NXP Semiconductors 74HCT4051N,112

Overview

74HCT4051N,112 from NXP Semiconductors is an 8-channel analog/digital multiplexer/demultiplexer with active-LOW enable (E), three binary select inputs (S0–S2), eight independent I/Os (Y0–Y7), and one common I/O (Z). It operates at 4.5 V to 5.5 V logic supply (VCC), supports ±5 V analog signal swing (VEE = −5 V), delivers 60 Ω typical ON-resistance at VCC−VEE = 9.0 V, and features built-in break-before-make switching for clean channel transitions - used in precision sensor signal routing and mixed-signal data acquisition systems.

For engineers reviewing the 74HCT4051N,112 datasheet, 74HCT4051N,112 pinout, 74HCT4051N,112 application, or 74HCT4051N,112 equivalent, this device is selected for its TTL-compatible control interface, rail-to-rail analog capability, low leakage (<±0.4 µA OFF-state), ESD-hardened design (HBM >2000 V), and DIP16 package suitability for prototyping and industrial instrumentation.

Technical Context

The 74HCT4051N,112 implements a 1-of-8 bidirectional analog switch matrix controlled by standard TTL-level digital inputs. Its internal decoder activates exactly one Yn–Z path when E is LOW, while all channels enter high-impedance OFF-state when E is HIGH - independent of S0–S2 state.

VCC powers only the digital control circuitry (S0/S1/S2/E); analog signal paths (Y0–Y7, Z) operate between VEE and VCC, supporting dual-supply configurations up to 10 V total (VCC − VEE ≤ 10.0 V). The device guarantees operation from −40 °C to +125 °C and includes inherent logic-level translation for interfacing 5 V digital controllers with ±5 V analog front-ends.

Key Specifications

Pinout & Package

74HCT4051N,112 uses a 16-pin plastic dual in-line package (DIP16, SOT38-4) with 300-mil width, through-hole mounting, and industry-standard pin spacing. Pin 1 is index-marked; thermal performance rated at 750 mW total power dissipation below 70 °C.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar analog multiplexer applications.

Compared with CD74HC4051E and ADG708BRUZ, the 74HCT4051N,112 uniquely balances TTL-compatible digital control, ±5 V analog swing, DIP16 prototyping convenience, and industrial temperature rating - making it optimal for drop-in upgrades in legacy 5 V systems requiring robust analog multiplexing.

Availability

74HCT4051N,112 is available at Aetrix Electronics and suitable for industrial sensor interfaces, automotive battery management systems, and test equipment requiring stable component supply across extended temperature ranges and long production lifecycles.

Supply support for 74HCT4051N,112 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

NXP Semiconductors is a global semiconductor leader focused on secure connectivity solutions for automotive, industrial, and IoT applications.

The 74HCT4051N,112 belongs to NXP's legacy logic portfolio designed for robust, pin-compatible replacements of obsolete TTL multiplexers - emphasizing reliability, wide temperature operation, and mixed-signal interoperability in mission-critical systems.

FAQ

What is the maximum allowable voltage difference between VCC and VEE for the 74HCT4051N,112?

The 74HCT4051N,112 specifies VCC − VEE ≤ 10.0 V absolute maximum. For example, with VCC = 5.0 V, VEE may be as low as −5.0 V. Exceeding this limit risks permanent damage to the internal analog switches. This constraint applies regardless of whether VEE is grounded or actively biased - always verify the differential voltage during power-up sequencing and fault conditions in the 74HCT4051N,112 design.

Can the 74HCT4051N,112 be used with a single 5 V supply for analog signals?

Yes - tie VEE to GND and operate Y0–Y7 and Z between 0 V and VCC = 5.0 V. In this unipolar configuration, the 74HCT4051N,112 maintains 60 Ω typical RON and <0.4 µA leakage. However, note that the full ±5 V analog range requires dual supplies (e.g., VCC = +5 V, VEE = −5 V), and the 74HCT4051N,112's TTL-compatible inputs remain functional regardless of VEE setting.

Does the 74HCT4051N,112 support hot insertion or live signal switching?

No - the 74HCT4051N,112 is not specified for hot insertion. Switching must occur only when all analog voltages (Yn, Z) are within VEE to VCC bounds and digital control signals (S0–S2, E) are stable. Transient overvoltage on Yn/Z during power-up or signal surges can exceed absolute maximum ratings and cause latch-up. Always sequence VCC/VEE before applying analog signals in any 74HCT4051N,112 application.

What is the meaning of 'break-before-make' in the 74HCT4051N,112 datasheet?

'Break-before-make' means the 74HCT4051N,112 guarantees zero overlap between the turn-OFF of the previously selected channel and turn-ON of the newly selected channel during address changes. This prevents momentary short-circuits between Yn nodes - critical when multiplexing independently sourced analog signals (e.g., multiple sensors with different output impedances). The timing is inherent to the internal decoder design and requires no external timing control in the 74HCT4051N,112.

How does the 74HCT4051N,112 handle leakage current in high-impedance measurement circuits?

The 74HCT4051N,112 limits OFF-state leakage to ±0.4 µA maximum per channel (all channels combined ≤ ±0.4 µA) at VCC = 5.5 V and Tamb = 25 °C. At 125 °C, leakage rises to ±4.0 µA - still acceptable for most 12-bit ADC front-ends with ≤1 MΩ source impedance. For femtoamp-level measurements, pair the 74HCT4051N,112 with guard traces and low-leakage PCB materials, as its leakage is orders of magnitude lower than standard PCB surface contamination.