Analog Devices Inc. AD4111BCPZ

Overview

AD4111BCPZ from Analog Devices is a 24-bit sigma-delta ADC with integrated analog front end for industrial process monitoring, supporting ±10 V differential or single-ended voltage inputs (up to 8 channels) and 0 mA to 20 mA current inputs (4 channels), with open wire detection, ±0.06% voltage accuracy at 25°C, and operation from −40°C to +105°C.

For engineers reviewing the AD4111BCPZ datasheet, AD4111BCPZ pinout, AD4111BCPZ application, or AD4111BCPZ equivalent, key selection criteria include its dual-input capability (voltage + current), on-chip 2.5 V reference (±0.12% initial accuracy), 6.21 kSPS per-channel scan rate, IEC61000-4-x EMC robustness, and LFCSP-40 package compatibility with isolated PLC analog input modules.

Technical Context

The AD4111BCPZ implements a multi-stage sinc5 + sinc1 digital filter architecture enabling simultaneous 50 Hz and 60 Hz rejection at 27.27 SPS, with selectable filter modes (sinc3, sinc5+sinc1) and single-cycle settling (161 µs). It integrates programmable gain, offset calibration registers, and an internal 2.5 V bandgap reference with ±5 ppm/°C drift.

Its analog front end supports eight independent channel configurations via dedicated setup registers, with rail-to-rail reference input buffers, open wire detection circuitry using COMPA/COMPB compensation pins, and dual power domains (AVDD 3.0–5.5 V, IOVDD 2–5.5 V) for galvanic isolation flexibility.

Key Specifications

Pinout & Package

The AD4111BCPZ is housed in a 40-lead, 6 mm × 6 mm LFCSP package with exposed thermal pad soldered to AVSS for mechanical stability and heat dissipation.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar precision industrial ADC applications.

Compared with AD7177-2BRUZ and LTC2499CGN#PBF, the AD4111BCPZ uniquely integrates voltage/current dual-input capability, open wire diagnostics, and certified EMC immunity-making it the only drop-in solution for space-constrained, safety-critical PLC analog input designs requiring zero external signal conditioning.

Availability

AD4111BCPZ is available at Aetrix Electronics and suitable for process control transmitters, PLC analog input modules, and industrial data loggers requiring stable component supply, long-term lifecycle support, and guaranteed traceable sourcing.

Supply support for AD4111BCPZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and digital signal processing semiconductors, headquartered in Norwood, MA.

The AD4111 product line is designed specifically for industrial automation signal chains-integrating precision ADCs, robust analog front ends, and system-level diagnostics to simplify PLC, DCS, and field instrument design.

FAQ

What is the maximum channel scan rate of the AD4111BCPZ?

The AD4111BCPZ achieves a maximum channel scan rate of 6.21 kSPS per channel with fully settled data (161 µs settling time). This performance is maintained across all eight voltage input channels when configured in sequenced mode, enabling high-throughput acquisition in modular I/O systems without sacrificing accuracy or noise performance. The AD4111BCPZ sustains this rate while delivering 24-bit no-missing-codes resolution and simultaneous 50/60 Hz rejection.

Does the AD4111BCPZ support both voltage and current inputs simultaneously?

Yes, the AD4111BCPZ supports concurrent voltage and current acquisition: up to eight ±10 V single-ended or four differential voltage inputs, plus four independent 0 mA to 20 mA current inputs-all on a single chip. Each channel is individually configurable via dedicated setup registers, allowing mixed-mode operation (e.g., VIN0 = voltage sensor, IIN0+ = 4–20 mA transmitter) without external multiplexing or reconfiguration delays. The AD4111BCPZ handles both signal types with separate accuracy specs (±0.06% for voltage, ±0.08% for current at 25°C).

How does open wire detection work on the AD4111BCPZ?

Open wire detection on the AD4111BCPZ uses dedicated COMPA and COMPB pins to monitor continuity of voltage input leads. When enabled, each voltage input (VIN0–VIN7) connects through a 1 kΩ resistor and 680 pF capacitor to either COMPA (for VIN0/VIN2/VIN4/VIN6) or COMPB (for VIN1/VIN3/VIN5/VIN7). The internal circuitry detects broken connections by measuring impedance changes and flags faults in the status register. This feature operates with a single 3.3 V or 5 V supply and requires no external active components-making the AD4111BCPZ ideal for self-diagnosing field instrumentation.

What reference options does the AD4111BCPZ provide?

The AD4111BCPZ integrates a buffered 2.5 V internal reference with ±0.12% initial accuracy and ±5 ppm/°C typical drift, eliminating the need for external references in most industrial applications. It also supports external differential reference inputs (REF+ and REF−) ranging from 1 V to AVDD, with common-mode voltage limits and buffered inputs for improved noise immunity. Reference selection is controlled via the REF_EN bit in the ADC Mode register, and the AD4111BCPZ maintains specified accuracy whether using internal or external references across −40°C to +105°C.

Is the AD4111BCPZ compatible with standard serial interfaces?

Yes, the AD4111BCPZ features a 3-wire or 4-wire SPI-compatible serial interface with Schmitt-triggered SCLK, supporting SPI, QSPI, MICROWIRE, and DSP protocols. It operates with CS, SCLK, DIN, and DOUT/RDY pins, and includes CRC checksum protection and register-level error flagging. The interface tolerates IOVDD from 2 V to 5.5 V independently of AVDD, enabling direct connection to 1.8 V, 3.3 V, or 5 V microcontrollers without level shifters. All timing parameters (e.g., t3/t4 SCLK pulse widths, t23 data valid delay) are fully characterized across temperature and voltage ranges for reliable interoperability.