Analog Devices Inc. ADRF5023-EVALZ

Overview

ADRF5023-EVALZ from Analog Devices is an evaluation board designed to characterize the ADRF5023 silicon SPDT RF switch - a nonreflective, ultra-wideband (9 kHz to 45 GHz) component with 1.7 dB typical insertion loss and 42 dB isolation at 45 GHz, used for high-frequency signal routing in millimeter-wave test instrumentation and 5G infrastructure.

For engineers reviewing the ADRF5023-EVALZ datasheet, ADRF5023-EVALZ pinout, ADRF5023-EVALZ application, or ADRF5023-EVALZ equivalent, this board enables rapid validation of RF performance metrics including insertion loss, isolation, switching speed (3.5 μs 0.1 dB settling), power handling (30 dBm hot-switching), and CMOS/LVTTL-compatible control interface behavior under dual- and single-supply conditions.

Technical Context

The ADRF5023-EVALZ implements a fully populated, impedance-matched coplanar waveguide layout optimized for the ADRF5023's 20-lead LGA package (CC-20-19), supporting both dual-supply (±3.3 V) and single-supply (3.3 V/VSS = GND) operation. It provides direct access to all RF ports (RFC, RF1, RF2), supply pins (VDD, VSS), and digital controls (CTRL, EN) with decoupling capacitors and 50 Ω SMA connectors.

Measuring performance on the ADRF5023-EVALZ validates key behaviors confirmed in the datasheet: nonreflective termination of off-state ports, bidirectional RF path capability, DC-coupled 50 Ω RF interfaces requiring no external matching, and all-off state activation via EN high - all verified across −40°C to +105°C case temperature range.

Key Specifications

Availability

ADRF5023-EVALZ is available at Aetrix Electronics and suitable for 5G mmWave base station development, military radar front-end testing, microwave radio prototyping, and industrial scanner RF path validation requiring stable component supply and traceable evaluation hardware.

Supply support for ADRF5023-EVALZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and RF ICs, serving precision instrumentation, communications, industrial, and defense markets with innovation in signal chain solutions.

The ADRF5023-EVALZ belongs to Analog Devices' RF & Microwave Evaluation Platform family, engineered specifically to accelerate characterization and integration of ultra-wideband silicon RF switches in demanding millimeter-wave systems.

FAQ

What is the primary purpose of the ADRF5023-EVALZ?

The ADRF5023-EVALZ is an evaluation board built to validate the RF performance of the ADRF5023 nonreflective SPDT switch. It provides calibrated 50 Ω SMA interfaces, proper decoupling, and CPWG-optimized PCB layout to measure insertion loss, isolation, switching speed, and linearity - all as specified in the ADRF5023 datasheet. Engineers use the ADRF5023-EVALZ to confirm real-world behavior before integrating the ADRF5023 into final designs.

Does the ADRF5023-EVALZ support both dual-supply and single-supply operation of the ADRF5023?

Yes, the ADRF5023-EVALZ supports both configurations: dual-supply (VDD = +3.3 V, VSS = −3.3 V) and single-supply (VDD = +3.3 V, VSS tied to ground). The board includes dedicated test points and jumper options to configure either mode, enabling direct comparison of RF performance trade-offs - such as reduced P0.1dB (16 dBm vs. 31 dBm) and slower settling time (7.8 μs vs. 3.5 μs) in single-supply operation - as documented for the ADRF5023.

How is RF matching implemented on the ADRF5023-EVALZ?

The ADRF5023-EVALZ uses a coplanar waveguide (CPWG) layout with precise trace geometry (14 mil width, 7 mil clearance) on Rogers RO4003 substrate (8 mil thickness) to maintain 50 Ω characteristic impedance from SMA connectors through the ADRF5023 LGA pads. Tapered 45° transitions minimize discontinuities, and the internal 50 Ω terminations of the ADRF5023 eliminate need for external matching - ensuring measurement integrity up to 45 GHz on the ADRF5023-EVALZ.

Can the ADRF5023-EVALZ be used to verify hot-switching capability of the ADRF5023?

Yes, the ADRF5023-EVALZ enables hot-switching validation at the RFC port with up to 30 dBm input power (at TCASE = 85°C, dual-supply mode), as specified for the ADRF5023. Its robust grounding, thermal vias under the EPAD, and low-inductance supply paths allow sustained RF stress testing while monitoring for degradation in insertion loss, isolation, or distortion - confirming the ADRF5023's rated hot-switching performance directly on the ADRF5023-EVALZ.

What control logic states does the ADRF5023-EVALZ support for the ADRF5023?

The ADRF5023-EVALZ exposes the CTRL and EN pins of the ADRF5023 with test points and optional pull-up/down resistors, supporting all four combinations defined in the ADRF5023 truth table: RF1-on/RF2-off, RF1-off/RF2-on, and two all-off states (EN high regardless of CTRL). This allows full verification of the ADRF5023's nonreflective termination, isolation behavior, and enable-controlled shutdown - critical for system-level timing and fault-safety validation using the ADRF5023-EVALZ.