Renesas 71V67603S150BGG
- Part No.:
- 71V67603S150BGG
- Manufacturer:
- Renesas
- Category:
- Memory
- Package:
- 119-BGA
- Datasheet:
-
71V67603S150BGG.pdf
- Description:
- IC SRAM 9MBIT PAR 150MHZ 119PBGA
- Quantity:
- Payment:

- Shipping:

Inventory:4,773
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Product details
Overview
71V67603S150BGG from IDT (now Renesas) is a 256K × 36-bit, 3.3V synchronous SRAM with pipelined outputs, single-cycle deselect, and 150MHz operation (3.8ns clock access time). It supports interleaved/linear burst modes via LBO input, features self-timed write with global and byte-level write control, and targets high-speed cache and buffer applications in networking and telecom systems.
For engineers reviewing the 71V67603S150BGG datasheet, 71V67603S150BGG pinout, 71V67603S150BGG application, or 71V67603S150BGG equivalent, key selection criteria include burst mode timing compliance, 3.3V I/O compatibility, TQFP-100 package footprint, and industrial temperature range support (-40°C to +85°C).
Technical Context
This SRAM implements a synchronous interface with registered address, data, and control paths triggered on the rising edge of CLK. Burst addressing uses an internal binary counter synchronized to ADV, with LBO selecting linear or interleaved sequence - both defined per JEDEC-standard burst protocols.
Write operations are self-timed: GW enables full 36-bit writes, while BWE and BW1–BW4 allow selective 9-bit byte writes. Power management includes asynchronous ZZ-controlled sleep mode (IZZ ≤ 70mA) and CMOS standby (ISB1 ≤ 70mA), with pipelined read outputs delivering first data one clock cycle after address latch.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Memory Organization | 256K × 36-bit (9Mbit); supports 512K × 18-bit via pin-strapping |
| Max Clock Frequency | 150MHz - guarantees tCYC ≤ 6.7ns for full-speed burst reads/writes |
| Access Time | 3.8ns - clock-to-valid-data delay (tCD) at 150MHz, enabling tight system timing budgets |
| Supply Voltages | VDD = 3.3V ±5% (core), VDDQ = 3.3V ±5% (I/O) - requires dual 3.3V rails with independent decoupling |
| Operating Temperature | -40°C to +85°C - qualified for industrial-grade embedded systems |
| Burst Mode | Linear or interleaved 4-word burst (LBO-selectable) - eliminates external address sequencing logic |
| Power-Down Current | IZZ ≤ 70mA - reduces active power by >80% during sleep mode |
Pinout & Package
Packaged in a JEDEC-standard 100-pin thin quad flatpack (TQFP), 14mm × 20mm body, lead pitch 0.5mm. Pinout validated for 256K × 36 configuration per PKG100 drawing (Rev. 6.42, p.5).
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| A0–A18 | Address Inputs | Synchronous inputs latched on rising CLK edge with ADSP/ADSC; A0–A17 used for 256K×36 addressing |
| CLK | System Clock | Rising-edge-triggered master timing reference for all registers and burst counter |
| GW, BWE, BW1–BW4 | Write Control | GW enables full 36-bit write; BWE gates BWx; BW1–BW4 each enable one 9-bit byte (I/O0–7/I/OP1, etc.) |
| ADV, ADSP, ADSC | Burst Address Control | ADV advances internal burst counter; ADSP (processor) and ADSC (cache) load address register synchronously |
| LBO | Burst Order Select | Asynchronous static input: LOW = linear burst, HIGH = interleaved burst (per JEDEC) |
| ZZ | Sleep Mode Enable | Asynchronous HIGH disables internal clock and reduces current to IZZ ≤ 70mA |
| I/O0–I/O31, I/OP1–I/OP4 | Data I/O | 36-bit bidirectional bus; registered input/output paths; all pins driven only when OE = LOW and chip selected |
| OE | Output Enable | Asynchronous control: LOW enables output drivers; HIGH forces high-impedance state regardless of clock |
Key Features
| Feature | Design Value |
|---|---|
| Pipelined Outputs | First read data appears on next CLK rising edge - eliminates wait states in CPU/cache interfaces |
| Single-Cycle Deselect | Chip deactivation completes within one clock cycle - enables rapid bank switching in multi-SRAM systems |
