My Inquiry
My Account
Analog Devices Inc. AD676KNZ
- Part No.:
- AD676KNZ
- Manufacturer:
- Analog Devices Inc.
- Category:
- Analog to Digital Converters (ADC)
- Package:
- 28-DIP (0.600", 15.24mm)
- Datasheet:
-
AD676KNZ.pdf
- Description:
- IC ADC 16BIT SAR 28DIP
- Quantity:
- Payment:
- Shipping:
Inventory:3,184
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
AD676KNZ from Analog Devices is a 16-bit successive-approximation analog-to-digital converter (SAR ADC) with on-chip sample-hold, autocalibration, and parallel digital output. It delivers 100 kSPS conversion rate (10 µs total time), ±1.5 LSB integral nonlinearity at 100 kSPS over 0°C to +70°C, –97 dB THD, and 90 dB S/(N+D) at 100 kSPS. It operates from +5 V, ±12 V supplies and targets precision data acquisition in instrumentation and signal processing systems.
For engineers reviewing the AD676KNZ datasheet, AD676KNZ pinout, AD676KNZ application, or AD676KNZ equivalent, key selection considerations include its 28-pin ceramic DIP package, dual-chip BiMOS II/CMOS architecture, 1 MHz full-power bandwidth, bipolar ±VREF input range, and requirement for external 5–10 V reference voltage.
Technical Context
The AD676KNZ implements a switched-capacitor charge redistribution SAR architecture-replacing laser-trimmed resistor ladders with binary-weighted capacitors to eliminate temperature-induced linearity drift. Its two-die construction separates analog signal processing (BiMOS II) from digital control (DSP CMOS), minimizing crosstalk between domains.
Autocalibration is performed asynchronously via the CAL pin and completes in 85,530 clock cycles; it measures and corrects capacitor mismatch errors for MSB through bit 9, storing compensation values in on-chip RAM. Conversion is initiated by the SAMPLE pin's falling edge, followed by exactly 17 CLK cycles, with BUSY indicating active conversion or calibration.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Resolution | 16-bit - guarantees no missing codes across full operating range |
| Conversion Rate | 100 kSPS - fixed 10 µs total conversion time enables deterministic timing in real-time systems |
| INL (Max) | ±1.5 LSB - ensures monotonicity and <0.023% full-scale error for high-accuracy measurement |
| THD | –97 dB at 100 kSPS, +25°C - supports clean spectral performance in audio and communications applications |
| S/(N+D) | 90 dB at 100 kSPS, +25°C - enables >14.6 ENOB for demanding dynamic signal analysis |
| Full-Power Bandwidth | 1 MHz - allows accurate digitization of fast-slewing signals up to 1 MHz without amplitude loss |
| Supply Voltages | +5 V (VDD), +12 V (VCC), –12 V (VEE) - separate analog/digital rails reduce switching noise coupling into conversion path |
| Reference Input Range | 5 V to 10 V - supports flexible scaling; 10 V reference yields ±10 V input range with 152.6 µV LSB |
Pinout & Package
AD676KNZ is housed in a 28-pin side-brazed ceramic DIP (package option D-28), rated for 0°C to +70°C operation. The package integrates two monolithic dies (analog BiMOS II + digital CMOS) and features isolated analog/digital grounds, AGND sense, and dedicated power pins for optimal noise isolation.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| 1–6 BIT 11–BIT 16 | Digital Output (LSBs) | Parallel 6-bit LSB data outputs; active during BUSY LOW, valid after 17th CLK rising edge |
| 7 BUSY | Digital Output (Status) | Active-HIGH open-collector status signal; indicates ongoing conversion or calibration; requires buffering if loaded >1 TTL input |
| 8 CAL | Digital Input (Control) | Asynchronous calibration trigger; HIGH resets internal logic, LOW initiates 85,530-cycle autocalibration sequence |
| 9 SAMPLE | Digital Input (Control) | Acquisition control; HIGH enables track mode, falling edge initiates conversion; must be LOW during calibration |
| 10 CLK | Digital Input (Timing) | Master clock input; 17 precise cycles required per conversion; rising edge drives internal SAR logic |
| 11 DGND | Power Reference | Digital ground return; must be connected to system digital common, isolated from AGND except at single-point tie |
| 12 VCC | Analog Supply | +12 V analog supply for SHA and ADC core; requires local 0.1 µF bypass to AGND |
| 13 AGND | Analog Reference | Analog ground return; primary reference for VIN, VREF, and analog circuitry; low-impedance plane required |
| 14 AGND SENSE | Analog Input | Remote sensing node for AGND; improves accuracy by compensating for trace IR drop in high-current analog paths |
| 15 VIN | Analog Input | Differential input referenced to AGND; accepts ±VREF range (e.g., ±10 V); 50 pF sampling capacitance |
| 16 VREF | Analog Input | External precision reference input (5–10 V); sets full-scale range and directly impacts LSB size and gain accuracy |
| 17 VEE | Analog Supply | –12 V analog supply; ceramic package lid internally tied to VEE; requires 0.1 µF bypass to AGND |
| 18 VDD | Digital Supply | +5 V logic supply for output buffers and controller; decoupled separately to DGND to prevent digital noise injection |
