V3556SA133BQGI support JTAG boundary scan, and which pins are used?
Yes, the 71V3556SA133BQGI supports IEEE 1149.1-compliant JTAG boundary scan. Pins TMS, TDI, TCK, TDO, and optional TRST are assigned to JTAG functionality. On the 100-pin TQFP package (BQGI suffix), these signals are implemented on dedicated pins - TMS (Pin 89), TDI (Pin 90), TCK (Pin 91), TDO (Pin 92), and TRST (Pin 93) - and are functional only when the SA version is selected. TRST is optional and may be left floating if unused.
How does the ZBTTM feature eliminate dead cycles in the 71V3556SA133BQGI?
The ZBTTM (Zero Bus Turnaround) feature in the 71V3556SA133BQGI removes idle cycles between consecutive read and write operations by overlapping bus direction control internally. Unlike conventional SRAMs that require explicit turnaround time (typically 1–2 clocks), the 71V3556SA133BQGI allows a write cycle to immediately follow a read (or vice versa) without inserting wait states - achieving continuous 133 MT/s throughput. This is implemented via internal bus arbitration logic synchronized to the rising CLK edge.
What are the voltage requirements and power supply separation for the 71V3556SA133BQGI?
The 71V3556SA133BQGI requires two independent 3.3 V supplies: VDD (core logic, 3.3 V ±5%) and VDDQ (I/O drivers, also 3.3 V ±5%). VSS serves as common ground. Separation prevents I/O switching noise from affecting core timing. Both supplies must ramp monotonically during power-up; no sequencing is required, but no I/O pin voltage may exceed VDDQ during ramp. Absolute max ratings specify –0.5 V to VDDQ +0.5 V on I/O pins.
Can the 71V3556SA133BQGI operate in sleep mode, and how is it enabled?
Yes, the 71V3556SA133BQGI supports low-power sleep mode via the ZZ pin. When ZZ is driven HIGH (VIH ≥ 2.0 V), the internal clock is gated and the device enters its lowest power state while maintaining full data retention. ZZ is a synchronous input with internal pulldown; it must be held HIGH for at least one CLK cycle to activate sleep. In sleep mode, all outputs go high-impedance and dynamic power drops significantly - critical for power-constrained telecom modules.
71V3556SA133BQGI Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- -
- Package/Case:
- 165-TBGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, SDR (ZBT)
- Memory Size:
- 4.5Mbit
- Memory Organization:
- 128K x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 133 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 4.2 ns
- Voltage - Supply:
- 3.135V ~ 3.465V
- Operating Temperature:
- -40°C ~ 85°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-CABGA (13x15)
71V3556SA133BQGI FAQ
1.How can I place an order for 71V3556SA133BQGI through Aetrix?
Please submit a Request for Quotation (RFQ) for 71V3556SA133BQGI on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for 71V3556SA133BQGI reliable?
The price and inventory of 71V3556SA133BQGI are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for 71V3556SA133BQGI is usually 5 days.
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5.How can I obtain technical support or documentation for 71V3556SA133BQGI?
For technical support, including 71V3556SA133BQGI datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your 71V3556SA133BQGI requirements.
6.How does Aetrix verify that 71V3556SA133BQGI is sourced from the original manufacturer or authorized distributors?
All 71V3556SA133BQGI products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 71V3556SA133BQGI meets industry standards.
7.What is the process for return or replacement of 71V3556SA133BQGI?
All 71V3556SA133BQGI units undergo pre-shipment inspection (PSI). If there is an issue with 71V3556SA133BQGI, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 71V3556SA133BQGI part is unused and in its original packaging.
Return procedure for 71V3556SA133BQGI:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
71V3556SA133BQGI Tags

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M24C02-WMN6TP
STMicroelectronics
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Microchip Technology

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Microchip Technology
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Microchip Technology

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