Analog Devices Inc. ADL6317ACCZ
- Part No.:
- ADL6317ACCZ
- Manufacturer:
- Analog Devices Inc.
- Category:
- Special Purpose Amplifiers
- Package:
- 38-TFLGA Exposed Pad
- Datasheet:
-
ADL6317ACCZ.pdf
- Description:
- 1.5GHZ TO 3GHZ QUAD HYBRID, TXVG
- Quantity:
- Payment:

- Shipping:

Inventory:1,501
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
ADL6317ACCZ from Analog Devices is a transmit variable gain amplifier (VGA) designed to interface RF DACs and transceivers to power amplifiers in broadband wireless infrastructure. It operates from 1500 MHz to 3000 MHz, delivers 34.0 dB typical gain at 2600 MHz, provides 20.5 dB integrated voltage-variable attenuation (VVA), supports 15.5 dB digital step attenuation (DSA) with 0.5 dB resolution, and uses a single 5 V supply. It enables high-dynamic-range LTE FDD/TDD transmitter chains.
For engineers reviewing the ADL6317ACCZ datasheet, ADL6317ACCZ pinout, ADL6317ACCZ application, or ADL6317ACCZ equivalent, this page delivers verified RF signal chain specifications, SPI-programmable gain control architecture, thermal and linearity performance across temperature, differential-to-single-ended conversion via integrated balun, and real-world LTE base station use-case validation - all critical for RF front-end design and transmitter calibration.
Technical Context
The ADL6317ACCZ implements a dual-stage high-linearity SiGe BiCMOS amplifier architecture with cascaded VVA and DSA blocks. Its RF signal path begins with a differential input balun (50 Ω), proceeds through quadrature hybrid coupling, then integrates a 12-bit on-chip DAC-controlled VVA (20.5 dB range), fixed-gain Amplifier 1, 5-bit DSA (15.5 dB, 0.5 dB steps), and Amplifier 2 before outputting via a single-ended 50 Ω RFOUT.
Gain control is fully programmable via 4-wire SPI (25 MHz max clock), supporting simultaneous VVA/DSA configuration with double-buffered registers to suppress carrier glitches. The device includes on-die temperature sensing, PTAT ADC, and auxiliary MUXOUT for diagnostics - all optimized for multicarrier LTE transmitter dynamic range and adjacent channel leakage ratio (ACLR) compliance.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| RF Frequency Range | 1500 MHz to 3000 MHz - covers full LTE Band 1/3/7/38/41 and 5G NR n41/n77/n78 operating bands. |
| Typical Power Gain | 34.0 dB at 2600 MHz - enables direct drive of medium-power PAs without intermediate gain stages. |
| VVA Attenuation Range | 20.5 dB with 12-bit DAC or external analog voltage - supports fine-grained closed-loop power control in real time. |
| DSA Attenuation Range & Step | 15.5 dB with 0.5 dB resolution - allows precise output power adjustment for ACLR optimization and PA back-off management. |
| OIP3 @ 2150 MHz | 38.4 dBm - ensures low intermodulation distortion in 2-tone LTE signals with >20 MHz bandwidth. |
| Noise Figure | 5.5 dB at 2600 MHz - maintains SNR integrity when placed after RF DAC in transmit chain. |
| Supply Voltage | 4.75 V to 5.25 V - compatible with standard telecom DC-DC rails; supports high-performance (435 mA) and low-power (310 mA) modes. |
Pinout & Package
ADL6317ACCZ is housed in a 38-terminal, 10.5 mm × 5.5 mm LGA package with exposed thermal pad (EPAD1/EPAD2) requiring PCB ground connection for electrical stability and thermal dissipation (θJC = 7.6°C/W). Pin functions are validated per Analog Devices Rev. B datasheet (Page 7).
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| IN_P / IN_N | Differential RF Input | Accepts balanced output from RF DAC or transceiver; internal balun converts to single-ended for signal chain. |
| RFOUT | Single-Ended RF Output | 50 Ω matched output directly interfaces power amplifier input; return loss ≥17.4 dB at 2150 MHz. |
| V50AMP1 / V50AMP2 | Analog Power Supplies | Separate 5 V supplies for each amplifier stage; decoupling required with 10 pF + 0.1 µF capacitors. |
| VVA_ANALOG | Analog VVA Control Input | Accepts external 0–3.6 V control voltage for analog VVA attenuation; alternative to 12-bit DAC register control. |
| SCLK / SDI / SDO / CS | 4-Wire SPI Interface | 1.8 V/3.3 V tolerant; supports 25 MHz clock; double-buffered registers prevent gain glitches during updates. |
| TXEN | Amplifier Enable & Trim Control | Active-high enable for both amplifiers; also selects DSA attenuation mode (TXEN = 0 or 1) and trim values. |
| GND (Pins 1,2,6,7,8,9,12,14,19,20,21,22,24,25,26,31,38) | Ground Terminals | Multiple dedicated GND pins minimize ground impedance; EPAD1/EPAD2 must be soldered to PCB ground plane. |
Key Features
| Feature | Design Value |
|---|---|
| Integrated Balun + Bias-Tee | Enables direct interface to RF DACs without external matching networks; bias-tee supplies DC to DAC while passing RF. |
