Texas Instruments ADS5560IRGZT

Overview

ADS5560IRGZT from Texas Instruments is a 16-bit, 40 MSPS analog-to-digital converter with DDR LVDS and CMOS output options, internal reference, and low-frequency noise suppression mode. It features 84 dBFS SNR at 3 MHz input, 85 dBc SFDR, and operates from 3.3-V analog/digital supplies in industrial temperature range (–40°C to 85°C) for high-fidelity signal acquisition in medical imaging and test instrumentation.

For engineers reviewing the ADS5560IRGZT datasheet, ADS5560IRGZT pinout, ADS5560IRGZT application, or ADS5560IRGZT equivalent, key selection criteria include its 40 MSPS sampling rate, 16-bit resolution with no missing codes, DDR LVDS interface timing, fine gain programmability (1-dB steps), and dual-reference support (internal/external) - all in a compact 48-pin VQFN package.

Technical Context

The ADS5560IRGZT implements a high-speed pipeline ADC architecture with integrated sample-and-hold, supporting both differential analog input (INP/INM) and differential clock input (CLKP/CLKM). Its digital output interface is configurable between DDR LVDS (multiplexed D0–D15 pairs) and parallel CMOS (non-multiplexed D0–D15), selected via DFS and MODE pins.

It includes programmable fine gain (0–6 dB in 1-dB steps), low-frequency noise suppression mode (improves noise below ~1 MHz), and flexible power management: standby mode (155 mW), clock-stop mode (125–150 mW), and full operation (674 mW at 40 MSPS). Reference configuration is determined by MODE pin state, with VCM serving as either internal common-mode output or external reference input.

Key Specifications

Pinout & Package

The ADS5560IRGZT is housed in a 48-pin VQFN (RGZ) package with 7.00 mm × 7.00 mm body size and exposed thermal pad. Pin functions differ between LVDS and CMOS output modes; LVDS mode uses multiplexed differential data pairs (e.g., D0_D1_P/M), while CMOS mode provides single-ended outputs (D0–D15).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-speed ADC applications.

Compared with ADS5562IRGZT and ADS5547IPAPR, the ADS5560IRGZT uniquely balances 40 MSPS performance, DDR LVDS pin efficiency, and low-frequency noise suppression - making it optimal for space-constrained, medium-bandwidth applications where power and SNR below 1 MHz matter most.

Availability

ADS5560IRGZT is available at Aetrix Electronics and suitable for medical imaging, wireless infrastructure, and test instrumentation requiring stable component supply, long-term lifecycle assurance, and traceable sourcing for Class II medical and industrial deployments.

Supply support for ADS5560IRGZT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and high-performance data converters for industrial, automotive, and communications markets.

The ADS556x product line was designed for high-fidelity, medium-speed digitization in demanding signal-chain applications - emphasizing SNR, spurious performance, and integration density in compact packages.

FAQ

What is the maximum sampling rate supported by the ADS5560IRGZT?

The ADS5560IRGZT supports a maximum sampling rate of 40 MSPS under recommended operating conditions (AVDD = DRVDD = 3.3 V, –40°C to 85°C). This rate is guaranteed across temperature and supply variations, and applies to both DDR LVDS and CMOS output modes. The device enters LOW SPEED mode below 25 MSPS, where timing margins relax to accommodate lower-frequency clock sources.

Does the ADS5560IRGZT require external decoupling capacitors for its internal reference?

No, the ADS5560IRGZT does not require external decoupling capacitors for its internal reference. As stated in the datasheet, innovative design eliminates the need for external 10-µF bypass capacitors typically required by other high-precision ADCs. This reduces bill-of-materials cost and PCB area, while maintaining 1.5 V ±0.1 V common-mode output stability across temperature and load.

How does the low-frequency noise suppression mode affect the ADS5560IRGZT's performance?

The low-frequency noise suppression mode in the ADS5560IRGZT improves the noise floor from DC to approximately 1 MHz. This enhancement directly increases SNR and SINAD for baseband and narrowband IF signals - particularly beneficial in MRI and audio test applications. The mode is enabled via register programming and does not impact maximum sampling rate or power consumption in active mode.

Can the ADS5560IRGZT operate with an external reference, and how is it configured?

Yes, the ADS5560IRGZT supports external reference operation. Configuration is performed by driving the MODE pin low (internally pulldown to AGND), which places VCM in input mode. An externally supplied reference voltage of 1.5 ±0.05 V is then applied to VCM. In this mode, the internal reference is disabled, and the ADC's full-scale range scales proportionally to the applied reference, preserving 16-bit resolution and linearity.

What are the power consumption values for the ADS5560IRGZT in different operating modes?

The ADS5560IRGZT consumes 674 mW at 40 MSPS in full operation (LVDS mode), 155 mW in STANDBY mode with clock running, and 125–150 mW in clock-stop mode. These values are measured at AVDD = DRVDD = 3.3 V and T_A = 25°C. Power scales automatically at lower sampling rates, and CMOS output mode draws slightly less current than LVDS due to reduced driver loading.