Renesas 71V3559S75PFG8
- Part No.:
- 71V3559S75PFG8
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- 100-LQFP
- Datasheet:
-
71V3559S75PFG8.pdf
- Description:
- IC SRAM 4.5MBIT PARALLEL 100TQFP
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
71V3559S75PFG8 from Integrated Device Technology is a 3.3V synchronous ZBT™ SRAM organized as 256K x 18 (4.5 Mbit), featuring flow-through outputs, 4-word burst capability (linear or interleaved), and zero bus turnaround for high-speed memory interfacing in networking and telecom data paths. It operates at 100 MHz with 7.5 ns clock-to-data access, supports individual byte write control via BW1–BW4, and includes JTAG boundary scan (IEEE 1149.1 compliant).
For engineers reviewing the 71V3559S75PFG8 datasheet, 71V3559S75PFG8 pinout, 71V3559S75PFG8 application, or 71V3559S75PFG8 equivalent, key selection criteria include burst mode timing compatibility, ZBT™ dead-cycle elimination, TQFP-100 package footprint, 3.3V core/I/O supply tolerance, and synchronous chip enable logic for depth expansion in packet buffer systems.
Technical Context
The 71V3559S75PFG8 implements a synchronous dual-edge-triggered architecture where address/control latching occurs on the rising CLK edge, with data output appearing one cycle later via flow-through path-no output register. Its internal burst counter advances on ADV/LD = HIGH, while LBO selects linear or interleaved addressing order.
Three chip enables (CE1, CE2 active-low; CE2 active-high) support hierarchical memory banking; CEN suspends all synchronous operation without affecting output state; ZZ enables low-power sleep mode with guaranteed data retention. JTAG interface (TMS/TDI/TCK/TDO/TRST) provides IEEE 1149.1-compliant test access.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 256K x 18 (4.5 Mbit) - supports 18-bit data bus width with full word addressing for compact memory mapping in DSP and switch fabric designs. |
| Clock Frequency | 100 MHz - enables 10 ns cycle time for high-throughput packet buffering in 10G Ethernet and SONET line cards. |
| Access Time | 7.5 ns clock-to-data - defines minimum latency between CLK rise and valid I/O output, critical for meeting setup/hold timing in synchronous bus interfaces. |
| Burst Length | 4-word fixed burst - reduces address overhead per transfer; linear/interleaved sequence selectable via static LBO pin for cache-line or DMA alignment. |
| Supply Voltage | VDD = VDDQ = 3.3 V ±5% - requires single regulated 3.3V rail for core and I/O, simplifying power delivery in multi-SRAM systems. |
| Operating Temperature | –40°C to +85°C - qualified for industrial-grade deployment in base station equipment and ruggedized network infrastructure. |
| Package | 100-pin TQFP (14 mm × 20 mm, JEDEC standard) - surface-mount compatible with automated assembly; pinout matches IDT's ZBT™ family for layout reuse. |
Pinout & Package
71V3559S75PFG8 is packaged in a JEDEC-standard 100-pin thin quad flatpack (TQFP), 14 mm × 20 mm body, 0.5 mm pitch, lead-free (Pb-free) and RoHS-compliant.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A17 | Address Input | Synchronous 18-bit address bus; latched on rising CLK when ADV/LD = LOW and chip enabled - defines 256K-word address space. |
| CE1, CE2, CE2 | Chip Enable | Three independent enables (CE1/CE2 active-low, CE2 active-high) allow flexible depth expansion and bank selection without external logic. |
| R/W | Read/Write Control | Synchronous signal determining cycle type; sampled with ADV/LD to initiate load read/write or burst advance - eliminates separate RD/WR pins. |
| ADV/LD | Advance Burst / Load Address | Controls burst counter: LOW loads new external address; HIGH increments internal counter - enables continuous burst streaming without address bus updates. |
| LBO | Linear/Interleaved Burst Order | Static input selecting burst sequence (LBO = LOW → linear; HIGH → interleaved) - matches CPU cache or DMA controller addressing patterns. |
| BW1–BW4 | Byte Write Enables | Four active-low signals enabling 9-bit byte writes (I/O[0:7]+I/OP1 through I/O[24:31]+I/OP4); allows partial-word updates without read-modify-write cycles. |
| CLK | System Clock Input | Primary timing reference; all synchronous inputs referenced to rising edge - defines deterministic timing for pipelined memory access. |
| OE | Output Enable | Asynchronous, active-low; tri-states I/Os independently of clock - supports shared bus arbitration and hot-swap isolation. |
