Texas Instruments ADS5517IRGZR

Overview

ADS5517IRGZR from Texas Instruments is a high-performance 11-bit, 200-MSPS analog-to-digital converter (ADC) with fully differential LVDS DDR and selectable parallel CMOS outputs. It features 67-dBFS SNR at 70-MHz IF, 84-dBc SFDR, 800-MHz analog input bandwidth, internal reference support, and programmable output clock positioning for precise data capture in demanding RF sampling applications.

For engineers reviewing the ADS5517IRGZR datasheet, ADS5517IRGZR pinout, ADS5517IRGZR application, or ADS5517IRGZR equivalent, this page delivers verified technical context, real-world timing and power specifications, validated package mapping to QFN-48 (7 mm × 7 mm), confirmed functional alternatives, and design-critical interface behavior-including LVDS/CMOS mode selection, clock duty cycle stabilization, and gain-programmable SNR/SFDR trade-off at high IF.

Technical Context

The ADS5517IRGZR implements a high-bandwidth track-and-hold front-end with low-jitter clock buffer and supports both internal (0.5 V to 2.5 V) and external reference modes-eliminating external decoupling on the reference path. Its dual-output architecture allows runtime selection between DDR LVDS (3.5 mA drive, 100 Ω termination) and parallel CMOS (3.3-V logic levels), each with independent timing control.

Programmable features include output clock edge position (±1/12 Ts resolution), gain up to +6 dB for SFDR optimization at reduced full-scale input, and LOW SPEED mode enabling scaled power operation below 50 MSPS. Latency is fixed at 14 clock cycles in LVDS mode and includes aperture jitter of 150 fs rms.

Key Specifications

Pinout & Package

ADS5517IRGZR is housed in a thermally enhanced 48-pin QFN package (7 mm × 7 mm) with exposed thermal pad, rated for industrial temperature range (–40°C to +85°C). Pin assignment follows TI's standard ADC layout: differential analog inputs (INP/INM), differential clock inputs (CLKP/CLKM), LVDS DDR data pairs (D0–D10_P/M), output clock (CLKOUTP/CLKOUTM), serial control (SEN/SCLK/SDATA), and dual supply domains (AVDD/AGND, DRVDD/DRGND).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-speed ADC applications.

Compared with ADS5517IRGZR, ADS5560IRGZT trades speed for resolution and lower power, while AD9434BCPZ-250 offers higher raw performance at the cost of increased reference design overhead-making ADS5517IRGZR optimal for balanced IF sampling where integration, thermal efficiency, and timing flexibility are prioritized.

Availability

ADS5517IRGZR is available at Aetrix Electronics and suitable for wireless infrastructure, software-defined radio, radar signal processing, and test equipment applications requiring stable component supply across extended product lifecycles.

Supply support for ADS5517IRGZR includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and high-performance data converters for industrial, communications, and automotive markets.

The ADS5517IRGZR belongs to TI's high-speed ADC portfolio designed specifically for IF sampling in wireless infrastructure and defense electronics-emphasizing low jitter, wide analog bandwidth, and flexible digital interfacing to simplify FPGA-based receiver designs.

FAQ

What is the maximum analog input frequency supported by the ADS5517IRGZR?

The ADS5517IRGZR specifies an analog input bandwidth of 800 MHz, enabling direct sampling of RF signals up to S-band (2–4 GHz) when used with appropriate anti-alias filtering. At 70-MHz IF, it achieves 67-dBFS SNR and 84-dBc SFDR-validating its use in high-frequency receiver front-ends. Performance degrades above 400 MHz due to harmonic distortion, but usable signal integrity remains within specification up to 800 MHz.

Does the ADS5517IRGZR require external reference decoupling capacitors?

No, the ADS5517IRGZR does not require external reference decoupling capacitors. Its internal reference architecture (0.5 V to 2.5 V, ±25 mV error) is designed for self-contained operation, eliminating the need for external bypass caps on the VREF pins. This reduces PCB footprint and improves layout robustness-confirmed in the device's "No External Reference Decoupling Required" feature list and electrical characteristics table.

How many clock cycles of latency does the ADS5517IRGZR exhibit in LVDS DDR mode?

The ADS5517IRGZR exhibits a fixed latency of 14 clock cycles in DDR LVDS mode, as specified in Figure 1 and the Timing Characteristics section. This value is constant across all sampling rates and operating conditions, enabling deterministic timing alignment in FPGA-based capture logic. Latency includes aperture delay (1.2 ns), clock propagation delay (4.4 ns typ), and internal pipeline stages-verified under 200 MSPS, 3.3-V supply, and –1 dBFS input conditions.

Can the ADS5517IRGZR operate with a 1.8-V digital supply?

No, the ADS5517IRGZR requires a 3.3-V digital supply (DRVDD) with a recommended operating range of 3.0 V to 3.6 V. The absolute maximum rating for DRVDD is 3.9 V, and operation below 3.0 V is not characterized or guaranteed. Attempting to power the digital core at 1.8 V will result in undefined behavior, failed register writes, and invalid LVDS/CMOS output levels-per the Recommended Operating Conditions table.

What is the purpose of the DFS pin on the ADS5517IRGZR?

The DFS pin on the ADS5517IRGZR controls data format and output interface selection via hardware configuration. When pulled to GND, it selects 2's complement data with DDR LVDS output (default). Other voltage levels configure offset binary/CMOS combinations. This parallel control operates independently of serial register settings unless overridden by priority rules-allowing fast mode switching without SPI communication, as defined in Table 6 of the datasheet.