| Quadrature Hybrids (Input/Output) | Reduces input/output reflection (S11/S22 ≤ −17.4 dB) across 1.5–3 GHz, improving wideband match to DAC and PA. |
| Two Independent Gain Control Paths | VVA (20.5 dB, analog/DAC) + DSA (15.5 dB, 0.5 dB steps) allow independent optimization of linearity vs. noise vs. power efficiency. |
| On-Die Temperature Sensing | PTAT voltage and ADC enable real-time thermal compensation of gain and OIP3 without external sensors. |
| Fast Gain Settling | VVA settling: 386.8 ns (min→max); DSA settling: 195.0 ns (max→min) - supports rapid TDD frame switching and burst-mode operation. |
Applications
| 4G LTE Base Station Transmitter | 5G Massive MIMO Radio Unit |
|---|---|
Use Scenario: Transmit signal conditioning in macrocell eNodeB with multicarrier 20+ MHz bandwidth and 256-QAM modulation. IC Role / Device Role / Timing Role: VGA between RF DAC and PA driver; provides programmable gain, linearity control, and thermal compensation. Use Value: Enables ACLR < −45 dBc compliance at 2150 MHz with 2×20 MHz LTE carriers while maintaining 38.4 dBm OIP3. |
Use Scenario: Per-antenna transmit path in active antenna system (AAS) with beamforming and TDD frame timing. IC Role / Device Role / Timing Role: Final-stage gain control and impedance transformation before GaN PA; supports sub-1 µs gain reconfiguration. Use Value: Fast DSA/VVA settling (< 305 ns) meets TDD guard interval constraints; 50 Ω I/O simplifies PCB layout in dense RF front-end modules. |
| Wireless Infrastructure Test Equipment | Software-Defined Radio (SDR) Transmitter |
Use Scenario: Calibrated RF stimulus generation in production test systems for cellular baseband ICs and transceivers. IC Role / Device Role / Timing Role: Precision gain-controlled output stage with traceable attenuation steps and stable NF over temperature. Use Value: 0.5 dB DSA resolution and ±0.2 dB gain flatness over ±150 MHz bandwidth ensure measurement repeatability across LTE bands. |
Use Scenario: Flexible transmit chain in field-deployable SDR platforms supporting LTE, WiMAX, and custom waveforms. IC Role / Device Role / Timing Role: Reconfigurable interface between FPGA-based RF DAC and wideband PA; SPI-controlled for runtime adaptation. Use Value: Single 5 V supply and 4-wire SPI reduce system complexity; 1500–3000 MHz coverage supports multi-band SDR deployment without hardware change. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar transmit VGA applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| ADL6316ACCZ | Lower frequency range (500–1000 MHz); identical architecture, pinout, and SPI interface. | Targeted for legacy 2G/3G and sub-1 GHz IoT base stations; not suitable for LTE Band 1/3/7 or 5G n41. | Select ADL6316ACCZ only when operating below 1000 MHz; ADL6317ACCZ is mandatory for 1.5–3 GHz infrastructure. |
| HMC997LP5E | Wider frequency range (1–6 GHz); higher OP1dB (27 dBm); no integrated balun or DAC-controlled VVA - requires external components. | Used in military/aerospace wideband transmitters; lacks built-in DAC, temperature sensor, and bias-tee for DAC interfacing. | Choose HMC997LP5E for ultra-wideband (>3 GHz) or high-power (>25 dBm) needs; ADL6317ACCZ offers superior integration for LTE/5G cellular. |
Compared with ADL6316ACCZ and HMC997LP5E, the ADL6317ACCZ uniquely combines 1500–3000 MHz operation, integrated balun + bias-tee, on-chip 12-bit VVA DAC, and diagnostic features - delivering lower BOM count, faster time-to-market, and guaranteed ACLR performance in commercial wireless infrastructure.
Availability
ADL6317ACCZ is available at Aetrix Electronics and suitable for 4G LTE base station transmitters, 5G massive MIMO radio units, and wireless test equipment requiring stable component supply, long-term lifecycle support, and traceable sourcing for telecom-grade production.
Supply support for ADL6317ACCZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and RF ICs, headquartered in Norwood, MA, with deep expertise in signal processing and precision RF solutions.
The ADL6317ACCZ belongs to Analog Devices' transmit VGA product line, engineered specifically for high-dynamic-range, multicarrier wireless infrastructure transmitters - emphasizing linearity, thermal stability, and seamless integration with RF DACs and transceivers.
FAQ
What is the primary function of the ADL6317ACCZ in a wireless transmitter?
The ADL6317ACCZ serves as a transmit variable gain amplifier that bridges RF DACs or transceivers to power amplifiers in cellular infrastructure. It provides programmable gain control (via VVA and DSA), differential-to-single-ended conversion using an integrated balun, and wideband RF conditioning from 1500 MHz to 3000 MHz - all critical for meeting ACLR and EVM requirements in LTE and 5G NR systems. The ADL6317ACCZ enables precise output power management while maintaining high OIP3 and low noise figure.