| 19–28 BIT 1–BIT 10 | Digital Output (MSBs) | Parallel 10-bit MSB data outputs; combined with pins 1–6, form full 16-bit twos-complement word |
Key Features
| Feature | Design Value |
|---|---|
| On-chip autocalibration | Eliminates need for external trims; corrects capacitor mismatch errors for bits 1–9, enabling ±1.5 LSB INL without user intervention |
| Integrated sample-hold amplifier | Removes requirement for external SHA; supports 2 µs input settling time and 100 ps aperture jitter for high-fidelity acquisition |
| Separate analog/digital supplies | VCC/VEE (+12 V/–12 V) and VDD (+5 V) isolation reduces digital switching noise coupling into analog conversion path |
| AGND sense terminal | Compensates for PCB trace resistance between AGND pin and remote analog ground plane, preserving dc accuracy under load |
| Twos-complement output coding | Direct interface with DSPs and microprocessors; offset binary conversion possible via MSB inversion without external logic |
| 17-cycle deterministic timing | Fixed 17-clock conversion protocol simplifies timing design and enables predictable BUSY-driven data capture in synchronous systems |
Applications
| High-Accuracy Data Logging | Automated Test Equipment (ATE) |
|---|---|
Use Scenario: Continuous acquisition of sensor outputs (e.g., strain gauges, RTDs) in environmental monitoring stations requiring 16-bit resolution and long-term stability. IC Role / Device Role / Timing Role: Primary SAR ADC performing buffered, calibrated digitization of bipolar analog inputs; triggered by periodic SAMPLE pulses synchronized to system scheduler. Use Value: ±1.5 LSB INL and on-chip autocalibration ensure measurement repeatability across temperature without recalibration, reducing field maintenance. | Use Scenario: Digitizing stimulus-response waveforms in semiconductor parametric testers where dynamic performance and channel count are critical. IC Role / Device Role / Timing Role: High-fidelity front-end ADC capturing transient responses; driven by precise CLK and SAMPLE timing to align with pattern generator outputs. Use Value: 90 dB S/(N+D) and –97 dB THD enable accurate characterization of device harmonic content up to 1 MHz full-power bandwidth. |
| Industrial Process Control | Communications Signal Analysis |
Use Scenario: Closed-loop feedback acquisition in PLC analog I/O modules interfacing with 4–20 mA transmitters and precision voltage sensors. IC Role / Device Role / Timing Role: Isolated analog input conditioner and digitizer; uses AGND SENSE to reject ground loop errors in distributed plant wiring. Use Value: Separate AGND/DGND and dedicated VCC/VEE/VDD supplies minimize noise coupling in electrically noisy factory environments. | Use Scenario: Baseband I/Q sampling in software-defined radio receivers analyzing modulated signals within 0–500 kHz bandwidth. IC Role / Device Role / Timing Role: Dual-channel (I/Q) sampling ADC; configured for continuous convert mode using SAMPLE retriggering during BUSY HIGH to maximize throughput. Use Value: 100 kSPS sustained rate with 16-bit no-missing-codes resolution preserves signal integrity for FFT-based spectral analysis. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar 16-bit SAR ADC applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| AD7606BSTZ | 8-channel simultaneous sampling, integrated reference, 200 kSPS, SPI interface; no CAL/SAMPLE control pins | Multi-channel data acquisition vs. single-channel precision; eliminates need for external reference but lacks asynchronous calibration trigger | Select AD7606BSTZ when multi-input synchronization and reduced BOM count outweigh need for programmable calibration timing |
| ADS8860IDRCT | 16-bit, 1 MSPS, single-ended input, SPI interface, internal reference; no analog supply separation or AGND sense | High-speed portable instrumentation vs. lab-grade precision; optimized for low power (2.5 mW) rather than dc accuracy or noise immunity | Select ADS8860IDRCT when sampling speed and compact QFN packaging are prioritized over bipolar input support and ground-sense accuracy |
Compared with AD7606BSTZ and ADS8860IDRCT, the AD676KNZ uniquely combines asynchronous autocalibration control, AGND sense, and fully isolated ±12 V analog supplies-making it suitable for legacy industrial systems requiring deterministic timing, field recalibration, and robust noise rejection without redesigning power or grounding architecture.
Availability
AD676KNZ is available at Aetrix Electronics and suitable for high-accuracy data logging, automated test equipment (ATE), and industrial process control applications requiring stable component supply, long-lifecycle support, and guaranteed ceramic-DIP packaging.
Supply support for AD676KNZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and digital signal processing semiconductors, headquartered in Wilmington, MA.
The AD676KNZ belongs to Analog Devices' precision SAR ADC product line, designed specifically for applications demanding 16-bit accuracy, low drift, and autonomous calibration in harsh industrial and instrumentation environments.
