Texas Instruments ADC161S626EB/NOPB

Overview

ADC161S626EB/NOPB from Texas Instruments (formerly National Semiconductor) is an evaluation board designed to accelerate prototyping and performance validation of the ADC161S626 - a 16-bit, differential-input, micro-power SAR analog-to-digital converter operating at 50 kSPS to 250 kSPS. It supports both stand-alone logic analyzer-based testing and computer-mode operation via the WaveVision 4.1+ data capture board and software, with configurable reference, clock, analog supply (VA), and I/O supply (VIO) rails.

For engineers reviewing the ADC161S626EB/NOPB datasheet, ADC161S626EB/NOPB pinout, ADC161S626EB/NOPB application, or ADC161S626EB/NOPB equivalent, this board enables rapid functional verification, dynamic parameter measurement (SNR, SINAD, THD, SFDR, ENOB), FFT-based spectral analysis, and flexible analog input conditioning (AC/DC-coupled, single-ended or differential) for precision data acquisition systems.

Technical Context

The ADC161S626EB/NOPB implements a complete test platform for the ADC161S626 IC, featuring jumper-selectable biasing for VREF (via LM4132-4.1 or VA), VA (from WV board +5.0 V or external 2.7–5.5 V), VIO (tied to VA or externally supplied), and clock source (on-board 800 kHz–4 MHz crystal oscillator Y2 or external CMOS signal at TP15). All critical analog and digital signals - including SCLK, CSB, DOUT, +IN/−IN - are accessible via J6 (WV interface) and J8 (analog input).

It provides dual analog input configurations: AC-coupled (with 1 µF C21/C22 and optional 4.99 kΩ R27–R33 for common-mode shift) and DC-coupled (with 20 Ω R30/R34), supporting input ranges up to 2 × VREF. Power delivery is optimized for low-noise operation, with dedicated decoupling (10 µF + 0.1 µF per rail) and ground isolation strategies across AGND test points (TP13, TP16, TP17, TP19, TP21, TP23).

Key Specifications

Availability

ADC161S626EB/NOPB is available at Aetrix Electronics and suitable for precision sensor interfacing, industrial process monitoring, and portable instrumentation requiring stable component supply, traceable sourcing, and long-term evaluation board continuity.

Supply support for ADC161S626EB/NOPB includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments acquired National Semiconductor in 2011 and maintains legacy evaluation platforms like ADC161S626EB/NOPB under its precision data converter portfolio.

This board belongs to TI's high-accuracy ADC evaluation kit family, engineered specifically to simplify design-in of 16-bit SAR converters in noise-sensitive, low-power applications such as weigh scales, medical diagnostics, and battery-powered test equipment.

FAQ

What is the primary function of the ADC161S626EB/NOPB evaluation board?

The ADC161S626EB/NOPB evaluation board is a dedicated hardware platform for evaluating the ADC161S626 - a 16-bit, 50–250 kSPS, differential-input SAR ADC. It provides configurable analog input conditioning, SPI interface access, multiple reference and supply options, and seamless integration with WaveVision software for dynamic performance analysis. ADC161S626EB/NOPB does not contain the ADC161S626 IC itself but hosts it (U7) as the core device under test.

Does the ADC161S626EB/NOPB include the ADC161S626 IC?

Yes, the ADC161S626EB/NOPB includes the ADC161S626 IC mounted as U7 on the board. The Bill of Materials (page 14) explicitly lists "U7: ADC161S626" as a populated component. This makes ADC161S626EB/NOPB a fully assembled evaluation system - not just a breakout or adapter board - ready for immediate functional and dynamic testing.

Can the ADC161S626EB/NOPB operate without connecting to a WaveVision board?

Yes, ADC161S626EB/NOPB supports stand-alone mode using external test equipment. In this mode, users drive CSB and SCLK directly via J6 pins 1 and 3 (or vias 5 and 6), and monitor DOUT at J6 pin 5 (or via 7). A logic analyzer or pattern generator suffices for basic waveform capture and timing validation - no WaveVision board or PC required for fundamental SPI communication checks.

What clock sources are supported by the ADC161S626EB/NOPB?

ADC161S626EB/NOPB supports two clock sources selected via JP12: (1) on-board through-hole crystal oscillator Y2 (800 kHz–4 MHz range), or (2) external CMOS-level signal applied to TP15 (51 Ω terminated). When using TP15, Y2 must be removed to avoid noise coupling. Both sources meet the ADC161S626's timing specifications and enable full-speed operation up to 250 kSPS.

How is analog input configured for differential versus single-ended operation on the ADC161S626EB/NOPB?

ADC161S626EB/NOPB supports both modes via J8 (5-pin header). For differential input, apply the signal across J8.P3 (+IN) and J8.P5 (−IN). For single-ended, drive J8.P3 with a sinusoidal signal referenced to a stable VCM (common-mode voltage), while holding J8.P5 at VCM - achieved using resistor networks (e.g., R27–R33) or external bias. AC/DC coupling is selected by populating C21/C22 (AC) or R30/R34 (DC), as detailed in Figures 2 and 3.