Renesas 71V35761SA200BGG8
- Part No.:
- 71V35761SA200BGG8
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- 119-BGA
- Datasheet:
-
71V35761SA200BGG8.pdf
- Description:
- IC SRAM 4.5MBIT PAR 119PBGA
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
71V35761SA200BGG8 from IDT is a 128K × 36-bit, 3.3V synchronous SRAM with pipelined outputs, burst counter, and single-cycle deselect. It supports 200MHz operation (3.1ns clock access), features JTAG boundary scan (IEEE 1149.1), and operates across industrial temperature (–40°C to +85°C). Used in high-speed cache and networking buffers requiring deterministic latency and burst data throughput.
For engineers reviewing the 71V35761SA200BGG8 datasheet, 71V35761SA200BGG8 pinout, 71V35761SA200BGG8 application, or 71V35761SA200BGG8 equivalent, key selection criteria include burst mode timing (linear/interleaved), ZZ sleep mode current (30mA), 100-pin TQFP package compatibility, and JTAG testability for system-level validation.
Technical Context
This SRAM implements a synchronous interface with dual address status inputs (ADSP/ADSC) for processor- or cache-controller-driven burst initiation. Its internal 2-bit binary burst counter advances on ADV low and selects sequence order via LBO - linear (LBO = LOW) or interleaved (LBO = HIGH).
The device uses registered I/O paths: data input register, output register, and output buffer all clocked on CLK rising edge. Write control combines global (GW) and byte-level (BW1–BW4, BWE) enables, with self-timed write logic ensuring cycle completion without external timing constraints.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 128K × 36 bits = 4.608 Mbit; supports 36-bit parallel bus interfaces without external width expansion. |
| Max Clock Frequency | 200 MHz (commercial); enables 4-word burst transfers every 5 ns, critical for CPU cache line fills. |
| Access Time | 3.1 ns clock-to-data (tCD); guarantees pipelined output valid one cycle after address latch, reducing read latency. |
| Supply Voltages | VDD = 3.3 V ±5% (core), VDDQ = 3.3 V ±5% (I/O); separate rails allow I/O voltage stability during core switching noise. |
| Sleep Mode Current | IZZ = 30 mA max at VDD = 3.465 V; enables low-power standby in network packet buffers during idle periods. |
| Burst Control | LBO pin selects linear or interleaved 4-word burst order; determines memory address mapping for cache coherence. |
| JTAG Support | IEEE 1149.1 compliant TAP controller (TMS/TDI/TCK/TRST/TDO); enables board-level structural test and debug without dedicated test pads. |
Pinout & Package
Packaged in JEDEC-standard 119-ball BGA (BGG119), 14 mm × 20 mm footprint, RoHS-compliant, with 3.3V core and I/O supply pins distributed for low-noise power delivery.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A17 | Address Inputs | 18-bit synchronous address bus; latched on rising CLK edge when ADSP or ADSC is active low, supporting full 128K depth. |
| CLK | System Clock Input | Primary timing reference; all registers (address, data, enable) are edge-triggered on rising CLK, enabling synchronous system integration. |
| ADSP / ADSC | Address Status Inputs | Processor- or cache-controller-initiated address load signals; ADSP gated by CE, ADSC independent - enables dual-bus arbitration. |
| ADV | Burst Address Advance | Active-low synchronous signal controlling burst counter increment; held high to suspend burst and retain current address. |
| LBO | Burst Order Select | Asynchronous static input defining burst sequence: LOW = linear (00→01→10→11), HIGH = interleaved (00→01→11→10). |
| GW / BWE / BW1–BW4 | Write Control Inputs | GW enables full 36-bit write; BWE gates byte enables; BW1–BW4 select 9-bit bytes (I/O0–7+I/OP1, etc.), enabling partial writes without read-modify-write. |
| ZZ | Sleep Mode Input | Asynchronous high-active signal gating internal CLK and reducing supply current to 30 mA; retains data without refresh. |
| TMS/TDI/TCK/TRST/TDO | JTAG Test Interface | IEEE 1149.1 boundary-scan chain; TRST optional reset; supports in-system test and interconnect verification on dense PCBs. |
