Renesas 71V35761SA183BQG

Overview

71V35761SA183BQG from IDT is a 128K × 36-bit, 3.3V synchronous SRAM with pipelined outputs, burst counter, and single-cycle deselect. It operates at 183MHz (3.3ns clock access time), supports linear/interleaved burst modes via LBO input, and features JTAG boundary scan (IEEE 1149.1) in the SA variant. Used in high-speed networking and embedded control buffers requiring deterministic latency.

For engineers reviewing the 71V35761SA183BQG datasheet, 71V35761SA183BQG pinout, 71V35761SA183BQG application, or 71V35761SA183BQG equivalent, key selection criteria include burst mode timing compliance, ZZ sleep-mode current (30mA), TQFP-100 package compatibility, and JTAG-enabled testability for production validation.

Technical Context

The 71V35761SA183BQG implements a synchronous, clock-driven architecture with registered address, data, and control paths. Its internal burst counter generates four sequential addresses per initial address, with order determined by LBO state-linear (LBO = LOW) or interleaved (LBO = HIGH).

Burst operation is initiated by ADSP/ADSC low and advanced by ADV low; pipelined output delivers first data on the next rising CLK edge, followed by three more outputs on subsequent edges. Sleep mode is entered asynchronously via ZZ high, gating CLK and reducing supply current to 30mA while retaining data.

Key Specifications

Pinout & Package

71V35761SA183BQG is packaged in a JEDEC-standard 100-pin thin quad flatpack (TQFP), 14 mm × 20 mm body, with 0.5 mm pitch. Pin 1 marked by corner notch; pin 14 (VDD/NC) may be tied to VDD or left unconnected; pin 64 (ZZ) must be actively driven for sleep control.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar synchronous SRAM applications.

Compared with CY7C1362BV33-167AXC and AS7C31026B-15JIN, the 71V35761SA183BQG uniquely delivers JTAG testability, 183 MHz burst throughput, and deterministic pipelined latency-making it optimal for new high-reliability, high-speed embedded systems where debug visibility and timing predictability are mandatory.

Availability

71V35761SA183BQG is available at Aetrix Electronics and suitable for high-speed network buffering, industrial motion control, telecom baseband processing, and avionics data acquisition requiring stable component supply across extended product lifecycles.

Supply support for 71V35761SA183BQG includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

IDT (Integrated Device Technology) is a fabless semiconductor company specializing in timing, memory interface, RF, and sensor solutions, now part of Renesas Electronics.

The 71V35761SA183BQG belongs to IDT's high-performance synchronous SRAM product line, designed specifically for deterministic, low-jitter memory interfacing in networking, telecom, and industrial real-time systems.

FAQ

What is the maximum operating frequency of the 71V35761SA183BQG?

The 71V35761SA183BQG is rated for 183 MHz operation (3.3 ns clock access time) across the industrial temperature range (–40°C to +85°C). This speed is guaranteed under VDD/VDDQ = 3.3 V ±5%, with timing validated per AC Electrical Characteristics Table 16 in the official datasheet. The "183" in the part number explicitly denotes this speed grade.

Does the 71V35761SA183BQG support both linear and interleaved burst modes?

Yes, the 71V35761SA183BQG supports both burst modes via the LBO (Linear/Interleaved Burst Order) input pin. When LBO is driven LOW, the device uses linear addressing (00→01→10→11); when HIGH, it uses interleaved order (00→01→11→10). LBO is asynchronous and static-its state must be stable before and during burst operation.

What JTAG signals are implemented on the 71V35761SA183BQG?

The 71V35761SA183BQG implements a full IEEE 1149.1-compliant JTAG boundary scan interface: TMS, TDI, TCK, TDO, and optional TRST. All JTAG pins have internal pull-ups except ZZ (internally pulled down). TRST is optional and may be left floating if unused; the TAP controller resets automatically at power-up.

How does sleep mode function on the 71V35761SA183BQG?

Sleep mode is activated asynchronously by driving the ZZ pin HIGH. This gates the internal clock and reduces supply current to 30 mA (IZZ) while guaranteeing data retention. Recovery requires tZZR ≥ 100 ns after ZZ returns LOW before valid operations resume. ZZ has an internal pull-down, so it must be actively driven for reliable control.

What package type is used for the 71V35761SA183BQG?

The 71V35761SA183BQG is supplied in a JEDEC-standard 100-pin plastic thin quad flatpack (TQFP), 14 mm × 20 mm body size, 0.5 mm lead pitch. Pin 1 is identified by a corner notch; pin 14 is VDD/NC and may be tied to VDD or left unconnected; pin 64 is the ZZ input and must be actively controlled.