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Renesas 71V3556SA166BG8

Part No.:
71V3556SA166BG8
Manufacturer:
Renesas
Category:
Memory
Package:
119-BGA
Datasheet:
Aetrix71V3556SA166BG8.pdf
Description:
IC SRAM 4.5MBIT PAR 119PBGA
Quantity:
Payment:
Payment
Shipping:
Shipping

Inventory:2,271

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Product details

Overview

71V3556SA166BG8 from Renesas is a 3.3V synchronous ZBT SRAM with 128K × 36-bit organization (4.5 Mbit), 166 MHz operation, 3.5 ns clock-to-data access, zero bus turnaround architecture, and pipelined outputs. It supports interleaved/linear 4-word burst reads/writes, individual byte write control (BW1–BW4), and JTAG boundary scan (IEEE 1149.1) in BGA packaging - used in high-speed networking packet buffers and telecom line-card memory subsystems.

For engineers reviewing the 71V3556SA166BG8 datasheet, 71V3556SA166BG8 pinout, 71V3556SA166BG8 application, or 71V3556SA166BG8 equivalent, key selection criteria include ZBT timing compliance, 3.3V I/O compatibility, industrial temperature support (–40°C to +85°C), burst counter behavior under ADV/LD control, and BGA-119 package mechanical constraints for PCB layout and thermal management.

Technical Context

The 71V3556SA166BG8 implements a fully synchronous, positive-edge-triggered pipeline: address/control registers sample on CLK rising edge with CEN low, and data transfers occur two cycles later. Its ZBT architecture eliminates dead cycles between read/write transitions by decoupling bus direction control from OE and using internal synchronization of output enable.

It integrates a programmable burst counter (LBO-selectable linear/interleaved), three chip enables (CE1, CE2 active-low; CE2 active-high) for depth expansion, and optional IEEE 1149.1 JTAG test interface with TMS/TDI/TCK/TDO/TRST pins - all implemented in a high-performance CMOS process with separate VDD (core) and VDDQ (I/O) supplies.

Key Specifications

Parameter Value and Actual Design Meaning
Memory Organization 128K × 36-bit (4.5 Mbit); supports x36 interface without external width conversion.
Max Clock Frequency 166 MHz; enables 166 MT/s throughput with deterministic 3.5 ns clock-to-data access time.
Supply Voltages VDD = 3.3 V ±5% (core), VDDQ = 3.3 V ±5% (I/O); independent rails allow I/O voltage tuning and noise isolation.
Burst Capability 4-word burst (linear or interleaved); reduces address bus traffic and improves bandwidth efficiency in sequential access patterns.
Operating Temperature –40°C to +85°C industrial grade; validated for sustained operation in base station and industrial control environments.
JTAG Support IEEE 1149.1 compliant with TMS/TDI/TCK/TDO/TRST; enables boundary-scan testing and system-level debug without intrusive probing.
Package 119-ball BGA (BG119); JEDEC-standard footprint with 1.0 mm ball pitch, optimized for high-density routing and thermal dissipation.

Pinout & Package

71V3556SA166BG8 is packaged in a 119-ball fine-pitch BGA (BG119) per JEDEC MO-207AB, with 1.0 mm ball pitch, 14 mm × 14 mm body size, and exposed thermal pad. Pin functions are defined for the 128K × 36 configuration; unused pins (e.g., NC) are no-connect in this variant.

Pin/Terminal Circuit Role Design Meaning
CLK Clock input Positive-edge-triggered master timing reference; all synchronous inputs sampled on rising edge.
A0–A16 Address inputs 17-bit address bus for 128K-depth addressing; registered on CLK rising edge with ADV/LD low.
R/W Read/write control Synchronous signal defining cycle type; determines data flow direction two cycles later.
ADV/LD Burst advance / address load High = increment internal burst counter; low = load new external address into register.
LBO Burst order select Static input: low = linear burst sequence, high = interleaved burst sequence.
BW1–BW4 Byte write enables Active-low per-byte controls for 9-bit segments (I/O[0:7]+I/OP1 through I/O[24:31]+I/OP4).
CE1, CE2, CE2 Chip enables Three independent enables (CE1/CE2 active-low, CE2 active-high) for multi-chip depth expansion.
I/O0–I/O31, I/OP1–I/OP4 Data I/O 36-bit bidirectional synchronous data bus; registered inputs/outputs aligned to CLK rising edge.
TMS, TDI, TCK, TDO, TRST JTAG interface IEEE 1149.1 boundary-scan signals; TRST is optional asynchronous reset (internal pull-up).
VDD, VDDQ, VSS Power/ground VDD = 3.3 V core supply; VDDQ = 3.3 V I/O supply; VSS = common ground reference.

