Analog Devices Inc. ADL5960-KIT-EVALZ

Overview

ADL5960-KIT-EVALZ from Analog Devices is an evaluation kit for the ADL5960 integrated vector network analyzer (VNA) front end IC, enabling rapid prototyping of broadband RF measurement systems from 10 MHz to 20 GHz. It provides full access to the 26-lead LGA package's RFIN/RFOUT, differential IF outputs (IFFP/IFFM/IFRP/IFRM), SPI interface (CS/SCK/SDIO), LO (LOP/LOM), OF (OFP/OFM), and VCM control pins - supporting bidirectional bridge characterization, S-parameter magnitude/phase extraction, and multiport VNA synchronization.

For engineers reviewing the ADL5960-KIT-EVALZ datasheet, ADL5960-KIT-EVALZ pinout, ADL5960-KIT-EVALZ application, or ADL5960-KIT-EVALZ equivalent, this kit delivers calibrated RF signal path validation, SPI-configurable IF bandwidth (1–100 MHz) and gain (6 dB steps), offset LO interface testing, temperature sensor readout, and SYNC-based multi-device phase alignment - critical for automated test equipment, reflectometer design, and materials analysis platforms.

Technical Context

The ADL5960-KIT-EVALZ implements a complete reference design for the ADL5960 IC, featuring impedance-matched 50 Ω RF input/output paths, precision 100 Ω differential LO termination, and configurable 0.1–400 MHz offset frequency interface. Its layout preserves the IC's 24.1 dB raw directivity at 1 GHz and >12 dB return loss up to 20 GHz while enabling accurate measurement of forward/reverse IF channels with programmable 1–100 MHz low-pass filtering and ±17.3 dB voltage conversion gain range.

It supports all ADL5960 LO configurations - bypass, divide-by-2, ×1/×2/×4 multiplication, and offset mixing - and validates the SYNC pin's ability to halt dividers and synchronize multiple ADL5960 devices for coherent multiport operation. The board includes on-board decoupling (1 nF + 4.7 μF per AVCC/OVCC), thermal EPAD grounding, and VCM biasing circuitry to maintain <±100 mV common-mode error across IFFP/IFFM/IFRP/IFRM outputs.

Key Specifications

Availability

ADL5960-KIT-EVALZ is available at Aetrix Electronics and suitable for automated test equipment development, RF component characterization, and multiport VNA system integration requiring stable component supply, traceable evaluation hardware, and production-ready reference layouts.

Supply support for ADL5960-KIT-EVALZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices, Inc. is a global semiconductor leader specializing in high-performance analog, mixed-signal, and digital signal processing technologies for precision measurement, communications, and industrial applications.

The ADL5960 product line delivers compact, wideband vector network analyzer front ends for benchtop and embedded RF test systems - designed to replace discrete bridge/mixer/filter chains with a single 3 mm × 4 mm IC supporting full S-parameter acquisition from 10 MHz to 20 GHz.

FAQ

What is the primary purpose of the ADL5960-KIT-EVALZ?

The ADL5960-KIT-EVALZ is an evaluation platform for the ADL5960 integrated VNA front end IC. It enables engineers to validate RF performance - including directivity (24.1 dB at 1 GHz), insertion loss (1.1 dB at 1 GHz), and IF signal chain behavior - without custom PCB design. The kit supports full SPI configuration of the ADL5960-KIT-EVALZ, real-time IF bandwidth/gain tuning, and multi-device SYNC synchronization for scalable VNA architectures.

Does ADL5960-KIT-EVALZ support both single-ended and differential LO drive?

Yes, ADL5960-KIT-EVALZ fully supports both drive modes. The LOP/LOM inputs are internally terminated to 100 Ω differential, allowing direct connection of either a differential source or a single-ended 50 Ω source with appropriate AC coupling and biasing. The board's layout preserves signal integrity across the full 0.01–20 GHz LO range in bypass mode and accommodates all LOMODE configurations (divide-by-2, ×1/×2/×4) as defined in the ADL5960-KIT-EVALZ datasheet.

Can ADL5960-KIT-EVALZ be used to measure S-parameters?

Yes - ADL5960-KIT-EVALZ enables full two-port S-parameter magnitude and phase measurement when paired with a second ADL5960-KIT-EVALZ or compatible receiver. Its bidirectional bridge architecture delivers forward (S21) and reverse (S12) transmission data via IFFP/IFFM and IFRP/IFRM outputs, while reflection coefficients (S11/S22) are derived from incident/reflected wave separation. Calibration routines (short/open/load) are supported through the ADL5960-KIT-EVALZ's accessible RFIN/RFOUT and SPI-controlled gain/offset settings.

How does the SYNC function operate on ADL5960-KIT-EVALZ?

The SYNC pin on ADL5960-KIT-EVALZ halts internal dividers in the LO and OF interfaces when driven high and initiates synchronized restart upon falling edge - ensuring deterministic phase alignment across multiple ADL5960-KIT-EVALZ units. This capability is validated on the evaluation board via dedicated test points and enables coherent multiport VNA systems where timing skew between channels must be minimized for accurate phase-sensitive measurements.

What power supply requirements must be met for ADL5960-KIT-EVALZ operation?

ADL5960-KIT-EVALZ requires three independent supplies: AVCC and OVCC at 4.75–5.25 V (225 mA typical), and OVDD at 1.8–3.6 V (24 µA typical). The board implements recommended decoupling (1 nF + 4.7 µF per AVCC/OVCC pin) and enforces proper power sequencing - AVCC/OVCC applied before OVDD during startup, and OVDD removed first during shutdown - to prevent latch-up or damage to the ADL5960-KIT-EVALZ IC.