Texas Instruments ADS62P23IRGCT

Overview

ADS62P23IRGCT from Texas Instruments is a dual-channel, 12-bit analog-to-digital converter with 80 MSPS maximum sampling rate, DDR LVDS or parallel CMOS outputs, and integrated digital processing block including decimation (×2/4/8), 24-tap programmable filters, and fine gain correction in 0.05 dB steps. It operates over –40°C to 85°C and targets high-fidelity signal acquisition in software-defined radio baseband receivers.

For engineers reviewing the ADS62P23IRGCT datasheet, ADS62P23IRGCT pinout, ADS62P23IRGCT application, or ADS62P23IRGCT equivalent, this page delivers verified specifications, package-validated pin functions, real-world use cases in wireless infrastructure, and two confirmed alternative parts with documented functional and application-level differences.

Technical Context

The ADS62P23IRGCT implements a pipelined ADC architecture with internal sample-and-hold and low-jitter clock buffer, enabling 71.5 dBFS SINAD at 10 MHz input and 69.7 dBFS at 190 MHz with 3.5 dB coarse gain. Its digital processing block supports independent channel offset correction and programmable filter coefficients via serial interface or parallel pin configuration.

It supports flexible clocking with sine, LVPECL, LVDS, or LVCMOS inputs down to 400 mV_PP, includes a clock duty cycle stabilizer, and offers dual output modes: DDR LVDS (3.3 V DRVDD, 100 Ω termination) or multiplexed/parallel CMOS (1.8–3.6 V DRVDD). Internal reference (1 V–2 V) eliminates external reference pins, though external reference mode remains supported.

Key Specifications

Pinout & Package

ADS62P23IRGCT is housed in a thermally enhanced 64-pin QFN package (9 mm × 9 mm) with exposed thermal pad, θ_JA = 23.17 °C/W (0 LFM), and JEDEC-standard 4-layer PCB mounting requirements.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar dual-channel, 12-bit ADC applications.

Compared with ADS62P24IRGCT and ADS62P22IRGCT, the ADS62P23IRGCT delivers optimal balance of 80 MSPS bandwidth, 594 mW power, and 71.5 dBFS SINAD-making it the preferred choice for mid-tier wireless infrastructure and SDR platforms where oversampling margin and thermal density must be tightly managed.

Availability

ADS62P23IRGCT is available at Aetrix Electronics and suitable for wireless communications infrastructure, software-defined radio development, and power amplifier linearization systems requiring stable component supply across industrial temperature ranges and long production lifecycles.

Supply support for ADS62P23IRGCT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and high-performance data converters for industrial, automotive, and communications markets.

The ADS62P2X family was designed specifically for high-speed, dual-channel digitization in wireless infrastructure and instrumentation-emphasizing low power, integrated digital processing, and flexible interface options without sacrificing AC performance.

FAQ

What is the maximum sampling rate supported by the ADS62P23IRGCT?

The ADS62P23IRGCT supports a maximum sampling rate of 80 MSPS, as specified in the SLAS576C datasheet revision October 2011. This rate is validated across the full industrial temperature range (–40°C to 85°C) with AVDD = 3.3 V and proper clock conditioning. Exceeding 80 MSPS may result in degraded SFDR and increased aperture jitter, as confirmed by Table 1 and Electrical Characteristics sections.

Does the ADS62P23IRGCT support both LVDS and CMOS digital outputs?

Yes, the ADS62P23IRGCT supports both DDR LVDS and parallel CMOS outputs. Output mode is selected via the SEN pin voltage level per Table 5: (3/8)AVDD enables straight-binary DDR LVDS, while AVDD selects 2's complement parallel CMOS. The device does not support single-ended CMOS or LVDS-only differential DDR LVDS or 12-bit parallel CMOS with configurable drive strength.

What is the SINAD performance of the ADS62P23IRGCT at 190 MHz input frequency?

At 190 MHz input frequency with 3.5 dB coarse gain enabled, the ADS62P23IRGCT achieves 69.7 dBFS SINAD, as measured under typical conditions (25°C, AVDD = 3.3 V, –1 dBFS input, internal reference). This value is specified across the full temperature range and reflects the device's ability to maintain signal fidelity in high-frequency IF sampling applications such as radar and broadband communications.

Can the ADS62P23IRGCT operate with an external reference voltage?

Yes, the ADS62P23IRGCT supports external reference mode. When the SCLK pin is biased to (3/8)AVDD or (5/8)AVDD, the device disables its internal 1 V–2 V reference and accepts an external reference applied to the VCM pin within 1.45 V to 1.55 V. External reference mode preserves full 12-bit resolution and linearity but requires careful decoupling and noise isolation per Section 8.2.2 of SLAS576C.

What package type and thermal characteristics apply to the ADS62P23IRGCT?

The ADS62P23IRGCT uses a 64-pin QFN package (RGC designation) measuring 9 mm × 9 mm with exposed thermal pad. Its thermal resistance is θ_JA = 23.17 °C/W (0 LFM air flow) and θ_JC = 22.1 °C/W when mounted on a JEDEC-standard four-layer 3 in × 3 in PCB with 2 oz. copper and soldered thermal pad, as defined in the Package/Ordering Information section of SLAS576C.