Renesas 71V65803S100BQG8
- Part No.:
- 71V65803S100BQG8
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- 165-TBGA
- Datasheet:
-
71V65803S100BQG8.pdf
- Description:
- IC SRAM 9MBIT PAR 165CABGA
- Quantity:
- Payment:

- Shipping:

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Product details
Overview
71V65803S100BQG8 from Renesas Electronics is a 3.3V synchronous ZBT™ SRAM with 256K × 36-bit (9,437,184-bit) organization, 150 MHz clock speed, 3.8 ns clock-to-data access, zero bus turnaround (ZBT) architecture, and pipelined outputs. It supports interleaved/linear 4-word burst reads/writes and operates across industrial temperature range (–40°C to +85°C), targeting high-speed cache and buffer applications in networking and telecom systems.
For engineers reviewing the 71V65803S100BQG8 datasheet, 71V65803S100BQG8 pinout, 71V65803S100BQG8 application, or 71V65803S100BQG8 equivalent, key selection criteria include ZBT timing compliance, TQFP-100 package compatibility, 3.3V I/O and core supply requirements, burst counter control via ADV/LD and LBO, and support for individual byte write (BW1–BW4) and three-chip-enable depth expansion.
Technical Context
The 71V65803S100BQG8 implements a fully synchronous, pipelined SRAM architecture where address/control registration occurs on the rising CLK edge, with data output valid two cycles later. Its ZBT feature eliminates dead cycles between read/write transitions by internally synchronizing OE and enabling immediate bus turnaround without external control.
It integrates a 4-word burst counter with static LBO input selecting linear or interleaved addressing, ADV/LD toggling between external address load (ADV/LD = LOW) and internal counter advance (ADV/LD = HIGH), and asynchronous ZZ sleep mode for low-power retention. All synchronous inputs-including R/W, CEN, CE1/CE2/CE2, and BWx-are sampled on CLK rising edge with setup/hold timing referenced to that edge.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 256K × 36-bit (9,437,184-bit); supports 512K × 18-bit via pin-compatible variant |
| Max Clock Frequency | 150 MHz; enables 6.67 ns cycle time for sustained high-bandwidth memory access |
| Clock-to-Data Access | 3.8 ns; defines minimum latency from CLK rise to valid Q output in read cycles |
| Supply Voltages | VDD = 3.3 V ±5% (core); VDDQ = 3.3 V ±5% (I/O); ensures signal integrity and compatibility with 3.3V logic families |
| Burst Capability | 4-word linear or interleaved burst; reduces address bus traffic and improves throughput in sequential access patterns |
| Operating Temperature | –40°C to +85°C (industrial grade); validated for deployment in base station, router, and industrial controller environments |
| Zero Bus Turnaround | ZBT™ architecture; allows immediate read-after-write or write-after-read without bus idle cycles, increasing effective bandwidth |
Pinout & Package
Packaged in JEDEC-standard 100-pin plastic thin quad flatpack (TQFP), 14 mm × 20 mm body size, with exposed pad not present. Pin pitch is 0.5 mm. Compatible with standard reflow soldering profiles for industrial PCB assembly.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| CLK | Clock Input | Rising-edge-triggered master timing reference for all synchronous registers (address, control, data) |
| A0–A17 | Address Inputs | 18-bit address bus for 256K × 36 configuration; A18 unused in this variant |
| R/W | Read/Write Control | Synchronous signal determining cycle type; sampled with ADV/LD to initiate load or burst operation |
| ADV/LD | Burst Counter Control | LOW loads new external address; HIGH advances internal burst counter-critical for burst sequencing |
| LBO | Burst Order Select | Static input: LOW = linear burst (0,1,2,3); HIGH = interleaved burst (0,2,1,3)-determines memory access pattern |
| BW1–BW4 | Byte Write Enables | Four independent active-low enables for 9-bit bytes (I/O[0:7]+I/OP1 through I/O[24:31]+I/OP4) |
| CE1, CE2, CE2 | Chip Enables | Three enables (CE1/CE2 active-low, CE2 active-high) for flexible depth expansion and hierarchical memory decoding |
| OE | Output Enable | Asynchronous; drives I/O pins to high-Z when HIGH-eliminates need for precise timing coordination |
| ZZ | Sleep Mode Input | Asynchronous HIGH gates internal clock and reduces power consumption while retaining data |
| I/O0–I/O31, I/OP1–I/OP4 | Data I/O | 36-bit bidirectional synchronous bus; registered input and output paths ensure timing predictability |
Key Features
| Feature | Design Value |
|---|---|
| ZBTTM Architecture | Eliminates bus turnaround dead cycles between reads and writes, enabling continuous data flow in burst-intensive systems |
| Internally Synchronized OE | Removes requirement for external OE timing control-simplifies system-level interface design and reduces FPGA logic overhead |
| 4-Word Burst Counter | Reduces address bus activity by 75% during sequential accesses; supports both linear and interleaved sequences per LBO setting |
| Individual Byte Write (BW1–BW4) | Enables partial-word updates without read-modify-write, preserving data integrity in multi-threaded or packet-based buffer management |
