Analog Devices Inc. AD676KDZ
- Part No.:
- AD676KDZ
- Manufacturer:
- Analog Devices Inc.
- Category:
- Analog to Digital Converters (ADC)
- Package:
- 28-CDIP (0.600", 15.24mm)
- Datasheet:
-
AD676KDZ.pdf
- Description:
- IC ADC 16BIT SAR 28CDIP
- Quantity:
- Payment:

- Shipping:

Inventory:4,432
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
AD676KDZ from Analog Devices is a 16-bit successive-approximation analog-to-digital converter (SAR ADC) with on-chip sample-hold, autocalibration, and parallel digital output. It delivers 100 kSPS conversion rate, ±1.5 LSB integral nonlinearity (INL), –97 dB THD, and 87 dB S/(N+D) at 83 kSPS - enabling high-fidelity data acquisition in precision instrumentation and automated test equipment.
For engineers reviewing the AD676KDZ datasheet, AD676KDZ pinout, AD676KDZ application, or AD676KDZ equivalent, key selection considerations include its dual-chip BiMOS II + DSP CMOS architecture, ±12 V / +5 V triple-supply operation, 28-pin ceramic DIP package, and requirement for external 5–10 V reference voltage to achieve specified dynamic performance.
Technical Context
The AD676KDZ implements a switched-capacitor charge-redistribution SAR architecture - eliminating laser-trimmed resistor ladders and reducing temperature-induced linearity drift. Its two-die construction separates analog signal processing (BiMOS II) from digital control (DSP CMOS), minimizing crosstalk between domains.
Autocalibration uses an on-chip microcontroller and calibration DAC to measure and correct capacitor mismatch errors across the top nine bits, storing correction values in RAM for real-time compensation. Conversion timing requires exactly 17 clock cycles per sample, with BUSY asserted high during acquisition and conversion, and data valid on the falling edge of the 17th CLK.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Resolution | 16-bit - supports 65,536 distinct output codes with no missing codes guaranteed. |
| Conversion Rate | 100 kSPS - 10 µs total conversion time enables real-time sampling of signals up to 50 kHz Nyquist bandwidth. |
| INL (Max) | ±1.5 LSB - ensures monotonicity and <0.023% full-scale error over 0°C to +70°C operating range. |
| THD | –97 dB - corresponds to 0.0014% distortion at 100 kSPS, critical for spectral purity in signal analysis. |
| S/(N+D) | 87 dB - defines usable dynamic range of ~14.5 effective bits under 83 kSPS conditions. |
| Full Power BW | 1 MHz - allows accurate digitization of fast transients and wideband analog inputs without amplitude roll-off. |
| Supply Voltages | +12 V (VCC), –12 V (VEE), +5 V (VDD) - separate analog/digital rails reduce switching noise coupling into conversion path. |
| Reference Input | 5–10 V external VREF - directly scales full-scale input range (±VREF); accuracy and stability of reference dominate system gain error. |
Pinout & Package
AD676KDZ is housed in a 28-pin side-brazed ceramic DIP (package option D-28), with hermetically sealed construction suitable for industrial and military-grade applications. Pin 17 (VEE) connects internally to the package lid for thermal and shielding integrity.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| 1–6, 19–28 | Digital Output (BIT 11–16, BIT 1–10) | 16-bit two's complement parallel data bus; BIT 1 = MSB, BIT 16 = LSB; outputs valid after BUSY falls. |
| 7 | Digital Output (BUSY) | Active-high status signal indicating conversion or calibration in progress; must be buffered if loaded >10 pF. |
| 8 | Digital Input (CAL) | Asynchronous calibration trigger; rising edge resets internal logic, falling edge initiates 85,530-clock autocalibration sequence. |
| 9 | Digital Input (SAMPLE) | Acquisition control; HIGH enables track mode, falling edge initiates conversion and freezes VIN sample via aperture delay (6 ns). |
| 10 | Digital Input (CLK) | Master clock input; 17 rising edges required per conversion; minimum period 480 ns; duty cycle flexible but tCH/tCL ≥50 ns. |
| 11 | Power (DGND) | Digital ground reference for VDD and all digital I/O; must be isolated from AGND except at single-point connection near AD676KDZ. |
| 12, 17 | Power (VCC, VEE) | +12 V and –12 V analog supplies powering SHA, comparator, and capacitor array; VEE tied to ceramic lid for EMI shielding. |
| 13, 14 | Analog Input (AGND, AGND SENSE) | Primary analog ground and Kelvin sense return; AGND SENSE minimizes ground loop error in high-accuracy measurement setups. |
| 15 | Analog Input (VIN) | Differential-input-capable analog input; accepts ±VREF range; 50 pF input capacitance during sample phase affects external driver requirements. |
| 16 | Analog Input (VREF) | External reference voltage input (5–10 V); sets full-scale range and dominates gain error budget; requires low-noise, low-drift source. |
| 18 | Power (VDD) | +5 V logic supply for digital controller, output buffers, and calibration circuitry; decoupled separately from analog supplies. |