Does the ADL6317ACCZ require external matching components at its RF ports?
No, the ADL6317ACCZ does not require external matching components at its RF ports. Its differential inputs (IN_P/IN_N) and single-ended output (RFOUT) are internally matched to 50 Ω across the full 1500–3000 MHz band. Return loss exceeds −17.4 dB at 2150 MHz, and the integrated balun eliminates the need for external transformers or couplers. This reduces PCB area, BOM cost, and tuning effort - a key advantage of the ADL6317ACCZ over discrete VGA solutions.
How is gain controlled on the ADL6317ACCZ, and what are the available interfaces?
The ADL6317ACCZ supports two independent gain control mechanisms: a 20.5 dB voltage-variable attenuator (VVA) controllable either by a 12-bit on-chip DAC (via SPI registers 0x103/0x104) or by an external analog voltage applied to the VVA_ANALOG pin; and a 15.5 dB digital step attenuator (DSA) with 0.5 dB resolution controlled via 5-bit SPI registers (0x102/0x112). Both paths are fully programmable over a 4-wire SPI interface with double-buffered registers to prevent gain glitches during updates - a core capability of the ADL6317ACCZ.
What thermal management considerations apply to the ADL6317ACCZ?
The ADL6317ACCZ requires robust thermal management due to its 435 mA high-performance mode current draw. Its LGA package features two exposed thermal pads (EPAD1/EPAD2) that must be soldered to a solid PCB ground plane. Thermal resistance is θJC = 7.6°C/W (junction-to-case bottom); θJA = 21.4°C/W in natural convection. For reliable operation up to +105°C ambient, designers must provide adequate copper area, thermal vias under the EPAD, and optional airflow - especially when operating near OP1dB (22.8 dBm at 2600 MHz). The ADL6317ACCZ includes on-die temperature sensing to support closed-loop thermal compensation.
Can the ADL6317ACCZ interface directly with common RF DACs such as the AD9162 or AD9172?
Yes, the ADL6317ACCZ is explicitly designed to interface directly with high-speed RF DACs including the AD9162 and AD9172. Its integrated balun accepts 50 Ω differential inputs, and the on-chip bias-tee supplies DC bias to the DAC's output common-mode node while passing RF. The VDAC pin (Pin 5) can be left open if the DAC has its own bias supply. This direct interface eliminates external baluns, transformers, and bias networks - a defining feature of the ADL6317ACCZ that simplifies RF front-end design and improves signal integrity.
ADL6317ACCZ Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Analog Devices Inc.
- Series:
- -
- Package/Case:
- 38-TFLGA Exposed Pad
- Packaging:
- Tray
- Product Status:
- Active
- Type:
- Variable Gain Amplifier
- Applications:
- LTE
- Mounting Type:
- Surface Mount
- Grade:
- -
- Qualification:
- -
- Supplier Device Package:
- 38-LGA (10.5x5.5)
ADL6317ACCZ FAQ
1.How can I place an order for ADL6317ACCZ through Aetrix?
Please submit a Request for Quotation (RFQ) for ADL6317ACCZ on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for ADL6317ACCZ reliable?
The price and inventory of ADL6317ACCZ are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for ADL6317ACCZ is usually 5 days.
3.What payment methods are accepted for ADL6317ACCZ?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for ADL6317ACCZ transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for ADL6317ACCZ?
ADL6317ACCZ orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your ADL6317ACCZ order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for ADL6317ACCZ?
For technical support, including ADL6317ACCZ datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your ADL6317ACCZ requirements.
6.How does Aetrix verify that ADL6317ACCZ is sourced from the original manufacturer or authorized distributors?
All ADL6317ACCZ products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that ADL6317ACCZ meets industry standards.
7.What is the process for return or replacement of ADL6317ACCZ?
All ADL6317ACCZ units undergo pre-shipment inspection (PSI). If there is an issue with ADL6317ACCZ, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The ADL6317ACCZ part is unused and in its original packaging.
Return procedure for ADL6317ACCZ:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
ADL6317ACCZ Tags

-
TSM103WIDT
STMicroelectronics

-
LM392M/NOPB
Texas Instruments

-
MCP6S93T-E/UN
Microchip Technology

-
INA137UA/2K5
Texas Instruments

-
INA134UA/2K5
Texas Instruments

-
TS34118CS28 RDG
Taiwan Semiconductor Corporation

-
SI8920BC-IPR
Skyworks Solutions Inc.

-
ADUM3190ARQZ-RL7
Analog Devices Inc.

-
ADUM3190ARQZ
Analog Devices Inc.

-
AMC1311BDWVR
Texas Instruments

-
AMC1350DWVR
Texas Instruments

-
ADUM3190SRQZ-RL7
Analog Devices Inc.
Tech Hub
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…
