Renesas 71V35761S183PFG

Overview

71V35761S183PFG from IDT is a 128K × 36-bit, 3.3V synchronous SRAM with pipelined outputs, burst counter, and single-cycle deselect. It supports 183MHz operation (3.3ns clock access time), operates across industrial temperature range (–40°C to +85°C), and features JTAG boundary scan (IEEE 1149.1) for testability. Used in high-speed networking line cards and packet buffer subsystems requiring deterministic low-latency memory access.

For engineers reviewing the 71V35761S183PFG datasheet, 71V35761S183PFG pinout, 71V35761S183PFG application, or 71V35761S183PFG equivalent, key selection criteria include burst mode configuration (LBO), sleep mode control (ZZ), byte-write granularity (BW1–BW4), and compatibility with 3.3V I/O systems requiring pipelined read timing and self-timed write cycles.

Technical Context

The 71V35761S183PFG implements a synchronous, clock-driven architecture with registered address, data, and control paths. Its internal burst counter generates four consecutive addresses from a single input, supporting both linear and interleaved sequences selected by the LBO pin. Pipelined output registers deliver first data on the second clock edge after address assertion.

Write operations are fully synchronous and support global (GW) or byte-selectable (BWE + BW1–BW4) modes, with self-timed internal write completion. Sleep mode is activated asynchronously via ZZ, gating the internal clock and reducing supply current to ≤35mA while retaining data.

Key Specifications

Pinout & Package

Packaged in a JEDEC-standard 100-pin thin quad flatpack (TQFP), 14 mm × 20 mm body, lead pitch 0.5 mm. Pinout validated per IDT 71V35761 PKG100 drawing (Rev. May 18, 2020).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar synchronous SRAM applications.

Compared with CY7C1375DV18-167BZI and AS7C33128PFSIG, the 71V35761S183PFG uniquely combines industrial temperature support, JTAG testability, and configurable burst ordering - making it optimal for carrier-class infrastructure where field reliability and test coverage are mandatory.

Availability

71V35761S183PFG is available at Aetrix Electronics and suitable for network packet buffering, telecom line card memory, and industrial PLC data logging requiring stable component supply across extended temperature ranges and long production lifecycles.

Supply support for 71V35761S183PFG includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

IDT (Integrated Device Technology) is a fabless semiconductor company specializing in high-performance timing, memory, and interface solutions for communications and computing markets.

The 71V35761S183PFG belongs to IDT's high-speed synchronous SRAM product line, designed specifically for deterministic, low-latency buffering in telecom infrastructure, enterprise networking, and industrial control systems demanding industrial-grade reliability.

FAQ

What is the maximum operating frequency of the 71V35761S183PFG?

The 71V35761S183PFG is rated for 183 MHz operation with a 3.3 ns clock-to-data access time (tCD) under industrial temperature conditions (–40°C to +85°C). This speed grade is confirmed in the device's ordering part number suffix "183" and validated in Table 16 of the official IDT datasheet (Rev. May 18, 2020).

Does the 71V35761S183PFG support JTAG boundary scan?

Yes, the 71V35761S183PFG includes an optional IEEE 1149.1-compliant JTAG boundary scan interface with TMS, TDI, TCK, TDO, and TRST pins. This feature is present in the TQFP-100 package and supports interconnect testing and in-system debugging per the functional description in Section 1 of the datasheet.

How does the LBO pin affect burst behavior in the 71V35761S183PFG?

The LBO (Linear/Interleaved Burst Order) pin selects the 4-word burst address sequence: LOW configures linear order (00→01→10→11), HIGH selects interleaved (00→01→11→10). As stated in Tables 14 and 15, this static input must remain stable during operation and directly determines how the internal burst counter advances A0/A1 for sequential reads/writes.

What is the function of the ZZ pin on the 71V35761S183PFG?

The ZZ pin is an asynchronous sleep mode input. When driven HIGH, it internally gates the CLK signal and reduces supply current to ≤35 mA (IZZ) while guaranteeing data retention. Per Table 9 and Figure 12, recovery requires tZZR ≥ 100 ns after ZZ returns LOW before normal operation resumes.

Can the 71V35761S183PFG perform byte-wide writes?

Yes, the 71V35761S183PFG supports granular byte writes using BWE (byte write enable) and BW1–BW4 (individual byte write selects). As defined in Table 12, BW1 controls I/O0–7 + I/OP1 (9 bits), BW2 controls I/O8–15 + I/OP2, etc., enabling independent 9-bit writes without affecting other bytes in the 36-bit word.