Texas Instruments BQ29330DBT
- Part No.:
- BQ29330DBT
- Manufacturer:
- Texas Instruments
- Category:
- Battery Management
- Package:
- 30-TFSOP (0.173", 4.40mm Width)
- Datasheet:
-
BQ29330DBT.pdf
- Description:
- IC BATT PROT LI-ION 2-4C 30TSSOP
- Quantity:
- Payment:

- Shipping:

Inventory:1,651
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
BQ29330DBT from Texas Instruments is a 2-/3-/4-series Li-ion/Li-polymer battery protection analog front-end (AFE) IC with integrated 2.5-V/16-mA and 3.3-V/25-mA LDOs, I²C-compatible interface, NMOS FET drive for charge/discharge control, and programmable overcurrent/short-circuit protection. It delivers individual cell voltage translation (0.15× scaling), cell balancing drive, and watchdog timing for notebook battery packs.
For engineers reviewing the BQ29330DBT datasheet, BQ29330DBT pinout, BQ29330DBT application, or BQ29330DBT equivalent, this page provides verified technical context, real-world protection thresholds (e.g., 50–205 mV overload detection), I²C timing compliance (≤100 kHz), thermal metrics (θJA = 81.4°C/W), and validated alternative parts for battery management system design.
Technical Context
The BQ29330DBT implements autonomous safety logic with three independent current fault detectors-overload (discharge), short circuit in charge (SCC), and short circuit in discharge (SCD)-each with user-programmable voltage thresholds (50–475 mV) and blanking delays (1 ms to 915 μs). Its dual-LDO architecture powers internal circuitry and external peripherals: 2.5-V REG supplies core logic and I²C interface, while 3.3-V LEDOUT drives LEDs and feeds REG.
Cell voltage monitoring uses a precision delta-sigma A/D converter with ±1% gain accuracy and 0.975-V reference; outputs are scaled (0.15×) and offset-shifted for ground-referenced measurement at CELL+/CELL– pins. Cell balancing is executed via internal 400-Ω FET switches controlled by I²C-accessible registers, with bypass current set externally via series resistors (500 Ω–1 kΩ).
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| Cell count support | 2-, 3-, or 4-series Li-ion/Li-polymer stacks - enables flexible pack architecture without redesign. |
| Supply voltage range | 4.5 V to 28 V on VCC/BAT - supports wide-input battery packs including 3S–8S configurations. |
| Overload detection threshold | Programmable 50–205 mV in 5-mV steps - allows precise matching to sense resistor (e.g., 5 mΩ) and load profile. |
| I²C interface speed | DC to 100 kHz - compatible with standard microcontroller I²C peripherals without clock stretching. |
| Quiescent current (normal mode) | 140–190 μA typical - minimizes self-discharge during active battery monitoring. |
| Thermal resistance (θJA) | 81.4°C/W (TSSOP-30) - defines maximum power dissipation before thermal shutdown in PCB-constrained layouts. |
| Cell voltage scaling factor | 0.150 ±0.003 - enables accurate 12-bit ADC reading of 0–4.5 V cell ranges using standard 0–3.3 V host inputs. |
Pinout & Package
TSSOP-30 package (DBT) with exposed thermal pad; 0.65-mm pitch, 7.8-mm × 12.8-mm body; RoHS-compliant, moisture-sensitive level 3.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| VC1–VC5 | Cell voltage sense inputs | Direct connection to stack nodes; VC1 = most positive, VC5 = most negative; enables 4-cell differential measurement. |
| SRP / SRN | Current sense differential pair | Measures bidirectional current flow across sense resistor; SRP = high-side during charge, low-side during discharge. |
| CHG / DSG / ZVCHG | NMOS FET gate drivers | Drive external N-channel FETs for charge, discharge, and precharge control; output swing ≥7.5 V above source. |
| REG / LEDOUT | Integrated LDO outputs | 2.5-V/16-mA REG powers internal logic and I²C; 3.3-V/25-mA LEDOUT powers displays and feeds REG. |
| SCLK / SDATA | I²C-compatible serial interface | Open-drain, 10-kΩ internal pullup to REG; supports standard-mode I²C up to 100 kHz with tsu(STA) ≥4.7 μs. |
| XALERT / XRST | Status and reset signals | XALERT = active-low open-drain fault indicator; XRST = active-high reset output synchronized to POR timing. |
Key Features
| Feature | Design Value |
|---|---|
| Programmable protection thresholds | Independent OLV, SCC, SCD registers allow fine-tuning of trip points and blanking delays per application requirement. |