| Self-Timed Write Cycle | Internal timing logic eliminates need for external write pulse generation - simplifies controller design |
| Byte-Write Capability | Four independent 9-bit write enables (BW1–BW4) allow partial-word updates without read-modify-write overhead |
| Industrial Temperature Range | Rated -40°C to +85°C - suitable for base station, router, and industrial automation environments |
Applications
| High-Speed Cache Buffer | Network Packet Buffer |
|---|---|
Use Scenario: L2/L3 cache between processor and DRAM in telecom line cards. IC Role / Device Role / Timing Role: Synchronous SRAM providing low-latency, burst-mode data storage with pipelined read outputs. Use Value: 150MHz operation and 3.8ns tCD reduce memory access latency by >30% vs. asynchronous SRAMs in same footprint. | Use Scenario: Temporary storage for packet headers and payloads in Ethernet switches. IC Role / Device Role / Timing Role: Burst-capable buffer interfacing with MAC controllers using ADV/ADSP handshaking. Use Value: Linear/interleaved burst modes align with IEEE 802.3 frame structures, minimizing bus turnaround overhead. |
| Baseband Processor Memory | Industrial PLC Data Buffer |
Use Scenario: Real-time data exchange between DSP cores and FPGA accelerators in wireless infrastructure. IC Role / Device Role / Timing Role: High-reliability SRAM with ZZ sleep mode for power-gated subsystems. Use Value: IZZ ≤ 70mA in sleep mode extends uptime in fanless, thermally constrained enclosures. | Use Scenario: Deterministic I/O data staging in programmable logic controllers with deterministic scan cycles. IC Role / Device Role / Timing Role: Industrial-temp SRAM supporting single-cycle deselect for precise timing-critical I/O updates. Use Value: Guaranteed -40°C to +85°C operation ensures stable timing margins across factory floor thermal swings. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar synchronous SRAM applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| CY7C1362BV18 | 512K × 18-bit organization; 166MHz max; different pinout (119-ball BGA only) | Requires PCB redesign; lacks TQFP option and LBO-configurable burst order | Select when higher density and maximum speed are prioritized over package compatibility |
| AS7C3256B | 256K × 32-bit; 150MHz; 3.3V core/I/O; no burst mode or pipelined outputs | Supports basic SRAM interface only; no ADV/ADSP/BWx control logic | Select for cost-sensitive designs where burst performance is not required |
Compared with CY7C1362BV18 and AS7C3256B, the 71V67603S150BGG uniquely delivers 256K × 36-bit density in TQFP-100 with JEDEC-compliant burst modes, pipelined outputs, and industrial temperature rating - making it optimal for space-constrained, high-throughput embedded buffers requiring minimal controller overhead.
Availability
71V67603S150BGG is available at Aetrix Electronics and suitable for high-speed cache buffers, network packet buffers, and industrial PLC data staging requiring stable component supply across extended temperature ranges.
Supply support for 71V67603S150BGG includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
IDT (Integrated Device Technology), now part of Renesas Electronics, is a fabless semiconductor company specializing in high-performance timing, memory, and interface solutions.
The 71V67603S150BGG belongs to IDT's high-speed synchronous SRAM product line, designed specifically for low-latency, burst-oriented buffering in networking, telecom, and industrial real-time systems.
FAQ
What is the memory organization supported by the 71V67603S150BGG?
The 71V67603S150BGG is organized as 256K × 36 bits (9Mbit) in its default configuration. It also supports 512K × 18-bit operation through pin-strapping and address mapping - verified in the functional block diagram and PKG100 pin configurations for both memory modes.
Does the 71V67603S150BGG support burst mode, and how is it configured?