| Three Chip Enables (CE1/CE2/CE2) | Supports seamless depth expansion up to 3× without external decode logic-ideal for scalable memory subsystems |
| Asynchronous Sleep Mode (ZZ) | Reduces active power by >90% while maintaining data retention-critical for power-constrained telecom line cards |
Applications
| High-Speed Network Buffer | Telecom Line Card Cache |
|---|---|
Use Scenario: Storing packet headers and metadata in 10G/25G Ethernet switch ASIC interfaces requiring sub-4ns access latency. IC Role / Device Role / Timing Role: Low-latency, burst-capable SRAM acting as first-level packet buffer with ZBT-enabled read-after-write for header modification pipelines. Use Value: 3.8 ns clock-to-data and zero bus turnaround enable real-time packet inspection and forwarding at line rate without pipeline stalls. | Use Scenario: Serving as shared instruction/data cache for DSP clusters in wireless baseband processing units operating at –40°C to +85°C. IC Role / Device Role / Timing Role: Industrial-grade synchronous SRAM providing deterministic 150 MHz burst access to multiple DSP cores via common bus. Use Value: 3.3V I/O compatibility and TQFP-100 footprint simplify integration with legacy FPGA-based baseband controllers. |
| Industrial PLC Data Log | Radar Signal Processing FIFO |
Use Scenario: Capturing sensor event timestamps and status logs in programmable logic controllers deployed in factory automation environments. IC Role / Device Role / Timing Role: Nonvolatile-buffered SRAM with ZZ sleep mode supporting periodic wake-up logging while minimizing standby power. Use Value: Asynchronous ZZ control and industrial temperature rating ensure reliable operation during extended unattended runtime. | Use Scenario: Implementing high-throughput FIFO for ADC sample streaming in phased-array radar front-ends requiring burst-aligned data ingestion. IC Role / Device Role / Timing Role: Pipelined SRAM with ADV/LD-controlled burst counter acting as elastic buffer between ADC interface and FFT engine. Use Value: 4-word interleaved burst mode matches radar pulse repetition intervals, reducing DMA overhead and jitter. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C1371BV33-133AXC | 133 MHz max frequency; 256K × 36 organization; uses QDR-II architecture with separate read/write ports | Requires dual-port memory controller; lacks ZBT and burst counter; higher bandwidth but more complex interface | Select when system demands simultaneous read/write concurrency over ZBT simplicity |
| AS7C3256A-15JCN | 15 ns async access; 32K × 8 organization; asynchronous CMOS SRAM with no burst or pipelining | No clock, no burst, no ZBT-suitable only for simple glue logic or low-speed control plane buffers | Select only for cost-sensitive, non-timing-critical applications where 150 MHz sync performance is unnecessary |
Compared with CY7C1371BV33-133AXC and AS7C3256A-15JCN, the 71V65803S100BQG8 delivers deterministic 3.8 ns latency and zero bus turnaround in a single-clock, single-port architecture-reducing controller complexity while meeting strict timing budgets in telecom and industrial real-time systems.
Availability
71V65803S100BQG8 is available at Aetrix Electronics and suitable for high-speed network buffers, telecom line card caches, and industrial PLC data loggers requiring stable component supply, long-term industrial temperature support, and JEDEC-standard TQFP packaging.
Supply support for 71V65803S100BQG8 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Renesas Electronics Corporation is a global semiconductor leader specializing in microcontrollers, analog, power, and memory solutions for automotive, industrial, and infrastructure markets.
The 71V65803 belongs to Renesas' ZBT™ synchronous SRAM product line, engineered specifically for high-bandwidth, low-latency buffering in networking equipment, base stations, and real-time embedded systems demanding deterministic timing and zero bus turnaround.
FAQ
What is the maximum operating frequency of the 71V65803S100BQG8?
The 71V65803S100BQG8 is rated for a maximum clock frequency of 150 MHz, corresponding to a 6.67 ns clock period. This specification is guaranteed across the full industrial temperature range (–40°C to +85°C) and 3.3 V ±5% supply conditions. The device achieves 3.8 ns clock-to-data access time at this speed, making it suitable for demanding high-speed buffering applications such as packet switching and radar signal processing where timing predictability is critical. The 71V65803S100BQG8 maintains this performance without derating under specified operating conditions.
Does the 71V65803S100BQG8 support burst read and write operations?
Yes, the 71V65803S100BQG8 supports 4-word burst operations for both reads and writes. Burst sequencing is controlled by the ADV/LD and LBO pins: ADV/LD = HIGH advances the internal burst counter, while LBO selects linear (LBO = LOW) or interleaved (LBO = HIGH) address order. Each burst cycle delivers four consecutive data words starting from the loaded base address, reducing address bus traffic and improving throughput in sequential access scenarios. The 71V65803S100BQG8 executes bursts synchronously with the CLK rising edge and maintains full ZBT functionality throughout burst sequences.
