Analog Devices Inc. ADL5355-EVALZ

Overview

ADL5355-EVALZ from Analog Devices is an evaluation board for the ADL5355 1200–2500 MHz balanced mixer IC, integrating RF balun, LO buffer, and IF amplifier. It enables rapid characterization of power conversion gain (8.4 dB), SSB noise figure (9.2 dB), input IP3 (27 dBm), and LO-to-RF isolation (−39 dBm) in cellular base station receiver and transmit observation applications.

For engineers reviewing the ADL5355-EVALZ datasheet, ADL5355-EVALZ pinout, ADL5355-EVALZ application, or ADL5355-EVALZ equivalent, this board provides full access to all ADL5355 signal paths-including RFIN, LOI1/LOI2, IFOP/IFON, PWDN, and VGS0/VGS1-along with calibrated 50 Ω SMA interfaces, bias resistor tuning points, and thermal management features for repeatable RF performance validation.

Technical Context

The ADL5355-EVALZ implements the ADL5355's dual-LO SPDT switch architecture with external 0 Ω jumpers selecting between LOI1 and LOI2, supporting TDD frequency agility. Its layout preserves the 5 mm × 5 mm LFCSP-20 footprint and exposed paddle grounding, ensuring accurate thermal and impedance behavior matching production use.

Board-level design includes discrete 4:1 IF output transformer, choke-based VPIF/VLOx supply filtering, and configurable R9/R14 bias resistors to replicate both 5 V (190 mA) and 3.3 V (125 mA) operating conditions per the ADL5355 datasheet, enabling direct correlation of measured conversion gain, IP3, and noise figure to published specifications.

Key Specifications

Availability

ADL5355-EVALZ is available at Aetrix Electronics and suitable for cellular base station development, transmit observation receiver prototyping, and radio link downconverter validation requiring stable component supply and traceable evaluation hardware.

Supply support for ADL5355-EVALZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and digital signal processing semiconductors, headquartered in Wilmington, MA.

The ADL5355-EVALZ belongs to Analog Devices' RF & Microwave Evaluation Platform product line, designed specifically to accelerate time-to-test for high-linearity mixer ICs used in infrastructure-grade wireless receivers.

FAQ

What is the primary function of the ADL5355-EVALZ?

The ADL5355-EVALZ is an evaluation board for the ADL5355 balanced mixer IC. It provides full electrical access to all ADL5355 pins-including RFIN, LOI1/LOI2, IFOP/IFON, PWDN, and VGS0/VGS1-enabling engineers to validate RF-to-IF downconversion performance across 1200–2500 MHz under real-world bias, thermal, and signal integrity conditions. The ADL5355-EVALZ supports both 3.3 V and 5 V operation as specified in the ADL5355 datasheet.

Does the ADL5355-EVALZ support dual-LO switching as described in the ADL5355 datasheet?

Yes, the ADL5355-EVALZ fully supports the ADL5355's high-speed SPDT LO switch. It provides two independent SMA connectors for LOI1 and LOI2, with the LOSW control signal accessible via test point and jumper configuration. Measured switching time is <40 ns, matching the ADL5355 specification, and allows rapid TDD-mode LO source selection without external circuitry.

How is the IF output configured on the ADL5355-EVALZ?

The ADL5355-EVALZ provides differential IF outputs (IFOP/IFON) as open-collector nodes, consistent with the ADL5355's internal IF amplifier architecture. A 4:1 broadband transformer is included for 50 Ω system interfacing, and external dc bias networks are provided per the ADL5355 datasheet recommendations. The board also exposes IFGM and LEXT pins for precise IF bias control during ADL5355 characterization.

Can the ADL5355-EVALZ be used to measure SSB noise figure and input IP3 of the ADL5355?

Yes, the ADL5355-EVALZ is optimized for accurate SSB noise figure (9.2 dB typ.) and input IP3 (27 dBm typ.) measurement. Its low-noise layout, calibrated 50 Ω interfaces, and proper termination of idler frequencies per the ADL5355 functional block diagram enable repeatable results aligned with datasheet test conditions (fRF = 1950 MHz, fLO = 1750 MHz, LO = 0 dBm). Measurement accuracy is verified using standard spectrum analyzer and noise figure analyzer setups.

What thermal design features does the ADL5355-EVALZ include to match ADL5355 production requirements?

The ADL5355-EVALZ replicates the ADL5355's thermal interface requirements by soldering the LFCSP-20 exposed paddle directly to a large internal ground plane with 12 thermal vias. This ensures junction-to-board thermal resistance matches production PCBs, enabling valid thermal validation of the ADL5355 under 125 mA (3.3 V) or 190 mA (5 V) quiescent current conditions. Thermal imaging confirms uniform heat distribution across the ADL5355 die area during sustained operation.