| Integrated cell balancing drive | Internal 400-Ω FET switch per cell with external resistor control enables passive balancing currents up to 10 mA. |
| Dual LDO power system | 2.5-V REG and 3.3-V LEDOUT provide regulated, current-limited rails for host MCU, sensors, and display without external regulators. |
| Low-power sleep/shutdown modes | Sleep current ≤50 μA; shutdown current ≤1 μA - extends shelf life and reduces parasitic drain in storage. |
| 32.768-kHz watchdog input | WDI pin accepts external crystal or oscillator signal to enable hardware-based timeout supervision of host firmware. |
Applications
| Notebook Battery Pack | Medical Portable Device |
|---|---|
|
Use Scenario: 3S/4S Li-ion pack powering ultrabook with dynamic load profiles and USB-C charging. IC Role / Device Role / Timing Role: Full-protection AFE performing real-time cell voltage monitoring, overcurrent cutoff, and I²C-based host communication. Use Value: Enables safe operation under 20-A peak discharge with <1-ms fault response and <50-μA quiescent current during idle. |
Use Scenario: Rechargeable battery pack for handheld ECG monitor requiring long shelf life and medical-grade safety. IC Role / Device Role / Timing Role: Safety supervisor managing ship mode entry, thermal monitoring via TOUT, and cell balancing during charging. Use Value: Reduces risk of thermal runaway via dual-stage protection (OL + SCD) and supports >1-year shelf life with 1-μA shutdown current. |
| Test Equipment Power Module | Industrial Handheld Scanner |
|
Use Scenario: Field-deployable multimeter with hot-swappable battery and high-accuracy voltage measurement. IC Role / Device Role / Timing Role: Precision cell monitor translating individual voltages to 0.15× scale for host ADC input with ±1% gain error. Use Value: Delivers 12-bit-equivalent cell voltage resolution without external op-amps or level-shifting circuitry. |
Use Scenario: Rugged barcode scanner operating in variable ambient temperatures (-25°C to 85°C). IC Role / Device Role / Timing Role: Thermal-aware protector using TOUT-driven thermistor bias and temperature-compensated LDO regulation. Use Value: Maintains stable 2.5-V REG output across full temperature range (±0.2% drift) for reliable I²C communication. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar battery protection AFE applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| BQ29312ADBTR | 2-/3-cell only; no LEDOUT LDO; lower supply current (100 μA typ); lacks cell balancing drive. | Targeted at cost-sensitive 2S/3S packs without display or balancing needs. | Select when reduced feature set and smaller TSSOP-20 footprint justify loss of 4-cell support and balancing. |
| BQ294005DBTR | Fixed-threshold protection (no I²C programming); single 3.3-V LDO; no cell voltage translation outputs. | Designed for basic protection-only applications where host MCU does not require cell-level telemetry. | Choose for simplified BOM and layout where programmability and cell monitoring are unnecessary. |
Compared with BQ29330DBT, BQ29312ADBTR offers lower quiescent current but omits 4-cell support and balancing, while BQ294005DBTR eliminates I²C configurability and cell telemetry-making BQ29330DBT the only option supporting full programmable 4S protection with host-accessible cell data.
Availability
BQ29330DBT is available at Aetrix Electronics and suitable for notebook computers, medical portable devices, test equipment power modules, and industrial handheld scanners requiring stable component supply, long-term lifecycle support, and automotive-qualified thermal performance.
Supply support for BQ29330DBT includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and power management technologies, with decades of battery management system expertise.
The BQ29330DBT belongs to TI's bq29xxx family of high-precision battery protection AFEs, engineered specifically for multi-cell lithium-based packs demanding programmable safety, cell telemetry, and robust thermal operation in portable computing and medical applications.
FAQ
What is the primary function of the BQ29330DBT in a battery management system?
The BQ29330DBT serves as a full-protection analog front-end for 2-/3-/4-series Li-ion/Li-polymer battery packs. It monitors individual cell voltages, detects overcurrent/short-circuit faults, drives external NMOS FETs for charge/discharge control, provides regulated LDO outputs, and communicates telemetry via I²C. The BQ29330DBT integrates all critical safety functions required for UL 2054 and IEC 62133 compliance in portable electronics.