| I/O0–I/O31, I/OP1–I/OP4 | Data I/O Pins | 36-bit bidirectional bus with registered input and output paths; I/OPx are parity bits for ECC-capable systems. |
| VDD / VDDQ / VSS | Power & Ground | Dedicated core (VDD) and I/O (VDDQ) supplies with multiple VSS pins; decoupling required per ball group to meet AC noise specs. |
Key Features
| Feature | Design Value |
|---|---|
| Pipelined Output Architecture | Output register stages data one clock cycle after address latch, enabling back-to-back reads at 200 MHz without turnaround penalty. |
| Single-Cycle Deselect | Chip deactivation completes within one CLK cycle - eliminates bus contention during rapid chip-select switching in multi-SRAM systems. |
| Self-Timed Write Cycle | Internal write timing logic resolves setup/hold violations dynamically; removes need for external write pulse generation or timing margining. |
| Linear/Interleaved Burst Modes | LBO pin configures burst address sequence to match CPU cache line layout - avoids software remapping in x86 or PowerPC systems. |
| JTAG Boundary Scan (IEEE 1149.1) | Full pin-level interconnect test capability; reduces test fixture cost and enables solder-joint validation on fine-pitch BGA assemblies. |
| Industrial Temperature Range | –40°C to +85°C operation validated across speed grades; suitable for base station, router, and industrial control applications. |
Applications
| Network Packet Buffer | CPU Cache Controller |
|---|---|
Use Scenario: Storing ingress/egress Ethernet frames in Layer 2/L3 switches before forwarding decisions. IC Role / Device Role / Timing Role: High-bandwidth, low-latency SRAM acting as first-level packet memory with burst-aligned DMA access. Use Value: 200MHz clock rate and pipelined outputs sustain 7.2 GB/s peak bandwidth (36 bits × 200 MHz), matching 10Gbps+ line rates. | Use Scenario: Holding instruction/data cache lines for RISC-V or ARM-based SoCs with burst-capable bus interfaces. IC Role / Device Role / Timing Role: Synchronous cache RAM interfacing directly to CPU's address/data bus with ADSP/ADSC handshake protocol. Use Value: Single-cycle deselect and burst counter reduce cache miss penalty by 30% vs. non-burst SRAMs in sequential access patterns. |
| Baseband Signal Processing | Industrial PLC Memory Module |
Use Scenario: Temporary storage of FFT coefficients and channel estimation data in LTE/5G baseband FPGAs. IC Role / Device Role / Timing Role: External memory co-processor buffer synchronized to FPGA fabric clock with JTAG-accessible debug visibility. Use Value: JTAG boundary scan validates signal integrity on 0.8mm-pitch BGA interconnects, critical for RF subsystem reliability. | Use Scenario: Retentive data logging and program storage in programmable logic controllers operating in harsh factory environments. IC Role / Device Role / Timing Role: Industrial-grade SRAM providing deterministic access under thermal cycling and EMI stress. Use Value: –40°C to +85°C rating and ZZ sleep mode (30 mA) extend battery-backed runtime during brownouts or maintenance shutdowns. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C1371DV33-200BZXI | 128K × 36, 200MHz, 3.3V, no JTAG; uses different burst control (MODE pin instead of LBO) and lacks ADSC input. | Targeted at legacy Cypress-based designs; no IEEE 1149.1 test support limits board-level diagnostics. | Select when JTAG is unnecessary and existing layout uses MODE pin routing. |
| AS7C33128P33A-200BIN | 128K × 36, 200MHz, 3.3V, no burst counter; asynchronous OE and no pipelined outputs - higher read latency (tAA = 5.5ns). | Suitable for simpler control-plane buffers where burst efficiency is secondary to cost; lacks ADV/ADSP/ADSC protocol support. | Select only if system does not require burst-mode performance or cache-coherent address sequencing. |
Compared with CY7C1371DV33-200BZXI and AS7C33128P33A-200BIN, the 71V35761SA200BGG8 uniquely delivers JTAG testability, dual-address-status protocol, and configurable burst order - essential for high-reliability networking and compute applications demanding traceable validation and deterministic timing.
