Texas Instruments ADS5517IRGZT

Overview

ADS5517IRGZT from Texas Instruments is a high-performance 11-bit, 200 MSPS analog-to-digital converter with fully differential LVDS DDR and selectable parallel CMOS outputs, 67-dBFS SNR at 70-MHz IF, 84-dBc SFDR, and internal reference support - deployed in wireless infrastructure base stations for IF sampling of 70-MHz LTE/802.16d signals.

For engineers reviewing the ADS5517IRGZT datasheet, ADS5517IRGZT pinout, ADS5517IRGZT application, or ADS5517IRGZT equivalent, key selection criteria include its 200-MSPS maximum sample rate, programmable output clock position for DDR data capture timing margin, 800-MHz analog input bandwidth, 1.23-W total power dissipation at full speed, and QFN-48 package compatibility with high-density RF front-end layouts.

Technical Context

The ADS5517IRGZT implements a pipeline ADC architecture with integrated sample-and-hold, clock duty cycle stabilizer, and flexible digital output interface. It supports both internal (0.5 V to 2.5 V) and external reference modes, eliminating external decoupling on the reference path.

Its dual-output capability enables system-level trade-offs: DDR LVDS reduces pin count and EMI for high-speed backplanes, while parallel CMOS simplifies FPGA interfacing at lower sampling rates. Programmable gain up to +6 dB optimizes SFDR at reduced full-scale input ranges without sacrificing SNR.

Key Specifications

Pinout & Package

ADS5517IRGZT is housed in a thermally enhanced 48-pin QFN package (7 mm × 7 mm) with exposed thermal pad, supporting JEDEC-standard PCB layout for 2 oz. copper trace cooling (θJC = 16.5°C/W).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-speed ADC applications.

Compared with ADS5517IRGZT, ADS5560IRGZT trades speed for resolution and lacks integrated reference, while AD9268BCPZ-105 offers multichannel capability and modern serial interface at the cost of higher power and non-drop-in packaging - making ADS5517IRGZT the optimal choice for single-channel, 200-MSPS, space-constrained wireless infrastructure designs.

Availability

ADS5517IRGZT is available at Aetrix Electronics and suitable for wireless infrastructure, radar signal acquisition, test and measurement instrumentation, and medical imaging systems requiring stable component supply across extended product lifecycles.

Supply support for ADS5517IRGZT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and high-performance data converters for industrial, automotive, and communications markets.

The ADS5517IRGZT belongs to TI's high-speed precision ADC portfolio, engineered specifically for demanding IF sampling in wireless infrastructure and defense electronics where SNR, SFDR, and timing determinism are critical.

FAQ

What is the maximum input clock frequency supported by the ADS5517IRGZT?

The ADS5517IRGZT supports a maximum sample rate of 200 MSPS, corresponding to a 200-MHz input clock frequency in default speed mode. Its clock input accepts differential amplitudes as low as 400 mVPP and tolerates duty cycles from 35% to 65%, with an integrated duty cycle stabilizer ensuring robust sampling timing even with imperfect clock sources. The ADS5517IRGZT maintains full AC performance specifications up to this rated speed.

Does the ADS5517IRGZT require external reference decoupling capacitors?

No, the ADS5517IRGZT does not require external reference decoupling capacitors. It integrates an internal reference generator (0.5 V to 2.5 V) that eliminates traditional reference pins and associated external decoupling components. This feature reduces BOM count, saves PCB area, and improves reliability in high-vibration or thermally cycled environments where capacitor solder joints may fatigue. The ADS5517IRGZT also supports external reference mode if system-level calibration or tighter tolerance is required.

How many bits of resolution does the ADS5517IRGZT provide, and is it guaranteed monotonic?

The ADS5517IRGZT provides 11-bit resolution with guaranteed no missing codes across its full operating temperature range (–40°C to +85°C). Its differential non-linearity (DNL) is specified from –0.6 LSB to +1.0 LSB, and integral non-linearity (INL) from –1.5 LSB to +1.5 LSB, confirming monotonic behavior and predictable transfer function. This ensures reliable digital representation of analog signals in closed-loop control and feedback applications where code transitions must be strictly ordered - a verified characteristic of the ADS5517IRGZT.

Can the ADS5517IRGZT operate with both LVDS and CMOS digital outputs simultaneously?

No, the ADS5517IRGZT cannot operate with LVDS and CMOS outputs simultaneously. It supports either DDR LVDS or parallel CMOS output format, selected at power-up via the DFS pin or serial register configuration. The device uses shared output drivers and timing resources, so concurrent operation would cause signal contention and undefined logic states. The ADS5517IRGZT's dual-mode capability is intended for system-level flexibility - choose LVDS for high-speed, low-noise backplane links or CMOS for direct FPGA GPIO interfacing - but only one mode is active per configuration.

What is the typical power consumption of the ADS5517IRGZT at 200 MSPS?

The ADS5517IRGZT consumes 1.23 W total power at 200 MSPS with LVDS output enabled, based on 3.3-V AVDD and DRVDD supplies. Analog supply current is 306 mA, digital supply current is 66 mA, and standby power drops to ≤150 mW when clock is stopped. This power figure reflects worst-case DDR LVDS loading (IO = 3.5 mA, RL = 100 Ω); CMOS mode reduces digital current to ~47 mA. The ADS5517IRGZT's power scales dynamically with sample rate, enabling energy-efficient operation in TDD systems.