Texas Instruments ADS62P45IRGCT

Overview

ADS62P45IRGCT from Texas Instruments is a dual-channel, 14-bit analog-to-digital converter with 125 MSPS maximum sampling rate, DDR LVDS or parallel CMOS outputs, and integrated digital processing block (offset/fine gain correction, decimation, 24-tap programmable filters). It delivers 73.7 dBFS SINAD and 88 dBc SFDR at 10 MHz input with 0 dB gain, targeting high-fidelity signal acquisition in radar front-ends and medical imaging systems.

For engineers reviewing the ADS62P45IRGCT datasheet, ADS62P45IRGCT pinout, ADS62P45IRGCT application, or ADS62P45IRGCT equivalent, this page provides verified specifications, package mapping to QFN-64 (9 mm × 9 mm), confirmed pin functions, industrial temperature range (–40°C to 85°C) operation, and two validated alternative parts for system-level design trade-offs.

Technical Context

The ADS62P45IRGCT implements a dual-sampling architecture with independent analog front-ends per channel, each featuring internal sample-and-hold and low-jitter clock buffering. Its digital processing block supports real-time offset correction, fine gain adjustment in 0.05 dB steps, decimation by 2/4/8, and configurable 24-tap FIR filtering-enabling SNR/SFDR optimization without external DSP.

It supports flexible clocking with sine, LVPECL, LVDS, or LVCMOS inputs down to 400 mVPP amplitude and includes a clock duty cycle stabilizer. Output interface selection (DDR LVDS or CMOS) and coarse/fine gain control are configurable via parallel pins or serial interface, with latency as low as 10 clock cycles in low-latency mode.

Key Specifications

Pinout & Package

ADS62P45IRGCT is housed in a 64-pin QFN package (RGC designation, 9 mm × 9 mm body, 0.5 mm pitch) with an exposed thermal pad. Pin functions are validated per TI SLAS561C Rev F (Feb 2012).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar dual-channel, 14-bit ADC applications.

Compared with ADS62P44IRGCT and ADS5500IRGCT, the ADS62P45IRGCT uniquely combines 125 MSPS dual-channel sampling, on-chip digital processing, and QFN-64 packaging-making it optimal for space-constrained, high-fidelity radar and medical systems where channel correlation and real-time preprocessing are critical.

Availability

ADS62P45IRGCT is available at Aetrix Electronics and suitable for radar systems, medical ultrasound equipment, and wireless infrastructure requiring stable component supply across extended product lifecycles.

Supply support for ADS62P45IRGCT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog and embedded processing technologies, with over 50 years of innovation in data converters and signal chain solutions.

The ADS62P4X family was designed specifically for high-performance, low-power dual-channel digitization in demanding RF and instrumentation applications-emphasizing integration, configurability, and industrial-grade reliability.

FAQ

What is the maximum sampling rate supported by the ADS62P45IRGCT?

The ADS62P45IRGCT supports a maximum sampling rate of 125 MSPS, as specified in TI's SLAS561C datasheet. This rate applies under recommended operating conditions: AVDD = 3.3 V, DRVDD = 3.3 V, 50% clock duty cycle, and –1 dBFS differential analog input. At this rate, the device maintains 73.7 dBFS SINAD and 88 dBc SFDR at 10 MHz input frequency with 0 dB gain. The ADS62P45IRGCT is the highest-speed variant in the ADS62P4X family.

Does the ADS62P45IRGCT include an internal voltage reference?

Yes, the ADS62P45IRGCT includes an internal reference with VREFT = 2 V and VREFB = 1 V, yielding a 1 V reference span. It also supports external reference operation via the VCM pin, which accepts 1.45–1.55 V in external-reference mode. Internal reference mode eliminates need for external decoupling capacitors on reference pins, simplifying layout. The ADS62P45IRGCT's internal reference contributes ±2% FS gain error, characterized across –40°C to +85°C.

Can the ADS62P45IRGCT operate with both DDR LVDS and parallel CMOS outputs simultaneously?

No, the ADS62P45IRGCT supports either DDR LVDS or parallel CMOS output interface-not both simultaneously. Interface selection is determined at power-up via analog voltage levels on the SEN pin: 0 V selects 2's complement DDR LVDS, while AVDD selects 2's complement parallel CMOS. The ADS62P45IRGCT does not multiplex or time-share these interfaces; configuration is static per power cycle unless reprogrammed via serial interface.

What digital processing capabilities are integrated into the ADS62P45IRGCT?

The ADS62P45IRGCT integrates a configurable digital processing block including offset correction, fine gain adjustment (in 0.05 dB steps), decimation by 2/4/8, and built-in or custom-programmable 24-tap low-/high-/band-pass FIR filters. These functions operate per channel and can be enabled/disabled independently. By default, the block is bypassed; enabling it reduces host processor load and enables real-time signal conditioning without external logic. The ADS62P45IRGCT's digital processing is accessible via serial interface registers or parallel pin configuration.

Is the ADS62P45IRGCT pin-compatible with other devices in the ADS62P4X family?

Yes, all ADS62P4X variants-including ADS62P45IRGCT, ADS62P44IRGCT, ADS62P43IRGCT, and ADS62P42IRGCT-are pin-compatible and share identical QFN-64 (RGC) packaging, pinout, and footprint. They differ only in maximum sampling rate (125/105/80/65 MSPS), power consumption, and AC performance metrics. This allows direct drop-in replacement within the same family for performance scaling or cost optimization without PCB revision. The ADS62P45IRGCT is fully backward compatible with lower-speed variants.