FAQ
What is the operating temperature range for the AD676KNZ?
The AD676KNZ is specified for operation from 0°C to +70°C. This K-grade rating is confirmed in the Ordering Guide and DC Specifications table, where AD676K/B models list TMIN = 0°C and TMAX = +70°C. The "N" suffix denotes the ceramic DIP package (D-28), and "Z" indicates tape-and-reel packaging. Performance parameters including INL (±1.5 LSB) and S/(N+D) (87 dB) are guaranteed across this full range.
Does the AD676KNZ require an external voltage reference?
Yes, the AD676KNZ requires an external precision voltage reference applied to the VREF pin. The datasheet specifies a 5 V to 10 V input range, with typical operation at 10.0 V. Using VREF = 10 V establishes a ±10 V analog input range and defines the LSB size as 152.6 µV. No internal reference is provided; reference stability and noise directly impact gain error and dynamic performance such as THD and S/(N+D).
How does autocalibration work on the AD676KNZ?
Autocalibration on the AD676KNZ is initiated asynchronously by driving the CAL pin HIGH then LOW. It executes a 85,530-clock-cycle routine that nulls sample/hold offset and measures capacitor mismatch errors for the MSB through bit 9. Correction values are stored in on-chip RAM and applied during subsequent conversions. Calibration is recommended at power-up after supplies stabilize; uncalibrated operation may degrade accuracy to ~10-bit level.
What are the power supply requirements for the AD676KNZ?
The AD676KNZ requires three independent supplies: +12 V (VCC), –12 V (VEE), and +5 V (VDD). VCC and VEE power the analog circuitry (SHA and ADC core), while VDD powers digital logic and output buffers. Each supply must be decoupled with a 0.1 µF capacitor placed adjacent to its respective pin. The device consumes 360 mW typical during conversion, drawing 14.5–18 mA from each ±12 V rail and 2–5 mA from the +5 V rail.
Can the AD676KNZ interface directly with a microprocessor data bus?
Yes, the AD676KNZ supports direct parallel interface with 16-bit microprocessor buses. Its 16-bit twos-complement output (BIT 1–BIT 16) is latched and valid after the 17th CLK rising edge, with BUSY going LOW to signal data readiness. The datasheet's "Microprocessor Interfacing" section confirms compatibility with standard 16-bit address/data buses, and timing diagrams show straightforward handshaking using BUSY as a ready signal for latch enable or interrupt generation.
AD676KNZ Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Analog Devices Inc.
- Series:
- -
- Package/Case:
- 28-DIP (0.600", 15.24mm)
- Packaging:
- Bulk
- Product Status:
- Active
- Number of Bits:
- 16
- Sampling Rate (Per Second):
- 100k
- Number of Inputs:
- 1
- Input Type:
- Single Ended
- Data Interface:
- Parallel
- Configuration:
- S/H-ADC
- Ratio - S/H:ADC:
- 1:1
- Number of A/D Converters:
- 1
- Architecture:
- SAR
- Reference Type:
- External
- Voltage - Supply, Analog:
- ±12V
- Voltage - Supply, Digital:
- 5V
- Features:
- -
- Operating Temperature:
- 0°C ~ 70°C
- Supplier Device Package:
- 28-PDIP
- Mounting Type:
- Through Hole
- Grade:
- -
- Qualification:
- -
AD676KNZ FAQ
1.How can I place an order for AD676KNZ through Aetrix?
Please submit a Request for Quotation (RFQ) for AD676KNZ on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for AD676KNZ reliable?
The price and inventory of AD676KNZ are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for AD676KNZ is usually 5 days.
3.What payment methods are accepted for AD676KNZ?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for AD676KNZ transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for AD676KNZ?
AD676KNZ orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your AD676KNZ order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for AD676KNZ?
For technical support, including AD676KNZ datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your AD676KNZ requirements.
6.How does Aetrix verify that AD676KNZ is sourced from the original manufacturer or authorized distributors?
All AD676KNZ products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that AD676KNZ meets industry standards.
7.What is the process for return or replacement of AD676KNZ?
All AD676KNZ units undergo pre-shipment inspection (PSI). If there is an issue with AD676KNZ, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The AD676KNZ part is unused and in its original packaging.
Return procedure for AD676KNZ:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
AD676KNZ Tags
-
ADC081C021CIMKX/NOPB
Texas Instruments
-
MCP3021A5T-E/OT
Microchip Technology
-
TLA2024IRUGR
Texas Instruments
-
MCP3221A5T-E/OT
Microchip Technology
-
MCP3221A5T-I/OT
Microchip Technology
-
MCP3221A4T-E/OT
Microchip Technology
-
MCP3221A6T-E/OT
Microchip Technology
-
MCP3221A0T-E/OT
Microchip Technology
-
MCP3221A1T-E/OT
Microchip Technology
-
ADC121S021CIMFX/NOPB
Texas Instruments
-
MCP3001-I/MS
Microchip Technology
-
MCP3001-I/SN
Microchip Technology
Tech Hub
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…