| ZZ | Sleep Mode Input | Active-high synchronous input gating internal clock and reducing power consumption while retaining memory contents - used for dynamic power management. |
| I/O0–I/O17, I/OP1–I/OP2 | Data I/O | 18-bit bidirectional data bus (16 data + 2 parity) with registered input path and flow-through output - enables zero-latency read forwarding in pipeline stages. |
| TMS, TDI, TCK, TDO, TRST | JTAG Test Interface | IEEE 1149.1-compliant boundary scan chain; supports production testing, interconnect verification, and in-system debug without dedicated test pads. |
Key Features
| Feature | Design Value |
|---|---|
| ZBT™ Zero Bus Turnaround | Eliminates dead cycles between consecutive reads/writes - enables back-to-back memory transactions at full clock rate for sustained 200 MB/s throughput. |
| Flow-Through Output Architecture | Removes output register delay - data appears on I/O bus one clock after address/control setup, reducing read latency by one cycle vs. registered-output SRAMs. |
| 4-Word Synchronous Burst | Single address initiates four sequential data transfers - cuts address bus activity by 75%, easing timing closure in high-speed parallel buses. |
| Individual Byte Write Control | BW1–BW4 enable selective 9-bit writes - avoids full-word overwrites in protocol header manipulation or table update applications. |
| Three Independent Chip Enables | Supports up to 8:1 depth expansion using only CE logic - simplifies design of large memory banks without address decoder ICs. |
| JTAG Boundary Scan (IEEE 1149.1) | Enables PCB-level interconnect test and in-system programming - reduces test fixture cost and improves manufacturing yield for dense routing layouts. |
Applications
| Packet Buffering in Switch Fabric | Line Card Memory for Telecom Equipment |
|---|---|
Use Scenario: Storing ingress/egress packet headers and payload fragments in multi-gigabit Ethernet switches. IC Role / Device Role / Timing Role: High-speed, low-latency SRAM acting as first-level packet buffer with burst-aligned read/write for cut-through forwarding. Use Value: ZBT™ architecture enables immediate turnaround between header read and payload write, minimizing pipeline stalls and sustaining 10 Gbps line-rate performance. |
Use Scenario: Buffering ATM cells or SONET frames in carrier-grade optical line cards operating across –40°C to +85°C. IC Role / Device Role / Timing Role: Industrial-temperature synchronous SRAM providing deterministic 7.5 ns access for real-time frame assembly/disassembly. Use Value: Flow-through outputs and 100 MHz clocking meet tight setup/hold margins required by framer ASICs, eliminating need for external latch tuning. |
| DSP Co-Processor Memory | Protocol Accelerator Cache |
Use Scenario: Serving as local instruction/data memory for TI C6000 or Analog Devices SHARC DSPs in radar signal processing modules. IC Role / Device Role / Timing Role: 256K x 18 configuration matches DSP external memory bus width; burst mode aligns with cache-line fetches. Use Value: Linear burst sequence (LBO = LOW) delivers contiguous 4-word blocks matching DSP prefetch engine stride, improving cache hit efficiency. |
Use Scenario: Accelerating TCP/IP or IPSec header parsing in network security appliances using dedicated offload engines. IC Role / Device Role / Timing Role: Low-latency SRAM storing lookup tables and session state; byte-write enables atomic field updates without locking. Use Value: Individual BW1–BW4 control allows concurrent modification of TCP flags and sequence numbers in separate 9-bit fields, preventing race conditions. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C1355KV18-75BAXI | 72-Mbit (512K × 144) QDR SRAM; 75 MHz max, differential clocks, no ZBT™ or flow-through outputs. | Targeted at high-bandwidth, dual-port applications (e.g., graphics frame buffers); lacks burst counter and zero-turnaround behavior. | Select when dual-clock domain synchronization or higher density is required; not drop-in for ZBT™-optimized control logic. |
| AS7C33128PFS-75BIN | 128K × 36 sync SRAM; 75 MHz, 3.3V, but no JTAG, no ZZ sleep, and no interleaved burst mode. | Cost-optimized for simpler embedded controllers; missing advanced features needed for telecom switching latency budgets. | Consider for non-critical buffering where JTAG testability and power-aware sleep are unnecessary. |
Compared with CY7C1355KV18-75BAXI and AS7C33128PFS-75BIN, the 71V3559S75PFG8 uniquely combines ZBT™ zero-turnaround, flow-through outputs, and IEEE 1149.1 JTAG in a 100-pin TQFP - making it optimal for latency-sensitive, testable, and thermally demanding telecom line card designs.