Key Features
| Feature | Design Value |
|---|---|
| On-chip sample-hold | Eliminates need for external SHA; 2 µs input settling time and 100 ps aperture jitter support high-fidelity transient capture. |
| Autocalibration | Compensates capacitor mismatch errors in real time; achieves ±1.5 LSB INL without user trim; calibration valid over full temperature range. |
| Two-die monolithic integration | Separates analog (BiMOS II) and digital (DSP CMOS) functions to suppress supply and switching noise coupling into conversion path. |
| Parallel 16-bit output | Direct interface to 16-bit microprocessors/DSPs without serialization overhead; BUSY-synchronized latching simplifies timing-critical reads. |
| Triple isolated supplies | VCC/VEE (±12 V) and VDD (+5 V) are physically and functionally segregated to minimize digital feedthrough into analog front-end. |
| AGND sense architecture | Dedicated AGND SENSE pin enables 4-wire Kelvin connection to eliminate IR drop errors in precision measurement systems. |
Applications
| High-Accuracy Data Loggers | Automated Test Equipment (ATE) |
|---|---|
Use Scenario: Continuous monitoring of sensor outputs (e.g., strain gauges, RTDs) in environmental chambers with 0.01°C or 1 µε resolution requirements. IC Role / Device Role / Timing Role: Primary SAR ADC capturing slow-varying dc-coupled signals; uses autocalibration to maintain INL stability across thermal cycles. Use Value: ±1.5 LSB INL and 87 dB S/(N+D) ensure measurement repeatability within 0.023% FSR over 0°C to +70°C without recalibration. | Use Scenario: Digitizing stimulus-response waveforms in semiconductor parametric testers requiring <0.05% gain error and sub-100 ps timing fidelity. IC Role / Device Role / Timing Role: High-linearity acquisition stage synchronized to system clock; BUSY-driven latching aligns sampled data to test controller timing windows. Use Value: 1 MHz full-power bandwidth and –97 dB THD preserve harmonic content of multi-tone test signals for accurate parameter extraction. |
| Precision Industrial Process Controllers | Medical Diagnostic Signal Acquisition |
Use Scenario: Closed-loop feedback control of temperature, pressure, or flow using 4–20 mA transmitters and HART-compatible analog inputs. IC Role / Device Role / Timing Role: Bipolar input ADC interfacing to isolated signal conditioners; AGND SENSE compensates for ground potential differences in distributed I/O racks. Use Value: ±VREF input range and bipolar zero error <0.005% FSR enable accurate offset-nulling of field transmitter offsets without software correction. | Use Scenario: Digitizing ECG, EEG, or ultrasound receive-path signals where baseline stability and harmonic distortion directly impact diagnostic confidence. IC Role / Device Role / Timing Role: Front-end ADC in battery-powered portable diagnostics; autocalibration maintains accuracy despite ambient temperature shifts during clinical use. Use Value: 90 dB S/(N+D) at 100 kSPS and 16-bit no-missing-codes guarantee detection of low-amplitude pathological features buried in noise floor. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar 16-bit SAR ADC applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| AD7606BSTZ | 8-channel simultaneous-sampling, integrated reference and PGA; 200 kSPS per channel; uses single +5 V supply. | Better suited for multi-channel synchronized acquisition; lacks autocalibration - requires external trimming for <±2 LSB INL. | Select when channel density and system integration outweigh need for self-calibrating single-channel precision. |
| ADS8860IDRCT | 16-bit, 1 MSPS, SPI interface; single +3 V supply; no internal sample-hold or reference; 0.5 LSB INL (typ). | Higher speed and lower power, but requires external SHA, reference, and digital interface logic; not pin-compatible. | Select for portable, high-throughput applications where board space and power efficiency are prioritized over out-of-box dc accuracy. |
Compared with AD7606BSTZ and ADS8860IDRCT, the AD676KDZ provides guaranteed ±1.5 LSB INL without external calibration hardware or software, operates from industry-standard ±12 V/5 V supplies, and integrates sample-hold functionality - making it optimal for legacy industrial systems and metrology-grade single-channel designs where long-term dc stability is non-negotiable.
Availability
AD676KDZ is available at Aetrix Electronics and suitable for high-accuracy data loggers, automated test equipment, and precision industrial process controllers requiring stable component supply across extended product lifecycles.
Supply support for AD676KDZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and digital signal processing semiconductors, headquartered in Wilmington, MA.
The AD676 series belongs to Analog Devices' precision data acquisition portfolio, designed specifically for applications demanding guaranteed 16-bit linearity, low distortion, and autonomous calibration in harsh industrial and test environments.