Yes, the 71V67603S150BGG supports 4-word burst mode with selectable linear or interleaved sequences. Configuration is controlled by the LBO pin: LOW selects linear burst, HIGH selects interleaved burst. This is explicitly defined in the Interleaved and Linear Burst Sequence Tables and validated in AC timing waveforms.
What package type and pin count does the 71V67603S150BGG use?
The 71V67603S150BGG uses a JEDEC-standard 100-pin thin quad flatpack (TQFP) with 14mm × 20mm body and 0.5mm lead pitch. Pinout is fully documented for the 256K × 36 configuration in Figure 510 drw 02 (Rev. 6.42, p.5).
How does the 71V67603S150BGG handle power management?
The 71V67603S150BGG implements three power states: active (IDD ≤ 325mA at 150MHz), CMOS standby (ISB1 ≤ 70mA), and full sleep mode (IZZ ≤ 70mA) activated by the asynchronous ZZ input. Sleep mode retains data while minimizing current draw - confirmed in DC Electrical Characteristics Table 09.
What are the key timing parameters for read operations at 150MHz?
At 150MHz, the 71V67603S150BGG guarantees tCD ≤ 3.8ns (clock-to-valid-data), tOE ≤ 3.8ns (output enable access), and tCHZ ≤ 3.8ns (clock-high-to-output-high-Z). These values are specified in AC Electrical Characteristics Table 16 and validated in Pipelined Read Cycle waveform (Figure 5310 drw 08).
71V67603S150BGG Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Renesas
- Series:
- -
- Package/Case:
- 119-BGA
- Packaging:
- Tray
- Product Status:
- Obsolete
- Programmable:
- Not Verified
- Memory Type:
- Volatile
- Memory Format:
- SRAM
- Technology:
- SRAM - Synchronous, SDR
- Memory Size:
- 9Mbit
- Memory Organization:
- 256K x 36
- Memory Interface:
- Parallel
- Clock Frequency:
- 150 MHz
- Write Cycle Time - Word, Page:
- -
- Access Time:
- 3.8 ns
- Voltage - Supply:
- 3.135V ~ 3.465V
- Operating Temperature:
- 0°C ~ 70°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 119-PBGA (14x22)
71V67603S150BGG FAQ
1.How can I place an order for 71V67603S150BGG through Aetrix?
Please submit a Request for Quotation (RFQ) for 71V67603S150BGG on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
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The price and inventory of 71V67603S150BGG are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for 71V67603S150BGG is usually 5 days.
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6.How does Aetrix verify that 71V67603S150BGG is sourced from the original manufacturer or authorized distributors?
All 71V67603S150BGG products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that 71V67603S150BGG meets industry standards.
7.What is the process for return or replacement of 71V67603S150BGG?
All 71V67603S150BGG units undergo pre-shipment inspection (PSI). If there is an issue with 71V67603S150BGG, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The 71V67603S150BGG part is unused and in its original packaging.
Return procedure for 71V67603S150BGG:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
71V67603S150BGG Tags

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M24C02-WMN6TP
STMicroelectronics
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AT24C02C-XHM-T
Microchip Technology

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AT21CS01-STUM10-T
Microchip Technology

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AT24C02C-SSHM-T
Microchip Technology

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24LC01BT-I/OT
Microchip Technology
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M24C02-FMC6TG
STMicroelectronics

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AT24CS02-SSHM-T
Microchip Technology

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93LC46BT-I/OT
Microchip Technology

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AT24C04C-SSHM-T
Microchip Technology

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24LC01BT-I/SN
Microchip Technology

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24AA02UIDT-I/OT
Microchip Technology

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AT24C08C-STUM-T
Microchip Technology
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