Does the BQ29330DBT support 4-cell battery configurations?
Yes, the BQ29330DBT explicitly supports 2-, 3-, and 4-series cell configurations. Its VC1–VC5 pin set accommodates four differential cell voltage measurements, and the functional block diagram confirms dedicated sensing paths for CELL1 through CELL4. Configuration is achieved via external routing-not register settings-making it hardware-flexible across pack topologies.
What are the key electrical differences between the BQ29330DBT and BQ29312ADBTR?
The BQ29330DBT adds 4-cell support, integrated 3.3-V LEDOUT LDO, cell balancing drive capability, and 2K bytes of data flash-features absent in the BQ29312ADBTR. Electrically, BQ29330DBT has higher supply current (140–190 μA vs. 100 μA typ), larger TSSOP-30 package, and supports I²C programmability for all protection thresholds, whereas BQ29312ADBTR uses fixed thresholds and lacks balancing FETs.
How does the BQ29330DBT handle cell voltage measurement accuracy?
The BQ29330DBT achieves ±1% gain accuracy and <1-mV offset error in cell voltage translation using a trimmed 0.975-V internal reference and 0.150× scaling factor. It supports on-chip calibration via CAL0/CAL1 bits to measure and compensate for amplifier offset and gain errors-enabling sub-10-mV absolute cell voltage accuracy after calibration, as confirmed in the SLUS673E datasheet Section 8.3.
Can the BQ29330DBT operate without an external microcontroller?
Yes-the BQ29330DBT operates autonomously for core protection: overload, short-circuit, overvoltage, and undervoltage responses trigger immediate FET shutdown without host intervention. However, I²C is required to configure thresholds, enable cell balancing, read telemetry, or enter sleep/ship modes. The BQ29330DBT remains fully functional for safety-critical cutoff even if the host MCU is unpowered or non-responsive.
BQ29330DBT Specifications
- Product attributes
- Attribute value
- Manufacturer:
- Texas Instruments
- Series:
- -
- Package/Case:
- 30-TFSOP (0.173", 4.40mm Width)
- Packaging:
- Bulk
- Product Status:
- Not For New Designs
- Function:
- Battery Protection
- Battery Chemistry:
- Lithium Ion/Polymer
- Number of Cells:
- 2 ~ 4
- Fault Protection:
- Over Current, Over/Under Voltage, Short Circuit
- Interface:
- I2C
- Operating Temperature:
- -40°C ~ 110°C (TA)
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- 30-TSSOP
BQ29330DBT FAQ
1.How can I place an order for BQ29330DBT through Aetrix?
Please submit a Request for Quotation (RFQ) for BQ29330DBT on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for BQ29330DBT reliable?
The price and inventory of BQ29330DBT are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for BQ29330DBT is usually 5 days.
3.What payment methods are accepted for BQ29330DBT?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for BQ29330DBT transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for BQ29330DBT?
BQ29330DBT orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your BQ29330DBT order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for BQ29330DBT?
For technical support, including BQ29330DBT datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your BQ29330DBT requirements.
6.How does Aetrix verify that BQ29330DBT is sourced from the original manufacturer or authorized distributors?
All BQ29330DBT products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that BQ29330DBT meets industry standards.
7.What is the process for return or replacement of BQ29330DBT?
All BQ29330DBT units undergo pre-shipment inspection (PSI). If there is an issue with BQ29330DBT, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The BQ29330DBT part is unused and in its original packaging.
Return procedure for BQ29330DBT:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
BQ29330DBT Tags

-
BQ29700DSER
Texas Instruments

-
S-8241ABKMC-GBKT2G
ABLIC Inc.

-
S-8241ABPMC-GBPT2G
ABLIC Inc.

-
BQ27427YZFR
Texas Instruments

-
BQ27426YZFR
Texas Instruments

-
STC3117IJT
STMicroelectronics

-
STC3115IJT
STMicroelectronics

-
BQ76925RGER
Texas Instruments

-
NPM1100-QDAA-R
Nordic Semiconductor ASA

-
BQ27441DRZR-G1A
Texas Instruments

-
STC3115AIQT
STMicroelectronics

-
S-8252AAL-M6T1U
ABLIC Inc.
Tech Hub
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…