Availability
71V3559S75PFG8 is available at Aetrix Electronics and suitable for packet buffering in switch fabrics, line card memory for telecom equipment, and DSP co-processor memory requiring stable component supply, long-term industrial temperature support, and verified ZBT™ timing compliance.
Supply support for 71V3559S75PFG8 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Integrated Device Technology (IDT), now part of Renesas Electronics, is a fabless semiconductor company specializing in timing, memory interface, RF, and power management ICs for communications, computing, and industrial markets.
The 71V3559S75PFG8 belongs to IDT's ZBT™ synchronous SRAM product line, engineered specifically for zero-latency memory interfacing in high-speed networking and telecom infrastructure where bus turnaround overhead must be eliminated.
FAQ
What memory organization does the 71V3559S75PFG8 implement?
The 71V3559S75PFG8 implements a 256K x 18 memory organization, totaling 4.5 Mbit of storage. This configuration provides an 18-bit data bus width optimized for compatibility with telecom framer ASICs and DSP external memory interfaces. It is distinct from the 128K x 36 variant (e.g., 71V3557S75PFG8) and cannot be substituted without redesigning data path width and address decoding logic.
Does the 71V3559S75PFG8 support both linear and interleaved burst modes?
Yes, the 71V3559S75PFG8 supports both linear and interleaved 4-word burst sequences. The LBO (Linear/Interleaved Burst Order) pin selects the mode: LBO = LOW enables linear addressing (A0, A1, A2, A3), while LBO = HIGH enables interleaved (A0, A2, A1, A3). This selection is static and must remain stable during operation to prevent burst corruption.
How does the ZBT™ feature of the 71V3559S75PFG8 reduce system latency?
The ZBT™ (Zero Bus Turnaround) feature in the 71V3559S75PFG8 eliminates idle cycles between consecutive read and write operations. Unlike conventional SRAMs requiring OE deassertion and bus turnaround time, the 71V3559S75PFG8 allows immediate transition from read to write (or vice versa) within the same clock domain - enabling sustained 100 MHz throughput without dead cycles.
What is the function of the ZZ pin on the 71V3559S75PFG8?
The ZZ pin on the 71V3559S75PFG8 is a synchronous sleep mode input. When driven HIGH, it gates the internal clock and reduces power consumption to its lowest level while guaranteeing data retention. This feature is essential for power-aware telecom systems that dynamically scale memory activity based on traffic load - and is confirmed functional in the 71V3559S75PFG8's TQFP package per datasheet revision DSC-5282/09.
Is JTAG boundary scan supported on the 71V3559S75PFG8, and which pins are used?
Yes, the 71V3559S75PFG8 includes optional IEEE 1149.1-compliant JTAG boundary scan. Pins TMS, TDI, TCK, TDO, and TRST (optional reset) are dedicated to this function. In the 100-pin TQFP package, these appear on pins 87 (TMS), 88 (TDI), 89 (TCK), 90 (TDO), and 64 (TRST/ZZ multiplexed in later die revisions). JTAG is fully functional and production-tested per IDT specification DSC-5282/09.
71V3559S75PFG8 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- -
- Package/Case:
- 100-LQFP
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, SDR (ZBT)
- Memory Size:
- 4.5Mbit
- Memory Organization:
- 256K x 18
- Memory Interface:
- Parallel
- Clock Frequency:
- -
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 7.5 ns
- Voltage - Supply:
- 3.135V ~ 3.465V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 100-TQFP (14x14)
71V3559S75PFG8 FAQ
1.How can I place an order for 71V3559S75PFG8 through Aetrix?
Please submit a Request for Quotation (RFQ) for 71V3559S75PFG8 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for 71V3559S75PFG8 reliable?
The price and inventory of 71V3559S75PFG8 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for 71V3559S75PFG8 is usually 5 days.
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6.How does Aetrix verify that 71V3559S75PFG8 is sourced from the original manufacturer or authorized distributors?
All 71V3559S75PFG8 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 71V3559S75PFG8 meets industry standards.
7.What is the process for return or replacement of 71V3559S75PFG8?
All 71V3559S75PFG8 units undergo pre-shipment inspection (PSI). If there is an issue with 71V3559S75PFG8, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 71V3559S75PFG8 part is unused and in its original packaging.
Return procedure for 71V3559S75PFG8:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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