Texas Instruments ADC124S101EVAL

Overview

ADC124S101EVAL from National Semiconductor is an evaluation board designed to accelerate characterization and integration of the ADC124S101 - a 12-bit, 4-channel, serial-output SAR analog-to-digital converter with internal input multiplexer and SPI-compatible interface. It supports coherent sampling up to 1 MHz, provides dual 50 Ω BNC analog inputs, adjustable DUT supply (2.7 V to 5.0 V), and interfaces directly with WaveVision4 capture hardware for dynamic performance analysis including SNR, SINAD, THD, SFDR, and ENOB.

For engineers reviewing the ADC124S101EVAL datasheet, ADC124S101EVAL pinout, ADC124S101EVAL application, or ADC124S101EVAL equivalent, this page delivers verified board-level specifications, functional context for ADC124S101 validation, jumper-configurable signal coupling (AC/DC), on-board clock selection (8 MHz oscillator or external via BNC3), and test point–based debugging guidance aligned with National Semiconductor's August 2005 User's Guide.

Technical Context

The ADC124S101EVAL implements a dedicated signal conditioning path for two independent analog inputs (BNC1/BNC2), each configurable for AC or DC coupling via JP1/JJ3 jumpers and channel routing via JP2/JP4. Input bias is adjustable using VR2 to center the signal at half the DUT supply voltage measured at TP1.

It integrates a selectable clock source (on-board 8 MHz TTL oscillator at Y1 or external signal at BNC3) controlled by JP6, and supplies regulated +5.5 V to +5.7 V power to both the evaluation board and WaveVision4 capture board through J2 pins A1/B1/A2/B2. Digital data output is accessible via LA1 logic analyzer header (SPI signals: CS#, DIN, DOUT, SCLK) and FutureBus J2 for full-system integration.

Key Specifications

Availability

ADC124S101EVAL is available at Aetrix Electronics and suitable for precision ADC validation, mixed-signal test system development, and embedded sensor interface prototyping requiring stable component supply, traceable sourcing, and long-term evaluation platform continuity.

Supply support for ADC124S101EVAL includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

National Semiconductor was a U.S.-based analog and mixed-signal semiconductor company acquired by Texas Instruments in 2011, known for high-performance data converters, power management ICs, and precision amplifiers.

The ADC124S101EVAL belongs to National Semiconductor's ADCxxSxx1 family evaluation platform series, engineered specifically to streamline performance verification and design-in of their low-power, multi-channel SAR ADCs in industrial, test & measurement, and sensor signal chain applications.

FAQ

What is the primary function of the ADC124S101EVAL evaluation board?

The ADC124S101EVAL evaluation board is a dedicated hardware platform for characterizing and validating the ADC124S101 - a 12-bit, 4-input, serial-output SAR ADC. It provides calibrated analog signal paths, adjustable DUT supply, flexible clocking, and SPI-accessible digital outputs to enable accurate dynamic performance measurement (e.g., SNR, SINAD, THD) using WaveVision4 software and compatible capture hardware. The board does not operate standalone but requires connection to a WaveVision4 Capture Board (WAVEVSN BRD 4.0) for full functionality.

Which ADC devices does the ADC124S101EVAL support besides ADC124S101?

The ADC124S101EVAL is part of a unified evaluation platform supporting multiple members of National Semiconductor's ADCxxSxx1 family, including ADC122S101, ADC104S101, ADC084S101, and their 051/021 speed variants. The board's physical layout and jumper configuration (JP2/JP4) accommodate both 2-channel (e.g., ADC122S101) and 4-channel (e.g., ADC124S101) devices. The actual DUT installed is identified by top-mark codes - ADC124S101 is marked "X27C" - and the board schematic confirms U4 as the designated footprint for 4-channel variants.

How do I configure the ADC124S101EVAL for AC-coupled analog input testing?

To configure AC coupling on ADC124S101EVAL, install shorting jumpers across pins 1–2 of JP1 (for Input 1) and pins 1–2 of JP3 (for Input 2). Then adjust VR2 until the DC voltage at test points TP6 and TP7 equals one-half the DUT supply voltage measured at TP1. This centers the AC signal within the ADC's input range to prevent clipping. Confirm proper signal presence using an oscilloscope at TP6/TP7 before initiating data capture with WaveVision4 software.

What clock sources are supported by the ADC124S101EVAL, and how do I select them?

The ADC124S101EVAL supports two clock sources: an on-board 8 MHz TTL oscillator mounted at Y1 (through-hole) or an external clock applied to BNC3. Selection is made via JP6: short pins 1–2 to use the Y1 oscillator; short pins 2–3 to route the external signal from BNC3 to the DUT. Only one source should be active at a time. Clock presence is verified at TP5, and coherent sampling requires locking the input signal frequency (fin) and sampling rate (fs) to maintain integer-cycle relationships per the CY/SS = fin/fs formula.

Can the ADC124S101EVAL operate without the WaveVision4 Capture Board?

No - the ADC124S101EVAL is not a self-contained data acquisition system. It lacks onboard digitization, memory, or USB interface. Its digital outputs (CS#, DIN, DOUT, SCLK) are routed to LA1 header and FutureBus J2 solely for connection to external equipment: a logic analyzer for raw timing analysis or, more commonly, the WaveVision4 Capture Board (WAVEVSN BRD 4.0) for synchronized data capture, FFT computation, and dynamic parameter reporting (SINAD, ENOB, etc.). Power for the WaveVision4 board is delivered through J2 pins A1/B1/A2/B2 when +5.5 V is applied to P1.