FAQ
What is the operating temperature range for the AD676KDZ?
The AD676KDZ is rated for 0°C to +70°C operation (K grade). This specification is confirmed in the Ordering Guide and DC Specifications tables, where AD676KD models are explicitly listed with TMIN = 0°C and TMAX = +70°C. The device maintains ±1.5 LSB INL and 87 dB S/(N+D) across this full range post-calibration.
Does the AD676KDZ require an external voltage reference, and what range is supported?
Yes, the AD676KDZ requires an external voltage reference applied to the VREF pin. It supports 5 V to 10 V input range, as specified in the DC Specifications table under "VOLTAGE REFERENCE INPUT RANGE." Using 10 V yields ±10 V input range; using 5 V yields ±5 V. Reference stability and noise directly impact gain error and dynamic performance.
How does autocalibration work in the AD676KDZ, and how often must it be performed?
The AD676KDZ performs capacitor mismatch correction by measuring and storing error coefficients in on-chip RAM during a dedicated 85,530-clock-cycle sequence triggered by the CAL pin. Calibration is typically required only at power-up, after major temperature excursions, or if accuracy degrades - uncalibrated operation may fall to ~10-bit effective resolution. The process is fully autonomous and requires no user intervention beyond asserting CAL.
What are the critical PCB layout requirements for maintaining AD676KDZ performance?
Key layout requirements include: (1) separate analog (AGND) and digital (DGND) ground planes joined at a single point near the AD676KDZ, (2) 0.1 µF ceramic decoupling capacitors placed within 2 mm of each supply pin (VCC, VEE, VDD, VREF), (3) routing VIN and VREF away from digital traces, and (4) using AGND SENSE for Kelvin connection to eliminate ground path resistance errors.
Is the AD676KDZ pin-compatible with other members of the AD676 family, such as the AD676JD or AD676BD?
Yes, all AD676 variants - including AD676JD, AD676KD, AD676AD, and AD676BD - share identical 28-pin ceramic DIP pinouts and electrical interfaces. Differences are limited to temperature grade (J/K = 0°C to +70°C; A/B = –40°C to +85°C) and tested performance limits (e.g., AD676KD guarantees 87 dB S/(N+D), while AD676JD guarantees 85 dB). No PCB changes are required when substituting within the same package type.
AD676KDZ Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Analog Devices Inc.
- Series:
- -
- Package/Case:
- 28-CDIP (0.600", 15.24mm)
- Packaging:
- Tube
- Product Status:
- Active
- Number of Bits:
- 16
- Sampling Rate (Per Second):
- 100k
- Number of Inputs:
- 1
- Input Type:
- Single Ended
- Data Interface:
- Parallel
- Configuration:
- S/H-ADC
- Ratio - S/H:ADC:
- 1:1
- Number of A/D Converters:
- 1
- Architecture:
- SAR
- Reference Type:
- External
- Voltage - Supply, Analog:
- ±12V
- Voltage - Supply, Digital:
- 5V
- Features:
- -
- Operating Temperature:
- 0°C ~ 70°C
- Supplier Device Package:
- 28-CDIP
- Mounting Type:
- Through Hole
- Grade:
- -
- Qualification:
- -
AD676KDZ FAQ
1.How can I place an order for AD676KDZ through Aetrix?
Please submit a Request for Quotation (RFQ) for AD676KDZ on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for AD676KDZ reliable?
The price and inventory of AD676KDZ are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for AD676KDZ is usually 5 days.
3.What payment methods are accepted for AD676KDZ?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for AD676KDZ transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for AD676KDZ?
AD676KDZ orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your AD676KDZ order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for AD676KDZ?
For technical support, including AD676KDZ datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your AD676KDZ requirements.
6.How does Aetrix verify that AD676KDZ is sourced from the original manufacturer or authorized distributors?
All AD676KDZ products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that AD676KDZ meets industry standards.
7.What is the process for return or replacement of AD676KDZ?
All AD676KDZ units undergo pre-shipment inspection (PSI). If there is an issue with AD676KDZ, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The AD676KDZ part is unused and in its original packaging.
Return procedure for AD676KDZ:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
AD676KDZ Tags

-
ADC081C021CIMKX/NOPB
Texas Instruments

-
MCP3021A5T-E/OT
Microchip Technology

-
TLA2024IRUGR
Texas Instruments

-
MCP3221A5T-E/OT
Microchip Technology

-
MCP3221A5T-I/OT
Microchip Technology

-
MCP3221A4T-E/OT
Microchip Technology

-
MCP3221A6T-E/OT
Microchip Technology

-
MCP3221A0T-E/OT
Microchip Technology

-
MCP3221A1T-E/OT
Microchip Technology

-
ADC121S021CIMFX/NOPB
Texas Instruments

-
MCP3001-I/MS
Microchip Technology

-
MCP3001-I/SN
Microchip Technology
Tech Hub
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…