Key Features

Feature Design Value
ZBT™ Zero Bus Turnaround Eliminates dead cycles between read/write transitions, enabling continuous high-bandwidth bus utilization in burst-mode systems.
Pipelined Output Enable OE is internally synchronized - no external timing control needed; outputs tri-state cleanly without glitches during mode changes.
4-Word Burst Counter Reduces address bus activity by 75% for sequential accesses; LBO pin selects linear or interleaved addressing order.
Individual Byte Write Control BW1–BW4 allow selective 9-bit writes without masking logic or additional control circuitry - critical for partial-word updates.
Three Chip Enables Supports seamless depth expansion across multiple devices using mixed polarity enables (CE1/CE2 low, CE2 high).
JTAG Boundary Scan Enables production testability and board-level diagnostics without physical probe access; compliant with IEEE 1149.1 standard.

Applications

Packet Buffer Memory Telecom Line Card Cache

Use Scenario: Storing ingress/egress Ethernet or SONET frames in network switches and routers before forwarding decisions.

IC Role / Device Role / Timing Role: High-speed, low-latency buffer with deterministic 3.5 ns access and zero-turnaround burst capability for back-to-back frame handling.

Use Value: Sustains 166 MT/s throughput with no bus idle cycles, reducing packet jitter and improving switch fabric efficiency.

Use Scenario: Acting as local cache for DSP-based voice processing or protocol translation in carrier-grade line cards.

IC Role / Device Role / Timing Role: Synchronous SRAM providing burst-aligned data to dual-port DSPs with precise clock-domain alignment via CLK and CEN.

Use Value: Enables 4-word burst reads/writes matching DSP memory controller burst length, minimizing wait states and CPU overhead.

Industrial PLC Data Log Test Equipment Pattern Memory

Use Scenario: Capturing real-time sensor data streams in programmable logic controllers operating in harsh industrial environments.

IC Role / Device Role / Timing Role: Industrial-temperature (–40°C to +85°C) SRAM with sleep mode (ZZ) for power-gated logging during idle periods.

Use Value: Guarantees data retention in Sleep Mode while reducing system power consumption during non-acquisition intervals.

Use Scenario: Storing stimulus/response vectors in automated test equipment requiring precise timing and repeatable waveform generation.

IC Role / Device Role / Timing Role: Deterministic-access memory with JTAG boundary scan for in-system verification and fault isolation of pattern memory paths.

Use Value: Enables full-pin visibility and interconnect testing without modifying test firmware or adding external probes.

Equivalent & Alternatives

The following parts are listed as comparable options for similar synchronous SRAM applications.

Alternative Part Technical Difference Application Difference Selection Advice
CY7C1370DV18-167BZI 144-Mbit QDR II+ SRAM (72M × 16), 167 MHz, differential clocks, no ZBT architecture. Targets high-throughput, dual-data-rate applications like graphics frame buffers; lacks burst counter and ADV/LD control. Select when DDR-style read/write concurrency is required over ZBT's single-cycle turnaround optimization.
AS7C33128PFSIG 128-Mbit async SRAM (8M × 16), 15 ns access, no clocking, no burst, no JTAG. Suitable for legacy microcontroller interfaces where synchronous timing and testability are unnecessary. Choose only for cost-sensitive, low-speed control-plane memory where deterministic latency and IEEE 1149.1 are not required.

Compared with CY7C1370DV18-167BZI and AS7C33128PFSIG, the 71V3556SA166BG8 uniquely delivers zero-bus-turnaround timing with integrated burst control and JTAG testability - making it optimal for high-reliability, high-speed embedded memory subsystems requiring both performance and verifiability.

Availability

71V3556SA166BG8 is available at Aetrix Electronics and suitable for packet buffering, telecom line-card caching, industrial PLC data logging, test equipment pattern storage, and JTAG-enabled system diagnostics requiring stable component supply across extended product lifecycles.

Supply support for 71V3556SA166BG8 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Renesas Electronics is a global semiconductor leader delivering microcontrollers, analog, power, and memory solutions for automotive, industrial, and infrastructure markets.

The 71V3556SA166BG8 belongs to Renesas' ZBT SRAM product line, engineered specifically for high-speed, low-latency memory subsystems in networking, telecom, and test equipment where deterministic timing and bus efficiency are critical.

