Analog Devices Inc. ADRF5025-EVALZ

Overview

ADRF5025-EVALZ from Analog Devices is a 4-layer evaluation board designed to characterize the ADRF5025 silicon SPDT reflective RF switch (9 kHz–44 GHz) under real-world PCB conditions. It features Rogers RO4003 dielectric (8 mil top layer), coplanar waveguide transmission lines (50 Ω, 14 mil trace/7 mil gap), 2.4 mm end-launch RF connectors (J8–J10), and dual-layout options-impedance-matched and non-matched-for accurate de-embedding of board loss using THRU CAL calibration.

For engineers reviewing the ADRF5025-EVALZ datasheet, ADRF5025-EVALZ pinout, ADRF5025-EVALZ application, or ADRF5025-EVALZ equivalent, this board enables precise measurement of insertion loss, isolation, return loss, and RF settling time (3.4 µs) across mmWave bands up to 44 GHz-critical for 5G infrastructure, test instrumentation, and military radar validation.

Technical Context

The ADRF5025-EVALZ implements two parallel RF layouts on a single PCB: one with 5-mil impedance-matching stubs at RFC/RF1/RF2 pads (per Figure 24), and one without (Figure 25). Both use identical 4-layer stackup-0.5 oz outer copper plated to 1.5 oz, grounded inner/bottom planes, and 62-mil total thickness-to support mechanical compatibility with 2.4 mm launchers.

Calibration is enabled via a dedicated THRU line (J6–J7 or J4–J5) for S-parameter de-embedding, while power delivery includes 100 pF bypass capacitors at TP7 (VDD) and TP5 (VSS), and configurable RC filtering at TP6 (CTRL). The board hosts the ADRF5025 in its native CC-12-3 LGA package (2.25 mm × 2.25 mm) with thermal vias under the EPAD for junction-to-board heat transfer.

Key Specifications

Availability

ADRF5025-EVALZ is available at Aetrix Electronics and suitable for 5G mmWave base station development, microwave radio transceiver validation, and electronic warfare (EW) system testing requiring stable component supply, repeatable RF measurement accuracy, and mmWave-capable evaluation infrastructure.

Supply support for ADRF5025-EVALZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and digital signal processing (DSP) technologies, serving precision instrumentation, communications, industrial, and defense markets since 1965.

The ADRF5025-EVALZ belongs to Analog Devices' RF & Microwave Evaluation Platform family-engineered specifically to accelerate characterization and integration of ultrawideband silicon RF switches like the ADRF5025 into demanding mmWave systems.

FAQ

What is the purpose of the THRU CAL line on the ADRF5025-EVALZ?

The THRU CAL line (J6–J7 or J4–J5) on the ADRF5025-EVALZ provides a calibrated reference path for vector network analyzer (VNA) de-embedding. It allows engineers to isolate and subtract PCB transmission line loss from measured S-parameters, yielding true device-level insertion loss, return loss, and isolation data for the ADRF5025-especially critical above 26 GHz where board effects dominate.

Does the ADRF5025-EVALZ support both impedance-matched and non-matched configurations?

Yes-the ADRF5025-EVALZ integrates two independent RF routing variants on one board. By default, the impedance-matched configuration (with 5-mil matching stubs) is populated; the non-matched variant uses direct 50 Ω CPWG routing. This dual-layout design lets users directly compare board-loss-corrected performance versus raw measurement, as documented in Figure 19 of the ADRF5025 datasheet Rev. D.

Which RF connector type is used on the ADRF5025-EVALZ, and why is it suitable for 44 GHz operation?

The ADRF5025-EVALZ uses Southwest Microwave 1492‑04A-5 2.4 mm end-launch connectors (J8, J9, J10). These are precision-machined, air-dielectric coaxial interfaces rated to 50 GHz, with low VSWR (<1.15:1) and repeatability <0.02 dB insertion loss variation-making them ideal for validating the ADRF5025's 44 GHz performance without introducing connector-related uncertainty.

How is thermal management handled on the ADRF5025-EVALZ during high-power RF testing?

The ADRF5025-EVALZ employs dense arrays of plated-through vias around the ADRF5025's exposed pad (EPAD) and RF traces to conduct heat into the internal ground planes. Combined with the 62-mil board thickness and solid copper ground layers, this structure maintains thermal stability during continuous-wave testing at the ADRF5025's rated 27 dBm hot-switching power level-ensuring consistent RF performance across −40°C to +105°C operating range.

Can the ADRF5025-EVALZ be used to evaluate both ADRF5025 and ADRF5024 devices?

No-the ADRF5025-EVALZ is specifically designed for the ADRF5025 SPDT switch and is not validated for the ADRF5024. Although the ADRF5025 and ADRF5024 share pin compatibility (CC-12-3 LGA), their control logic timing, low-frequency cutoff (9 kHz vs. 100 MHz), and internal biasing differ. The ADRF5025-EVALZ layout, calibration, and documentation are optimized exclusively for ADRF5025 characterization per its Rev. D datasheet specifications.