Analog Devices Inc. ADRF5046-EVALZ

Overview

ADRF5046-EVALZ from Analog Devices is a 4-layer evaluation board designed to characterize the ADRF5046 silicon SP4T reflective RF switch (100 MHz–44 GHz) under real-world high-frequency conditions. It features 2.4 mm end-launch RF connectors, Rogers RO4003 top dielectric, coplanar waveguide transmission lines (50 Ω), and a THRU CAL line for de-embedding board loss effects during S-parameter measurements.

For engineers reviewing the ADRF5046-EVALZ datasheet, ADRF5046-EVALZ pinout, ADRF5046-EVALZ application, or ADRF5046-EVALZ equivalent, this board enables accurate RF performance validation-including insertion loss, isolation, and switching transients-across mmWave 5G, test instrumentation, and radar subsystems where package-level device behavior must be isolated from PCB parasitics.

Technical Context

The ADRF5046-EVALZ implements a calibrated measurement platform using a 62-mil-thick stackup with outer 0.5 oz Cu layers plated to 1.5 oz, grounded inner/bottom planes, and an 8-mil Rogers RO4003 top dielectric optimized for >40 GHz signal integrity. RF paths use CPWG routing (14-mil trace, 7-mil ground clearance) extending 8 mil from the LGA package edge to tapered transitions.

It integrates dedicated test points for VDD (+3.3 V), VSS (−3.3 V), V1/V2 digital controls, and GND, with 100 pF bypass capacitors on supply lines and provisioned RC filter pads on control traces. The THRU CAL line connects unpopulated 2.4 mm launchers to enable full 2-port calibration and de-embedding of board loss from ADRF5046 device measurements.

Key Specifications

Availability

ADRF5046-EVALZ is available at Aetrix Electronics and suitable for mmWave 5G base station development, microwave radio design, and electronic warfare test instrumentation requiring stable component supply and repeatable high-frequency characterization.

Supply support for ADRF5046-EVALZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices, Inc. is a global leader in high-performance analog, mixed-signal, and RF ICs, serving precision instrumentation, communications, and defense markets since 1965.

The ADRF5046-EVALZ belongs to Analog Devices' RF evaluation board product line, engineered specifically to validate ultra-wideband silicon RF switches like the ADRF5046 in production-relevant 50 Ω environments up to 44 GHz.

FAQ

What is the primary purpose of the ADRF5046-EVALZ?

The ADRF5046-EVALZ is a dedicated evaluation board for the ADRF5046 SP4T RF switch, enabling accurate measurement of its insertion loss, isolation, and switching performance up to 44 GHz. It uses 2.4 mm end-launch connectors and a THRU CAL line to de-embed board losses, allowing engineers to isolate true device behavior from PCB parasitics during lab validation of mmWave systems.

Does the ADRF5046-EVALZ require soldering of the RF connectors?

No, the 2.4 mm RF launchers on the ADRF5046-EVALZ are contact-mounted-not soldered-to the board edges. This mechanical interface preserves signal integrity and allows quick connector replacement or repositioning without thermal stress to the PCB or device, supporting repeatable high-frequency calibration and measurement workflows.

How is board loss removed from measurements taken on the ADRF5046-EVALZ?

Board loss is removed using the THRU CAL line-a dedicated 50 Ω transmission path connecting unpopulated 2.4 mm RF launchers. By performing a 2-port S-parameter calibration (e.g., SOLT or TRL) across this line, users can mathematically de-embed the evaluation board's frequency-dependent loss and phase shift, yielding de-embedded device data referenced directly to the ADRF5046 package pins.

What power supply configuration does the ADRF5046-EVALZ support for the ADRF5046 IC?

The ADRF5046-EVALZ provides dedicated test points for +3.3 V (VDD) and −3.3 V (VSS) supplies required by the ADRF5046, with integrated 100 pF bypass capacitors on each rail. Unpopulated pads allow addition of extra decoupling capacitance, and the board's grounded internal layers ensure low-inductance return paths critical for stable biasing of the ultra-wideband switch.

Can the ADRF5046-EVALZ be used for hot-switching characterization of the ADRF5046?

Yes-the ADRF5046-EVALZ supports hot-switching tests via its direct-access RFC and RF1–RF4 ports. With proper external RF signal routing and synchronized digital control (V1/V2), users can apply continuous RF input while toggling switch states to measure settling time (50 ns for 0.1 dB), transient feedthrough (<35 mV_p-p), and power-handling robustness (27 dBm through path, 27 dBm hot-switching at RFC) per ADRF5046 specifications.