Availability
71V35761SA200BGG8 is available at Aetrix Electronics and suitable for network packet buffering, CPU cache extension, baseband signal processing, and industrial PLC memory modules requiring stable component supply across extended temperature ranges and long production lifecycles.
Supply support for 71V35761SA200BGG8 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
IDT (Integrated Device Technology) is a fabless semiconductor company specializing in high-performance timing, memory, and interface solutions, now part of Renesas Electronics.
The 71V35761SA200BGG8 belongs to IDT's high-speed synchronous SRAM product line, engineered for low-latency, burst-capable memory subsystems in communications infrastructure and real-time embedded systems.
FAQ
What is the maximum operating frequency of the 71V35761SA200BGG8?
The 71V35761SA200BGG8 is rated for 200 MHz operation in the commercial temperature range (0°C to +70°C), delivering a 3.1 ns clock-to-data access time (tCD). At 183 MHz and 166 MHz, it supports industrial temperature operation (–40°C to +85°C) with tCD of 3.3 ns and 3.5 ns respectively. These speeds are guaranteed across voltage (3.3 V ±5%) and temperature specifications.
Does the 71V35761SA200BGG8 support JTAG boundary scan, and which pins are used?
Yes, the 71V35761SA200BGG8 includes IEEE 1149.1-compliant JTAG boundary scan. The required pins are TMS (pin U5), TDI (U4), TCK (U6), TDO (U7), and optional TRST (U8), all located in the U-row of the 119-ball BGA (BGG119) package. These pins are dedicated and not shared with functional I/O.
How does burst mode work on the 71V35761SA200BGG8, and what controls the sequence order?
Burst mode on the 71V35761SA200BGG8 delivers four consecutive 36-bit words per address using an internal 2-bit binary counter. The LBO pin selects sequence order: LOW enables linear burst (00→01→10→11), HIGH enables interleaved burst (00→01→11→10). ADV must be held LOW to advance the counter; holding ADV HIGH suspends the burst after the current word.
What is the function of the ZZ pin on the 71V35761SA200BGG8, and how much power does it save?
The ZZ pin on the 71V35761SA200BGG8 enables full sleep mode when driven HIGH. In this state, internal clock gating reduces supply current to 30 mA max (IZZ), while retaining all memory contents. This is distinct from standby (ISB1 = 30 mA) and clock-running (ISB2 = 130 mA) modes, offering the lowest active-power state without data loss.
Can the 71V35761SA200BGG8 perform partial writes, and how are byte enables implemented?
Yes, the 71V35761SA200BGG8 supports partial writes via four independent 9-bit byte write enables (BW1–BW4), each controlling a 9-bit segment of the 36-bit bus (e.g., BW1 → I/O0–I/O7 + I/OP1). BWE must be LOW to activate BWx signals; when BWE is HIGH, only GW can initiate a write. This allows precise 1–4 byte updates without read-modify-write cycles.
71V35761SA200BGG8 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- -
- Package/Case:
- 119-BGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, SDR
- Memory Size:
- 4.5Mbit
- Memory Organization:
- 128K x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 200 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 3.1 ns
- Voltage - Supply:
- 3.135V ~ 3.465V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 119-PBGA (14x22)
71V35761SA200BGG8 FAQ
1.How can I place an order for 71V35761SA200BGG8 through Aetrix?
Please submit a Request for Quotation (RFQ) for 71V35761SA200BGG8 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for 71V35761SA200BGG8 reliable?
The price and inventory of 71V35761SA200BGG8 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for 71V35761SA200BGG8 is usually 5 days.
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For technical support, including 71V35761SA200BGG8 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your 71V35761SA200BGG8 requirements.
6.How does Aetrix verify that 71V35761SA200BGG8 is sourced from the original manufacturer or authorized distributors?
All 71V35761SA200BGG8 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 71V35761SA200BGG8 meets industry standards.
7.What is the process for return or replacement of 71V35761SA200BGG8?
All 71V35761SA200BGG8 units undergo pre-shipment inspection (PSI). If there is an issue with 71V35761SA200BGG8, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 71V35761SA200BGG8 part is unused and in its original packaging.
Return procedure for 71V35761SA200BGG8:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
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