What is the function of the ZZ pin on the 71V65803S100BQG8?
The ZZ pin on the 71V65803S100BQG8 is an asynchronous sleep mode input. When driven HIGH, ZZ gates the internal clock and places the device into a low-power retention state while preserving stored data. In this mode, core and I/O power consumption drops significantly-enabling energy-efficient operation in intermittently active systems like remote sensors or standby telecom modules. The 71V65803S100BQG8 exits sleep mode synchronously on the next valid CLK rising edge after ZZ returns LOW, with no reset or initialization sequence required.
How does the ZBTTM feature improve system performance in the 71V65803S100BQG8?
The ZBTTM (Zero Bus Turnaround) feature in the 71V65803S100BQG8 eliminates dead cycles when switching between read and write operations on the same bus. Unlike conventional SRAMs requiring explicit bus turnaround time, the 71V65803S100BQG8 allows immediate back-to-back read-after-write or write-after-read transfers. This is achieved through internally synchronized output enable and pipelined control logic. As a result, the 71V65803S100BQG8 increases effective memory bandwidth by up to 25% in mixed-access workloads typical of network packet processing and real-time control loops.
What package type is used for the 71V65803S100BQG8?
The 71V65803S100BQG8 is packaged in a JEDEC-standard 100-pin plastic thin quad flatpack (TQFP) with 0.5 mm pitch and 14 mm × 20 mm body dimensions. This RoHS-compliant, green-part-qualified package supports standard surface-mount assembly and reflow processes. The pinout is optimized for signal integrity, with dedicated VDDQ/VSS pairs adjacent to I/O banks and distributed power/ground pins to minimize noise coupling. The 71V65803S100BQG8's TQFP-100 footprint ensures drop-in compatibility with other members of the IDT71V65603/65803 family.
71V65803S100BQG8 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- -
- Package/Case:
- 165-TBGA
- Packaging:
- Tape & Reel (TR)
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, SDR (ZBT)
- Memory Size:
- 9Mbit
- Memory Organization:
- 512K x 18
- Memory Interface:
- Parallel
- Clock Frequency:
- 100 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 5 ns
- Voltage - Supply:
- 3.135V ~ 3.465V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 165-CABGA (13x15)
71V65803S100BQG8 FAQ
1.How can I place an order for 71V65803S100BQG8 through Aetrix?
Please submit a Request for Quotation (RFQ) for 71V65803S100BQG8 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for 71V65803S100BQG8 reliable?
The price and inventory of 71V65803S100BQG8 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for 71V65803S100BQG8 is usually 5 days.
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Once your 71V65803S100BQG8 order is processed, you will receive an email with the shipment details and tracking number.
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5.How can I obtain technical support or documentation for 71V65803S100BQG8?
For technical support, including 71V65803S100BQG8 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your 71V65803S100BQG8 requirements.
6.How does Aetrix verify that 71V65803S100BQG8 is sourced from the original manufacturer or authorized distributors?
All 71V65803S100BQG8 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 71V65803S100BQG8 meets industry standards.
7.What is the process for return or replacement of 71V65803S100BQG8?
All 71V65803S100BQG8 units undergo pre-shipment inspection (PSI). If there is an issue with 71V65803S100BQG8, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 71V65803S100BQG8 part is unused and in its original packaging.
Return procedure for 71V65803S100BQG8:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
71V65803S100BQG8 Tags

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M24C02-WMN6TP
STMicroelectronics
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AT24C02C-XHM-T
Microchip Technology

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AT21CS01-STUM10-T
Microchip Technology

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AT24C02C-SSHM-T
Microchip Technology

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24LC01BT-I/OT
Microchip Technology
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M24C02-FMC6TG
STMicroelectronics

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AT24CS02-SSHM-T
Microchip Technology

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93LC46BT-I/OT
Microchip Technology

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AT24C04C-SSHM-T
Microchip Technology

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24LC01BT-I/SN
Microchip Technology

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24AA02UIDT-I/OT
Microchip Technology

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AT24C08C-STUM-T
Microchip Technology
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