Analog Devices Inc. ADRF5027-EVALZ

Overview

ADRF5027-EVALZ from Analog Devices is a 4-layer evaluation board designed to characterize the ADRF5027 ultrawideband nonreflective SPDT RF switch (9 kHz–44 GHz) in real-world RF signal routing applications. It features 2.4 mm end-launch connectors on RFC, RF1, and RF2 ports; 50 Ω coplanar waveguide traces; and integrated thru-calibration line for de-embedding board loss. The board supports full DC-coupled operation with dual ±3.3 V supplies and enables accurate measurement of insertion loss, isolation, P1dB, and IP3 up to 44 GHz.

For engineers reviewing the ADRF5027-EVALZ datasheet, ADRF5027-EVALZ pinout, ADRF5027-EVALZ application, or ADRF5027-EVALZ equivalent, this evaluation platform delivers traceable, calibrated RF performance data across mmWave bands-critical for 5G infrastructure, test instrumentation, and military radar front-end validation where wideband switching integrity and thermal stability at +105°C must be verified before IC integration.

Technical Context

The ADRF5027-EVALZ implements a controlled-impedance layout using 8 mil Rogers RO4003 dielectric, 14 mil trace width / 7 mil ground spacing CPWG transmission lines, and solid inner/outer ground planes to preserve signal integrity from 9 kHz to 44 GHz. Its THRU_CAL line enables S-parameter de-embedding to isolate device-level performance from board parasitics.

It supports both hot-switching (24 dBm RF present during state change) and all-off control mode verification, with dedicated test points for VDD, VSS, CTRL, EN, and GND, plus provisions for RC filtering and additional bypass capacitors. Thermal management relies on dense via arrays under the LGA package's exposed pad and top-layer copper plating.

Key Specifications

Availability

ADRF5027-EVALZ is available at Aetrix Electronics and suitable for 5G mmWave base station development, microwave radio transceiver validation, and electronic warfare system testing requiring stable component supply, calibrated RF measurement capability, and rapid prototyping support for high-frequency silicon SPDT switches.

Supply support for ADRF5027-EVALZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and RF ICs, serving precision instrumentation, communications, industrial, and defense markets since 1965.

The ADRF5027-EVALZ belongs to Analog Devices' RF Switch Evaluation Platform product line, engineered specifically to accelerate characterization and design-in of their ultrawideband silicon SPDT switches-including the ADRF5027-across cellular infrastructure, test equipment, and aerospace applications.

FAQ

What is the primary purpose of the ADRF5027-EVALZ evaluation board?

The ADRF5027-EVALZ evaluation board is designed exclusively to evaluate the ADRF5027 nonreflective SPDT RF switch across its full 9 kHz to 44 GHz bandwidth. It provides calibrated RF access via 2.4 mm connectors, de-embedding capability through its THRU_CAL line, and verified thermal/mechanical implementation-enabling engineers to validate insertion loss, isolation, linearity (P1dB/IP3), and switching behavior before integrating the ADRF5027 into final PCB designs.

Does the ADRF5027-EVALZ support hot-switching measurements at full rated power?

Yes, the ADRF5027-EVALZ supports hot-switching measurements up to 24 dBm RF input power while toggling between RF1 and RF2 states, consistent with the ADRF5027's specified hot-switching rating. Its robust 50 Ω CPWG layout, low-inductance grounding, and dual ±3.3 V supply interface ensure stable operation under these conditions without signal distortion or latch-up.

How is board-level loss compensated when measuring ADRF5027 performance on the ADRF5027-EVALZ?

Board-level loss is compensated using the integrated THRU_CAL line on the ADRF5027-EVALZ. By performing a thru calibration with a vector network analyzer, users can de-embed the evaluation board's transmission characteristics-yielding accurate, device-only S-parameters for the ADRF5027 at its pins, especially critical above 26 GHz where trace loss becomes significant.

Can the ADRF5027-EVALZ be used to verify the ADRF5027's all-off control functionality?

Yes, the ADRF5027-EVALZ fully supports verification of the ADRF5027's all-off control mode. With EN driven high, both RF1→RFC and RF2→RFC paths enter isolation state simultaneously-confirmed by measuring >43 dB isolation at 44 GHz and observing internal 50 Ω terminations at RF1/RF2 using the board's calibrated RF ports and control test points.

What RF connector type is used on the ADRF5027-EVALZ, and is it soldered or press-fit?

The ADRF5027-EVALZ uses three 2.4 mm end-launch RF connectors (J1=RFC, J2=RF1, J3=RF2) that are contact-mounted-not soldered-to the board edges. This press-fit interface ensures repeatable, low-parasitic connection for high-frequency probing and eliminates solder-related impedance discontinuities above 26 GHz.