FAQ

What is the memory organization and total capacity of the 71V3556SA166BG8?

The 71V3556SA166BG8 is organized as 128K × 36 bits, delivering a total capacity of 4,718,592 bits (4.5 Mbit). This configuration supports a 36-bit data bus without external width expansion, directly interfacing with 36-bit memory controllers in high-speed networking ASICs and FPGAs.

Does the 71V3556SA166BG8 support both linear and interleaved burst modes?

Yes, the 71V3556SA166BG8 supports both linear and interleaved 4-word burst sequences. The LBO (Linear Burst Order) pin selects the mode: pulled low for linear addressing (A0, A0+1, A0+2, A0+3), high for interleaved (A0, A0+2, A0+1, A0+3). This flexibility matches varying memory controller burst protocols.

How does the ZBT™ architecture eliminate dead cycles in the 71V3556SA166BG8?

The 71V3556SA166BG8 achieves zero bus turnaround by internally synchronizing output enable (OE) and decoupling bus direction control from external timing. Reads and writes can be issued back-to-back without waiting for bus release, enabling continuous data flow at 166 MHz with no idle cycles between operations.

What package type and ball count does the 71V3556SA166BG8 use?

The 71V3556SA166BG8 uses a 119-ball fine-pitch BGA (BG119) package per JEDEC MO-207AB, with 1.0 mm ball pitch and 14 mm × 14 mm body size. This package includes dedicated VDD, VDDQ, and VSS balls for low-noise power delivery and thermal management in dense PCB layouts.

Is JTAG boundary scan supported on the 71V3556SA166BG8, and which pins implement it?

Yes, the 71V3556SA166BG8 supports IEEE 1149.1 JTAG boundary scan. Pins TMS, TDI, TCK, TDO, and optional TRST (with internal pull-up) are assigned to the JTAG interface. These signals are functional only in the "SA" version (as indicated by the "SA" suffix in the part number), confirming full testability integration.

71V3556SA166BG8 Specifications

Product attributes
Attribute value
Manufacturer:
Renesas
Series:
-
Package/Case:
119-BGA
Packaging:
Tape & Reel (TR)
Product Status:
Obsolete
Programmable:
Not Verified
Memory Type:
Volatile
Memory Format:
SRAM
Technology:
SRAM - Synchronous, SDR (ZBT)
Memory Size:
4.5Mbit
Memory Organization:
128K x 36
Memory Interface:
Parallel
Clock Frequency:
166 MHz
Write Cycle Time - Word, Page:
-
Access Time:
3.5 ns
Voltage - Supply:
3.135V ~ 3.465V
Operating Temperature:
0°C ~ 70°C (TA)
Grade:
-
Qualification:
-
Mounting Type:
Surface Mount
Supplier Device Package:
119-PBGA (14x22)

71V3556SA166BG8 FAQ

1.How can I place an order for 71V3556SA166BG8 through Aetrix?

Please submit a Request for Quotation (RFQ) for 71V3556SA166BG8 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.

2.Are the price and stock information for 71V3556SA166BG8 reliable?

The price and inventory of 71V3556SA166BG8 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for 71V3556SA166BG8 is usually 5 days.

3.What payment methods are accepted for 71V3556SA166BG8?

We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for 71V3556SA166BG8 transactions.

Note: Certain payment methods may incur a processing fee.

4.How is shipping managed for 71V3556SA166BG8?

71V3556SA166BG8 orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.

Once your 71V3556SA166BG8 order is processed, you will receive an email with the shipment details and tracking number.

Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.

5.How can I obtain technical support or documentation for 71V3556SA166BG8?

For technical support, including 71V3556SA166BG8 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your 71V3556SA166BG8 requirements.

6.How does Aetrix verify that 71V3556SA166BG8 is sourced from the original manufacturer or authorized distributors?

All 71V3556SA166BG8 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 71V3556SA166BG8 meets industry standards.

7.What is the process for return or replacement of 71V3556SA166BG8?

All 71V3556SA166BG8 units undergo pre-shipment inspection (PSI). If there is an issue with 71V3556SA166BG8, returns or replacements are accepted under the following conditions:

1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.

2.The issue is reported within 90 days of delivery.

3.The 71V3556SA166BG8 part is unused and in its original packaging.

Return procedure for 71V3556SA166BG8:

1.Submit a request within 90 days.

2.Obtain a Return Material Authorization (RMA) from Aetrix.

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